EP1403648A1 - Detecteur magnetique - Google Patents

Detecteur magnetique Download PDF

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Publication number
EP1403648A1
EP1403648A1 EP02728231A EP02728231A EP1403648A1 EP 1403648 A1 EP1403648 A1 EP 1403648A1 EP 02728231 A EP02728231 A EP 02728231A EP 02728231 A EP02728231 A EP 02728231A EP 1403648 A1 EP1403648 A1 EP 1403648A1
Authority
EP
European Patent Office
Prior art keywords
magnetic
magnetic impedance
detection apparatus
magnetic field
applying
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
EP02728231A
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German (de)
English (en)
Other versions
EP1403648A4 (fr
EP1403648B1 (fr
Inventor
Takahiro C/O Fuji Electric Co. Ltd. Kudo
Yujiro c/o FUJI ELECTRIC CO. LTD. KITAIDE
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fuji Electric FA Components and Systems Co Ltd
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Fuji Electric Co Ltd
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Publication date
Application filed by Fuji Electric Co Ltd filed Critical Fuji Electric Co Ltd
Publication of EP1403648A1 publication Critical patent/EP1403648A1/fr
Publication of EP1403648A4 publication Critical patent/EP1403648A4/fr
Application granted granted Critical
Publication of EP1403648B1 publication Critical patent/EP1403648B1/fr
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R15/00Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
    • G01R15/14Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00Arrangements or instruments for measuring magnetic variables
    • G01R33/02Measuring direction or magnitude of magnetic fields or magnetic flux

Definitions

  • the present invention relates to a magnetism detection apparatus that utilizes a magnetic impedance effect, more particularly to a magnetism detection apparatus having an improved constitution.
  • the proposals include providing a magnetic impedance element based on the application of amorphous wires, as disclosed in JP-A-6-281712 (1994), and providing a magnetic impedance element based on a thin-film application, as disclosed in JP-A-8-075835 (1996), for example.
  • any magnetic impedance element of any shape exhibits its own characteristics for detection of magnetism with high sensitivity, since the magnetism-detecting characteristics of the element itself are non-linear, as in the case of the magnetic impedance characteristics of the amorphous wire shown in FIG. 14, as disclosed in JP-A-6-176930 (1994) and JP-A-6-347489 (1994) for example, it is so arranged as to provide a magnetism detection element having excellent linearity by improving the linearity of the dependency of the impedance variation on the applied magnetic field by applying a bias magnetic field, or by feeding a current proportional to the voltage at both ends of a magnetic impedance element to a negative-feedback coil after winding the negative-feedback coil around the magnetic impedance element.
  • FIG. 15 exemplifies a downsized magnetism detection apparatus using amorphous wires.
  • the reference character W designates amorphous wires
  • C designates a coil.
  • the magnetism sensitivity of the magnetic impedance element becomes variable.
  • FIG. 16 exemplifies a conventional magnetism detection circuit (magnetism sensor) of a conventional magnetic impedance element.
  • the impedance value of the magnetic impedance element 1 is sought by causing an output current generated at the time of the feeding of high-frequency current from a high-frequency current generator OSC to the magnetic impedance element 1 to be output externally via a wave-detection circuit A and an amplifying circuit B.
  • the output level is adjusted by a variable resistor VR.
  • variable sensitivity of the magnetic impedance element 1 is adjusted simply by using a variable resistor VR, it is extremely difficult to minimize variations in sensitivity. Further, in order to minimize variations in the sensitivity of the magnetic impedance element 1 through the use of the above detection circuit, it is required that adjustment and calibration be performed for each detection circuit, thus sharply increasing costs. Although the detection circuit can be properly adjusted and calibrated, as it is impracticable to calibrate the drifting effect of the output caused by degradation in the quality of the detection circuit over time, the problem also arises that the compensatory precision can hardly be enhanced.
  • the object of the present invention is to provide an improved high-precision and low-cost magnetism detection circuit without causing the detection precision to be reduced due to insufficient durability against environmental conditions or quality degradation of the magnetism detection circuit over time.
  • the present invention according to Claim 1 is characterized by the provision of the following: a magnetic impedance element providing a magnetic impedance effect; a terminal for applying AC current to both ends of the magnetic impedance element; a plurality of coils and terminals for applying a bias magnetic field to the magnetic impedance element; and a plurality of coils and terminals for applying a negative-feedback magnetic field to the magnetic impedance element; wherein the magnetic impedance element, those coils and terminals for applying the bias magnetic field to the magnetic impedance element, and those coils and terminals for applying the negative-feedback magnetic field to the magnetic impedance element, are integrally assembled through a resinous molding process.
  • the present invention according to Claim 2 is characterized by the provision of the following: a pair of magnetic impedance elements individually providing a magnetic impedance effect; a plurality of terminals for applying AC current to both ends of a pair of said magnetic impedance elements; a plurality of coils and terminals for applying a bias magnetic field to a pair of said magnetic impedance elements; and a plurality of coils and terminals for applying a negative-feedback magnetic field to a pair of said magnetic impedance elements; wherein a pair of said magnetic impedance elements, a plurality of said coils and terminals for applying said bias magnetic field, and a plurality of said coils and terminals for applying said negative-feedback magnetic field, are integrally assembled through a resinous molding process.
  • the present invention according to Claim 4 is characterized by the provision of the following: at least two magnetic impedance elements individually providing a magnetic impedance effect; a terminal for applying AC current to both ends of the at least two magnetic impedance elements; a magnet for applying a bias magnetic field to a plurality of said magnetic impedance elements; and a plurality of coils and terminals for applying a negative-feedback magnetic field to a plurality of said magnetic impedance elements; wherein a plurality of said magnetic impedance elements, said magnet, and a plurality of said coils and terminals for applying said negative-feedback magnetic field to a plurality of said magnetic impedance elements are integrally assembled through a resinous molding process.
  • FIG. 1 is an exploded perspective view of a magnetism detection apparatus according to a first embodiment of the present invention.
  • the reference numeral 1 designates a magnetic impedance element having a thin-film configuration.
  • the reference numeral 3 designates a resinous bobbin that is formed on the external side of the magnetic impedance element 1 by an insert-molding process.
  • the reference numeral 4 designates a coil for applying a bias magnetic field to the magnetic impedance element 1.
  • the reference numeral 5 designates a coil for applying a negative-feedback magnetic field to the magnetic impedance element 1.
  • the reference numeral 6 designates a resinous case for protecting the magnetic impedance element 1 and the coils 4 and 5 from various environmental hazards, wherein the resinous case 6 is formed via an insert-molding process.
  • the reference numeral 2 designates terminals for applying a high-frequency current to both ends of the magnetic impedance element 1 and also for applying current to the coils 4 and 5.
  • the reference numeral 10 designates the
  • FIG. 2 designates the flow of the serial steps for sequentially assembling the above components into the magnetism detection apparatus related to the present invention.
  • the magnetic impedance element 1 is attached between a pair of terminals (shown in 2) of a lead frame 20 (shown in 1) by any of the uniting methods including a soldering process, adhesion, and a bonding method.
  • a resinous bobbin 3 is molded inside the lead frame 20 on which the magnetic impedance element 1 is attached.
  • the biasing coil 4 and the negative-feedback coil 5 are then respectively wound on the resinous bobbin 3.
  • a resinous case 6 is formed on the resinous bobbin 3 wound with the coils 4 and 5 as shown in 6.
  • the terminals 2 are folded, which completes the manufacturing process for the magnetism detection apparatus 10.
  • FIG. 3 is a simplified schematic block diagram of the magnetism detection circuit.
  • the reference numeral 80 designates an element driver for applying high-frequency current to the magnetic impedance element 1.
  • the reference numeral 81 designates a biasing driver for driving the biasing coil 4.
  • the reference numeral 82 designates a wave-detecting circuit.
  • the reference numerals 83 and 84 respectively designate a holding circuit.
  • the reference numeral 85 designates a differential amplifying circuit.
  • the reference numeral 86 designates a feedback element consisting of , for example, a resistor, which is used to feed back an output to the negative-feedback coil 5.
  • the reference numeral 87 designates a voltage/digital-value converter for converting a voltage output from the differential amplifying circuit 85 into a digital value.
  • the reference numeral 88 designates a compensatory arithmetic operating unit consisting of a micro-computer and other devices.
  • the wave-detecting circuit 82 detects variations in impedance caused by an external magnetic field, and then, through synchronization with the timing of a waveform applied to the biasing coil 4, the holding circuit 83 retains the positive side of the detected waveform, while the other holding circuit 84 retains the negative side thereof, thereby enabling the differential amplifying circuit 85 to detect the difference between them.
  • FIGS. 4(a) to (d) are graphs illustrating the output when AC bias current is applied to the magnetic detection apparatus 10.
  • the graphs show characteristics of a conventional magnetic impedance element.
  • Each graph shows an aspect of the acquisition of a sensor output regardless of the direction of the magnetic field, based on a zero external magnetic field.
  • (a) and (b) refer to a case (1) in which the external magnetic field remains in the state of zero, where the output values on the positive and negative sides as detected at the output of the magnetic impedance element 1 are identical to each other, and thus the output values of the holding circuits 83 and 84 are equal, whereby the output value of the differential amplifying circuit 85 becomes zero, as shown by the arrow A.
  • (c) and (d) refer to a case (2) in which an external magnetic field is applied, where the difference between the positive-side output and the negative-side output as detected as the output of the magnetic impedance element 1, becomes ⁇ V, and thus the difference in the output values between the holding circuits 83 and 84 also becomes ⁇ V. Accordingly, the output value of the differential amplifying circuit 85 becomes " ⁇ x ⁇ V" as shown by the arrow B. Note that " ⁇ " designates the gain of the differential amplifying circuit 85.
  • FIG. 5 is a chart explanatory of the magnetic-field generating direction in the magnetism detection apparatus.
  • the negative-feedback coil 5 is wound on the external side of a biasing coil 4. Instead, it is also allowable to wind the biasing coil 4 on the external side of the negative-feedback coil 5.
  • the negative-feedback coil 5 By reversing the direction of the magnetic field via the negative-feedback coil 5 against the magnetic-field detecting direction of the magnetic impedance element 1 shown by the arrow C, it is possible to decrease the magnetic field applied to the magnetic impedance element 1, thus making it possible to detect the magnetic field in a broader range.
  • FIG. 6 is a chart exemplifying the output characteristics of the magnetism detection apparatus against the detectable magnetic field with and without a negative feedback element 86. It is found that the magnetic field could be detected in a broader range in the case of providing negative feedback.
  • FIG. 7 exemplifies a constitution for detecting current via the magnetism detection apparatus 10, wherein FIG. 7 (a) is a perspective view and FIG. 7 (b) is a plan view thereof.
  • FIG. 7 (a) exemplifies that a magnetism detection apparatus has been loaded on a substrate 11 equipped with a current-conducting wiring unit 12. Magnetic flux generated by current 120 is designated by a dotted circle D in FIG. 7 (b).
  • the output sensitivity of the magnetism detection apparatus 10 can be determined.
  • the arrow E on the magnetism detection apparatus 10 in FIG. 7 (b) designates the magnetic-field detecting direction of the magnetic impedance element 1.
  • FIG. 8 exemplifies a constitution of a magnetic shielding structure during the detection of current through the use of the magnetic detection apparatus 10.
  • the magnetic shielding structure 13 is added to the structure shown in FIG. 7. It is essential that its configuration be optimized in correspondence with the magnitude of the current 120.
  • FIG. 9 is an exploded perspective view of the magnetism detection apparatus according to a second embodiment of the present invention.
  • the second embodiment is characterized by the provision of two magnetic impedance elements 1a and 1b, in contrast with the one, shown in FIG. 1.
  • it is possible to determine the output difference between the two magnetic impedance elements 1a and 1b, thereby making it possible to detect the actual magnetic field by canceling the adverse effect of an external noise magnetic field.
  • it is possible to conduct detection with higher precision.
  • FIG. 10 is a schematic of a method for canceling an external disruptive magnetic field.
  • FIG. 11 is an exploded perspective view of the magnetism detection apparatus according to a third embodiment of the present invention.
  • the third embodiment is characterized by the provision of a micro-magnet 7 in place of the biasing coil 4 shown in FIG. 9.
  • the micro-magnet 7 applies a DC bias magnetic field to the magnetic impedance elements 1a and 1b. This means that no current is needed for the micro-magnet 7, opposite to the case in which a biasing coil is utilized. Normally, current of approximately 30 mA is required for the biasing coil at a voltage of 5 V; hence, the micro-magnet 7 allows saving approximately 150 mW of driving power.
  • FIGS. 12 (a) to (f) show the characteristics of the bias magnetic filed applied by the micro-magnet 7 shown in FIG. 11.
  • the sensor output characteristics in response to an external magnetic field shown in FIG. 12 exhibit the characteristics of conventional magnetic impedance elements. This in turn illustrates that a sensor output can be obtained, based on the zero external magnetic field, independently of the direction of the external magnetic field.
  • the case (1) shown in FIGS. 12 (a), (b), and (c) corresponds to the state in which the external magnetic field is zero, thereby equalizing the output of the magnetic impedance elements 1a and 1b, enabling the output of the holding circuits 83 and 84 to be equal. In consequence, the output value of the differential amplifying circuit 85 becomes zero, as shown by the arrow E.
  • FIG. 13 is an exploded perspective view of the magnetism detection apparatus according to a fourth embodiment of the present invention.
  • the fourth embodiment is characterized by the provision of the magnetism detection circuit 8 shown in Fig. 3 inside the magnetism detection apparatus, which includes circuits shown in Fig. 3, in contrast with the constitution of the magnetism detection apparatus shown in FIG. 1.
  • the magnetism detection circuit 8 is also applicable to the magnetism detection apparatuses shown in FIGS. 9 and 11.
  • the present invention as a result of the integral assembly of the magnetic impedance elements, a biasing coil, a negative-feedback coil, and terminals through a resin molding process, it has become possible to minimize the magnetic resistance, thereby further minimizing the amount of bias current and negative-feedback current. Accordingly, it is possible for the present invention to provide a downsized and low-power-consumption magnetism detection apparatus.
  • the present invention provides a high-precision magnetism detection apparatus distinguished in terms of its durability against environmental conditions.
  • the negative-feedback current As it is possible to cause the negative-feedback current to decrease the magnetic field, by increasing the negative-feedback current, it is possible to adjust the output sensitivity of the magnetism detection apparatus for a detected external magnetic field. Accordingly, it is possible to provide a low-power-consumption magnetism detection apparatus capable of detecting magnetism in a wide range without causing the detected magnetic field to saturate the output potentials of the magnetism detection apparatus.
  • the present invention by detecting the output difference between two magnetic impedance elements, it is possible to cancel the adverse effects of an external noise magnetic field, thereby enabling the present invention to provide a low-power-consumption and high-precision magnetism detection apparatus.
  • the amount of current to be applied to the biasing coil is decreased, thereby facilitating a reduction in power consumption.
  • a signal-processing circuit i.e., a magnetism detection circuit
  • S/N signal-to-noise
  • the present invention provides a high-precision and low-power-consumption magnetism detection apparatus.
EP02728231A 2001-06-06 2002-06-04 Detecteur magnetique Expired - Lifetime EP1403648B1 (fr)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2001171078A JP2002365350A (ja) 2001-06-06 2001-06-06 磁気検出装置
JP2001171078 2001-06-06
PCT/JP2002/005464 WO2002101396A1 (fr) 2001-06-06 2002-06-04 Detecteur magnetique

Publications (3)

Publication Number Publication Date
EP1403648A1 true EP1403648A1 (fr) 2004-03-31
EP1403648A4 EP1403648A4 (fr) 2005-01-26
EP1403648B1 EP1403648B1 (fr) 2011-03-02

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EP02728231A Expired - Lifetime EP1403648B1 (fr) 2001-06-06 2002-06-04 Detecteur magnetique

Country Status (8)

Country Link
US (1) US6879153B2 (fr)
EP (1) EP1403648B1 (fr)
JP (1) JP2002365350A (fr)
KR (1) KR100750439B1 (fr)
CN (1) CN100495044C (fr)
DE (1) DE60239334D1 (fr)
TW (1) TWI266059B (fr)
WO (1) WO2002101396A1 (fr)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2014149416A3 (fr) * 2013-03-15 2014-10-23 Allegro Microsystems, Llc Procédés et appareil pour capteur magnétique doté d'une bobine accessible de l'extérieur
CN107290694A (zh) * 2017-07-18 2017-10-24 上海交通大学 抑制方向串扰的电感型磁传感器及其制备方法
US9817078B2 (en) 2012-05-10 2017-11-14 Allegro Microsystems Llc Methods and apparatus for magnetic sensor having integrated coil

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TWI221929B (en) 2001-10-09 2004-10-11 Fuji Electric Co Ltd Overload current protection apparatus
US7304475B2 (en) * 2003-03-25 2007-12-04 Honeywell Federal Manufacturing & Technologies Mechanism for and method of biasing magnetic sensor
JP4845335B2 (ja) * 2003-05-21 2011-12-28 キヤノン株式会社 データストリーム送信装置及びデータストリーム受信装置
JP4483497B2 (ja) * 2004-09-16 2010-06-16 富士ゼロックス株式会社 磁性体検知装置
JP4725600B2 (ja) * 2008-06-10 2011-07-13 愛知製鋼株式会社 マグネトインピーダンスセンサ素子
US20100188078A1 (en) * 2009-01-28 2010-07-29 Andrea Foletto Magnetic sensor with concentrator for increased sensing range
CN102183736B (zh) * 2011-02-28 2013-10-02 上海奥波信息科技有限公司 一种弱磁场测量装置及方法
CN102707246B (zh) * 2011-03-28 2016-01-20 新科实业有限公司 测量隧道磁电阻传感器中纵向偏磁场的方法
JP5533826B2 (ja) * 2011-09-19 2014-06-25 株式会社デンソー 電流センサおよび電流センサの組み付け構造
US8629539B2 (en) 2012-01-16 2014-01-14 Allegro Microsystems, Llc Methods and apparatus for magnetic sensor having non-conductive die paddle
US10234513B2 (en) 2012-03-20 2019-03-19 Allegro Microsystems, Llc Magnetic field sensor integrated circuit with integral ferromagnetic material
US9494660B2 (en) 2012-03-20 2016-11-15 Allegro Microsystems, Llc Integrated circuit package having a split lead frame
US9666788B2 (en) 2012-03-20 2017-05-30 Allegro Microsystems, Llc Integrated circuit package having a split lead frame
US9812588B2 (en) 2012-03-20 2017-11-07 Allegro Microsystems, Llc Magnetic field sensor integrated circuit with integral ferromagnetic material
US9411025B2 (en) 2013-04-26 2016-08-09 Allegro Microsystems, Llc Integrated circuit package having a split lead frame and a magnet
JP2016057190A (ja) * 2014-09-10 2016-04-21 愛知製鋼株式会社 磁界測定装置
JP6370768B2 (ja) * 2015-11-26 2018-08-08 矢崎総業株式会社 磁界検出センサ
CN105606877B (zh) * 2016-02-22 2019-01-04 宁波中车时代传感技术有限公司 一种闭环tmr电流传感器
KR102357876B1 (ko) 2016-09-26 2022-01-28 매직 립, 인코포레이티드 가상 현실 또는 증강 현실 디스플레이 시스템에서 자기 및 광학 센서들의 교정
US10921391B2 (en) 2018-08-06 2021-02-16 Allegro Microsystems, Llc Magnetic field sensor with spacer
US10991644B2 (en) 2019-08-22 2021-04-27 Allegro Microsystems, Llc Integrated circuit package having a low profile

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19518157A1 (de) * 1994-05-17 1995-11-23 Mitsubishi Electric Corp Magnetischer Sensor
EP0892276A2 (fr) * 1997-07-14 1999-01-20 Alps Electric Co., Ltd. Capteur magnétique
EP0930508A1 (fr) * 1997-07-29 1999-07-21 Unitika Ltd. Dispositif a effet d'impedance magnetique
EP1146346A1 (fr) * 2000-04-13 2001-10-17 Aichi Steel Corporation Dispositif de détection de champs magnétiques

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000081471A (ja) 1998-06-30 2000-03-21 Aichi Steel Works Ltd 熱衝撃および機械振動に優れた磁気インピーダンス素子及び磁気インピーダンスセンサ
JP2000193729A (ja) 1998-12-24 2000-07-14 Alps Electric Co Ltd 磁気インピーダンス効果素子の駆動回路
JP2000258464A (ja) 1999-03-09 2000-09-22 Mitsubishi Materials Corp 電流センサ
JP2000284028A (ja) * 1999-03-30 2000-10-13 Kaneo Mori 薄膜磁性体mi素子
JP3764834B2 (ja) 1999-10-22 2006-04-12 キヤノン電子株式会社 電流センサー及び電流検出装置

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19518157A1 (de) * 1994-05-17 1995-11-23 Mitsubishi Electric Corp Magnetischer Sensor
EP0892276A2 (fr) * 1997-07-14 1999-01-20 Alps Electric Co., Ltd. Capteur magnétique
EP0930508A1 (fr) * 1997-07-29 1999-07-21 Unitika Ltd. Dispositif a effet d'impedance magnetique
EP1146346A1 (fr) * 2000-04-13 2001-10-17 Aichi Steel Corporation Dispositif de détection de champs magnétiques

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
See also references of WO02101396A1 *

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9817078B2 (en) 2012-05-10 2017-11-14 Allegro Microsystems Llc Methods and apparatus for magnetic sensor having integrated coil
US11680996B2 (en) 2012-05-10 2023-06-20 Allegro Microsystems, Llc Methods and apparatus for magnetic sensor having integrated coil
WO2014149416A3 (fr) * 2013-03-15 2014-10-23 Allegro Microsystems, Llc Procédés et appareil pour capteur magnétique doté d'une bobine accessible de l'extérieur
US10725100B2 (en) 2013-03-15 2020-07-28 Allegro Microsystems, Llc Methods and apparatus for magnetic sensor having an externally accessible coil
CN107290694A (zh) * 2017-07-18 2017-10-24 上海交通大学 抑制方向串扰的电感型磁传感器及其制备方法
CN107290694B (zh) * 2017-07-18 2020-12-18 上海交通大学 抑制方向串扰的电感型磁传感器及其制备方法

Also Published As

Publication number Publication date
US6879153B2 (en) 2005-04-12
EP1403648A4 (fr) 2005-01-26
KR100750439B1 (ko) 2007-08-22
WO2002101396A1 (fr) 2002-12-19
DE60239334D1 (de) 2011-04-14
KR20030031142A (ko) 2003-04-18
US20040207398A1 (en) 2004-10-21
CN1513119A (zh) 2004-07-14
JP2002365350A (ja) 2002-12-18
TWI266059B (en) 2006-11-11
EP1403648B1 (fr) 2011-03-02
CN100495044C (zh) 2009-06-03

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