ES2077865T3 - Sistema de caracterizacion de superficies por vision mecanizada. - Google Patents

Sistema de caracterizacion de superficies por vision mecanizada.

Info

Publication number
ES2077865T3
ES2077865T3 ES91915035T ES91915035T ES2077865T3 ES 2077865 T3 ES2077865 T3 ES 2077865T3 ES 91915035 T ES91915035 T ES 91915035T ES 91915035 T ES91915035 T ES 91915035T ES 2077865 T3 ES2077865 T3 ES 2077865T3
Authority
ES
Spain
Prior art keywords
image signal
edge
video image
light source
computed
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
ES91915035T
Other languages
English (en)
Inventor
Jeffrey Brent Parker
Brian James Czubko
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Autospect Inc
Original Assignee
Autospect Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Autospect Inc filed Critical Autospect Inc
Application granted granted Critical
Publication of ES2077865T3 publication Critical patent/ES2077865T3/es
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • G01B11/303—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces using photoelectric detection means

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)

Abstract

ESTE INVENTO ES UN SISTEMA INSPECTOR DE SUPERFICIES QUE INCLUYE UNA FUENTE DE LUZ (111) CON UN PROFUNDO MARGEN ENTRE CLARO Y OSCURO Y UNA CAMARA DE VIDEO (121) REFLEJANDO EL MARGEN REFLEJADO POR LA SUPERFICIE. LA INTENSIDAD DE LA LUZ DE LA FUENTE DE LUZ (111) ES CONTROLADA UTILIZANDO UN SENSOR DE INTENSIDAD DE LUZ (115). UN SISTEMA OPTICO (123) ENFOCA UNA IMAGEN DE LA FUENTE DE LUZ (111) EN LA CAMARA DE VIDEO CON SUFICIENTE PROFUNDIDAD DE ENFOQUE PARA INCLUIR LA SUPERFICIE (10) QUE DEBE SER INSPECCIONADA. LA DURACION DE LA EXPOSICION ESTA FIJADA PARA EVITAR IMAGENES BORROSAS SI LA SUPERFICIE SE ESTA MOVIENDO. UN APARTO DE CALCULO DE LA CALIDAD DE LA SUPERFICIE REALIZA, AL MENOS, UNA MEDIDA DE LA CALIDAD DE LA SUPERFICIE, COMO BRILLO, DISTINCION DE IMAGENES REFLEJADAS Y CORTEZA DE LA SUPERFICIE, DE LA SEÑAL DE VIDEO DE LA IMAGEN. EL APARATO DE CALCULO DE LA CALIDAD DE LA SUPERFICIE INCLUYE, PREFERIBLEMENTE, UN GRABADOR DE TRAMAS (130) Y UN ORDENADOR DIGITAL DE PROPOSITO GENERAL (140).
ES91915035T 1990-08-14 1991-08-09 Sistema de caracterizacion de superficies por vision mecanizada. Expired - Lifetime ES2077865T3 (es)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US07/567,271 US5078496A (en) 1990-08-14 1990-08-14 Machine vision surface characterization system

Publications (1)

Publication Number Publication Date
ES2077865T3 true ES2077865T3 (es) 1995-12-01

Family

ID=24266464

Family Applications (1)

Application Number Title Priority Date Filing Date
ES91915035T Expired - Lifetime ES2077865T3 (es) 1990-08-14 1991-08-09 Sistema de caracterizacion de superficies por vision mecanizada.

Country Status (7)

Country Link
US (1) US5078496A (es)
EP (1) EP0543900B1 (es)
AT (1) ATE129070T1 (es)
CA (1) CA2089079C (es)
DE (1) DE69113806T2 (es)
ES (1) ES2077865T3 (es)
WO (1) WO1992003699A1 (es)

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JPH0420845A (ja) * 1990-05-15 1992-01-24 Jujo Paper Co Ltd 光沢むらの測定方法
US5243405A (en) * 1991-01-07 1993-09-07 Tichenor Clyde L Optical system for surface verification
WO1993012615A1 (en) * 1991-12-19 1993-06-24 The United States Of America, Represented By The Secretary, United States Department Of Commerce Method and apparatus for assessment of surface smoothness using reflected energy
DE4239456A1 (de) * 1992-11-24 1994-06-09 Rheinmetall Sick Optical Inspe Verfahren und Vorrichtung zur Inspektion von Oberflächen
WO1996041304A1 (en) 1995-06-07 1996-12-19 The Trustees Of Columbia University In The City Of New York Apparatus and methods for determining the three-dimensional shape of an object using active illumination and relative blurring in two images due to defocus
US6982794B1 (en) 1995-06-07 2006-01-03 The Boeing Company Directional reflectometer
GB2307983B (en) * 1995-12-06 1998-04-29 Laurie Mullaney Associates Lim Test equipment for colour printing
US5892808A (en) * 1996-06-28 1999-04-06 Techne Systems, Inc. Method and apparatus for feature detection in a workpiece
US5986414A (en) * 1997-07-09 1999-11-16 Synergistech, Inc. Configurable light output controller, method for controlling lights and a system for implementing the method and including a configurable light output controller
WO1999045366A1 (en) 1998-03-05 1999-09-10 Universal Healthwatch, Inc. Optical imaging system for diagnostics
US6272437B1 (en) 1998-04-17 2001-08-07 Cae Inc. Method and apparatus for improved inspection and classification of attributes of a workpiece
US6788411B1 (en) * 1999-07-08 2004-09-07 Ppt Vision, Inc. Method and apparatus for adjusting illumination angle
JP2004522974A (ja) * 2001-03-16 2004-07-29 ハニウエル オサケ ユキチュア 高速移動ウェブの電子撮像および品質管理方法
KR100875806B1 (ko) * 2001-04-06 2008-12-26 아크조노벨코팅스인터내셔널비.브이. 표면 평가를 위한 방법 및 장치
FR2830079B1 (fr) * 2001-09-26 2004-04-30 Holo 3 Procede et dispositif de mesure d'au moins une grandeur geometrique d'une surface optiquement reflechissante
ATE506138T1 (de) * 2001-11-15 2011-05-15 Precitec Vision Gmbh & Co Kg VERFAHREN UND VORRICHTUNG ZUR ERFASSUNG DER NAHTQUALITÄT EINER SCHWEIßNAHT BEI DER SCHWEIßUNG VON WERKSTÜCKEN
US7391523B1 (en) * 2003-06-02 2008-06-24 K-Space Associates, Inc. Curvature/tilt metrology tool with closed loop feedback control
FI20126126L (fi) 2012-10-30 2014-05-01 Metso Automation Oy Menetelmä ja laite kiillon mittaamiseksi
DE102013221334A1 (de) * 2013-10-21 2015-04-23 Volkswagen Aktiengesellschaft Verfahren und Messvorrichtung zum Bewerten von Strukturunterschieden einer reflektierenden Oberfläche
JP2017040510A (ja) * 2015-08-18 2017-02-23 キヤノン株式会社 検査装置、検査方法および物体製造方法
KR102656197B1 (ko) * 2015-11-18 2024-04-09 삼성전자주식회사 이동체, 로봇 청소기, 바닥 상태 판단 장치, 상기 이동체의 제어 방법 및 상기 로봇 청소기의 제어 방법
JP2017198612A (ja) * 2016-04-28 2017-11-02 キヤノン株式会社 検査装置、検査システム、および物品製造方法
US10380767B2 (en) 2016-08-01 2019-08-13 Cognex Corporation System and method for automatic selection of 3D alignment algorithms in a vision system
US10928327B2 (en) * 2016-12-22 2021-02-23 Axalta Coating Systems Ip Co., Llc Apparatuses and methods for measuring spatial properties of surface coating containing flake pigment
US10957072B2 (en) 2018-02-21 2021-03-23 Cognex Corporation System and method for simultaneous consideration of edges and normals in image features by a vision system
CN116075855A (zh) * 2020-08-19 2023-05-05 3M创新有限公司 机器人修复控制系统和方法

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3509349A (en) * 1968-05-21 1970-04-28 Philco Ford Corp Surface finish inspection device utilizing a plurality of light sources
JPS5271289A (en) * 1975-12-11 1977-06-14 Mitsubishi Electric Corp Surface inspection device
JPS5676004A (en) * 1979-11-26 1981-06-23 Toyota Central Res & Dev Lab Inc Measuring device of flatness
JPS58169012A (ja) * 1982-03-31 1983-10-05 Matsushita Electric Works Ltd 表面欠陥検出装置
JPS59202045A (ja) * 1983-05-02 1984-11-15 Suga Shikenki Kk つや感の判別方法
US4629319A (en) * 1984-02-14 1986-12-16 Diffracto Ltd. Panel surface flaw inspection
USH220H (en) * 1986-03-13 1987-02-03 The United States Of America As Represented By The Secretary Of The Army Optical performance comparator
JPH0619262B2 (ja) * 1986-07-11 1994-03-16 関東自動車工業株式会社 塗面の平滑性測定方法
JPS63100310A (ja) * 1986-10-16 1988-05-02 Tokai Rika Co Ltd 表面性状測定装置
US4792232A (en) * 1987-05-18 1988-12-20 Shell Oil Company Method and apparatus for detection of undesirable surface deformities
US4847510A (en) * 1987-12-09 1989-07-11 Shell Oil Company Method for comparison of surfaces
US4929846A (en) * 1988-10-05 1990-05-29 Ford Motor Company Surface quality analyzer apparatus and method
IT1224030B (it) * 1988-12-23 1990-09-26 Fiat Ricerche Metodo e dispositivo per il rilievo e la classivicazione della raggrinzatura di trattamenti superficiali

Also Published As

Publication number Publication date
CA2089079C (en) 2001-05-08
EP0543900A4 (en) 1993-08-04
CA2089079A1 (en) 1992-02-15
DE69113806D1 (de) 1995-11-16
ATE129070T1 (de) 1995-10-15
DE69113806T2 (de) 1996-04-11
EP0543900A1 (en) 1993-06-02
US5078496A (en) 1992-01-07
EP0543900B1 (en) 1995-10-11
WO1992003699A1 (en) 1992-03-05

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