AU2002214275A1 - Method for correcting sensor output - Google Patents
Method for correcting sensor outputInfo
- Publication number
- AU2002214275A1 AU2002214275A1 AU2002214275A AU1427502A AU2002214275A1 AU 2002214275 A1 AU2002214275 A1 AU 2002214275A1 AU 2002214275 A AU2002214275 A AU 2002214275A AU 1427502 A AU1427502 A AU 1427502A AU 2002214275 A1 AU2002214275 A1 AU 2002214275A1
- Authority
- AU
- Australia
- Prior art keywords
- sensor output
- correcting sensor
- correcting
- output
- sensor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Abandoned
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/10—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void
- G01J1/16—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void using electric radiation detectors
- G01J1/1626—Arrangements with two photodetectors, the signals of which are compared
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/10—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void
- G01J1/12—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void using wholly visual means
- G01J1/122—Visual exposure meters for determining the exposure time in photographical recording or reproducing
- G01J1/124—Visual exposure meters for determining the exposure time in photographical recording or reproducing based on the comparison of the intensity of measured light with a comparison source or comparison illuminated surface
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/47—Scattering, i.e. diffuse reflection
- G01N21/4738—Diffuse reflection, e.g. also for testing fluids, fibrous materials
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/59—Transmissivity
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/59—Transmissivity
- G01N21/5907—Densitometers
- G01N2021/5915—Processing scan data in densitometry
- G01N2021/5949—Correcting nonlinearity of signal, e.g. in measurement of photomedium
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/59—Transmissivity
- G01N21/5907—Densitometers
- G01N2021/5957—Densitometers using an image detector type detector, e.g. CCD
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2000-343365 | 2000-11-10 | ||
JP2000343365 | 2000-11-10 | ||
PCT/JP2001/009850 WO2002039076A1 (en) | 2000-11-10 | 2001-11-09 | Method for correcting sensor output |
Publications (1)
Publication Number | Publication Date |
---|---|
AU2002214275A1 true AU2002214275A1 (en) | 2002-05-21 |
Family
ID=18817743
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
AU2002214275A Abandoned AU2002214275A1 (en) | 2000-11-10 | 2001-11-09 | Method for correcting sensor output |
Country Status (6)
Country | Link |
---|---|
US (1) | US7110901B2 (en) |
EP (1) | EP1333258B1 (en) |
JP (1) | JP3754989B2 (en) |
CN (1) | CN1241000C (en) |
AU (1) | AU2002214275A1 (en) |
WO (1) | WO2002039076A1 (en) |
Families Citing this family (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2006107666A2 (en) | 2005-04-01 | 2006-10-12 | Reinhard Hafellner | Body fluid testing component for analyte detection |
US7208735B2 (en) * | 2005-06-08 | 2007-04-24 | Rosemount, Inc. | Process field device with infrared sensors |
DE102007002106B3 (en) * | 2007-01-09 | 2008-07-03 | Wolfgang Weinhold | Object's surface configuration examining device, has control and evaluation unit connected with light sources and light sensor, where light sources are arranged such that optical radiation axis runs in different reference planes |
EP2073055A1 (en) * | 2007-12-20 | 2009-06-24 | TPO Displays Corp. | Detection of an incident light distribution |
JP5275956B2 (en) * | 2009-10-15 | 2013-08-28 | 株式会社ジャパンディスプレイウェスト | Information input device, information input program, and electronic device |
JP5387979B2 (en) * | 2009-12-20 | 2014-01-15 | 独立行政法人産業技術総合研究所 | Linearity inspection apparatus and linearity inspection method |
US20140152771A1 (en) * | 2012-12-01 | 2014-06-05 | Og Technologies, Inc. | Method and apparatus of profile measurement |
CN103925992B (en) * | 2013-01-16 | 2016-03-16 | 光宝电子(广州)有限公司 | There are the brightness measurement method and system of the device of backlight |
CN104019902B (en) * | 2014-06-16 | 2016-09-28 | 武汉工程大学 | Domestic reagent paper reader device and detection method thereof |
CN106197667A (en) * | 2016-07-12 | 2016-12-07 | 江苏浦亚照明科技股份有限公司 | A kind of miniature multi-channel spectrogrph and the Nonlinearity Correction Method of detector thereof |
JP6841406B2 (en) | 2016-09-09 | 2021-03-10 | 大塚電子株式会社 | Optical measurement method and optical measurement device |
DE102017110269A1 (en) * | 2017-05-11 | 2018-11-15 | B. Braun Avitum Ag | Online linearization of an optical sensor |
US10429174B2 (en) * | 2017-12-20 | 2019-10-01 | Texas Instruments Incorporated | Single wavelength reflection for leadframe brightness measurement |
CN109668847A (en) * | 2019-02-14 | 2019-04-23 | 杭州霆科生物科技有限公司 | A kind of residual tacheometer of agriculture with optics self-calibration function |
US11733605B2 (en) * | 2019-06-20 | 2023-08-22 | Kla Corporation | EUV in-situ linearity calibration for TDI image sensors using test photomasks |
CN110519516B (en) * | 2019-08-30 | 2020-09-25 | 联想(北京)有限公司 | Image noise processing method and device and electronic equipment |
CN111256744B (en) * | 2020-02-27 | 2021-06-29 | 苏州海之博电子科技有限公司 | Calibration method of linear output position sensor |
Family Cites Families (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH03204285A (en) * | 1989-12-29 | 1991-09-05 | Nec Corp | Uneven sensitivity correction circuit for solid-state image pickup element |
JPH03289777A (en) * | 1990-04-05 | 1991-12-19 | Nec Corp | Infrared image pickup device |
US5229838A (en) * | 1992-01-21 | 1993-07-20 | The Perkin-Elmer Corporation | Photodetector amplitude linearity |
JPH05297142A (en) * | 1992-04-21 | 1993-11-12 | Toshiba Corp | Scintillation camera |
JPH06225143A (en) * | 1993-01-27 | 1994-08-12 | Tokyo Electric Co Ltd | Picture reader |
JPH08128922A (en) * | 1994-10-31 | 1996-05-21 | Asahi Optical Co Ltd | Digital data processing device |
GB2314227B (en) * | 1996-06-14 | 1998-12-23 | Simage Oy | Calibration method and system for imaging devices |
US5902994A (en) * | 1997-05-06 | 1999-05-11 | Eastman Kodak Company | Apparatus for calibrating a linear image sensor |
JPH11249004A (en) * | 1998-03-02 | 1999-09-17 | Nikon Corp | Image sensor |
US6147702A (en) | 1998-04-17 | 2000-11-14 | Intel Corporation | Calibration of digital cameras |
JP3863290B2 (en) | 1998-05-12 | 2006-12-27 | 浜松ホトニクス株式会社 | Light intensity detector |
JP2000013807A (en) * | 1998-06-24 | 2000-01-14 | Seiko Epson Corp | Digital camera |
CN1308670C (en) * | 2000-11-10 | 2007-04-04 | 爱科来株式会社 | Measuring method and instrument comprising image sensor |
-
2001
- 2001-11-09 EP EP01982755.9A patent/EP1333258B1/en not_active Expired - Lifetime
- 2001-11-09 US US10/415,991 patent/US7110901B2/en not_active Expired - Lifetime
- 2001-11-09 CN CN01818683.1A patent/CN1241000C/en not_active Expired - Lifetime
- 2001-11-09 WO PCT/JP2001/009850 patent/WO2002039076A1/en active Application Filing
- 2001-11-09 AU AU2002214275A patent/AU2002214275A1/en not_active Abandoned
- 2001-11-09 JP JP2002541352A patent/JP3754989B2/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
US20040034494A1 (en) | 2004-02-19 |
CN1241000C (en) | 2006-02-08 |
EP1333258B1 (en) | 2013-08-21 |
JP3754989B2 (en) | 2006-03-15 |
EP1333258A4 (en) | 2011-04-06 |
WO2002039076A1 (en) | 2002-05-16 |
JPWO2002039076A1 (en) | 2004-03-18 |
EP1333258A1 (en) | 2003-08-06 |
CN1474937A (en) | 2004-02-11 |
US7110901B2 (en) | 2006-09-19 |
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