EP1071123A8 - Procede de formation de film - Google Patents
Procede de formation de film Download PDFInfo
- Publication number
- EP1071123A8 EP1071123A8 EP99909290A EP99909290A EP1071123A8 EP 1071123 A8 EP1071123 A8 EP 1071123A8 EP 99909290 A EP99909290 A EP 99909290A EP 99909290 A EP99909290 A EP 99909290A EP 1071123 A8 EP1071123 A8 EP 1071123A8
- Authority
- EP
- European Patent Office
- Prior art keywords
- gaseous molecules
- substrate
- onto
- film
- elements
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000000034 method Methods 0.000 title abstract 3
- 239000000758 substrate Substances 0.000 abstract 5
- 238000000151 deposition Methods 0.000 abstract 2
- 150000001875 compounds Chemical class 0.000 abstract 1
- 238000010494 dissociation reaction Methods 0.000 abstract 1
- 230000005593 dissociations Effects 0.000 abstract 1
Classifications
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/22—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of inorganic material, other than metallic material
- C23C16/30—Deposition of compounds, mixtures or solid solutions, e.g. borides, carbides, nitrides
- C23C16/40—Oxides
- C23C16/401—Oxides containing silicon
- C23C16/402—Silicon dioxide
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/22—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of inorganic material, other than metallic material
- C23C16/30—Deposition of compounds, mixtures or solid solutions, e.g. borides, carbides, nitrides
- C23C16/40—Oxides
- C23C16/401—Oxides containing silicon
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/22—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of inorganic material, other than metallic material
- C23C16/30—Deposition of compounds, mixtures or solid solutions, e.g. borides, carbides, nitrides
- C23C16/40—Oxides
- C23C16/409—Oxides of the type ABO3 with A representing alkali, alkaline earth metal or lead and B representing a refractory metal, nickel, scandium or a lanthanide
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/448—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for generating reactive gas streams, e.g. by evaporation or sublimation of precursor materials
- C23C16/452—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for generating reactive gas streams, e.g. by evaporation or sublimation of precursor materials by activating reactive gas streams before their introduction into the reaction chamber, e.g. by ionisation or addition of reactive species
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- Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Physics & Mathematics (AREA)
- Power Engineering (AREA)
- General Physics & Mathematics (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Computer Hardware Design (AREA)
- Manufacturing & Machinery (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Materials Engineering (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Organic Chemistry (AREA)
- General Chemical & Material Sciences (AREA)
- Metallurgy (AREA)
- Mechanical Engineering (AREA)
- Inorganic Chemistry (AREA)
- Plasma & Fusion (AREA)
- Formation Of Insulating Films (AREA)
- Chemical Vapour Deposition (AREA)
- Physical Or Chemical Processes And Apparatus (AREA)
- Other Surface Treatments For Metallic Materials (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP10122661A JPH11279773A (ja) | 1998-03-27 | 1998-03-27 | 成膜方法 |
JP12266198 | 1998-03-27 | ||
PCT/JP1999/001429 WO1999050899A1 (fr) | 1998-03-27 | 1999-03-23 | Procede de formation de film |
Publications (4)
Publication Number | Publication Date |
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EP1071123A1 EP1071123A1 (fr) | 2001-01-24 |
EP1071123A8 true EP1071123A8 (fr) | 2001-05-02 |
EP1071123A4 EP1071123A4 (fr) | 2004-11-24 |
EP1071123B1 EP1071123B1 (fr) | 2007-01-03 |
Family
ID=14841514
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
EP99909290A Expired - Lifetime EP1071123B1 (fr) | 1998-03-27 | 1999-03-23 | Procede de formation de film |
Country Status (9)
Country | Link |
---|---|
US (1) | US6746726B2 (fr) |
EP (1) | EP1071123B1 (fr) |
JP (1) | JPH11279773A (fr) |
KR (1) | KR100441836B1 (fr) |
CN (1) | CN1146025C (fr) |
AU (1) | AU748409B2 (fr) |
CA (1) | CA2326052A1 (fr) |
DE (1) | DE69934680D1 (fr) |
WO (1) | WO1999050899A1 (fr) |
Families Citing this family (21)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6977808B2 (en) * | 1999-05-14 | 2005-12-20 | Apple Computer, Inc. | Display housing for computing device |
JP4105353B2 (ja) * | 1999-07-26 | 2008-06-25 | 財団法人国際科学振興財団 | 半導体装置 |
ATE514181T1 (de) | 2000-03-13 | 2011-07-15 | Tadahiro Ohmi | Verfahren zur ausbildung eines dielektrischen films |
JP5068402B2 (ja) * | 2000-12-28 | 2012-11-07 | 公益財団法人国際科学振興財団 | 誘電体膜およびその形成方法、半導体装置、不揮発性半導体メモリ装置、および半導体装置の製造方法 |
JP3916565B2 (ja) * | 2001-01-22 | 2007-05-16 | 東京エレクトロン株式会社 | 電子デバイス材料の製造方法 |
WO2003049173A1 (fr) * | 2001-12-07 | 2003-06-12 | Tokyo Electron Limited | Procede de nitruration de film isolant, dispositif a semi-conducteur et son procede de production et dispositif et procede de traitement de surface |
KR20030077436A (ko) | 2002-03-26 | 2003-10-01 | 가부시키가이샤 히다치 고쿠사이 덴키 | 반도체 장치의 제조 방법 및 반도체 제조 장치 |
JP2003293128A (ja) * | 2002-04-05 | 2003-10-15 | Canon Inc | 堆積膜形成方法 |
US7494904B2 (en) * | 2002-05-08 | 2009-02-24 | Btu International, Inc. | Plasma-assisted doping |
US7614111B2 (en) * | 2002-08-09 | 2009-11-10 | Colgate-Palmolive Company | Oral care implement |
WO2004025744A1 (fr) * | 2002-09-13 | 2004-03-25 | Fujitsu Limited | Element sensible au magnetisme et procede de production correspondant, tete magnetique, codeur et unite de stockage magnetique utilisant un tel element |
US20040099283A1 (en) * | 2002-11-26 | 2004-05-27 | Axcelis Technologies, Inc. | Drying process for low-k dielectric films |
JP2004343031A (ja) * | 2002-12-03 | 2004-12-02 | Advanced Lcd Technologies Development Center Co Ltd | 誘電体膜およびその形成方法ならびに誘電体膜を用いた半導体装置およびその製造方法 |
JP2004265916A (ja) * | 2003-02-06 | 2004-09-24 | Tokyo Electron Ltd | 基板のプラズマ酸化処理方法 |
JP2004336019A (ja) | 2003-04-18 | 2004-11-25 | Advanced Lcd Technologies Development Center Co Ltd | 成膜方法、半導体素子の形成方法、半導体素子、表示装置の形成方法及び表示装置 |
US7968470B2 (en) * | 2005-06-08 | 2011-06-28 | Tohoku University | Plasma nitriding method, method for manufacturing semiconductor device and plasma processing apparatus |
JP2007141993A (ja) * | 2005-11-16 | 2007-06-07 | Tokyo Gas Co Ltd | 被膜形成装置および被膜形成方法 |
TWI423461B (zh) * | 2008-09-18 | 2014-01-11 | Atomic Energy Council | 微晶矽薄膜鍍膜之生成方法及其生成裝置 |
CA2753619C (fr) | 2009-03-03 | 2016-05-17 | The University Of Western Ontario | Procede de production d'hydrogene moleculaire hyperthermal et d'utilisation de cet hydrogene pour rompre selectivement des liaisons c-h et/ou si-h aux surfaces de substrats |
US20160233055A1 (en) * | 2015-02-06 | 2016-08-11 | Mks Instruments Inc. | Apparatus and Method for Metastable Enhanced Plasma Ignition |
CN109922590B (zh) * | 2019-03-13 | 2023-11-03 | 中国科学院微电子研究所 | 原子态等离子体的形成及维持方法及半导体材料的等离子体处理方法 |
Family Cites Families (17)
Publication number | Priority date | Publication date | Assignee | Title |
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JPS56116869A (en) * | 1980-02-18 | 1981-09-12 | Shunpei Yamazaki | Inductive reduced pressure gaseous phase method |
GB2164581A (en) * | 1982-04-13 | 1986-03-26 | Michael Paul Neary | Chemical method |
US4737379A (en) * | 1982-09-24 | 1988-04-12 | Energy Conversion Devices, Inc. | Plasma deposited coatings, and low temperature plasma method of making same |
JPS59159167A (ja) * | 1983-03-01 | 1984-09-08 | Zenko Hirose | アモルフアスシリコン膜の形成方法 |
US4883688A (en) * | 1984-03-16 | 1989-11-28 | Syntex (U.S.A) Inc. | Method for producing chromatographic devices having modified edges |
JPH0717997B2 (ja) * | 1987-02-21 | 1995-03-01 | 日本電信電話株式会社 | プラズマ酸化または窒化法及びそれに使用する装置 |
US5180435A (en) * | 1987-09-24 | 1993-01-19 | Research Triangle Institute, Inc. | Remote plasma enhanced CVD method and apparatus for growing an epitaxial semiconductor layer |
JPH03193880A (ja) * | 1989-08-03 | 1991-08-23 | Mikakutou Seimitsu Kogaku Kenkyusho:Kk | 高圧力下でのマイクロ波プラズマcvdによる高速成膜方法及びその装置 |
US5284789A (en) | 1990-04-25 | 1994-02-08 | Casio Computer Co., Ltd. | Method of forming silicon-based thin film and method of manufacturing thin film transistor using silicon-based thin film |
DE4132560C1 (en) | 1991-09-30 | 1993-04-22 | Siemens Ag, 8000 Muenchen, De | Plasma-aided deposition of film for integrated semiconductor circuit - using neutral particles, activated by microwave in separate chamber, and non-excited reaction gas, etc. |
JP3190745B2 (ja) * | 1992-10-27 | 2001-07-23 | 株式会社東芝 | 気相成長方法 |
US6171674B1 (en) * | 1993-07-20 | 2001-01-09 | Semiconductor Energy Laboratory Co., Ltd. | Hard carbon coating for magnetic recording medium |
JPH0729898A (ja) | 1993-07-15 | 1995-01-31 | Tadahiro Omi | 半導体製造方法 |
US5571576A (en) * | 1995-02-10 | 1996-11-05 | Watkins-Johnson | Method of forming a fluorinated silicon oxide layer using plasma chemical vapor deposition |
JPH0964176A (ja) * | 1995-08-21 | 1997-03-07 | Oki Electric Ind Co Ltd | 半導体素子の製造方法 |
JPH10242142A (ja) * | 1997-02-21 | 1998-09-11 | Nippon Asm Kk | 半導体素子とその製造方法 |
US6015759A (en) * | 1997-12-08 | 2000-01-18 | Quester Technology, Inc. | Surface modification of semiconductors using electromagnetic radiation |
-
1998
- 1998-03-27 JP JP10122661A patent/JPH11279773A/ja active Pending
-
1999
- 1999-03-23 CN CNB998056324A patent/CN1146025C/zh not_active Expired - Fee Related
- 1999-03-23 US US09/646,988 patent/US6746726B2/en not_active Expired - Fee Related
- 1999-03-23 KR KR10-2000-7010752A patent/KR100441836B1/ko not_active IP Right Cessation
- 1999-03-23 CA CA002326052A patent/CA2326052A1/fr not_active Abandoned
- 1999-03-23 WO PCT/JP1999/001429 patent/WO1999050899A1/fr active IP Right Grant
- 1999-03-23 AU AU28546/99A patent/AU748409B2/en not_active Ceased
- 1999-03-23 EP EP99909290A patent/EP1071123B1/fr not_active Expired - Lifetime
- 1999-03-23 DE DE69934680T patent/DE69934680D1/de not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
KR100441836B1 (ko) | 2004-07-27 |
EP1071123A4 (fr) | 2004-11-24 |
US6746726B2 (en) | 2004-06-08 |
WO1999050899A1 (fr) | 1999-10-07 |
AU748409B2 (en) | 2002-06-06 |
CN1146025C (zh) | 2004-04-14 |
JPH11279773A (ja) | 1999-10-12 |
EP1071123B1 (fr) | 2007-01-03 |
DE69934680D1 (de) | 2007-02-15 |
AU2854699A (en) | 1999-10-18 |
CA2326052A1 (fr) | 1999-10-07 |
CN1299517A (zh) | 2001-06-13 |
US20030003243A1 (en) | 2003-01-02 |
EP1071123A1 (fr) | 2001-01-24 |
KR20010042227A (ko) | 2001-05-25 |
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