EP3243217A4 - Semiconductor package and method of manufacturing the same - Google Patents
Semiconductor package and method of manufacturing the same Download PDFInfo
- Publication number
- EP3243217A4 EP3243217A4 EP16735133.7A EP16735133A EP3243217A4 EP 3243217 A4 EP3243217 A4 EP 3243217A4 EP 16735133 A EP16735133 A EP 16735133A EP 3243217 A4 EP3243217 A4 EP 3243217A4
- Authority
- EP
- European Patent Office
- Prior art keywords
- manufacturing
- same
- semiconductor package
- package
- semiconductor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000004519 manufacturing process Methods 0.000 title 1
- 239000004065 semiconductor Substances 0.000 title 1
Classifications
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- H01L23/29—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the material, e.g. carbon
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- H01L25/065—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers the devices being of a type provided for in group H01L27/00
- H01L25/0655—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers the devices being of a type provided for in group H01L27/00 the devices being arranged next to each other
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L25/00—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof
- H01L25/03—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes
- H01L25/04—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers
- H01L25/065—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers the devices being of a type provided for in group H01L27/00
- H01L25/0657—Stacked arrangements of devices
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- H—ELECTRICITY
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- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L25/00—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof
- H01L25/03—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes
- H01L25/10—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices having separate containers
- H01L25/105—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices having separate containers the devices being of a type provided for in group H01L27/00
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- H—ELECTRICITY
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- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/00014—Technical content checked by a classifier the subject-matter covered by the group, the symbol of which is combined with the symbol of this group, being disclosed without further technical details
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- H—ELECTRICITY
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- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/14—Integrated circuits
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- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
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- H01L2924/143—Digital devices
- H01L2924/1432—Central processing unit [CPU]
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- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/14—Integrated circuits
- H01L2924/143—Digital devices
- H01L2924/1433—Application-specific integrated circuit [ASIC]
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- H—ELECTRICITY
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- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/14—Integrated circuits
- H01L2924/143—Digital devices
- H01L2924/1434—Memory
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- H01—ELECTRIC ELEMENTS
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- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/14—Integrated circuits
- H01L2924/143—Digital devices
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- H01L2924/1436—Dynamic random-access memory [DRAM]
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- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/14—Integrated circuits
- H01L2924/143—Digital devices
- H01L2924/1434—Memory
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- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/14—Integrated circuits
- H01L2924/143—Digital devices
- H01L2924/1434—Memory
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- H—ELECTRICITY
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- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/151—Die mounting substrate
- H01L2924/153—Connection portion
- H01L2924/1531—Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface
- H01L2924/15311—Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface being a ball array, e.g. BGA
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
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- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/151—Die mounting substrate
- H01L2924/153—Connection portion
- H01L2924/1532—Connection portion the connection portion being formed on the die mounting surface of the substrate
- H01L2924/1533—Connection portion the connection portion being formed on the die mounting surface of the substrate the connection portion being formed both on the die mounting surface of the substrate and outside the die mounting surface of the substrate
- H01L2924/15331—Connection portion the connection portion being formed on the die mounting surface of the substrate the connection portion being formed both on the die mounting surface of the substrate and outside the die mounting surface of the substrate being a ball array, e.g. BGA
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Power Engineering (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Computer Hardware Design (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- Toxicology (AREA)
- Health & Medical Sciences (AREA)
- Signal Processing (AREA)
- Computer Networks & Wireless Communication (AREA)
- Chemical & Material Sciences (AREA)
- Ceramic Engineering (AREA)
- Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR20150003469 | 2015-01-09 | ||
KR1020150088717A KR102474242B1 (en) | 2015-01-09 | 2015-06-22 | Semiconductor Package and Manufacturing Method thereof |
PCT/KR2016/000013 WO2016111512A1 (en) | 2015-01-09 | 2016-01-04 | Semiconductor package and method of manufacturing the same |
Publications (2)
Publication Number | Publication Date |
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EP3243217A1 EP3243217A1 (en) | 2017-11-15 |
EP3243217A4 true EP3243217A4 (en) | 2018-01-10 |
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Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
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EP16735133.7A Pending EP3243217A4 (en) | 2015-01-09 | 2016-01-04 | Semiconductor package and method of manufacturing the same |
Country Status (4)
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EP (1) | EP3243217A4 (en) |
KR (1) | KR102474242B1 (en) |
CN (1) | CN107112296B (en) |
TW (1) | TWI691031B (en) |
Families Citing this family (5)
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TWI632844B (en) * | 2017-03-13 | 2018-08-11 | 景碩科技股份有限公司 | Anti-electromagnetic interference shielding device and manufacturing method thereof |
KR102028027B1 (en) * | 2017-03-14 | 2019-10-04 | (주)잉크테크 | EMI shielding apparatus and method for semiconductor chip |
KR102609138B1 (en) | 2019-04-29 | 2023-12-05 | 삼성전기주식회사 | Printed circuit board assembly |
CN110267431B (en) * | 2019-06-18 | 2021-11-09 | 青岛歌尔微电子研究院有限公司 | Circuit unit packaging structure |
TWI744869B (en) * | 2020-04-20 | 2021-11-01 | 力成科技股份有限公司 | Package structure and manufacturing method thereof |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20040262749A1 (en) * | 2003-06-30 | 2004-12-30 | Matayabas J. Christopher | Wire-bonded package with electrically insulating wire encapsulant and thermally conductive overmold |
US20090244878A1 (en) * | 2008-03-31 | 2009-10-01 | Apple Inc. | Conforming, electro-magnetic interference reducing cover for circuit components |
US20120120613A1 (en) * | 2009-07-17 | 2012-05-17 | Panasonic Corporation | Electronic module and production method therefor |
Family Cites Families (18)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6900383B2 (en) * | 2001-03-19 | 2005-05-31 | Hewlett-Packard Development Company, L.P. | Board-level EMI shield that adheres to and conforms with printed circuit board component and board surfaces |
JP2002334954A (en) * | 2001-05-08 | 2002-11-22 | Tdk Corp | Electronic device and method of manufacturing the same and cap for electronic component protection, and method of manufacturing the same |
EP1643818A4 (en) * | 2003-07-03 | 2006-08-16 | Hitachi Ltd | Module and method for fabricating the same |
JP4645233B2 (en) * | 2005-03-03 | 2011-03-09 | パナソニック株式会社 | Surface acoustic wave device |
JP2008258478A (en) * | 2007-04-06 | 2008-10-23 | Murata Mfg Co Ltd | Electronic component device and its manufacturing method |
KR101176431B1 (en) * | 2007-10-09 | 2012-08-30 | 히다치 가세고교 가부시끼가이샤 | Method for producing semiconductor chip with adhesive film, adhesive film for semiconductor used in the method, and method for producing semiconductor device |
US8212340B2 (en) * | 2009-07-13 | 2012-07-03 | Advanced Semiconductor Engineering, Inc. | Chip package and manufacturing method thereof |
US8268677B1 (en) * | 2011-03-08 | 2012-09-18 | Stats Chippac, Ltd. | Semiconductor device and method of forming shielding layer over semiconductor die mounted to TSV interposer |
WO2012120659A1 (en) * | 2011-03-09 | 2012-09-13 | 国立大学法人東京大学 | Method for manufacturing semiconductor device |
US8872312B2 (en) * | 2011-09-30 | 2014-10-28 | Taiwan Semiconductor Manufacturing Company, Ltd. | EMI package and method for making same |
KR101798571B1 (en) * | 2012-02-16 | 2017-11-16 | 삼성전자주식회사 | Semiconductor Packages |
TWI459521B (en) * | 2012-03-08 | 2014-11-01 | 矽品精密工業股份有限公司 | Semiconductor package and fabrication method thereof |
KR101935502B1 (en) * | 2012-08-30 | 2019-04-03 | 에스케이하이닉스 주식회사 | Semiconductor chip and semiconductor package having the same |
US9173331B2 (en) * | 2012-11-20 | 2015-10-27 | Lenovo Enterprise Solutions (Singapore) Pte. Ltd. | Variable thickness EMI shield with variable cooling channel size |
TWI528524B (en) * | 2012-12-18 | 2016-04-01 | 欣興電子股份有限公司 | Embedded electronic device package structure |
KR102110984B1 (en) * | 2013-03-04 | 2020-05-14 | 삼성전자주식회사 | Stacked semiconductor package |
CN203437643U (en) * | 2013-04-12 | 2014-02-19 | 机械科学研究总院江苏分院 | Metal-piece 3D laser printing and shaping equipment |
CN103327741B (en) * | 2013-07-04 | 2016-03-02 | 江俊逢 | A kind of base plate for packaging based on 3D printing and manufacture method thereof |
-
2015
- 2015-06-22 KR KR1020150088717A patent/KR102474242B1/en active IP Right Grant
-
2016
- 2016-01-04 EP EP16735133.7A patent/EP3243217A4/en active Pending
- 2016-01-04 CN CN201680005436.7A patent/CN107112296B/en active Active
- 2016-01-07 TW TW105100334A patent/TWI691031B/en not_active IP Right Cessation
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20040262749A1 (en) * | 2003-06-30 | 2004-12-30 | Matayabas J. Christopher | Wire-bonded package with electrically insulating wire encapsulant and thermally conductive overmold |
US20090244878A1 (en) * | 2008-03-31 | 2009-10-01 | Apple Inc. | Conforming, electro-magnetic interference reducing cover for circuit components |
US20120120613A1 (en) * | 2009-07-17 | 2012-05-17 | Panasonic Corporation | Electronic module and production method therefor |
Non-Patent Citations (1)
Title |
---|
See also references of WO2016111512A1 * |
Also Published As
Publication number | Publication date |
---|---|
KR20160086246A (en) | 2016-07-19 |
TWI691031B (en) | 2020-04-11 |
TW201637156A (en) | 2016-10-16 |
EP3243217A1 (en) | 2017-11-15 |
KR102474242B1 (en) | 2022-12-06 |
CN107112296A (en) | 2017-08-29 |
CN107112296B (en) | 2020-08-04 |
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