EP1149385A4 - Ic-test programmiersystem zur zuordnung logischer funktionstestdaten von logischen integrierten schaltung zu einer physikalischen darstellung - Google Patents

Ic-test programmiersystem zur zuordnung logischer funktionstestdaten von logischen integrierten schaltung zu einer physikalischen darstellung

Info

Publication number
EP1149385A4
EP1149385A4 EP99958909A EP99958909A EP1149385A4 EP 1149385 A4 EP1149385 A4 EP 1149385A4 EP 99958909 A EP99958909 A EP 99958909A EP 99958909 A EP99958909 A EP 99958909A EP 1149385 A4 EP1149385 A4 EP 1149385A4
Authority
EP
European Patent Office
Prior art keywords
data
chip
nets
nodes
integrated circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
EP99958909A
Other languages
English (en)
French (fr)
Other versions
EP1149385B1 (de
EP1149385A1 (de
Inventor
Shawn Smith
Hari Balachandran
Jason Parker
Butler Stephanie Watts
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
FEI Co
Texas Instruments Inc
Original Assignee
Texas Instruments Inc
Knights Technology Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Texas Instruments Inc, Knights Technology Inc filed Critical Texas Instruments Inc
Publication of EP1149385A1 publication Critical patent/EP1149385A1/de
Publication of EP1149385A4 publication Critical patent/EP1149385A4/de
Application granted granted Critical
Publication of EP1149385B1 publication Critical patent/EP1149385B1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
    • G01R31/318307—Generation of test inputs, e.g. test vectors, patterns or sequences computer-aided, e.g. automatic test program generator [ATPG], program translations, test program debugging
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2834—Automated test systems [ATE]; using microprocessors or computers

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Semiconductor Integrated Circuits (AREA)
EP99958909A 1998-11-13 1999-11-12 Ic-test programmiersystem zur zuordnung logischer funktionstestdaten von logischen integrierten schaltung zu einer physikalischen darstellung Expired - Lifetime EP1149385B1 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US09/192,164 US6185707B1 (en) 1998-11-13 1998-11-13 IC test software system for mapping logical functional test data of logic integrated circuits to physical representation
US192164 1998-11-13
PCT/US1999/026735 WO2000030119A1 (en) 1998-11-13 1999-11-12 Ic test software system for mapping logical functional test data of logic integrated circuits to physical representation

Publications (3)

Publication Number Publication Date
EP1149385A1 EP1149385A1 (de) 2001-10-31
EP1149385A4 true EP1149385A4 (de) 2002-01-30
EP1149385B1 EP1149385B1 (de) 2005-03-16

Family

ID=22708519

Family Applications (1)

Application Number Title Priority Date Filing Date
EP99958909A Expired - Lifetime EP1149385B1 (de) 1998-11-13 1999-11-12 Ic-test programmiersystem zur zuordnung logischer funktionstestdaten von logischen integrierten schaltung zu einer physikalischen darstellung

Country Status (9)

Country Link
US (1) US6185707B1 (de)
EP (1) EP1149385B1 (de)
JP (1) JP2002530659A (de)
KR (1) KR100527911B1 (de)
CN (1) CN1256733C (de)
AT (1) ATE291274T1 (de)
DE (1) DE69924296T8 (de)
TW (1) TW440859B (de)
WO (1) WO2000030119A1 (de)

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Also Published As

Publication number Publication date
ATE291274T1 (de) 2005-04-15
DE69924296T2 (de) 2006-02-02
KR20020008108A (ko) 2002-01-29
DE69924296T8 (de) 2006-04-27
EP1149385B1 (de) 2005-03-16
EP1149385A1 (de) 2001-10-31
US6185707B1 (en) 2001-02-06
TW440859B (en) 2001-06-16
KR100527911B1 (ko) 2005-11-09
DE69924296D1 (de) 2005-04-21
CN1256733C (zh) 2006-05-17
WO2000030119A1 (en) 2000-05-25
JP2002530659A (ja) 2002-09-17
CN1342318A (zh) 2002-03-27

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