EP1289354B1 - Verfahren zum Herstellen von Löchern in einer Mehrlagenleiterplatte - Google Patents
Verfahren zum Herstellen von Löchern in einer Mehrlagenleiterplatte Download PDFInfo
- Publication number
- EP1289354B1 EP1289354B1 EP01121061A EP01121061A EP1289354B1 EP 1289354 B1 EP1289354 B1 EP 1289354B1 EP 01121061 A EP01121061 A EP 01121061A EP 01121061 A EP01121061 A EP 01121061A EP 1289354 B1 EP1289354 B1 EP 1289354B1
- Authority
- EP
- European Patent Office
- Prior art keywords
- copper layer
- layer
- copper
- laser
- laser beam
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Images
Classifications
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/0011—Working of insulating substrates or insulating layers
- H05K3/0017—Etching of the substrate by chemical or physical means
- H05K3/0026—Etching of the substrate by chemical or physical means by laser ablation
- H05K3/0032—Etching of the substrate by chemical or physical means by laser ablation of organic insulating material
- H05K3/0038—Etching of the substrate by chemical or physical means by laser ablation of organic insulating material combined with laser drilling through a metal layer
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/02—Positioning or observing the workpiece, e.g. with respect to the point of impact; Aligning, aiming or focusing the laser beam
- B23K26/06—Shaping the laser beam, e.g. by masks or multi-focusing
- B23K26/064—Shaping the laser beam, e.g. by masks or multi-focusing by means of optical elements, e.g. lenses, mirrors or prisms
- B23K26/066—Shaping the laser beam, e.g. by masks or multi-focusing by means of optical elements, e.g. lenses, mirrors or prisms by using masks
- B23K26/0661—Shaping the laser beam, e.g. by masks or multi-focusing by means of optical elements, e.g. lenses, mirrors or prisms by using masks disposed on the workpiece
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/18—Working by laser beam, e.g. welding, cutting or boring using absorbing layers on the workpiece, e.g. for marking or protecting purposes
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K2101/00—Articles made by soldering, welding or cutting
- B23K2101/36—Electric or electronic devices
- B23K2101/42—Printed circuits
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/01—Dielectrics
- H05K2201/0104—Properties and characteristics in general
- H05K2201/0112—Absorbing light, e.g. dielectric layer with carbon filler for laser processing
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2203/00—Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
- H05K2203/12—Using specific substances
- H05K2203/121—Metallo-organic compounds
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/0011—Working of insulating substrates or insulating layers
- H05K3/0017—Etching of the substrate by chemical or physical means
- H05K3/0026—Etching of the substrate by chemical or physical means by laser ablation
- H05K3/0032—Etching of the substrate by chemical or physical means by laser ablation of organic insulating material
- H05K3/0035—Etching of the substrate by chemical or physical means by laser ablation of organic insulating material of blind holes, i.e. having a metal layer at the bottom
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/38—Improvement of the adhesion between the insulating substrate and the metal
- H05K3/382—Improvement of the adhesion between the insulating substrate and the metal by special treatment of the metal
- H05K3/383—Improvement of the adhesion between the insulating substrate and the metal by special treatment of the metal by microetching
Definitions
- the invention relates to a method for producing holes in the first copper layer forming the outside of a multilayer printed circuit board and in a dielectric layer which separates the first copper layer from a second copper layer by means of laser radiation, wherein a CO 2 laser beam is used for the removal of the dielectric layer either the intensity of the CO 2 laser beam is chosen to be higher than the threshold intensity required to remove the first copper layer, and the hole is produced in the first copper layer and in the dielectric layer with the same CO 2 laser beam or the outside of the first copper layer with a layer Whose CO 2 laser radiation absorption is greater than the CO 2 laser radiation absorption of the outside of the first copper layer, or provided with a CO 2 laser radiation absorption increasing surface finish and then a hole in the first copper layer and in de r Dielectric layer is produced with the same CO 2 laser beam.
- Such a method is for example by the WO 00/57680 A has become known.
- DE 197 19 700 A1 discloses a method for producing blind holes (so-called microvia holes) in a multilayer printed circuit board (multilayer board), which make possible through-connection between two copper layers separated from one another by a dielectric layer.
- a first laser by means of a first laser, a hole is made in the first copper layer forming the outer side of the multilayer printed circuit board, which extends into the underlying dielectric layer.
- the first laser is an Nd: YAG continuous wave laser with a wavelength of 355 nm suitable for removing copper, which is operated in giant pulse mode with pulse widths between 1 ns and 1 ⁇ s.
- the hole in the dielectric layer is recessed to the second copper layer.
- the second laser is also an Nd: YAG or a CO 2 laser with a larger wavelength in the range between 1064 nm and 10600 nm compared to the first laser, in which the laser radiation is reflected by copper.
- the diameter of the laser beam generated by the second laser is larger than in the case of the first laser, so that the first copper layer with the hole formed therein acts as a diaphragm and clean hole flanks are produced in the dielectric layer.
- the currently achievable hole diameter are between 50 and 100 microns.
- this process requires a drilling rig with two Nd: YAG lasers or a hybrid drilling rig with a CO 2 and Nd: YAG laser. After the drilling process, copper is deposited in the holes in a plating process and thus the electrical contact between the two copper layers, ie between the two interconnect levels, is produced.
- the first copper layer acts with the hole etched therein as a diaphragm, so that the beam diameter can be greater than the etched hole.
- a composite film with a copper foil which is fastened on a carrier film, is laminated onto a core plate.
- the copper foil is less than 10 ⁇ m thick and has a front side facing the carrier foil and a rear side coated with resin.
- the carrier foil is removed from the copper foil to expose the front side of the copper foil.
- holes are drilled through the copper foil and the resin with a CO 2 laser to form microvias.
- the front side of the copper foil is roughened or oxidized.
- the hole diameter of the first copper layer and holes drilled in the dielectric layer to reduce.
- This object is inventively achieved in that the Schwellenintestician of the CO 2 laser beam is exceeded only within a beam diameter smaller than the focus diameter of the CO 2 laser beam.
- the essential advantage of the method according to the invention is that the minimum hole diameter not by the focus diameter of the CO 2 laser beam, in which the maximum intensity has fallen to 1 / e 2 , but by the beam diameter, within which the intensity is higher than the threshold intensity of the Copper is determined. Outside this beam diameter, the first copper layer acts as a diaphragm for the laser beam. If the threshold intensity is therefore exceeded only in a beam diameter smaller than the focus diameter, hole diameters smaller than the focus diameter are possible.
- To microvia holes with a diameter of 90-100 microns too can be achieved, e.g. with a defocused beam with a diameter be worked by 150 microns on the surface.
- the to Copper drilling required energy is in this case 22 mJ. This is about 10 times the value of the drilling process in a dielectric layer of pure epoxy resin.
- the layer is deposited on the outside of the first copper layer, for example in the AlphaPrep method, or the outer surface of the first copper layer is roughened by etching.
- the layer is preferably an organometallic coating.
- the CO 2 laser radiation absorption on the copper surface is increased.
- the copper surface is etched and at the same time a brown-red, microporous, organometallic layer is deposited on the etched surface, which offers good adhesion properties for polymeric materials.
- This chemical pretreatment is used by default as a primer before the lamination process of the individual interconnect layers in the multilayer board manufacturing.
- the AlphaPrep process is offered, for example, by the company Würth Elektronik GmbH & Co. KG Printed Circuit Board Technology, D-74676 Niedernhall.
- the dielectric layer is removed to the second copper layer by means of the CO 2 laser beam.
- the 1 shows a multilayer printed circuit board 1 with two copper layers 2 , 3 and an intermediate dielectric layer 4 in the initial state before the introduction of a blind hole, which allows the through-connection between the copper layers 2, 3.
- the total thickness of the layer sequence shown is about 50 to 300 microns.
- the introduction of the blind hole should be made by the outside of the multilayer printed circuit board 1 forming the first copper layer 2 ago.
- the dielectric layer 4 consists of epoxy resin or of fiber-reinforced epoxy resin.
- the second copper layer 3 may be followed by further dielectric and copper layers.
- FIG. 2 shows, a further layer 5, whose CO 2 laser radiation absorption is greater than the CO 2 laser radiation absorption of the outside of the first copper layer 2, is first deposited on the outside of the first copper layer 2. Then, by means of a focused CO 2 laser beam 6 (wavelength: 9.2-11.8 ⁇ m), a hole 7 is introduced into the first copper layer 2 ( FIG. 3 ), then further into the dielectric layer 4 ( FIGS recessed to the second copper layer 3 ( Fig. 5 ).
- a focused CO 2 laser beam 6 wavelength: 9.2-11.8 ⁇ m
- the applied further layer 5 is a brown-red, microporous, organometallic layer, which in the AlphaPrep method is generated.
- This chemical pretreatment is standard as a primer before the lamination process the individual interconnect layers in the multilayer board production used.
- the intensity I of the CO 2 laser beam 6 is plotted over the beam cross section.
- the focus diameter D of the CO 2 laser beam 6 is defined by the fall of the maximum intensity I 0 to 1 / e 2 * I 0 .
- the further layer 5 increases the CO 2 laser radiation absorption of the first copper layer 2. Accordingly, the time required for removal of the first copper layer 2 threshold intensity I S reduces the CO 2 laser radiation, so that the coated first copper layer by means of the CO 2 laser beam 6, the intensity of which would not be sufficient for ablation of the uncoated first copper layer 2 is still removed ,
- the hole diameter is not determined by the focus diameter D of the CO 2 laser beam 6, but by the beam diameter d, within which the intensity is higher than the threshold intensity I S of the copper.
- the first copper layer 2 acts as a diaphragm for the laser beam 6.
- the beam diameter d, and thus the hole diameter is smaller than the focal diameter D.
- a focus diameter of approximately 90 ⁇ m can be drilled holes having a diameter of about 50 ⁇ m.
- a defocused laser beam with a focus diameter of 150 ⁇ m on the copper surface it is also possible to work with a defocused laser beam with a focus diameter of 150 ⁇ m on the copper surface.
- the energy required to drill copper is 22 mJ in this case.
Description
- Fign. 1 bis 5
- einen Querschnitt durch die Mehrlagenleiterplatte in unterschiedlichen Stadien des erfindungsgemäßen Verfahrens zum Herstellen eines Lochs in der Mehrlagenleiterplatte; und
- Fig. 6
- das über den Strahlquerschnitt aufgetragene Intensitätsprofil eines das Loch in der Mehrlagenleiterplatte erzeugenden CO2-Lasers.
Claims (4)
- Verfahren zum Herstellen von Löchern (7) in der die Außenseite einer Mehrlagenleiterplatte (1) bildenden ersten Kupferschicht (2) und in einer Dielektrikumschicht (4), welche die erste Kupferschicht (2) von einer zweiten Kupferschicht (3) trennt, mittels Laserstrahlung, wobei zur Abtragung der Dielektrikumschicht (4) ein CO2-Laserstrahl (6) verwendet wird und wobei entweder die Intensität des CO2-Laserstrahls (6) höher als die zum Abtragen der ersten Kupferschicht (2) erforderliche Schwellenintensität (Is) gewählt wird und das Loch (7) in der ersten Kupferschicht (2) und in der Dielektrikumschicht (4) mit dem gleichen CO2-Laserstrahl (6) erzeugt wird oder wobei die Außenseite der ersten Kupferschicht (2) mit einer Schicht (5), deren CO2-Laserstrahlungsabsorption größer als die CO2-Laserstrahlungsabsorption der Außenseite der ersten Kupferschicht (2) ist, oder mit einer die CO2-Laserstrahlungsabsorption erhöhenden Oberflächenbeschaffenheit versehen wird und dann ein Loch (7) in der ersten Kupferschicht (2) und in der Dielektrikumschicht (4) mit dem gleichen CO2-Laserstrahl (6) erzeugt wird,
dadurch gekennzeichnet, daß die Schwellenintensität (IS) des CO2-Laserstrahls (6) nur innerhalb eines Strahldurchmessers (d) kleiner als der Fokusdurchmesser (D) des CO2-Laserstrahls (6) überschritten wird. - Verfahren nach Anspruch 1, dadurch gekennzeichnet, daß die Schicht (5), vorzugsweise vollflächig, auf der Außenseite der ersten Kupferschicht (2) abgeschieden wird.
- Verfahren nach Anspruch 1 oder 2, dadurch gekennzeichnet, daß die Außenseite der ersten Kupferschicht (2) aufgeraut, vorzugweise angeätzt wird.
- Verfahren nach einem der Ansprüche 1 bis 3, dadurch gekennzeichnet, daß die Dielektrikumschicht (4) bis zur zweiten Kupferschicht (3) abgetragen wird.
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
AT01121061T ATE311736T1 (de) | 2001-09-01 | 2001-09-01 | Verfahren zum herstellen von löchern in einer mehrlagenleiterplatte |
EP01121061A EP1289354B1 (de) | 2001-09-01 | 2001-09-01 | Verfahren zum Herstellen von Löchern in einer Mehrlagenleiterplatte |
DE50108246T DE50108246D1 (de) | 2001-09-01 | 2001-09-01 | Verfahren zum Herstellen von Löchern in einer Mehrlagenleiterplatte |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP01121061A EP1289354B1 (de) | 2001-09-01 | 2001-09-01 | Verfahren zum Herstellen von Löchern in einer Mehrlagenleiterplatte |
Publications (2)
Publication Number | Publication Date |
---|---|
EP1289354A1 EP1289354A1 (de) | 2003-03-05 |
EP1289354B1 true EP1289354B1 (de) | 2005-11-30 |
Family
ID=8178508
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
EP01121061A Expired - Lifetime EP1289354B1 (de) | 2001-09-01 | 2001-09-01 | Verfahren zum Herstellen von Löchern in einer Mehrlagenleiterplatte |
Country Status (3)
Country | Link |
---|---|
EP (1) | EP1289354B1 (de) |
AT (1) | ATE311736T1 (de) |
DE (1) | DE50108246D1 (de) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR102126109B1 (ko) | 2014-06-03 | 2020-06-23 | 미츠비시 가스 가가쿠 가부시키가이샤 | 미세 비아홀 형성을 위한 프린트 배선판용 수지 적층체, 그리고, 수지 절연층에 미세 비아홀을 갖는 다층 프린트 배선판 및 그 제조 방법 |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101374389B (zh) * | 2007-08-24 | 2010-05-26 | 清华大学 | 电路板导孔的制作方法 |
US8211731B2 (en) | 2010-06-07 | 2012-07-03 | Sunpower Corporation | Ablation of film stacks in solar cell fabrication processes |
CN102950386A (zh) * | 2011-08-16 | 2013-03-06 | 悦虎电路(苏州)有限公司 | 一种线路板激光直接成孔后的孔顶悬铜解决方法 |
JP2014053342A (ja) * | 2012-09-05 | 2014-03-20 | Mitsui Mining & Smelting Co Ltd | プリント配線板の製造方法及びプリント配線板 |
Family Cites Families (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE3103986A1 (de) * | 1981-02-05 | 1982-09-09 | Reiner Dipl.-Phys. 8011 Vaterstetten Szepan | Verfahren zur herstellung von bohrloechern zur durchkontaktierung in elektronischen leiterplatten |
US5841099A (en) * | 1994-07-18 | 1998-11-24 | Electro Scientific Industries, Inc. | Method employing UV laser pulses of varied energy density to form depthwise self-limiting blind vias in multilayered targets |
ATE303712T1 (de) * | 1998-04-01 | 2005-09-15 | Mitsui Mining & Smelting Co | Verfahren zur herstellung einer mehrschichtigen gedruckten leiterplatte |
US6280641B1 (en) * | 1998-06-02 | 2001-08-28 | Mitsubishi Gas Chemical Company, Inc. | Printed wiring board having highly reliably via hole and process for forming via hole |
KR100592746B1 (ko) * | 1998-07-01 | 2006-06-26 | 프라이스 메탈즈, 인크. 디/비/에이 알파 메탈즈, 인크. | 인쇄 회로 기판 상의 구리 후처리 방법 |
JP2000153384A (ja) * | 1998-11-16 | 2000-06-06 | Hitachi Via Mechanics Ltd | Co2レーザによるブラインドホール加工方法 |
JP2000286527A (ja) * | 1999-01-26 | 2000-10-13 | Matsushita Electric Works Ltd | プリント配線板の製造方法 |
EP1172025B2 (de) * | 1999-03-23 | 2006-04-26 | Circuit Foil Luxembourg S.a.r.l. | Verfahren zur herstellung einer mehrschichtigen gedruckten leiterplatte und verbundfolie zur verwendung darin |
JP2001044642A (ja) * | 1999-07-26 | 2001-02-16 | Ibiden Co Ltd | 配線板の製造方法 |
JP2001068816A (ja) * | 1999-08-24 | 2001-03-16 | Mitsui Mining & Smelting Co Ltd | 銅張積層板及びその銅張積層板を用いたレーザー加工方法 |
JP2001135940A (ja) * | 1999-08-26 | 2001-05-18 | Matsushita Electric Works Ltd | プリント配線板の製造方法 |
JP2001144411A (ja) * | 1999-09-03 | 2001-05-25 | Mec Kk | プリント配線板の孔あけ法およびそれに用いる表面処理剤 |
-
2001
- 2001-09-01 AT AT01121061T patent/ATE311736T1/de not_active IP Right Cessation
- 2001-09-01 EP EP01121061A patent/EP1289354B1/de not_active Expired - Lifetime
- 2001-09-01 DE DE50108246T patent/DE50108246D1/de not_active Expired - Lifetime
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR102126109B1 (ko) | 2014-06-03 | 2020-06-23 | 미츠비시 가스 가가쿠 가부시키가이샤 | 미세 비아홀 형성을 위한 프린트 배선판용 수지 적층체, 그리고, 수지 절연층에 미세 비아홀을 갖는 다층 프린트 배선판 및 그 제조 방법 |
Also Published As
Publication number | Publication date |
---|---|
EP1289354A1 (de) | 2003-03-05 |
ATE311736T1 (de) | 2005-12-15 |
DE50108246D1 (de) | 2006-01-05 |
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