EP1497703A1 - Schaltungsanordnung zur spannungsregelung mittels eines spannungsteilers - Google Patents
Schaltungsanordnung zur spannungsregelung mittels eines spannungsteilersInfo
- Publication number
- EP1497703A1 EP1497703A1 EP03722263A EP03722263A EP1497703A1 EP 1497703 A1 EP1497703 A1 EP 1497703A1 EP 03722263 A EP03722263 A EP 03722263A EP 03722263 A EP03722263 A EP 03722263A EP 1497703 A1 EP1497703 A1 EP 1497703A1
- Authority
- EP
- European Patent Office
- Prior art keywords
- voltage
- diodes
- diode
- circuit arrangement
- divider
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05F—SYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES
- G05F3/00—Non-retroactive systems for regulating electric variables by using an uncontrolled element, or an uncontrolled combination of elements, such element or such combination having self-regulating properties
- G05F3/02—Regulating voltage or current
- G05F3/08—Regulating voltage or current wherein the variable is dc
- G05F3/10—Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics
- G05F3/16—Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics being semiconductor devices
- G05F3/20—Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics being semiconductor devices using diode- transistor combinations
- G05F3/24—Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics being semiconductor devices using diode- transistor combinations wherein the transistors are of the field-effect type only
Definitions
- the invention relates to a circuit arrangement for voltage regulation with a voltage divider, which is arranged between a first potential and a reference potential and which has a multiplicity of diodes connected in series, an output voltage being tapped at a connection of a diode, a control circuit on which the Output voltage and a reference voltage are present for regulating the first potential on the basis of a comparison of the output voltage with the reference voltage, the division ratio being changeable by activating or deactivating one or more diodes.
- Such circuit arrangements for voltage regulation are used, for example, in integrated circuit arrangements in which a voltage is generated which is greater than the supply voltage of the integrated circuit. Such voltages are required, for example, to erase memory cells of a non-volatile memory, in particular EEPRO memory.
- the problem that arises here is to regulate the potential difference between the first potential and the reference potential, which is referred to below as high voltage. Since the high voltage is above the supply voltage, it is not possible to measure and regulate this high voltage directly. For this reason, voltage dividers are used so that the measurement and control can take place at a lower voltage level, which is below the supply voltage.
- a solution which is more favorable in terms of the area required is to construct the voltage divider from diodes, in particular dividers from MOS transistors are known, each of which is connected as a diode. In order to be able to use such a divider, however, it is a prerequisite that the minimum required setting granularity of the divider is greater than the threshold voltage of the transistors.
- the voltage is adjusted by activating or deactivating individual diodes. Assuming a realistic value of approx. 0.6 V for the threshold voltage of the transistors, the high voltage can only be set in steps of 0.6 V.
- the nominal voltage drop must be reduced by means of a divider element, so that the total voltage can be changed by a voltage drop of, for example, 0.2 V by activating or deactivating it.
- diodes or MOS transistors can no longer be used, since their threshold voltage has been reached at 0.6 V and a voltage divider constructed in this way is no longer functional.
- the object of the invention is therefore to provide a circuit arrangement for voltage regulation with which an exact setting of the voltage is possible and which nevertheless requires little space.
- This object is achieved by a circuit arrangement of the type mentioned at the outset, which is characterized in that the divider ratio can also be changed by adjusting the level of the voltage drop in at least one of the diodes.
- the circuit arrangement according to the invention can be constructed entirely from MOS transistors, which have a very small area requirement in comparison to resistors.
- the fineness of the setting of the divider ratio is achieved in that the rough setting can be carried out as before by activating or deactivating individual diodes and, moreover, the fine control is accomplished in that the voltage drop across one or more of the diodes can be set separately is. While a voltage drop of typically 0.6 V arises for the diodes without additional wiring, this voltage drop can be set as desired between 0 V and 0.6 V by the transistor connected in parallel according to a development of the invention.
- a control circuit is used to control a transistor connected in parallel with a diode, with which the transistor can be controlled such that one of the connections of the diode assumes a predetermined voltage.
- Figure 1 shows a circuit arrangement for voltage control according to the prior art
- Figure 2 shows a circuit arrangement according to the invention for voltage regulation.
- FIG. 1 first describes how a circuit arrangement according to the prior art works and in what the problems that occur there are justified.
- a voltage divider which consists of the diodes D1 to D6, is connected between a high voltage U HV and a reference potential 0.
- the high voltage U HV is divided equally between the diodes Dl to D6, provided that the diodes are the same.
- An output voltage U ou is tapped between the diodes D2 and D3 and fed to a control circuit 2.
- the control circuit 2 the measured voltage U ou t is compared with a reference voltage U RE F.
- U REF is determined such that it is one third of the target high voltage.
- the control circuit 2 then regulates the high voltage U H SO until the measured voltage U 0 ut corresponds to the reference voltage U REF .
- Another setpoint for the high voltage U H can be set by changing the reference voltage value U REF .
- the problem here is that a change in U REF is multiplied by the reciprocal of the divider ratio, ie in the present case three times the change in U REF affects the high voltage U H V. In the example shown, this is not problematic since the divider ratio is 1: 3 and the voltage changes in U RE F must be relatively large in order to achieve a specific change in U HV ZU.
- a concrete version of such a Chen circuit is a divider but from much more diodes. At a desired high voltage of 16 V and a voltage drop of 0.6 V per diode, a divider with 26 diodes connected in series must be provided. A change in U REF by 0.1 V thus results in a voltage change of 2.6 V for the high voltage U HF . It is obvious from this that exact regulation of the high voltage U HV is difficult.
- a second possibility for changing the high voltage U HV is to change the divider ratio of the voltage divider.
- a suitable means for this is the bridging of individual diodes, as a result of which the high voltage U H V is reduced by the amount of the voltage drop across a diode, generally 0.6 V, in each case.
- 0.6 V the amount of the voltage drop across a diode
- a divider ratio control circuit 1 is provided to bridge one or more diodes D2 to D6 by means of a switch 3 each.
- a finer gradation of the setting option cannot be achieved with such a circuit constructed with diodes, since the threshold voltage of the diodes or transistors used is 0.6 V and cannot be fallen below. Although it is conceivable to use diodes with other semiconductor materials that have a threshold value lower than 0.6 V, this is associated with an unjustifiable cost.
- FIG. 1 A circuit arrangement for voltage regulation according to the invention is shown in FIG.
- a voltage divider is constructed using diodes, and in the exemplary embodiment shown are MOS transistors, each of which is connected as a diode. In the following, these transistors connected as diodes are referred to only as diodes.
- the uppermost diode is generally designated with T n and the diodes lying between T 3 and T n are indicated by dots.
- the output voltage U ou t is tapped above the lowest diode Ti.
- a control circuit 2 regulates the high voltage U H V in such a way that the tapped voltage U ou t again corresponds to a reference voltage U REF .
- the control circuit 2 has an operational amplifier OP2 and a charge pump circuit 4.
- the non-inverting input of the operational amplifier OP2 is supplied with the output voltage U out of the voltage divider.
- the reference voltage U REF is present at the inverting input of the operational amplifier OP2. Since the high voltage U HV is above the supply voltage of the circuit arrangement, the operational amplifier 0P2 cannot directly provide the high voltage U H V. Instead, it interacts with a charge pump circuit 4, at the output of which the high voltage U H V is provided.
- the control circuit 2 can also conceivable for the control circuit 2, so that the arrangement shown here is only to be understood as an example.
- a transistor T R is connected in parallel to the diode formed by T 2 .
- the voltage drop across the diode formed by T 2 can be reduced as desired.
- the division ratio is determined not only from the ratio of the number of diodes via which the output voltage U out is tapped to the total number of diodes, but also as additional analog one-piece size, the amount of voltage drop over the parallel connection of T 2 and T R flows.
- a great advantage of such an embodiment is that the sum of the currents through T 2 and T R in turn corresponds to the current In, so that the voltage drops across the other transistors connected as diodes do not change.
- the transistor T R is driven by an operational amplifier OP1, the non-inverting input of which is connected to the connection between the transistors T 2 and T 3 .
- a control voltage U 2 is present at the inverting input of the operational amplifier OP1. In this way, the voltage U 2 is impressed at the junction between the transistors T 2 and T 3 , since the operational amplifier OP1 changes the current through the transistor T R until the voltage U at the junction between T 2 and T 3 2 occurs.
- U2 can be set so that U REF is not undershot and 2 -U REF is not exceeded. In this case:
- control bandwidth is therefore only between 0 V and
- a division ratio controller 1 which controls switches 3, each of which bridges a diode.
- the fine control of the divider ratio is then carried out by correspondingly controlling the transistor T R with the voltage U 2 .
- a change in U 2 does not multiply by the number of diodes in the divider. Small unintentional deviations from U therefore do not lead to a large error in the high voltage U HV -
- the maximum error to be expected for the high voltage is relatively small, ie it is a maximum of 0.6 V, provided that this is the intended voltage drop per diode.
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Physics & Mathematics (AREA)
- Nonlinear Science (AREA)
- Electromagnetism (AREA)
- General Physics & Mathematics (AREA)
- Radar, Positioning & Navigation (AREA)
- Automation & Control Theory (AREA)
- Control Of Electrical Variables (AREA)
- Continuous-Control Power Sources That Use Transistors (AREA)
- Dc-Dc Converters (AREA)
Abstract
Description
Claims
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE10218097A DE10218097B4 (de) | 2002-04-23 | 2002-04-23 | Schaltungsanordnung zur Spannungsregelung |
DE10218097 | 2002-04-23 | ||
PCT/DE2003/001135 WO2003091818A1 (de) | 2002-04-23 | 2003-04-07 | Schaltungsanordnung zur spannungsregelung mittels eines spannungsteilers |
Publications (2)
Publication Number | Publication Date |
---|---|
EP1497703A1 true EP1497703A1 (de) | 2005-01-19 |
EP1497703B1 EP1497703B1 (de) | 2006-11-02 |
Family
ID=29224686
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
EP03722263A Expired - Lifetime EP1497703B1 (de) | 2002-04-23 | 2003-04-07 | Schaltungsanordnung zur spannungsregelung mittels eines spannungsteilers |
Country Status (5)
Country | Link |
---|---|
US (1) | US7091770B2 (de) |
EP (1) | EP1497703B1 (de) |
DE (2) | DE10218097B4 (de) |
TW (1) | TW200307946A (de) |
WO (1) | WO2003091818A1 (de) |
Families Citing this family (19)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6970794B2 (en) * | 2002-09-19 | 2005-11-29 | Marvell International Ltd. | Semiconductor having reduced configuration pins and method thereof |
US7512504B2 (en) * | 2002-09-19 | 2009-03-31 | Marvell World Trade Ltd. | Testing system using configurable integrated circuit |
US7940033B2 (en) * | 2003-04-22 | 2011-05-10 | Aivaka, Inc. | Control loop for switching power converters |
US7265523B2 (en) * | 2005-10-24 | 2007-09-04 | Aivaka | Control loop for switching power converters |
WO2007127403A2 (en) * | 2006-04-26 | 2007-11-08 | Aivaka | Clock with regulated duty cycle and frequency |
US8797010B2 (en) * | 2006-04-27 | 2014-08-05 | Aivaka, Inc. | Startup for DC/DC converters |
US20080238530A1 (en) * | 2007-03-28 | 2008-10-02 | Renesas Technology Corp. | Semiconductor Device Generating Voltage for Temperature Compensation |
US7876079B2 (en) * | 2009-03-24 | 2011-01-25 | Infineon Technologies Ag | System and method for regulating a power supply |
EP2251955A1 (de) * | 2009-04-23 | 2010-11-17 | ST-Ericsson SA (ST-Ericsson Ltd) | Stromversorgung für eine Echtzeituhr (RTC) |
TWI397812B (zh) * | 2009-06-01 | 2013-06-01 | Inventec Corp | 測試板 |
US8547081B2 (en) * | 2009-07-27 | 2013-10-01 | Electronics And Telecommunications Research Institute | Reference voltage supply circuit including a glitch remover |
US20130127515A1 (en) * | 2011-11-22 | 2013-05-23 | Taiwan Semiconductor Manufacturing Company, Ltd. | Voltage dividing circuit |
US9130478B2 (en) * | 2013-03-08 | 2015-09-08 | Infineon Technologies Ag | Rectifier with bridge circuit and parallel resonant circuit |
US9935560B2 (en) * | 2015-09-17 | 2018-04-03 | Stmicroelectronics S.R.L. | Electronic device with a maintain power signature (MPS) device and associated methods |
US9813056B2 (en) * | 2015-09-21 | 2017-11-07 | Analog Devices Global | Active device divider circuit with adjustable IQ |
US10727543B2 (en) * | 2018-01-08 | 2020-07-28 | Changs Ascending Enterprise Co., Ltd. | Battery module system and method |
TWI704438B (zh) * | 2018-07-12 | 2020-09-11 | 立積電子股份有限公司 | 電壓控制裝置 |
CN110988645B (zh) * | 2019-12-20 | 2022-03-22 | 西安西电电力系统有限公司 | 晶闸管级均压测试方法、装置 |
CN113009266A (zh) * | 2021-03-18 | 2021-06-22 | 广州亚美智造科技有限公司 | 一种治具插拔检测电路 |
Family Cites Families (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5039877A (en) * | 1990-08-30 | 1991-08-13 | Micron Technology, Inc. | Low current substrate bias generator |
US5233289A (en) * | 1991-04-23 | 1993-08-03 | Harris Corporation | Voltage divider and use as bias network for stacked transistors |
US5264785A (en) * | 1992-02-04 | 1993-11-23 | Intel Corporation | Voltage-controlled resistance element with superior dynamic range |
KR950004858B1 (ko) * | 1992-03-17 | 1995-05-15 | 삼성전자 주식회사 | 내부전원전압 발생회로 |
US5553295A (en) * | 1994-03-23 | 1996-09-03 | Intel Corporation | Method and apparatus for regulating the output voltage of negative charge pumps |
KR0158478B1 (ko) * | 1994-12-21 | 1999-02-01 | 김광호 | 반도체 메모리장치의 기판전압 조절회로 |
US5880593A (en) * | 1995-08-30 | 1999-03-09 | Micron Technology, Inc. | On-chip substrate regulator test mode |
JP3676904B2 (ja) * | 1997-04-11 | 2005-07-27 | 株式会社ルネサステクノロジ | 半導体集積回路 |
US6496027B1 (en) * | 1997-08-21 | 2002-12-17 | Micron Technology, Inc. | System for testing integrated circuit devices |
JP3908415B2 (ja) * | 1998-07-30 | 2007-04-25 | 株式会社東芝 | ポンプ回路を有する半導体装置 |
DE19947115C2 (de) * | 1999-09-30 | 2002-01-03 | Infineon Technologies Ag | Schaltungsanordnung zur stromsparenden Referenzspannungserzeugung |
KR100383769B1 (ko) * | 2000-12-18 | 2003-05-14 | 주식회사 하이닉스반도체 | 펌핑 전압 레귤레이션 회로 |
JP3868756B2 (ja) * | 2001-04-10 | 2007-01-17 | シャープ株式会社 | 半導体装置の内部電源電圧発生回路 |
JP3932841B2 (ja) * | 2001-08-29 | 2007-06-20 | 株式会社日立製作所 | 半導体電力変換装置 |
-
2002
- 2002-04-23 DE DE10218097A patent/DE10218097B4/de not_active Expired - Fee Related
-
2003
- 2003-04-04 TW TW092107828A patent/TW200307946A/zh unknown
- 2003-04-07 WO PCT/DE2003/001135 patent/WO2003091818A1/de active IP Right Grant
- 2003-04-07 DE DE50305578T patent/DE50305578D1/de not_active Expired - Lifetime
- 2003-04-07 EP EP03722263A patent/EP1497703B1/de not_active Expired - Lifetime
-
2004
- 2004-10-21 US US10/970,363 patent/US7091770B2/en not_active Expired - Lifetime
Non-Patent Citations (1)
Title |
---|
See references of WO03091818A1 * |
Also Published As
Publication number | Publication date |
---|---|
DE50305578D1 (de) | 2006-12-14 |
WO2003091818A1 (de) | 2003-11-06 |
TW200307946A (en) | 2003-12-16 |
DE10218097B4 (de) | 2004-02-26 |
EP1497703B1 (de) | 2006-11-02 |
US7091770B2 (en) | 2006-08-15 |
US20050073285A1 (en) | 2005-04-07 |
DE10218097A1 (de) | 2003-11-13 |
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