EP0355378B1 - Prüfstecker für Schaltungen in SMD-Technik und dessen Herstellungsverfahren. - Google Patents

Prüfstecker für Schaltungen in SMD-Technik und dessen Herstellungsverfahren. Download PDF

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Publication number
EP0355378B1
EP0355378B1 EP89112907A EP89112907A EP0355378B1 EP 0355378 B1 EP0355378 B1 EP 0355378B1 EP 89112907 A EP89112907 A EP 89112907A EP 89112907 A EP89112907 A EP 89112907A EP 0355378 B1 EP0355378 B1 EP 0355378B1
Authority
EP
European Patent Office
Prior art keywords
test
test clip
shells
channels
clip
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
EP89112907A
Other languages
German (de)
English (en)
French (fr)
Other versions
EP0355378A3 (de
EP0355378A2 (de
Inventor
Horst E. Moll
Carsten Moll
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
AP PRODUCTS GmbH
Original Assignee
AP PRODUCTS GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by AP PRODUCTS GmbH filed Critical AP PRODUCTS GmbH
Publication of EP0355378A2 publication Critical patent/EP0355378A2/de
Publication of EP0355378A3 publication Critical patent/EP0355378A3/de
Application granted granted Critical
Publication of EP0355378B1 publication Critical patent/EP0355378B1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R11/00—Individual connecting elements providing two or more spaced connecting locations for conductive members which are, or may be, thereby interconnected, e.g. end pieces for wires or cables supported by the wire or cable and having means for facilitating electrical connection to some other wire, terminal, or conductive member, blocks of binding posts
    • H01R11/11—End pieces or tapping pieces for wires, supported by the wire and for facilitating electrical connection to some other wire, terminal or conductive member
    • H01R11/22—End pieces terminating in a spring clip
    • H01R11/24—End pieces terminating in a spring clip with gripping jaws, e.g. crocodile clip

Definitions

  • the invention relates to a test plug, in particular to a clip or clip-like test plug.
  • Test plugs have long been known in the prior art in various variations; They have the task of temporarily connecting circuits of electrical devices with e.g. To manufacture or facilitate testing or measuring devices. If output pins are present on the devices, then the test plugs can have sockets so that the test plugs can be plugged in in a simple manner. On the other hand, the test plugs must be equipped with pins if the electrical devices have output sockets. The opposite ends of the plug sockets or plug pins are or are connected to the test leads.
  • SMD surface mounted device.
  • clamp-like test plugs have developed, in which parallel wires are embedded in the test plug, which is made of electrically non-conductive material, and protrude at both ends.
  • the wires on the clamp side of the test plug can be flattened to get a better contact surface.
  • the invention is therefore based on the object of creating a test plug or test clip for circuits in SMD technology, in which the different distance between the contact wire ends is possible in a simple and reliable manner.
  • the main idea of the invention is that channels for the contact wires are preformed in the clamp parts, so that the difficult and problematic insertion of the contact wires, as is customary in the known test plugs, is avoided.
  • clamp parts each consist of two halves, which are manufactured separately and in which corresponding half channels can then be formed in a simple manner, so that the channels for the contact wires are formed when the half-shells are joined together.
  • the course of the channels can be any within the scope of claim 1. however, it is advantageous and expedient if the channels run in this way. as is apparent from claim 2, since then the contact wires can be securely inserted or inserted into channels.
  • Another great advantage of the new test plug is that when the contact wires are subsequently inserted, they can be of the same length, since they can be pushed against a stop when inserted into the channels and cut to the same length at the opposite end.
  • part 8 shows a front view of a test clip 7 according to the invention. Only part 8 is visible in this illustration, all other parts are covered by part 8.
  • FIG. 2 first shows a clamp-like structure of the test clip 7 with the two similar parts 8 and 9.
  • the latter are articulated to one another via the lugs 10 and 11 and the joint disk 12 (FIG. 3) and are so by the coil spring 13 at the upper end pressed apart that the lower ends 14 and 15 lie against each other.
  • the width of the test clip i.e. H. depending on the number of contact wires 16
  • two or more spiral springs 13 can also be provided.
  • the exploded view of Figure 3 shows that the two clip parts 8 and 9 consist of two half-shells 17 and 18 or 19 and 20, which are manufactured separately and later connected to each other, as will be explained.
  • the sectional drawing in FIG. 6 shows that the half-shells 17 to 20 have mutually corresponding half-channels 21 and 22, which run according to the guidance of the contact wires 16 in the clip parts 8 and 9.
  • These half-shells 17 to 20 are very easy to manufacture, e.g. pour into appropriate molds.
  • the new test clip is now produced in the following way.
  • the parts shown in FIG. 3 are manufactured individually, the contact wires 16 being of the same length.
  • the plastic half-shells 17 and 18 or 19 and 20, in which the half-channels 21 and 22 are formed during manufacture, are then connected to one another.
  • the half-shell 17 extends over the half-shell 18 in a lid-like manner on the long sides. This results in a better connection surface than if the two half-shells butt together.
  • the connection is then made by ultrasonic welding, which is indicated by the weld seams 24 and 25.
  • the longitudinal channels 26 are formed, which run as shown in Fig.5.
  • the clear width of the channels 26 is practically no greater than the diameter of the contact wires 16. Therefore, the contact wires of the same length are mechanically driven into the channels 26 and in the process necessarily and correctly follow the bends of these channels. Because of this type of introduction of the contact wires 16 into the channels 26, no further fastening of the contact wires in the channels is necessary, since on the one hand the springing of the wires builds up a spring force which would prevent the contact wires 16 from slipping alone. On the other hand, the static friction between the contact wires 16 and the channels 26 also supports the fixed holding of the contact wires.
  • FIG. 4 shows a top view of one half of the test clip 7 produced in this way.
  • the lower ends 28 of the contact wires 16 can subsequently be flattened on one or both sides in order to obtain a better contact surface.
  • FIG. 1 and 1 a show a special design at the lower end 29 of the test clip 7. As FIG. 1 shows, the contact wires 16 close with the plastic body, but FIG. 1 a clearly shows that there are webs between them, which ensures better clamping on the circuit boards.
  • FIG. 6 shows a section of a cross section through part 8 from FIG. 1 or FIG. 2 along the line marked A-A in FIG. Only three channels 26 are shown here, through which a contact wire 16 each runs. On account of the course of the contact wires 16 which can be seen in FIG. 1, the distance of the wires in the cross section in FIG. 6 is greater than on the end face of the part 8 assigned to the printed circuit board (FIG. 5).

Landscapes

  • Measuring Leads Or Probes (AREA)
  • Coupling Device And Connection With Printed Circuit (AREA)
  • Manufacturing Of Printed Circuit Boards (AREA)
  • Polymerisation Methods In General (AREA)
  • Multi-Conductor Connections (AREA)
  • Glass Compositions (AREA)
  • Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
  • Laying Of Electric Cables Or Lines Outside (AREA)
EP89112907A 1988-08-19 1989-07-13 Prüfstecker für Schaltungen in SMD-Technik und dessen Herstellungsverfahren. Expired - Lifetime EP0355378B1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE3828148 1988-08-19
DE3828148A DE3828148A1 (de) 1988-08-19 1988-08-19 Clip- oder klammerartiger pruefstecker sowie verfahren zur herstellung eines solchen pruefsteckers

Publications (3)

Publication Number Publication Date
EP0355378A2 EP0355378A2 (de) 1990-02-28
EP0355378A3 EP0355378A3 (de) 1991-03-20
EP0355378B1 true EP0355378B1 (de) 1996-03-13

Family

ID=6361164

Family Applications (1)

Application Number Title Priority Date Filing Date
EP89112907A Expired - Lifetime EP0355378B1 (de) 1988-08-19 1989-07-13 Prüfstecker für Schaltungen in SMD-Technik und dessen Herstellungsverfahren.

Country Status (5)

Country Link
EP (1) EP0355378B1 (enrdf_load_stackoverflow)
AT (1) ATE135498T1 (enrdf_load_stackoverflow)
DE (2) DE3828148A1 (enrdf_load_stackoverflow)
ES (1) ES2084589T3 (enrdf_load_stackoverflow)
GR (1) GR3019319T3 (enrdf_load_stackoverflow)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19528011A1 (de) * 1995-07-31 1997-02-06 Kontron Elektronik Adapter mit einem eine Kontaktierungsvorrichtung aufweisenden Träger
DE19703897C1 (de) * 1997-02-03 1998-07-02 Herbert Amrhein Klemmvorrichtung
DE29803900U1 (de) * 1998-03-05 1999-04-01 Precision Motors Deutsche Minebea GmbH, 78549 Spaichingen Kontaktklemme zur Kontaktierung von elektrischen Leitungen mittels voneinander isolierter Kontakte
DE19827045A1 (de) * 1998-06-18 2000-01-05 Dbb Fuel Cell Engines Gmbh Vorrichtung zur Spannungsmessung
CN101814663B (zh) * 2010-04-02 2012-01-18 上海广为电器工具有限公司 一种高导电性节能夹

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE8124768U1 (de) * 1982-02-11 Standard Elektrik Lorenz Ag, 7000 Stuttgart Prüfklammer für integrierte Schaltungen
US3506949A (en) * 1967-12-29 1970-04-14 John T Venaleck Electrical connector clip device
US3899239A (en) * 1974-06-24 1975-08-12 Us Navy Integrated circuit test clamp
DD120307A1 (enrdf_load_stackoverflow) * 1975-07-07 1976-06-05
DE2537325C3 (de) * 1975-08-21 1979-08-23 Continental Specialties Corp., New Haven, Conn. (V.St.A.) Klemme für die Verbindung von Kontakten eines elektrischen Bauelementes mit einem Prüf- oder Meßgerät
JPH0448542Y2 (enrdf_load_stackoverflow) * 1985-05-16 1992-11-16

Also Published As

Publication number Publication date
DE3828148C2 (enrdf_load_stackoverflow) 1990-05-31
DE58909623D1 (de) 1996-04-18
EP0355378A3 (de) 1991-03-20
DE3828148A1 (de) 1990-02-22
ATE135498T1 (de) 1996-03-15
EP0355378A2 (de) 1990-02-28
GR3019319T3 (en) 1996-06-30
ES2084589T3 (es) 1996-05-16

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