EP2102667A2 - Module pour dispositif de contrôle destiné à tester des plaquettes de circuits imprimés - Google Patents

Module pour dispositif de contrôle destiné à tester des plaquettes de circuits imprimés

Info

Publication number
EP2102667A2
EP2102667A2 EP07822868A EP07822868A EP2102667A2 EP 2102667 A2 EP2102667 A2 EP 2102667A2 EP 07822868 A EP07822868 A EP 07822868A EP 07822868 A EP07822868 A EP 07822868A EP 2102667 A2 EP2102667 A2 EP 2102667A2
Authority
EP
European Patent Office
Prior art keywords
circuit board
contact
contact points
basic grid
printed circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
EP07822868A
Other languages
German (de)
English (en)
Inventor
Andreas Gülzow
Viktor Romanov
Volker Goldschmitt
Werner Müller
Rüdiger Dehmel
Uwe Rothaug
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
ASM Assembly Systems Switzerland GmbH
Original Assignee
ATG Luther and Maelzer GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by ATG Luther and Maelzer GmbH filed Critical ATG Luther and Maelzer GmbH
Publication of EP2102667A2 publication Critical patent/EP2102667A2/fr
Withdrawn legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
    • G01R31/2808—Holding, conveying or contacting devices, e.g. test adapters, edge connectors, extender boards
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
    • G01R1/07328—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support for testing printed circuit boards

Definitions

  • the present invention relates to a module for a test apparatus for testing printed circuit boards and a device for testing printed circuit boards.
  • Devices for testing electrical circuit boards are known, for example, from US Pat. No. 3,564,408 or US Pat. No. 4,417,204. These devices have a contact plate, are arranged on the test pins in a basic grid. The test pins are connected to a test circuit via long cables. The printed circuit boards to be tested are placed on the test plate, wherein an adapter between the circuit board and the test plate can be arranged so that between each test point of the circuit board to be tested and a test pin, an electrical contact is made.
  • test devices were developed, as described in the patents DE 32 40 916 C2 and DE 33 40 180 C1.
  • These types of test devices comprise a base plate on which are mounted vertically arranged modules each comprising part of the electronic test circuit and having vertically aligned test pins at its upper end.
  • modules are arranged side by side, wherein the arrangement of the test pins forms a contact plate replacing the contact field.
  • a perforated plate can be placed on the test pins, each test pin passes through a hole in the perforated plate and is thus fixed in position.
  • This modular structure of the contact field has proven very successful and enforced in practice.
  • a major advantage of this modular design is that the contact pressure applied when testing a printed circuit board is passed through the modules to the base plate.
  • the contact pad is modular.
  • These modules are strip-shaped with, for example, four rows of square pads or contact surfaces. It is disclosed herein that the pads are arranged in a grid having a pitch of, for example, 0.5-2 mm.
  • EP 0 875 767 A2 discloses a test device which is provided with an evaluation electronics having a number of test connections.
  • This test device has a basic grid formed from a multilayer printed circuit board, which has contact points arranged on the upper side in a grid. Several of these contact points are electrically connected to each other by means of scan channels extending in the circuit board of the basic grid.
  • An adapter and / or a translator on which a printed circuit board to be tested can be placed is mounted on the basic grid. The adapter and / or translator establishes electrical contact of circuit board test points located on the circuit board with the contact points of the basic screen.
  • EP 1 322 967 B1 discloses another module for a test apparatus for testing printed circuit boards which has a strip-shaped section with contact points which forms part of a basic grid of the test apparatus. Below the strip-shaped section, a vertically standing plate is arranged, on which a part of an evaluation unit for evaluating test signals is arranged. The contact points on the strip-shaped portion are arranged in a grid with a raster of not more than 2 mm and at least two contact points of a module are electrically connected such that the electrically connected contact points are in contact with a single input of an electronic unit.
  • the basic grid is formed from printed circuit boards which are perpendicular to the plane of the basic grid.
  • These printed circuit boards which are referred to as basic grid printed circuit boards, have contact points on the narrow side faces lying in the plane of the basic grid, which represent the contact elements of the basic grid. These contact points are connected to tracks extending over a side surface of the master grid boards.
  • These basic raster printed circuit boards are designed as multilayer printed circuit boards, wherein in different layers transverse conductor tracks are arranged which form a matrix. These can be electrically connected by means of a plated-through hole at the points of intersection of these interconnecting interconnects.
  • the maximum density of the contact points of a basic grid of a commercially available test device 62 contact points per square centimeter, which corresponds to a square grid with an edge length of 1, 27 mm.
  • the density of the contact points of the basic grid should be further increased. This makes it difficult to produce such a basic grid, in particular if certain contact points of the basic grid are to be electrically connected to one another.
  • the basic printed circuit boards known from EP 1 083 434 A2 the production of so closely adjacent contact points on the narrow side surfaces of the basic printed circuit boards is difficult.
  • the invention is therefore based on the object to provide a module for a test apparatus for testing printed circuit boards, which allows an increasing density of the contact points of the basic grid and also allows easy connection of selected contact points of the basic grid.
  • the inventive module for a test device for testing bare printed circuit boards is provided for a test device having a basic grid on which an adapter and / or a translator can be arranged to connect contact points of the basic grid with printed circuit board test points of a printed circuit board to be tested.
  • the module comprises a support plate and a contact plate.
  • the contact plate is made of a rigid circuit board portion, which is referred to as a basic grid element and at least one flexible printed circuit board portion formed.
  • At the base grid contact points are provided, each forming part of the contact points of the basic grid and are arranged with a density of at least 100 contact points per square centimeter.
  • the basic grid element is arranged transversely to the respective support plate on an end face of the support plate and the flexible circuit board portion is bent such that at least a part of the remaining portion of the contact plate is arranged approximately parallel to the support plate.
  • the contact points of the basic raster element are each in electrical contact with a conductor track running in the contact plate, which extends from the base grid element into the flexible printed circuit board section.
  • the contact points of the basic grid can be generated in a conventional manner in any desired density. Since the basic grid element is connected to a flexible printed circuit board section into which interconnects extending into the flexible printed circuit board section extend with the contact points of the basic grid element, a lot of space is available in planes perpendicular to the basic grid to select selected interconnects and thus selected Contact points of the basic grid electrically connect to each other. These connections can be realized in the contact plate or in the support plate, if this is designed as a printed circuit board. These connections can also be realized in a combination of conductor tracks running in the contact plate and the support plate or in a further circuit board.
  • the interconnects connected to the contact points are bent from the plane parallel to the basic grid plane into a plane approximately perpendicular to the basic grid.
  • a matrix can be formed from conductor tracks extending transversely to each other, wherein certain points of intersection are selectively connected by means of through-connection.
  • these connections can also be realized in other ways.
  • the individual interconnects connected to the contact points of the basic grid can be connected to terminals of one or more multiplexers and logic modules (Asics, FPGA) into which a corresponding logic matrix is connected.
  • FPGAs is special here advantageous because the connection or the linkage of the contact points of the basic grid can be changed at any time.
  • the contact plate on two flexible printed circuit board sections, wherein between the two flexible printed circuit board sections, the basic grid element is arranged.
  • the contact plate is formed from extending over the entire region of the contact plate flexible printed circuit terplatte on which one or more rigid circuit board sections are placed, wherein plated-through holes are provided, both through the rigid circuit board sections as well extend through the flexible circuit board, so that there are electrical connections between pads and traces in the two different types of printed circuit boards.
  • the contact plate may also be provided with one or more other rigid circuit board sections, referred to as channel sections.
  • the channel sections have a plurality of conductor tracks extending transversely to the interconnects connected to the contact points of the basic grid element, which form scan channels and are selectively electrically connected by means of through-connection to the interconnects leading to the contact points of the basic grid element.
  • a matrix of conductor tracks extending transversely to one another can also be provided within the support plate, vias being formed at specific intersection points of these conductor tracks such that the specific contact points of the basic louver element are electrically connected to one another.
  • FIG. 1 shows a module according to the invention in cross-section
  • FIG. 2a shows the module from FIG. 1 in plan view
  • FIG. 2 b shows a detail of a larger view of the top view from FIG. 2 a
  • FIG. 3 shows a contact plate in the extended state, which is part of the module of FIG. 1,
  • FIG. 4 shows the module according to the invention, wherein a contact plate is shown separately from a support plate
  • FIG. 5 shows a section of the contact plate of the module from FIG. 1 in the region of a channel section
  • Figure 6 shows another contact plate in the extended state of another embodiment of the module according to the invention.
  • FIG. 7 shows a further example of a module in a side view.
  • FIGS 1 to 4 show a first embodiment of a module according to the invention for a test apparatus for testing unpopulated printed circuit boards.
  • the module 1 is formed from a support plate 2 and a contact plate 3.
  • the support plate 2 is a steel elongated rectangular plate having a length of about 30 cm and a height of about 6 cm. It has at the top and bottom about a thickness of 4 to 5 mm.
  • On side surfaces 4 of the support plate 2 flat recesses 5 are provided which extend over the entire length of the support plate 2. These trough-shaped recesses 5 have a depth of about 1 mm and a width of about 3 to 4 cm.
  • this has a centrally arranged and downwardly projecting web 6 (Figure 1, 4).
  • the web 6 and the downwardly facing end face of the support plate 2 define two recesses or steps 7, in each of which an edge of a contact strip is received, which are explained in more detail below.
  • the contact plate 3 is formed of a flexible printed circuit board 8 which extends over the entire area of the contact plate 3.
  • the contact plate 3 is shown in the extended state.
  • At least one rigid printed circuit board 10 is arranged on the flexible printed circuit board 8 and has contact points 9 arranged in a predetermined pattern on the side deviating from the flexible printed circuit board 8.
  • This rigid circuit board forms a basic grid element 10, which is a section of a Basic grid of a parallel tester for testing populated printed circuit boards represents.
  • This basic grid element 10 is elongated, strip-shaped, with a width of, for example, about 5 mm and a length of about 26 cm. At the end regions of the basic grid element 10, this protrudes somewhat from the flexible printed circuit board 8.
  • This rigid circuit board is glued to the flexible circuit board surface, for example, a fiber-reinforced adhesive resin (prepreg) is used. Furthermore, vias (not shown) are provided in the basic grid element, which extend in each case from the individual contact points 9 through the rigid printed circuit board into the flexible printed circuit board 8 and are each connected there to a printed conductor 14 (FIG. 5).
  • preg fiber-reinforced adhesive resin
  • the pads are circular in shape because they are created by filling the holes defining the vias with gold. They have a diameter of 0.7 mm.
  • the grid, in which the contact points 9 are arranged is composed of two interlaced square grids. In the square grids, the contact points 9 are each about 1.27 mm apart, wherein at each corner of a square a contact point 9 is arranged. In the center between four arranged at the corners of a square contact points 9 of a grid, one contact point of the other square grid is arranged in each case. These two rasters are thus offset by half the distance between two adjacent contact points of a grid to each other. This half distance is 0.635 mm ( Figure 2b).
  • the density of the contact points of this grid is about 124 contact points per square centimeter and is thus twice as high as the maximum density of contact points of a basic grid of conventional testing devices.
  • Basic grids with such a high density of pads are used to test bare boards because a large number of board test points must be contacted simultaneously on bare boards. This module is thus intended for testing unpopulated printed circuit boards.
  • the contact plate 3 has two further rigid circuit boards 1 1, 12, which are arranged on both sides of the basic grid element 10 at a distance from this. These sections of the contact plate 3 with the rigid printed circuit boards 1 1, 12 are referred to as channel sections 13.
  • Figure 5 shows a section of such a channel section 13 and adjacent portions of the contact plate 3.
  • conductor tracks 14 which are each connected to a contact point 9 and at least extend into one of the channel sections 13.
  • extending tracks 15 are provided transversely to the tracks 14, which are referred to as scan channels 15.
  • scan channels 15 At certain intersections between the scan channels 15 and the printed conductors 14 of the flexible printed circuit board 8, plated-through holes 16 are arranged, which each connect a printed conductor 14 to a scan channel 15.
  • each scan channel 15 is connected to a plurality of printed conductors 14 by means of a plurality of plated-through holes 16.
  • groups of printed conductors 14 or groups of contact points 9 are electrically connected to one another via the scan channels 15.
  • connection of the contact points reference is made to EP 0 875 767 A2 and EP 1 083 434 A2, to which reference is made in full.
  • the channel section is preferably designed such that in each case two, three, four or five interconnects 14 are linked together. This halves the number of connections compared with the number of contact points of the basic grid or even reduces them to one fifth.
  • connection of the contact points 9 takes place by means of the interconnection of the conductor tracks 14 in a plane perpendicular to the basic grid, substantially more space is available than in the case of the formation of the connection according to EP 0 875 767 A2.
  • the link is therefore much simpler and less expensive.
  • a significantly higher number of contact points 9 can be securely and reliably electrically linked.
  • an additional rigid circuit board 1 1, 12 is provided in the channel section 13, which is connected to the flexible circuit board 8 by means of a prepreg connection is bonded over the entire surface.
  • the rigid circuit board 1 1, 12 at least one further layer is provided, in which conductor tracks (scan channels) can be formed.
  • conductor tracks can be formed instead of a rigid printed circuit board.
  • a multi-layer flexible printed circuit board 8 can be used instead of a rigid printed circuit board.
  • the use of a rigid printed circuit board fertilizer is cheaper and in a rigid circuit board, the vias can also be introduced easier and more reliable.
  • the scan channels 15 are connected to the conductor tracks 14 by means of via 16.
  • the channel section 13 it is also possible to form the channel section 13 as a printed circuit board, wherein the scan channels are strip conductors which are in contact with contact points located on the surface of the channel section.
  • the contact points of the channel portion are soldered to corresponding contact points of the flexible circuit board, which in turn are in contact with the conductor tracks 14.
  • the groups of electrically interconnected interconnects comprise only a small number of interconnects 14, such as two or three interconnects.
  • the channel sections 13 are arranged at a distance from the basic screen element 10, so that in each case a flexible section 17 of the contact plate 3 is formed between the channel sections 13 and the basic screen element 10.
  • the channel sections 13 are arranged symmetrically with respect to the basic grid element 10, so that the two flexible sections 17 have the same width.
  • contact strips 18, 19 are arranged.
  • the contact strips 18, 19 extend along the entire edge of the flexible printed circuit board 8 and protrude at the ends in front of the flexible printed circuit board 8.
  • the contact strips 18, 19 are formed as strip-shaped, rigid printed circuit boards, which are glued to the flexible printed circuit board 8.
  • At the contact strips 18, 19 are contact points (not shown, since they are arranged in Figure 3 on the back of the contact plate 3), which are connected to extending in the flexible circuit board 8 traces 14.
  • not every trace 14 of the flexible circuit board 8 is routed to a point of contact, but only linked together by a group via the scan channels Conductor tracks 14, only a single interconnect is connected to a contact point electrical.
  • the total number of contact points of the contact strips 18, 19 is substantially less than the number of contact points 9 of the basic grid element 10.
  • the contact plate 3 is connected to the support plate 2 such that the basic grid element 10 is arranged on an end face 21 of the support plate 2 and the adjacent flexible portions 17 are bent such that the contact plate 3 with the adjoining areas approximately parallel to the side surfaces. 4 the support plate 2 runs.
  • the contact plate 3 is glued over its entire surface with the support plate 2, wherein the channel sections 13 are arranged in the recesses 5 of the support plate 2.
  • the contact strips 18, 19 are each inserted with an edge region in one of the two recesses 7 of the support plate 2 and project downwards against the web 6 a piece and thus define between them a gap-shaped intermediate region.
  • the contact strips 18, 19 are fastened in the region of the web 6 with a screw connection to the support plate 2.
  • the edge of a circuit board 22 which extends over the contact strips 18, 19 a good distance down.
  • This circuit board 22 has in its area in which it is in contact with the contact strips 18, 19, contact points, which are soldered to the corresponding contact points of the contact strips 18, 19.
  • the contact points Since a lot of space is available compared to the basic grid element and the contact points are formed over a large area and arranged in a coarse grid, they can be soldered relatively easily. However, in principle, other types of contacting of the contact points of the contact strips 18, 19 with the contact points of the circuit board 22 are possible. For example, small spring contacts between the contact strip and the circuit board can be arranged.
  • the contact strips 18, 19 are screwed to the circuit board 22, so that a sufficient mechanical stability is ensured.
  • circuit board 22 On the circuit board 22 integrated circuits 23 may be arranged, which form a part of the evaluation, with which generates the measurement signals and be evaluated. However, it is equally possible to provide the circuit board 22 without such devices and provide only in the circuit board 22 lines that are connected to the transmitter.
  • the connection to the evaluation electronics preferably takes place via plug connectors (not shown) which are provided in the test apparatus and into which the lower edge of the circuit boards 22 is inserted.
  • the support plate 2 projects laterally slightly on the contact plate 3.
  • the lower edge of the protruding portions of the support plate 2 forms on bearing 24 ( Figure 4), which rest on corresponding support rails (not shown) in the tester and record the entire pressure force of the tester, which rests on the basic grid.
  • bearing 24 Figure 4
  • the circuit board 22 is free of mechanical stress.
  • the mechanical stress is separated early in the area below the basic grid of the electrical circuitry, making it easily possible to provide the circuit board 22 with other functional elements, since it is not subject to mechanical stress.
  • FIG. 6 shows an alternative embodiment of the contact plate 3.
  • This contact plate in turn has a flexible printed circuit board 8, a basic screen element 10, a channel section 13 arranged at a distance from the basic screen element 10, a flexible section 17 being formed therebetween. Furthermore, a contact strip 18 is provided. In this embodiment of the contact plate only a single channel portion 13 and a single contact strip 18 is provided.
  • This contact plate 3 therefore extends from the end face 21 of the support plate 2 only over one of the two side surfaces of the support plate 2 to the step 7. Otherwise, the structure and function of a module with this contact plate 3 corresponds to the module 1 described above.
  • the support plate 2 is formed of steel and can absorb considerable forces. For smaller testers that do not experience such high forces, less solid materials such as steel may be used for the support plate. Instead of steel, a similar solid composite can be used.
  • the interconnection of the conductor tracks can also take place in a connecting plate formed separately from the contact plate 3.
  • a linking plate is a printed circuit board which has contact points on a side surface which are in electrical connection with corresponding contact points of the contact plate.
  • Such an embodiment has the advantage that the links of the individual contact points can be set differently by exchanging the linking plate.
  • FIG. 7 shows a corresponding embodiment of a module 1, with a basic grid element 10 in the side view. Mechanically, the module is designed like the embodiment described above.
  • a multilayer rigid circuit board is arranged, which allows a complex circuit.
  • This circuit comprises four multiplexers 25 and a control element 26, which is a logic device. The control element 26 is connected to the evaluation electronics via a data line 27.
  • the data line 27 is preferably formed as a data bus, which is passed through all the modules of a test apparatus and via which the individual control elements 26 can be controlled by the evaluation electronics.
  • the control in turn drives the multiplexers 25.
  • the multiplexers 25 In the present embodiment, four multiplexers 25 are provided. Each multiplexer 25 is connected by means of conductor tracks 28 (for the sake of simplicity, only a few conductor tracks 28 are shown) to the contact points 9 of the basic screen element 10.
  • the interconnects 28, which are connected to a multiplexer 25, are subdivided into n groups, wherein each multiplexer can switch through all interconnects 28 of a group to corresponding output interconnects 29.
  • the output conductors 29 are further led to the transmitter.
  • the control unit 26 controls which of the n groups of printed conductors 28 or contact points 9 from the respective multiplexer 25 are switched through to the output line tracks 29.
  • the number of outputs (output lines 29) of a module compared to the number of contact points 9 can be significantly reduced.
  • Such an embodiment has the advantage that no fixed links between individual contact points are present, but each contact point can be individually connected to a terminal of the transmitter.
  • a single multiplexer would be enough to reduce the number of output traces versus the number of pads.
  • the number of contact points per group is smaller, which reduces the corresponding problem, because contact points which are connected to different multiplexers 25 can always be tested with one another independent of the group membership since they are simultaneously connected to output conductors 29 can be switched.
  • the control element 26 can also be programmed such that it automatically switches the multiplexer 25 between all modules automatically in accordance with a predetermined measuring clock, which is either transmitted via the data line 27 or has been synchronized in advance.
  • the switching mechanism shown in Figure 7 represents an independent inventive concept, which is also independent of the connection of the basic grid element on the flexible circuit board feasible.
  • the exemplary embodiments of modules for a test device explained above have a basic grid element on which the contact points of the basic grid are arranged at a density of 124 contact points per square centimeter.
  • the inventive combination of the strip-shaped basic grid element, which is formed of a rigid printed circuit board portion, in connection with the flexible printed circuit board portion, are guided in the standing in contact with the contact points of the basic grid element by the deflection in the vertical with respect to the basic grid in a simple way and much space made available, so that such a large number of contact points of the basic grid can be reliably connected to the transmitter.
  • two flexible printed circuit board sections are provided, each containing a part of the conductor tracks.
  • the strip conductors contained in the flexible printed circuit board sections are selectively electrically connected by means of scan channels, so that the necessary connections of the evaluation electronics are reduced.
  • a further advantageous embodiment of the invention resides in the combination of the basic grid element, the flexible printed circuit board connected thereto, and and the support plate, which is formed of a high strength material, such as steel or a correspondingly strong composite material, so that both the mechanical stress caused by the plurality of contact points, as well as the electrical connections can be handled reliably.
  • the module according to the invention is intended for a test device for testing bare printed circuit boards, which are usually tested simultaneously on the top side and the underside of the printed circuit board to be tested, so that the test device has two opposite basic grid fields which are moved toward one another with a press, so that an intermediate printed circuit board to be tested is subjected to contact elements between the basic grid fields and, if appropriate, between the adapter and the translator arranged therebetween.
  • the directions “down" and "top” of course to reverse accordingly.
  • the invention relates to a module for a test device for testing printed circuit boards.
  • Such testers have a basic grid on which an adapter and / or a translator can be arranged to connect contact points of the basic grid with printed circuit board test points with a printed circuit board to be tested.
  • the module has a support plate and a contact plate.
  • the contact plate is formed of a rigid circuit board portion referred to as a basic screen member and at least one flexible circuit board portion. At the base grid contact points are provided, each forming a part of the contact points of the basic grid.
  • the basic screen element is arranged on an end face of the support plate and the flexible printed circuit board section is bent in such a way that at least part of the remaining area of the contact plate is arranged parallel to the support plate.
  • the contact points of the basic grid element are each in electrical contact with conductor tracks running in the contact plate, which extend from the basic grid element into the flexible conductor section. LIST OF REFERENCES

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)

Abstract

L'invention concerne un module pour dispositif de contrôle destiné à tester des plaquettes de circuits imprimés. De tels dispositifs de contrôle présentent une grille de base sur laquelle peuvent être disposés un adaptateur et/ou un traducteur, en vue de relier des points de contact de la grille de base présentant des points-test des plaquettes de circuits imprimés avec une plaquette de circuit imprimé à tester. Le module présente une plaque support et une plaque de contact. La plaque de contact est constituée par une section rigide de plaquette de circuit imprimé, qui est conçue comme élément de la grille de base et qui est formée d'au moins une section de plaquette de circuit imprimé souple. Sur l'élément de grille de base sont prévus des points de contact qui forment respectivement une partie des points de contact de la grille de base. L'élément de grille de base est disposé sur une face frontale de la plaque support, et la section souple de ladite plaquette est cintrée de façon qu'au moins une partie de la zone restante de la plaque de contact soit parallèle à la plaque support. Les points de contact de l'élément de la grille de base sont respectivement en contact électrique avec des pistes conductrices de la plaque de contact qui s'étendent de l'élément de la grille de base dans la section souple de la plaquette de circuit imprimé.
EP07822868A 2006-12-15 2007-11-27 Module pour dispositif de contrôle destiné à tester des plaquettes de circuits imprimés Withdrawn EP2102667A2 (fr)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE102006059429A DE102006059429A1 (de) 2006-12-15 2006-12-15 Modul für eine Prüfvorrichtung zum Testen von Leiterplatten
PCT/EP2007/062888 WO2008071541A2 (fr) 2006-12-15 2007-11-27 Module pour dispositif de contrôle destiné à tester des plaquettes de circuits imprimés

Publications (1)

Publication Number Publication Date
EP2102667A2 true EP2102667A2 (fr) 2009-09-23

Family

ID=39262661

Family Applications (1)

Application Number Title Priority Date Filing Date
EP07822868A Withdrawn EP2102667A2 (fr) 2006-12-15 2007-11-27 Module pour dispositif de contrôle destiné à tester des plaquettes de circuits imprimés

Country Status (8)

Country Link
US (1) US7893705B2 (fr)
EP (1) EP2102667A2 (fr)
JP (1) JP2010513850A (fr)
KR (1) KR20090112635A (fr)
CN (1) CN101558317A (fr)
DE (1) DE102006059429A1 (fr)
TW (1) TW200839268A (fr)
WO (1) WO2008071541A2 (fr)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102007047269A1 (de) 2007-10-02 2009-04-09 Atg Luther & Maelzer Gmbh Vollrasterkassette für einen Paralleltester zum Testen einer unbestückten Leiterplatte, Federkontaktstift für eine solche Vollrasterkassette sowie Adapter für einen Paralleltester zum Testen einer unbestückten Leiterplatte
DE102008006130A1 (de) 2008-01-25 2009-07-30 Atg Luther & Maelzer Gmbh Modul für einen Paralleltester zum Prüfen von Leiterplatten
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US20090251161A1 (en) 2009-10-08
US7893705B2 (en) 2011-02-22
TW200839268A (en) 2008-10-01
JP2010513850A (ja) 2010-04-30
KR20090112635A (ko) 2009-10-28
DE102006059429A1 (de) 2008-06-26
WO2008071541A2 (fr) 2008-06-19
WO2008071541A3 (fr) 2008-08-21
CN101558317A (zh) 2009-10-14

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