EP0355378B1 - Test clip for SMD circuits and its method of fabrication - Google Patents

Test clip for SMD circuits and its method of fabrication Download PDF

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Publication number
EP0355378B1
EP0355378B1 EP89112907A EP89112907A EP0355378B1 EP 0355378 B1 EP0355378 B1 EP 0355378B1 EP 89112907 A EP89112907 A EP 89112907A EP 89112907 A EP89112907 A EP 89112907A EP 0355378 B1 EP0355378 B1 EP 0355378B1
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EP
European Patent Office
Prior art keywords
test
test clip
shells
channels
clip
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
EP89112907A
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German (de)
French (fr)
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EP0355378A3 (en
EP0355378A2 (en
Inventor
Horst E. Moll
Carsten Moll
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AP PRODUCTS GmbH
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AP PRODUCTS GmbH
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Publication date
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Publication of EP0355378A2 publication Critical patent/EP0355378A2/en
Publication of EP0355378A3 publication Critical patent/EP0355378A3/en
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Publication of EP0355378B1 publication Critical patent/EP0355378B1/en
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01RELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R11/00Individual connecting elements providing two or more spaced connecting locations for conductive members which are, or may be, thereby interconnected, e.g. end pieces for wires or cables supported by the wire or cable and having means for facilitating electrical connection to some other wire, terminal, or conductive member, blocks of binding posts
    • H01R11/11End pieces or tapping pieces for wires, supported by the wire and for facilitating electrical connection to some other wire, terminal or conductive member
    • H01R11/22End pieces terminating in a spring clip
    • H01R11/24End pieces terminating in a spring clip with gripping jaws, e.g. crocodile clip

Definitions

  • the invention relates to a test plug, in particular to a clip or clip-like test plug.
  • Test plugs have long been known in the prior art in various variations; They have the task of temporarily connecting circuits of electrical devices with e.g. To manufacture or facilitate testing or measuring devices. If output pins are present on the devices, then the test plugs can have sockets so that the test plugs can be plugged in in a simple manner. On the other hand, the test plugs must be equipped with pins if the electrical devices have output sockets. The opposite ends of the plug sockets or plug pins are or are connected to the test leads.
  • SMD surface mounted device.
  • clamp-like test plugs have developed, in which parallel wires are embedded in the test plug, which is made of electrically non-conductive material, and protrude at both ends.
  • the wires on the clamp side of the test plug can be flattened to get a better contact surface.
  • the invention is therefore based on the object of creating a test plug or test clip for circuits in SMD technology, in which the different distance between the contact wire ends is possible in a simple and reliable manner.
  • the main idea of the invention is that channels for the contact wires are preformed in the clamp parts, so that the difficult and problematic insertion of the contact wires, as is customary in the known test plugs, is avoided.
  • clamp parts each consist of two halves, which are manufactured separately and in which corresponding half channels can then be formed in a simple manner, so that the channels for the contact wires are formed when the half-shells are joined together.
  • the course of the channels can be any within the scope of claim 1. however, it is advantageous and expedient if the channels run in this way. as is apparent from claim 2, since then the contact wires can be securely inserted or inserted into channels.
  • Another great advantage of the new test plug is that when the contact wires are subsequently inserted, they can be of the same length, since they can be pushed against a stop when inserted into the channels and cut to the same length at the opposite end.
  • part 8 shows a front view of a test clip 7 according to the invention. Only part 8 is visible in this illustration, all other parts are covered by part 8.
  • FIG. 2 first shows a clamp-like structure of the test clip 7 with the two similar parts 8 and 9.
  • the latter are articulated to one another via the lugs 10 and 11 and the joint disk 12 (FIG. 3) and are so by the coil spring 13 at the upper end pressed apart that the lower ends 14 and 15 lie against each other.
  • the width of the test clip i.e. H. depending on the number of contact wires 16
  • two or more spiral springs 13 can also be provided.
  • the exploded view of Figure 3 shows that the two clip parts 8 and 9 consist of two half-shells 17 and 18 or 19 and 20, which are manufactured separately and later connected to each other, as will be explained.
  • the sectional drawing in FIG. 6 shows that the half-shells 17 to 20 have mutually corresponding half-channels 21 and 22, which run according to the guidance of the contact wires 16 in the clip parts 8 and 9.
  • These half-shells 17 to 20 are very easy to manufacture, e.g. pour into appropriate molds.
  • the new test clip is now produced in the following way.
  • the parts shown in FIG. 3 are manufactured individually, the contact wires 16 being of the same length.
  • the plastic half-shells 17 and 18 or 19 and 20, in which the half-channels 21 and 22 are formed during manufacture, are then connected to one another.
  • the half-shell 17 extends over the half-shell 18 in a lid-like manner on the long sides. This results in a better connection surface than if the two half-shells butt together.
  • the connection is then made by ultrasonic welding, which is indicated by the weld seams 24 and 25.
  • the longitudinal channels 26 are formed, which run as shown in Fig.5.
  • the clear width of the channels 26 is practically no greater than the diameter of the contact wires 16. Therefore, the contact wires of the same length are mechanically driven into the channels 26 and in the process necessarily and correctly follow the bends of these channels. Because of this type of introduction of the contact wires 16 into the channels 26, no further fastening of the contact wires in the channels is necessary, since on the one hand the springing of the wires builds up a spring force which would prevent the contact wires 16 from slipping alone. On the other hand, the static friction between the contact wires 16 and the channels 26 also supports the fixed holding of the contact wires.
  • FIG. 4 shows a top view of one half of the test clip 7 produced in this way.
  • the lower ends 28 of the contact wires 16 can subsequently be flattened on one or both sides in order to obtain a better contact surface.
  • FIG. 1 and 1 a show a special design at the lower end 29 of the test clip 7. As FIG. 1 shows, the contact wires 16 close with the plastic body, but FIG. 1 a clearly shows that there are webs between them, which ensures better clamping on the circuit boards.
  • FIG. 6 shows a section of a cross section through part 8 from FIG. 1 or FIG. 2 along the line marked A-A in FIG. Only three channels 26 are shown here, through which a contact wire 16 each runs. On account of the course of the contact wires 16 which can be seen in FIG. 1, the distance of the wires in the cross section in FIG. 6 is greater than on the end face of the part 8 assigned to the printed circuit board (FIG. 5).

Landscapes

  • Measuring Leads Or Probes (AREA)
  • Laying Of Electric Cables Or Lines Outside (AREA)
  • Manufacturing Of Printed Circuit Boards (AREA)
  • Polymerisation Methods In General (AREA)
  • Coupling Device And Connection With Printed Circuit (AREA)
  • Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
  • Glass Compositions (AREA)
  • Multi-Conductor Connections (AREA)

Abstract

The invention relates to a clip-type or clamp-type test plug for occasionally electrically connecting the contacts of a circuit board to test or measuring equipment. In this, the contact wires are guided in the plug in such a way that the distance of the contact wires at the clamp-side end is lower than at the opposite end. In this way it is then also possible to test circuit boards with very thick conductor tracks. The contact wires are guided in the test plug in channels which are formed during the manufacture of the test plug. <IMAGE>

Description

Die Erfindung bezieht sich auf einen Prüfstecker, insbesondere auf einen clip- oder klammerartigen Prüfstecker.The invention relates to a test plug, in particular to a clip or clip-like test plug.

Prüfstecker sind im Stand der Technik in vielfältigen Variationen seit langem bekannt; sie haben die Aufgabe, die temporäre Verbindung von Schaltungen elektrischer Geräte mit z.B. Prüf- oder Meßeinrichtungen herzustellen bzw. zu erleichtern. Sind an den Geräten Ausgangsstifte vorhanden, dann können die Prüfstecker Buchsen aufweisen, so daß die Prüfstecker in einfacher Weise aufgesteckt werden können. Andererseits müssen die Prüfstecker mit Stiften ausgerüstet sein, wenn die elektrischen Geräte Ausgangsbuchsen aufweisen. Die entgegengesetzten Enden der Steckerbuchsen bzw. Steckerstifte sind bzw. werden mit den Prüfleitungen verbunden.Test plugs have long been known in the prior art in various variations; They have the task of temporarily connecting circuits of electrical devices with e.g. To manufacture or facilitate testing or measuring devices. If output pins are present on the devices, then the test plugs can have sockets so that the test plugs can be plugged in in a simple manner. On the other hand, the test plugs must be equipped with pins if the electrical devices have output sockets. The opposite ends of the plug sockets or plug pins are or are connected to the test leads.

Eine besondere Art von Prüfsteckern ist erforderlich, wenn die elektrische Schaltung keine Ausgangsbuchsen oder Ausgangsstifte aufweisen, sondern wenn die Ausgangsleitungen in sogenannter SMD-Technik vorliegen (SMD = surface mounted device). Hier haben sich klammerartige Prüfstecker herausgebildet, bei denen in dem aus elektrisch nichtleitendem Material bestehenden Prüfstecker parallele Drähte eingebettet sind, die an beiden Enden herausragen. Dabei können die Drähte an der Klammerseite des Prüfsteckers abgeflacht sein, um eine bessere Kontaktfläche zu bekommen. Auch hier ist es unter Umständen zweckmäßig, wenn die klammerseitigen Drähte nicht über das Steckende hinausragende, sondern auf der kontaktabgewendeten Seite in dem isolierenden Prüfstecker eingebettet sind.A special type of test plug is required if the electrical circuit has no output sockets or output pins have, but if the output lines are in so-called SMD technology (SMD = surface mounted device). Here, clamp-like test plugs have developed, in which parallel wires are embedded in the test plug, which is made of electrically non-conductive material, and protrude at both ends. The wires on the clamp side of the test plug can be flattened to get a better contact surface. Here, too, it may be expedient if the wires on the clamp side do not protrude beyond the plug end, but are embedded in the insulating test plug on the side facing away from the contact.

Ein Problem entsteht nun, wenn die Ausgangsleitungen der elektrischen Schaltung immer näher aneinander rücken, was z.B. bei IC's und Chips der Fall ist, und damit das Anschließen von Prüfleitungen immer schwieriger, wenn nicht sogar unmöglich wird. Man ist daher dazu übergegangen, die Abstände der Steckerenden an der Ausgangsseite durch besondere Maßnahmen größer zu machen als an der Leiterplattenseite, so daß eine Verbindung mit den Prüfleitungen möglich ist.A problem now arises when the output lines of the electrical circuit move closer and closer together, which e.g. is the case with ICs and chips, and thus the connection of test leads is becoming increasingly difficult, if not impossible. It has therefore started to make the distances between the plug ends on the output side larger by special measures than on the printed circuit board side, so that a connection to the test leads is possible.

Der Erfindung liegt daher die Aufgabe zugrunde, einen Prüfstecker bzw. Testclip für Schaltungen in SMD-Technik zu schaffen, bei dem der unterschiedliche Abstand der Schaltdrähtenenden in einfacher und sicherer Weise möglich ist.The invention is therefore based on the object of creating a test plug or test clip for circuits in SMD technology, in which the different distance between the contact wire ends is possible in a simple and reliable manner.

Diese Aufgabe wird durch einen Prüfstecker mit den Merkmalen des Anspruchs 1 gelöstThis object is achieved by a test plug with the features of claim 1

Der wesentliche Gedanke der Erfindung besteht darin, daß in den Klammerteilen Kanäle für die Kontaktdrähte vorgeformt werden, so daß das schwierige und problembehaftete Einlegen der Kontakdrähte, wie bei den bekannte Prüfsteckern üblich, vermieden wird.The main idea of the invention is that channels for the contact wires are preformed in the clamp parts, so that the difficult and problematic insertion of the contact wires, as is customary in the known test plugs, is avoided.

Dabei ist es zweckmäßig, wenn die Klammerteile jeweils aus zwei Hälften bestehen, die getrennt hergestellt werden und in denen dann auf einfache Weise entsprechende Halbkanäle geformt werden können, so daß beim Zusammenfügen der Halbschalen die Kanäle für die Kontaktdrähte entstehen.It is expedient if the clamp parts each consist of two halves, which are manufactured separately and in which corresponding half channels can then be formed in a simple manner, so that the channels for the contact wires are formed when the half-shells are joined together.

Der Verlauf der Kanäle kann im Rahmen des Anspruchs 1 beliebig sein. doch ist es vorteilhaft und zweckmäßig, wenn die Kanäle so verlaufen. wie es sich aus dem Anspruch 2 ergibt, da dann die Kontaktdrähte sicher in Kanäle eingesteckt bzw. eingelegt werden können.The course of the channels can be any within the scope of claim 1. however, it is advantageous and expedient if the channels run in this way. as is apparent from claim 2, since then the contact wires can be securely inserted or inserted into channels.

Aus der US-PS 3 506 949 ist zwar ein Prüfstecker mit in einer Ebene nebeneinander verlaufenden Kanälen bekannt. Die Kanäle verlaufen hierbei jedoch stets parallel und mit gleichbleibendem Abstand zueinander. Ein unterschiedlicher Abstand der Schaltdrahtenden kann mit diesem Prüfstecker daher nicht bewirkt werden.From US Pat. No. 3,506,949, a test plug with channels running alongside one another in a plane is known. However, the channels always run parallel and at a constant distance from each other. A different distance between the wire ends can therefore not be achieved with this test plug.

Ein weiterer großer Vorteil des neuen Prüfsteckers besteht nun darin, daß beim nachträglichen Einführen der Kontaktdrähte diese gleich lang sein können, da man sie beim Einstecken in die Kanäle gegen einen Anschlag treiben und am entgegengesetzten Ende auf gleiche Länge abschneiden kann.Another great advantage of the new test plug is that when the contact wires are subsequently inserted, they can be of the same length, since they can be pushed against a stop when inserted into the channels and cut to the same length at the opposite end.

Weitere Merkmale und Vorteile der Erfindung ergeben sich aus den Patentansprüchen und der folgenden Beschreibung.Further features and advantages of the invention emerge from the patent claims and the following description.

Es zeigen

Fig.1
einen Prüfstecker gemäß der Erfindung
Fig.1a
Vergrößung des unteren Ende des Prüfsteckers
Fig.2
eine Seitenansicht des Prüfsteckers der Fig.1
Fig.3
eine Explosionsdarstellung des Prüfsteckers der Fig.2
Fig.4
eine andere Ausbildungsform des Prüfsteckers gemäß der Erfindung
Fig.5
die Sicht auf die der Leiterplatte zugeordnete Stirnseite des Prüfsteckers
Fig.6
Ausschnitt aus einem Querschnitt durch das Teil 8 aus Fig.1 bzw. Fig.2 entlang der Markierung A-A in Fig.1 (gegenüber Fig.1 vergrößerter Maßstab)
Show it
Fig. 1
a test plug according to the invention
Fig.1a
Enlargement of the lower end of the test plug
Fig. 2
a side view of the test plug of Fig.1
Fig. 3
an exploded view of the test plug of Fig.2
Fig. 4
another embodiment of the test plug according to the invention
Fig. 5
the view of the end face of the test plug assigned to the circuit board
Fig. 6
Section of a cross section through part 8 from FIG. 1 or FIG. 2 along the marking AA in FIG. 1 (enlarged scale compared to FIG. 1)

Fig.1 zeigt in Vorderansicht einen Testclip 7 gemäß der Erfindung. In dieser Darstellung ist nur das Teil 8 erkennbar, alle übrigen Teile sind durch Teil 8 verdeckt.1 shows a front view of a test clip 7 according to the invention. Only part 8 is visible in this illustration, all other parts are covered by part 8.

Fig.2 zeigt zunächst einen klammerartigen Aufbau des Testclips 7 mit den beiden gleichartigen Teilen 8 und 9. Letztere sind über die Ansätze 10 und 11 sowie die Gelenkscheibe 12 (Fig.3) miteinander gelenkig verbunden und werden durch die Spiralfeder 13 am oberen Ende so auseinandergedrückt, daß die unteren Enden 14 und 15 aneinander liegen. Je nach Breite des Testclips, d. h. nach der Anzahl der Kontaktdrähte 16, können auch zwei oder mehr Spiralfedern 13 vorgesehen werden. Außerdem kann es für manche Anwendungsfälle zweckmäßig sein, die Gelenkscheibe 12 wegzulassen und die beiden Teile 8 und 9 direkt über die Ansatzstücke 10 und 11 miteinander zu verbinden.FIG. 2 first shows a clamp-like structure of the test clip 7 with the two similar parts 8 and 9. The latter are articulated to one another via the lugs 10 and 11 and the joint disk 12 (FIG. 3) and are so by the coil spring 13 at the upper end pressed apart that the lower ends 14 and 15 lie against each other. Depending on the width of the test clip, i.e. H. depending on the number of contact wires 16, two or more spiral springs 13 can also be provided. In addition, it may be expedient for some applications to omit the joint disk 12 and to connect the two parts 8 and 9 directly to one another via the end pieces 10 and 11.

Die Explosionszeichnung der Fig.3 zeigt, daß die beiden Clipsteile 8 und 9 aus zwei Halbschalen 17 und 18 bzw. 19 und 20 bestehen, die getrennt hergestellt und später miteinander verbunden werden, wie noch erläutert wird. Die Schnittzeichnung der Fig.6 zeigt, daß die Halbschalen 17 bis 20 miteinander korrespondierende Halbkanäle 21 und 22 aufweisen, die entsprechend der Führung der Kontaktdrähte 16 in den Clipsteilen 8 und 9 verlaufen. Diese Halbschalen 17 bis 20 lassen sich sehr einfach herstellen, z.B. in entsprechende Formen gießen.The exploded view of Figure 3 shows that the two clip parts 8 and 9 consist of two half-shells 17 and 18 or 19 and 20, which are manufactured separately and later connected to each other, as will be explained. The sectional drawing in FIG. 6 shows that the half-shells 17 to 20 have mutually corresponding half-channels 21 and 22, which run according to the guidance of the contact wires 16 in the clip parts 8 and 9. These half-shells 17 to 20 are very easy to manufacture, e.g. pour into appropriate molds.

Die Herstellung des neuen Testclips erfolgt nun auf folgende Weise.The new test clip is now produced in the following way.

Die aus der Fig.3 ersichtlichen Teile werden einzeln hergestellt, wobei die Kontaktdrähte 16 gleich lang sind. Die aus Kunststoff bestehenden Halbschalen 17 und 18 bzw. 19 und 20, in denen beim Herstellen die Halbkanäle 21 und 22 ausgebildet werden, werden sodann miteinander verbunden. Wie Fig.5 zeigt, greift die Halbschale 17 an den Längsseiten über die Halbschale 18 deckelartig hinweg. Damit ergibt sich eine bessere Verbindungsfläche als bei stumpfem Aneinanderstoßen der beiden Halbschalen. Die Verbindung erfolgt dann durch Ultraschallschweißen, was mit den Schweißnähten 24 und 25 angedeutet ist. durch das Zusammenfügen der beiden Teile 17 und 18 entstehen die Längskanäle 26, die wie aus Fig.5 ersichtlich verlaufen.The parts shown in FIG. 3 are manufactured individually, the contact wires 16 being of the same length. The plastic half-shells 17 and 18 or 19 and 20, in which the half-channels 21 and 22 are formed during manufacture, are then connected to one another. As shown in FIG. 5, the half-shell 17 extends over the half-shell 18 in a lid-like manner on the long sides. This results in a better connection surface than if the two half-shells butt together. The connection is then made by ultrasonic welding, which is indicated by the weld seams 24 and 25. By joining the two parts 17 and 18, the longitudinal channels 26 are formed, which run as shown in Fig.5.

Die lichte Weite der Kanäle 26 ist praktisch nicht größer als der Durchmesser der Kontaktdrähte 16. Daher werden die gleich langen Kontaktdrähte maschinell in die Kanäle 26 hineingetrieben und folgen dabei zwangsweise und einwandfrei den Biegungen dieser Kanäle. Wegen dieser Art der Einbringung der Kontaktdrähte 16 in die Kanäle 26 ist keine weitere Befestigung der Kontaktdrähte in den Kanälen erforderlich, da sich einerseits durch das Biegen der Drähte eine Federkraft aufbaut, die schon allein ein Verrutschen der Kontaktdrähte 16 verhindern würde. Andererseits unterstützt aber noch die Haftreibung zwischen den Kontaktdrähten 16 und den Kanälen 26 die feste Halterung der Kontaktdrähte.The clear width of the channels 26 is practically no greater than the diameter of the contact wires 16. Therefore, the contact wires of the same length are mechanically driven into the channels 26 and in the process necessarily and correctly follow the bends of these channels. Because of this type of introduction of the contact wires 16 into the channels 26, no further fastening of the contact wires in the channels is necessary, since on the one hand the springing of the wires builds up a spring force which would prevent the contact wires 16 from slipping alone. On the other hand, the static friction between the contact wires 16 and the channels 26 also supports the fixed holding of the contact wires.

Fig.4 zeigt in Draufsicht eine so hergestellte Hälfte des Testclips 7. Die unteren Enden 28 der Kontaktdrähte 16 können ein- oder beidseitig noch nachträglich flachgedrückt werden, um so eine bessere Kontaktfläche zu erhalten.4 shows a top view of one half of the test clip 7 produced in this way. The lower ends 28 of the contact wires 16 can subsequently be flattened on one or both sides in order to obtain a better contact surface.

Die Fig.1 und Fig.1a zeigen eine besondere Ausbildung am unteren Ende 29 des Testclips 7. Wie Fig.1 zeigt, schließen die Kontaktdrähte 16 zwar mit dem Kunststoffkörper ab, doch zeigt Fig.1a deutlich, daß zwischen ihnen Stege vorhanden sind, wodurch ein besseres Festklemmen an den Schaltungsplatinen gewährleistet ist.1 and 1 a show a special design at the lower end 29 of the test clip 7. As FIG. 1 shows, the contact wires 16 close with the plastic body, but FIG. 1 a clearly shows that there are webs between them, which ensures better clamping on the circuit boards.

Fig.6 zeigt einen Ausschnitt aus einem Querschnitt durch das Teil 8 aus Fig.1 bzw. Fig.2 entlang der in Fig.1 mit A-A markierten Linie. Dargestellt sind hier nur drei Kanäle 26, durch die je ein Kontaktdraht 16 verläuft. Aufgrund des in Fig.1 erkennbaren Verlaufs der Kontaktdrähte 16, ist der Abstand der Drähte im Querschnitt Fig.6 größer als an der der Leiterplatte zugeordneten Stirnseite der Teils 8 (Fig.5).6 shows a section of a cross section through part 8 from FIG. 1 or FIG. 2 along the line marked A-A in FIG. Only three channels 26 are shown here, through which a contact wire 16 each runs. On account of the course of the contact wires 16 which can be seen in FIG. 1, the distance of the wires in the cross section in FIG. 6 is greater than on the end face of the part 8 assigned to the printed circuit board (FIG. 5).

Claims (7)

  1. Test clip consisting of two clip or clamp parts (8,9) for the temporary electrical connection of the contacts of a circuit board (IC, chip) equipped using the SMD technique with test or measurement apparatus or the like, comprising a plurality of connection lines (16) embedded in the test clip, with the spacing of the line ends (28) at the contact side (circuit board side) being smaller than the spacing of the opposite line ends at the connection side of the test clip, characterised in that channels (26) into which the conductors or contact wires (16) can be subsequently inserted, are provided in the test clip extending alongside one another in one plane from the connection side to the circuit board side; and in that the channels (26) first extend in a straight line from both ends of the test clip and the straight parts are connected together by channel parts with two oppositely directed bends for adaptation to the different conductor spacing at the contact side and at the connection side.
  2. Test clip in accordance with claim 1, characterised in that the straight path from the connection side up to the first bend is substantially larger than the connection path from the second bend up to the contact side.
  3. Test clip in accordance with claim 1 or claim 2, characterised in that each of the two clamp parts (8, 9) is put together from two half-shells (17, 18; 19, 20), and in that each half-shell has half-channels (21, 22) for the contact wires (16).
  4. Test clip in accordance with claim 3, characterised in that the two half-shells (17, 18; 19, 20) are ultrasonically welded.
  5. Test clip in accordance with claim 3 or claim 4, characterised in that the one half-shell (17, 19) engages in flap-like manner over the other half-shell (18, 20).
  6. Test clip in accordance with one of the claims 3 to 5, characterised in that the contact-side ends (29) of the half-shells are so formed that the wire ends (28) are exposed, and that webs (30) of the half-shells are of the same length and are present between the wire ends (28).
  7. Method of manufacturing a test plug in accordance with claim 1, characterised in that for each clamp part (8, 9) two half-shells (17, 18; 19, 20) are formed of plastic with congruently extending half-channels (21, 22) for the contact wires (16); in that the half-shells (17, 18; 19, 20) are then fixedly connected to one another by ultrawelding and the two clamp parts (8, 9) are resiliently connected together; and in that the contact wires (16) are then introduced up to an abutment (27) and are cut off at the upper end to the same length.
EP89112907A 1988-08-19 1989-07-13 Test clip for SMD circuits and its method of fabrication Expired - Lifetime EP0355378B1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE3828148 1988-08-19
DE3828148A DE3828148A1 (en) 1988-08-19 1988-08-19 CLIP OR CLAMP-LIKE TEST PLUG AND METHOD FOR PRODUCING SUCH A TEST PLUG

Publications (3)

Publication Number Publication Date
EP0355378A2 EP0355378A2 (en) 1990-02-28
EP0355378A3 EP0355378A3 (en) 1991-03-20
EP0355378B1 true EP0355378B1 (en) 1996-03-13

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EP89112907A Expired - Lifetime EP0355378B1 (en) 1988-08-19 1989-07-13 Test clip for SMD circuits and its method of fabrication

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EP (1) EP0355378B1 (en)
AT (1) ATE135498T1 (en)
DE (2) DE3828148A1 (en)
ES (1) ES2084589T3 (en)
GR (1) GR3019319T3 (en)

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DE19528011A1 (en) * 1995-07-31 1997-02-06 Kontron Elektronik Adapter with a carrier having a contacting device
DE19703897C1 (en) * 1997-02-03 1998-07-02 Herbert Amrhein Terminal device for providing releasable electrical connection e.g. for testing SMD components
DE29803900U1 (en) * 1998-03-05 1999-04-01 Precision Motors Deutsche Minebea GmbH, 78549 Spaichingen Contact terminal for contacting electrical lines using mutually insulated contacts
DE19827045A1 (en) * 1998-06-18 2000-01-05 Dbb Fuel Cell Engines Gmbh Device for voltage measurement
CN101814663B (en) * 2010-04-02 2012-01-18 上海广为电器工具有限公司 High conductivity energy saving clamp

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US3506949A (en) * 1967-12-29 1970-04-14 John T Venaleck Electrical connector clip device
US3899239A (en) * 1974-06-24 1975-08-12 Us Navy Integrated circuit test clamp
DD120307A1 (en) * 1975-07-07 1976-06-05
DE2537325C3 (en) * 1975-08-21 1979-08-23 Continental Specialties Corp., New Haven, Conn. (V.St.A.) Terminal for the connection of contacts of an electrical component with a test or measuring device
JPH0448542Y2 (en) * 1985-05-16 1992-11-16

Also Published As

Publication number Publication date
DE3828148C2 (en) 1990-05-31
ES2084589T3 (en) 1996-05-16
ATE135498T1 (en) 1996-03-15
EP0355378A3 (en) 1991-03-20
EP0355378A2 (en) 1990-02-28
GR3019319T3 (en) 1996-06-30
DE58909623D1 (en) 1996-04-18
DE3828148A1 (en) 1990-02-22

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