EP3243217A4 - Halbleiterbgehäuse und verfahren zur herstellung davon - Google Patents
Halbleiterbgehäuse und verfahren zur herstellung davon Download PDFInfo
- Publication number
- EP3243217A4 EP3243217A4 EP16735133.7A EP16735133A EP3243217A4 EP 3243217 A4 EP3243217 A4 EP 3243217A4 EP 16735133 A EP16735133 A EP 16735133A EP 3243217 A4 EP3243217 A4 EP 3243217A4
- Authority
- EP
- European Patent Office
- Prior art keywords
- manufacturing
- same
- semiconductor package
- package
- semiconductor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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- 238000004519 manufacturing process Methods 0.000 title 1
- 239000004065 semiconductor Substances 0.000 title 1
Classifications
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- H01L23/29—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the material, e.g. carbon
- H01L23/291—Oxides or nitrides or carbides, e.g. ceramics, glass
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- H01L25/065—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers the devices being of a type provided for in group H01L27/00
- H01L25/0655—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers the devices being of a type provided for in group H01L27/00 the devices being arranged next to each other
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- H01L25/00—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof
- H01L25/03—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes
- H01L25/04—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers
- H01L25/065—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers the devices being of a type provided for in group H01L27/00
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- H01L25/10—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices having separate containers
- H01L25/105—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices having separate containers the devices being of a type provided for in group H01L27/00
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- H01L2924/0001—Technical content checked by a classifier
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- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
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- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/151—Die mounting substrate
- H01L2924/153—Connection portion
- H01L2924/1531—Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface
- H01L2924/15311—Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface being a ball array, e.g. BGA
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- H—ELECTRICITY
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- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/151—Die mounting substrate
- H01L2924/153—Connection portion
- H01L2924/1532—Connection portion the connection portion being formed on the die mounting surface of the substrate
- H01L2924/1533—Connection portion the connection portion being formed on the die mounting surface of the substrate the connection portion being formed both on the die mounting surface of the substrate and outside the die mounting surface of the substrate
- H01L2924/15331—Connection portion the connection portion being formed on the die mounting surface of the substrate the connection portion being formed both on the die mounting surface of the substrate and outside the die mounting surface of the substrate being a ball array, e.g. BGA
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- Engineering & Computer Science (AREA)
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- Power Engineering (AREA)
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- Computer Hardware Design (AREA)
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- General Physics & Mathematics (AREA)
- Electromagnetism (AREA)
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- Signal Processing (AREA)
- Computer Networks & Wireless Communication (AREA)
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Applications Claiming Priority (3)
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KR20150003469 | 2015-01-09 | ||
KR1020150088717A KR102474242B1 (ko) | 2015-01-09 | 2015-06-22 | 반도체 패키지 및 그 제조 방법 |
PCT/KR2016/000013 WO2016111512A1 (en) | 2015-01-09 | 2016-01-04 | Semiconductor package and method of manufacturing the same |
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EP3243217A1 EP3243217A1 (de) | 2017-11-15 |
EP3243217A4 true EP3243217A4 (de) | 2018-01-10 |
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EP16735133.7A Pending EP3243217A4 (de) | 2015-01-09 | 2016-01-04 | Halbleiterbgehäuse und verfahren zur herstellung davon |
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KR (1) | KR102474242B1 (de) |
CN (1) | CN107112296B (de) |
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TWI632844B (zh) * | 2017-03-13 | 2018-08-11 | 景碩科技股份有限公司 | Anti-electromagnetic interference shielding device and manufacturing method thereof |
KR102028027B1 (ko) * | 2017-03-14 | 2019-10-04 | (주)잉크테크 | 반도체 칩의 전자파 차폐막 형성 장치 및 방법 |
KR102609138B1 (ko) | 2019-04-29 | 2023-12-05 | 삼성전기주식회사 | 인쇄회로기판 어셈블리 |
CN110267431B (zh) * | 2019-06-18 | 2021-11-09 | 青岛歌尔微电子研究院有限公司 | 一种电路单元封装结构 |
TWI744869B (zh) * | 2020-04-20 | 2021-11-01 | 力成科技股份有限公司 | 封裝結構及其製造方法 |
Citations (1)
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US20120120613A1 (en) * | 2009-07-17 | 2012-05-17 | Panasonic Corporation | Electronic module and production method therefor |
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US6900383B2 (en) * | 2001-03-19 | 2005-05-31 | Hewlett-Packard Development Company, L.P. | Board-level EMI shield that adheres to and conforms with printed circuit board component and board surfaces |
JP2002334954A (ja) * | 2001-05-08 | 2002-11-22 | Tdk Corp | 電子装置およびその製造方法ならびに電子部品保護用キャップおよびその製造方法 |
EP1643818A4 (de) * | 2003-07-03 | 2006-08-16 | Hitachi Ltd | Modul und verfahren zu seiner herstellung |
JP4645233B2 (ja) * | 2005-03-03 | 2011-03-09 | パナソニック株式会社 | 弾性表面波装置 |
JP2008258478A (ja) * | 2007-04-06 | 2008-10-23 | Murata Mfg Co Ltd | 電子部品装置およびその製造方法 |
US8198176B2 (en) * | 2007-10-09 | 2012-06-12 | Hitachi Chemical Company, Ltd. | Method for producing semiconductor chip with adhesive film, adhesive film for semiconductor used in the method, and method for producing semiconductor device |
US8212340B2 (en) * | 2009-07-13 | 2012-07-03 | Advanced Semiconductor Engineering, Inc. | Chip package and manufacturing method thereof |
US8268677B1 (en) * | 2011-03-08 | 2012-09-18 | Stats Chippac, Ltd. | Semiconductor device and method of forming shielding layer over semiconductor die mounted to TSV interposer |
WO2012120659A1 (ja) * | 2011-03-09 | 2012-09-13 | 国立大学法人東京大学 | 半導体装置の製造方法 |
US8872312B2 (en) * | 2011-09-30 | 2014-10-28 | Taiwan Semiconductor Manufacturing Company, Ltd. | EMI package and method for making same |
KR101798571B1 (ko) * | 2012-02-16 | 2017-11-16 | 삼성전자주식회사 | 반도체 패키지 |
TWI459521B (zh) * | 2012-03-08 | 2014-11-01 | 矽品精密工業股份有限公司 | 半導體封裝件及其製法 |
KR101935502B1 (ko) * | 2012-08-30 | 2019-04-03 | 에스케이하이닉스 주식회사 | 반도체 칩 및 이를 갖는 반도체 패키지 |
US9173331B2 (en) * | 2012-11-20 | 2015-10-27 | Lenovo Enterprise Solutions (Singapore) Pte. Ltd. | Variable thickness EMI shield with variable cooling channel size |
TWI528524B (zh) * | 2012-12-18 | 2016-04-01 | 欣興電子股份有限公司 | 內埋式電子元件封裝結構 |
KR102110984B1 (ko) * | 2013-03-04 | 2020-05-14 | 삼성전자주식회사 | 적층형 반도체 패키지 |
CN203437643U (zh) * | 2013-04-12 | 2014-02-19 | 机械科学研究总院江苏分院 | 一种金属件三维激光打印成形设备 |
CN103327741B (zh) * | 2013-07-04 | 2016-03-02 | 江俊逢 | 一种基于3d打印的封装基板及其制造方法 |
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---|---|---|---|---|
US20120120613A1 (en) * | 2009-07-17 | 2012-05-17 | Panasonic Corporation | Electronic module and production method therefor |
Also Published As
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KR20160086246A (ko) | 2016-07-19 |
CN107112296A (zh) | 2017-08-29 |
EP3243217A1 (de) | 2017-11-15 |
KR102474242B1 (ko) | 2022-12-06 |
TWI691031B (zh) | 2020-04-11 |
TW201637156A (zh) | 2016-10-16 |
CN107112296B (zh) | 2020-08-04 |
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