EP2118641A2 - Procédé et dispositif pour l'examen d'un objet - Google Patents

Procédé et dispositif pour l'examen d'un objet

Info

Publication number
EP2118641A2
EP2118641A2 EP07870190A EP07870190A EP2118641A2 EP 2118641 A2 EP2118641 A2 EP 2118641A2 EP 07870190 A EP07870190 A EP 07870190A EP 07870190 A EP07870190 A EP 07870190A EP 2118641 A2 EP2118641 A2 EP 2118641A2
Authority
EP
European Patent Office
Prior art keywords
light
examined
handset
segment
surface segment
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
EP07870190A
Other languages
German (de)
English (en)
Inventor
Wolfgang P. Weinhold
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Individual
Original Assignee
Individual
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Individual filed Critical Individual
Publication of EP2118641A2 publication Critical patent/EP2118641A2/fr
Withdrawn legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/30Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • G01B11/303Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces using photoelectric detection means
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/27Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
    • G01N21/274Calibration, base line adjustment, drift correction
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47Scattering, i.e. diffuse reflection
    • G01N21/4738Diffuse reflection, e.g. also for testing fluids, fibrous materials

Definitions

  • the invention relates to a device for examining an article, in particular with respect to its surface shape, according to the preamble of claim 1. Furthermore, the invention relates to a method for carrying out the method according to the teaching of the method main claim.
  • the corresponding effect is called hillshading or shadow plastic.
  • general my function is a functional relationship between the angle of incidence of the light, the spatial orientation and the position of a partial surface, in particular their inclination and height, and the angle of reflection of the reflected light.
  • the reflected light is detected by a light sensor, such as a line or matrix CCD camera, as a measured value and then fed to digital image processing.
  • This method is particularly suitable for punctual, line-like or frequently recurring shape deviations, such as soiling and scratches.
  • DE 35 40 288 C2 describes an optical control arrangement for controlling solder joints on printed circuit boards.
  • the solder joint is irradiated with light and the reflected light detected with a perpendicular to the soldering detection unit.
  • DE 41 23 916 C2 describes a method and a device for the dynamic recognition and classification of surface features and defects of an examination subject.
  • DE 197 16 228 C2 describes a method and a device for surface testing, with which in particular scratches and impurities can be detected.
  • the surface to be examined is illuminated with a grazing light pattern.
  • DE 103 19 543 A1 describes a method and a device for surface testing, wherein a material absorbing the light radiation is arranged above the light sources.
  • DE 103 36 493 A1 describes a method and a device for surface testing with two radiation sources, to each of which a radiation detector device is assigned.
  • the known methods and devices have the disadvantage that they can only insufficiently capture design features with a preferred direction.
  • the surfaces produced in this case each have a preferred direction, which decisively co-shapes the surface shape.
  • preferred direction can only be detected insufficiently by the known methods and devices.
  • the calibration of the known devices is extremely expensive and often leads to inaccurate measurement results.
  • the angle of incidence of the beam axes of the light sources should preferably be aligned in the range of 70 ° to 10 ° relative to the surface segment to be examined.
  • the reference planes, in which the beam axes each extend, should be aligned perpendicular to the surface segment to be examined.
  • the reference planes should intersect in a crossing line.
  • This crossing line then defines the middle region of the surface segment to be examined. It is particularly advantageous if the beam axes of the light sources intersect at a crossing point on the surface segment to be examined in order to concentrate the light emitted by the light sources on the surface segment to be examined.
  • the at least three reference planes of the at least three light sources are arranged relative to each other, is basically arbitrary.
  • the reference planes are arranged with an equidistant intermediate angle. This means in other words that when using three light sources with three correspondingly assigned reference planes, an intermediate angle of 120 ° in each case is present between the different reference planes.
  • Particularly accurate measurements of the surface shape based on the color and / or gray value information of the light reflected at the surface are obtained when the light sources illuminate the surface segment to be examined with light having a substantially parallelized beam path.
  • Light sources for producing directly parallelized light are relatively expensive.
  • Adhesive if between the light source of the light source, such as an LED, and the surface to be examined segment, an optical element is arranged, with which the light emitted from the light source can be parallelized.
  • the light source of the light source such as an LED
  • an optical element is arranged, with which the light emitted from the light source can be parallelized.
  • lenses in particular Fresnel lenses, or even lens systems comprising a plurality of lenses can be used as the optical element.
  • the light sensor for detecting the light reflected at the surface should preferably be aligned with its optical axis perpendicular relative to the surface segment to be examined.
  • optical axis of the light sensor and the intersection line of the reference planes are coaxial.
  • the choice of the light color of the light emitted by the light sources depends on the particular application. For example, all light sources can emit white light. According to a preferred embodiment, it is provided that the light sources in each case emit light with different light color, the light sensor being able to separately detect the different light colors of the light sources, in particular also during simultaneous irradiation. As a result, it is thereby possible to illuminate the surface segment to be examined simultaneously with, for example, three light colors from different directions and to record the respectively reflected light with the light sensor. Since each irradiation direction is assigned to a specific light color, this can be taken into account and differentiated accordingly in the evaluation of the light measurement values.
  • one or more overview light sources are also provided in the device, in order to realize an overview illumination of the surface segment to be examined.
  • the same light sensor is used, which is also used to capture the topographical impression.
  • the measurement data acquired with the overview illumination and the measurement data of the topographical examination in which the same surface segment is illuminated with the light sources arranged at an oblique angle of incidence, can thus be correlated with one another and further conclusions can be drawn.
  • the surface segment of the topographical examination and the surface segment of the visual impression correspond to one another and are recorded in the same size, on the same scale and in the same resolution with the same light sensor. Both measurements differ only by the type of surface lighting.
  • Which lighting characteristic the overview light source has is basically arbitrary. Particularly simple designs are obtained if the same illuminants are used for the overview light source as for the other light sources. However, the different light sources and the overview light source must then be controlled in succession, so that the signals do not overlap. If the overview light source has a different illumination characteristic, in particular a different light color, than the three light sources arranged at an oblique angle of incidence, it becomes possible to control the overview light source simultaneously with the other light sources since the different light sources can be evaluated differentiated due to the different illumination characteristics.
  • a particularly simple handling of the device according to the invention results when the housing is designed in the manner of a hand-held device. This handset can then be manually moved by the operator over the surface to be examined and positioned appropriately.
  • the handset should be designed to be largely light-tight except for the illumination opening to prevent the ingress of stray light.
  • a defined, in particular flat, bearing surface is provided on the hand-held device. With this support surface, the handset can then be placed in a defined position on the surface to be examined segment and thereby defined. In particular, a defined illumination angle and illumination distance can be easily maintained.
  • the handset on the side of the support surface on a housing recess As a result of this return, the operator can easily see the support surface during the positioning from the side, so that an accurate positioning is simplified.
  • the hand-held device has at least one, in particular three, flat gripping surface (s) on which the hand-held device can be guided by the operator. This improves the ergonomics during use.
  • the gripping surfaces can help guide the positioning of the handset at a particular relative angle.
  • the housing can optionally also have positioning aids, for example mechanical stop surfaces, in order to position the device at different times and with high repeat accuracy at the same measuring point of an object to be examined.
  • positioning aids for example mechanical stop surfaces
  • this handset can be connected to a second operating unit, for example an industrial PC. On this part of the control and evaluation is then realized, so that this part can then be omitted on the handset. Furthermore, then the power supply of the handset can be realized via the second operating unit.
  • a second operating unit for example an industrial PC.
  • a further improvement of the handling of the device according to the invention results when between the handset and the second Control unit a wireless data transmission path is available. In this way, the otherwise required connection cable between the handset and control unit can be omitted.
  • a cordless power supply in particular a battery, may be provided in the handset in order to realize the power supply without disturbing the supply cable.
  • a hardware component a so-called dongle (copy protection plug)
  • This hardware component can then be queried by the part of the control and evaluation unit implemented on the operating unit as an authorization check. Only with clear identification of a legitimate dongles, the function of the second operating unit is then enabled.
  • one or more displays and / or one or more controls, such as switches, may be provided on the handset.
  • the device can additionally be assigned at least one transmitted-light source, with which the surface segment to be examined can be transilluminated.
  • the transmitted light is recorded with the same light sensor as the reflected light.
  • the topographically and / or visually examined surface segment without a displacement of the measuring device is also examined immediately in transmitted light, for example, to detect the marbling of a paper web.
  • the measured data recorded with the transmitted-light illumination and the measured data of the topographical examination, in which the same surface segment is illuminated with the light sources arranged at an oblique angle of incidence can thus be correlated with one another and further investigation conclusions made.
  • For the surface segment of the topographic examination and the surface segment examined in transmitted light correspond to each other and are of the same size, in the same scale and in the same Resolution recorded with the same light sensor. Both measurements differ only by the type of lighting.
  • the inventive method is based on the basic idea that an accurate measurement of the surface segment to be examined requires the most uniform possible illumination. However, the further the requirements with regard to the uniformity of the illumination are driven upwards, so a higher technical equipment effort is required to realize the light sources.
  • the uniform illumination of the surface segment to be examined is particularly of great importance, even if the material to be examined has a preferred direction.
  • the fiction, contemporary method serves to minimize the technical equipment effort that an at least slight unevenness of the illumination is indeed accepted, this unevenness is detected as a known disturbance and taken into account as a correction value.
  • the calibration is carried out in the following steps:
  • the surface segment to be examined can also be divided into several subregions. For each of these subregions, a separate correction value can then be determined by differential value formation and stored.
  • correction values which are certainly a plurality of values, can be stored in a correction matrix, for example an inverse intensity correction matrix.
  • the height structure of the calibration workpiece should, if possible, be illuminated from different illumination directions, in particular from three illumination directions, in order to again avoid distortions due to preferred directions in the material. Furthermore, according to a preferred variant of the method, the visual impression recorded using the overview lighting can also be calibrated.
  • FIG. 1 shows a first embodiment of a device according to the invention in longitudinal section.
  • FIG. 2 shows the device according to FIG. 1 in cross section
  • FIG. 3 shows a second embodiment of a device according to the invention in longitudinal section
  • Fig. 4 shows the device of FIG. 2 with additional transmitted light source.
  • a device 01 for non-contact examination of the surface shape of an article is shown in longitudinal section.
  • the device 01 comprises a transportable housing 02 with a main body 03 and a housing cover 04. Displays and operating elements can be arranged on the upper side of the housing cover 04.
  • the housing 02 is formed in the manner of a handheld device and must be connected to complete the device 01 with a connection cable 05 to an industrial PC, not shown. About the connection cable 05 data are exchanged, and the power supply of the device 01 is realized. Alternatively, the data connection between housing 02 and industrial PC can also be implemented with a wireless data transmission. In this case, a separate power supply, for example a battery, is to be provided on the device 01. In the light-tight base body 03 of the housing 02, three light sources 06 are installed, which are aligned by arrangement of the housing 02 with a flat support surface 18 on the surface segment to be examined with their optical beam axes 07 in the defined oblique angle of incidence relative to the surface segment to be examined.
  • the surface segment to be examined is arranged below an illumination opening 08.
  • the light reflected at the surface segment to be examined is detected by a light sensor 09.
  • the light sensor 09 can be designed, for example, in the manner of a matrix CCD chip. By evaluating the measured values recorded with the light sensor 09, the surface shape of the surface segment to be examined can be determined.
  • the hand-held device 02 has a housing recess 19 on the side of the support surface 18 in order to facilitate the positioning of the support surface 18 for the operator.
  • the device 01 includes three light sources 06.
  • the device 01 also contains three light sources 10, which are designed in the manner of overview light sources and jointly realize an overview illumination.
  • the optical beam axes 07 of the three light sources 06 each extend at an oblique angle of incidence a of approximately 70 ° relative to the surface segment to be examined.
  • the optical beam axes 07 of the three light sources 06 each extend in reference planes which are perpendicular to the surface segment to be examined. These three reference planes are in this case with intermediate angles ⁇ of in each case 120 °, i. So with equidistant intermediate angles, arranged in the housing 02. As a result, the reference planes thus intersect in a crossing line that runs coaxially to the optical axis 1 1 of the light sensor 09.
  • light-emitting diodes 12 are provided as light sources in the light sources 06, the light emitted by the light-emitting diodes 12 falling through a lens system consisting of two lenses 13 and 14 onto the surface segment to be examined , When passing through the lenses 13 and 14, the light emitted by the light emitting diode 12 is largely parallelized.
  • the control required for controlling the light sources 06, 10 and the light sensor 09 is realized on an electronic board 15. Part of this electronic board 15 is also a dongle 16, which can be queried when connecting the handset to an industrial PC by means of the connection cable 05 as an authorization control.
  • a flat gripping surface 20 is provided on the circumference of the handset 02, which can be gripped by the operator with his fingers.
  • a second embodiment 17 of a device according to the invention is shown.
  • the device 17 differs from the device 01 substantially only by the angle of incidence a, which is approximately 30 ° in the device 17.
  • the remaining components of the device 17 are substantially identical to the device 01.
  • the device 17 is shown with additional transmitted light source 21 which is formed in the manner of a translucent table. Under a transparent plate 22 a plurality of bulbs 22 are arranged on a table top 23.
  • the object to be examined namely a paper web 24, is arranged between the transmitted light source 21 and the device 17, so that in addition to the topographic examination and the detection of the visual impression, a transmitted light examination can additionally be carried out.

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Biochemistry (AREA)
  • Pathology (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Theoretical Computer Science (AREA)
  • Mathematical Physics (AREA)
  • Engineering & Computer Science (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Length Measuring Devices By Optical Means (AREA)

Abstract

L'invention concerne un procédé et un dispositif (01, 17) pour l'examen d'un objet, en considération notamment de la configuration de sa surface, dispositif comprenant : un boîtier transportable (02), qui peut être positionné, en particulier manuellement, au-dessus du segment de surface de l'objet à examiner; au moins trois sources lumineuses (06) dont les axes de rayonnement optiques (07) sont dirigés sous un angle d'incidence incliné par rapport au segment de surface à examiner, les sources lumineuses (07) étant disposées à l'intérieur du boîtier et pouvant éclairer le segment de surface à examiner à travers un orifice d'éclairage (08) ménagé dans le boîtier (02); au moins un détecteur de lumière servant à détecter la lumière réfléchie sur le segment de surface à examiner; une unité de commande et d'évaluation qui est connectée avec les sources lumineuses (06) et le détecteur de lumière (09). L'invention est caractérisée en ce que les sources lumineuses (06) sont disposées de façon que leurs axes de rayonnement optiques (07) s'étendent respectivement dans des plans de référence différents, non parallèles entre eux.
EP07870190A 2007-01-09 2007-12-28 Procédé et dispositif pour l'examen d'un objet Withdrawn EP2118641A2 (fr)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE102007002106A DE102007002106B3 (de) 2007-01-09 2007-01-09 Verfahren und Vorrichtung zur Untersuchung eines Gegenstandes
PCT/DE2007/002316 WO2008083658A2 (fr) 2007-01-09 2007-12-28 Procédé et dispositif pour l'examen d'un objet

Publications (1)

Publication Number Publication Date
EP2118641A2 true EP2118641A2 (fr) 2009-11-18

Family

ID=39466044

Family Applications (1)

Application Number Title Priority Date Filing Date
EP07870190A Withdrawn EP2118641A2 (fr) 2007-01-09 2007-12-28 Procédé et dispositif pour l'examen d'un objet

Country Status (8)

Country Link
US (1) US9322644B2 (fr)
EP (1) EP2118641A2 (fr)
JP (1) JP5393479B2 (fr)
KR (1) KR101582694B1 (fr)
CN (1) CN101617213B (fr)
CA (1) CA2675028C (fr)
DE (1) DE102007002106B3 (fr)
WO (1) WO2008083658A2 (fr)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9245062B2 (en) * 2012-03-22 2016-01-26 Virtek Vision International Inc. Laser projection system using variable part alignment
KR101526495B1 (ko) * 2013-04-29 2015-06-05 주식회사 인포피아 바이오 센서의 식별정보 판독 장치
WO2014183268A1 (fr) * 2013-05-14 2014-11-20 杭州慧缘泰医疗器械有限公司 Procédé de détection quantitative d'une crp à l'aide d'une plaque de test à or colloïdal immunitaire et détecteur photoélectrique de paramètres biochimiques
DE102013213894B4 (de) * 2013-07-16 2018-07-05 Deutsches Zentrum für Luft- und Raumfahrt e.V. Effektor und Verfahren zum Prüfen von Werkstücken
JP6438703B2 (ja) * 2014-08-21 2018-12-19 バンドー化学株式会社 異物検査装置、異物検査システム及び異物検査方法
DE202014104531U1 (de) * 2014-09-23 2014-10-02 Leuze Electronic Gmbh + Co. Kg Sensor zur Erfassung von Objekten in einem Überwachungsbereich
US10180248B2 (en) 2015-09-02 2019-01-15 ProPhotonix Limited LED lamp with sensing capabilities
US10488261B2 (en) * 2015-12-18 2019-11-26 Nix Sensor Ltd. Compact portable color sensor
EP3397936B1 (fr) * 2015-12-28 2020-02-26 Pirelli Tyre S.p.A. Dispositif de controle de pneus
CN105387806A (zh) * 2016-01-04 2016-03-09 东莞市三姆森光电科技有限公司 一种多曲面玻璃量测设备
WO2019147829A2 (fr) * 2018-01-24 2019-08-01 Cyberoptics Corporation Projection de lumière structurée pour surfaces spéculaires
EP3584933A1 (fr) * 2018-06-19 2019-12-25 FRONIUS INTERNATIONAL GmbH Unité de commande optoélectronique destinée au fonctionnement d'un dispositif, en particulier d'un onduleur et boîtier d'onduleur
CN111692998B (zh) * 2020-06-11 2022-02-11 西格迈股份有限公司 一种活塞杆表面粗糙度检测系统
DE102021101155A1 (de) 2021-01-20 2022-07-21 Lippert Gmbh & Co. Kg Verfahren zur optischen Detektion von Fehlern in keramischen Artikeln
CN113884502A (zh) * 2021-12-07 2022-01-04 武汉华工激光工程有限责任公司 基于线阵相机的载板检测及激光标记系统和方法

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4029420A (en) * 1974-12-27 1977-06-14 Romilly John Simms Light reflectance instrument

Family Cites Families (28)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61293657A (ja) * 1985-06-21 1986-12-24 Matsushita Electric Works Ltd 半田付け外観検査方法
JP3142852B2 (ja) * 1990-02-20 2001-03-07 株式会社日立製作所 表面欠陥検査装置
DE4123916C2 (de) * 1990-07-19 1998-04-09 Reinhard Malz Verfahren und Vorrichtung zum beleuchtungsdynamischen Erkennen und Klassifizieren von Oberflächenmerkmalen und -defekten eines Objektes
FI935180A0 (fi) * 1993-11-22 1993-11-22 Rautaruukki Oy Konstruktion hos ett kalibreringsstycke, foerfarande foer utforming av den samma och kalibreringsfoerfarande
US6195163B1 (en) * 1996-02-05 2001-02-27 Micron Technology, Inc. Reflectance method for evaluating the surface characteristics of opaque materials
US5963333A (en) * 1996-09-12 1999-10-05 Color Savvy Systems Limited Color sensor
DE19716264C2 (de) * 1997-04-18 2002-07-25 Fraunhofer Ges Forschung Vorrichtung und Verfahren zur Überprüfung einer Oberfläche eines Gegenstands
DE19716228C2 (de) * 1997-04-18 2002-02-21 Fraunhofer Ges Forschung Vorrichtung und Verfahren zur Überprüfung einer Oberfläche einer optischen Komponente
US5905570A (en) * 1997-09-18 1999-05-18 Department Of Water And Power City Of Los Angeles Remote electro-optical sensor system for water quality monitoring
JP3815903B2 (ja) * 1997-11-12 2006-08-30 花王株式会社 測色装置
JP3843636B2 (ja) * 1999-02-22 2006-11-08 富士ゼロックス株式会社 光量測定装置及びカラー画像形成装置
DE19962779B4 (de) * 1999-12-23 2009-06-25 Byk-Gardner Gmbh Vorrichtung zur quantifizierten Bestimmung der Qualität von Oberflächen
AU2002214275A1 (en) * 2000-11-10 2002-05-21 Arkray, Inc. Method for correcting sensor output
JP4516220B2 (ja) * 2001-01-15 2010-08-04 富士機械製造株式会社 部品装着精度関連部分の相対位置関係取得方法および電気部品装着システム
DE10122313A1 (de) * 2001-05-08 2002-11-21 Wolfgang P Weinhold Verfahren und Vorrichtung zur berührungsfreien Untersuchung eines Gegenstandes, insbesondere hinsichtlich dessen Oberflächengestalt
US6633382B2 (en) * 2001-05-22 2003-10-14 Xerox Corporation Angular, azimuthal and displacement insensitive spectrophotometer for color printer color control systems
US6596996B1 (en) * 2001-07-24 2003-07-22 The Board Of Regents For Oklahoma State University Optical spectral reflectance sensor and controller
DE10149780B4 (de) * 2001-10-09 2019-09-05 Byk Gardner Gmbh Einrichtung zur Beleuchtung einer Messfläche und Vorrichtung und Verfahren zur Bestimmung der visuellen Eigenschaften von Körpern
WO2004008022A2 (fr) * 2002-07-12 2004-01-22 Electro Scientific Industries, Inc. Procede et dispositif de source d'eclairage uniforme
US6956649B2 (en) * 2002-11-26 2005-10-18 Sensys Medical, Inc. Spectroscopic system and method using a ceramic optical reference
JP2004279119A (ja) * 2003-03-13 2004-10-07 Bio Media Co Ltd 測定装置
DE10319543B4 (de) * 2003-04-30 2011-03-03 Byk-Gardner Gmbh Vorrichtung und Verfahren zur Bestimmung von Oberflächeneigenschaften
DE10336493A1 (de) * 2003-08-08 2005-03-03 Byk-Gardner Gmbh Vorrichtung und Verfahren zur Bestimmung von Oberflächeneigenschaften
JP3103990U (ja) * 2004-03-12 2004-08-26 コロナ電業株式会社 赤外線発光手段内臓カメラ
JP2005283199A (ja) * 2004-03-29 2005-10-13 A A N Corporation Kk センサーユニットおよび該センサーユニットを用いた印刷状態検査装置
DE102004034167A1 (de) * 2004-07-15 2006-02-09 Byk Gardner Gmbh Vorrichtung zur goniometrischen Untersuchung optischer Oberflächeneigenschaften
JP4600763B2 (ja) * 2005-09-20 2010-12-15 横河電機株式会社 配向計
US7777897B1 (en) * 2007-08-03 2010-08-17 Ventek, Inc. Veneer roughness detection

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4029420A (en) * 1974-12-27 1977-06-14 Romilly John Simms Light reflectance instrument

Also Published As

Publication number Publication date
DE102007002106B3 (de) 2008-07-03
JP2010515889A (ja) 2010-05-13
CA2675028A1 (fr) 2008-07-17
US9322644B2 (en) 2016-04-26
KR20090102845A (ko) 2009-09-30
JP5393479B2 (ja) 2014-01-22
WO2008083658A2 (fr) 2008-07-17
US20100033715A1 (en) 2010-02-11
CN101617213A (zh) 2009-12-30
KR101582694B1 (ko) 2016-01-05
CA2675028C (fr) 2016-10-18
CN101617213B (zh) 2012-12-19
WO2008083658A3 (fr) 2008-09-18

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