EP0246672A3 - Device for testing and sorting electronic components - Google Patents

Device for testing and sorting electronic components Download PDF

Info

Publication number
EP0246672A3
EP0246672A3 EP87110137A EP87110137A EP0246672A3 EP 0246672 A3 EP0246672 A3 EP 0246672A3 EP 87110137 A EP87110137 A EP 87110137A EP 87110137 A EP87110137 A EP 87110137A EP 0246672 A3 EP0246672 A3 EP 0246672A3
Authority
EP
European Patent Office
Prior art keywords
testing
magazine
component
class
receiving portions
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
EP87110137A
Other languages
English (en)
Other versions
EP0246672A2 (de
EP0246672B1 (de
Inventor
Ekkehard Ueberreiter
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Individual
Original Assignee
Individual
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Individual filed Critical Individual
Priority to AT87110137T priority Critical patent/ATE51166T1/de
Publication of EP0246672A2 publication Critical patent/EP0246672A2/de
Publication of EP0246672A3 publication Critical patent/EP0246672A3/de
Application granted granted Critical
Publication of EP0246672B1 publication Critical patent/EP0246672B1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
    • B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
    • B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
    • B07C5/34—Sorting according to other particular properties
    • B07C5/344—Sorting according to other particular properties according to electric or electromagnetic properties
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
    • B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
    • B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
    • B07C5/36—Sorting apparatus characterised by the means used for distribution

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Branching, Merging, And Special Transfer Between Conveyors (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Die Bonding (AREA)
EP87110137A 1983-11-07 1984-10-31 Vorrichtung zum Prüfen und Sortieren von elektronischen Bauteilen Expired - Lifetime EP0246672B1 (de)

Priority Applications (1)

Application Number Priority Date Filing Date Title
AT87110137T ATE51166T1 (de) 1983-11-07 1984-10-31 Vorrichtung zum pruefen und sortieren von elektronischen bauteilen.

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE3340183 1983-11-07
DE19833340183 DE3340183A1 (de) 1983-11-07 1983-11-07 Vorrichtung zum weiterleiten von bauteilen, insbesondere von integrierten chips, von einem eingangsmagazin zu einem ausgangsmagazin

Related Parent Applications (1)

Application Number Title Priority Date Filing Date
EP84113097.4 Division 1984-10-31

Publications (3)

Publication Number Publication Date
EP0246672A2 EP0246672A2 (de) 1987-11-25
EP0246672A3 true EP0246672A3 (en) 1988-01-20
EP0246672B1 EP0246672B1 (de) 1990-03-21

Family

ID=6213647

Family Applications (2)

Application Number Title Priority Date Filing Date
EP84113097A Expired EP0144715B1 (de) 1983-11-07 1984-10-31 Vorrichtung zum Weiterleiten von Bauteilen, insbesondere von integrierten Chips, von einem Eingangsmagazin zu einnem Ausgangsmagazin
EP87110137A Expired - Lifetime EP0246672B1 (de) 1983-11-07 1984-10-31 Vorrichtung zum Prüfen und Sortieren von elektronischen Bauteilen

Family Applications Before (1)

Application Number Title Priority Date Filing Date
EP84113097A Expired EP0144715B1 (de) 1983-11-07 1984-10-31 Vorrichtung zum Weiterleiten von Bauteilen, insbesondere von integrierten Chips, von einem Eingangsmagazin zu einnem Ausgangsmagazin

Country Status (4)

Country Link
US (1) US4694964A (de)
EP (2) EP0144715B1 (de)
AT (2) ATE36659T1 (de)
DE (3) DE3340183A1 (de)

Families Citing this family (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3531142A1 (de) * 1985-06-04 1986-12-04 Ekkehard 8011 Zorneding Ueberreiter Einrichtung zum pruefen und sortieren von elektronischen bauelementen, insbesondere integrierten chips
US4889242A (en) * 1985-06-04 1989-12-26 Multitest Elektronische Systeme Device for testing and sorting electronic components, more particularly integrated circuit chips
DE3638431A1 (de) * 1986-11-11 1988-05-26 Multitest Elektronische Syst Einrichtung zum testen und sortieren von elektronischen bauelementen, insbesondere von dual-in-line-ic's
DE3638430A1 (de) * 1986-11-11 1988-05-19 Multitest Elektronische Syst Vorrichtung zum testen und sortieren von elektronischen bauelementen, insbesondere ic's
US4926118A (en) * 1988-02-22 1990-05-15 Sym-Tek Systems, Inc. Test station
DE3912589A1 (de) * 1989-04-17 1990-10-25 Ekkehard Ueberreiter Einrichtung zum testen von elektronischen bauelementen mit einer ladestation, einer teststation und eine entladestation fuer die bauelemente
US5184068A (en) * 1990-09-24 1993-02-02 Symtek Systems, Inc. Electronic device test handler
JP3224483B2 (ja) * 1994-12-05 2001-10-29 富士通株式会社 ライブラリ装置及びその装置による複写ディスク選別方法
JP3417528B2 (ja) * 1996-04-05 2003-06-16 株式会社アドバンテスト Ｉｃ試験装置
TW358162B (en) * 1996-06-04 1999-05-11 Advantest Corp Semiconductor device testing apparatus
JP3344548B2 (ja) 1997-04-16 2002-11-11 株式会社アドバンテスト Ｉｃ試験装置
US5940466A (en) * 1997-10-29 1999-08-17 Micron Electronics, Inc. Apparatus for counting parts in a tray
US6112940A (en) * 1998-01-16 2000-09-05 Micron Electronics, Inc. Vertical magazine apparatus for integrated circuit device dispensing, receiving or storing
US6135291A (en) 1998-01-16 2000-10-24 Micron Electronics, Inc. Vertical magazine method for integrated circuit device dispensing, receiving, storing, testing or binning
US5998751A (en) * 1998-02-20 1999-12-07 Micron Electronics, Inc. Sorting system for computer chips
US5996996A (en) * 1998-02-20 1999-12-07 Micron Electronics, Inc. Method of sorting computer chips
US6563070B2 (en) 1999-03-30 2003-05-13 Micron Technology, Inc. Enhanced grading and sorting of semiconductor devices using modular “plug-in” sort algorithms
KR100972502B1 (ko) * 2003-12-30 2010-07-26 엘지디스플레이 주식회사 액정표시장치의 등급표시 자동화 장치 및 이의 동작 방법
US9193525B2 (en) * 2014-03-12 2015-11-24 Asm Technology Singapore Pte Ltd Apparatus for handling electronic components

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2008521A1 (de) * 1969-02-24 1970-09-10 International Business Machines Corp., Armonk, N.Y. (V.St.A.) Sortiermaschine, insbesondere Maschine zum Sortieren von Postsendungen
US3727757A (en) * 1972-06-12 1973-04-17 C Boissicat Dip handling apparatus
US3896935A (en) * 1973-11-26 1975-07-29 Ramsey Eng Co Integrated circuit handler
EP0007650A1 (de) * 1978-06-23 1980-02-06 Contrel Corporation Maschinelle Handhabung von, mit integrierten Schaltungen versehenen, Bauteilen mit doppelreihigen Leitungsanschlüssen

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US431699A (en) * 1890-07-08 Pneumatic dispatch-tube
US3032191A (en) * 1959-04-20 1962-05-01 Sylvania Electric Prod Testing and sorting apparatus
US3017025A (en) * 1960-04-26 1962-01-16 Western Electric Co Apparatus for distributing an article to one of several receiving locations
US3142382A (en) * 1962-03-12 1964-07-28 Motorola Inc Comprehensive testing system
US3716786A (en) * 1970-10-02 1973-02-13 Cogar Corp Module tester and sorter for use in a module test system
US3664499A (en) * 1970-11-06 1972-05-23 Fairchild Camera Instr Co High speed automatic sequential tester-handler
US4170290A (en) * 1977-02-28 1979-10-09 Motorola, Inc. Lift and feed mechanism for high speed integrated circuit handler
US4230985A (en) * 1978-01-12 1980-10-28 Fairchild Camera And Instrument Corporation Fixturing system
JPS5937785B2 (ja) * 1978-08-18 1984-09-12 松下電器産業株式会社 電子部品検査装置
DE2855913C2 (de) * 1978-12-23 1983-05-19 Licentia Patent-Verwaltungs-Gmbh, 6000 Frankfurt Vorrichtung zum Sortieren von Bauelementen
JPS5677765A (en) * 1979-11-28 1981-06-26 Tokyo Seimitsu Co Ltd Measurement/selection device of semiconductor device
SU980027A1 (ru) * 1981-01-12 1982-12-07 Предприятие П/Я А-1178 Устройство автоматического контрол электронных систем
SU970386A1 (ru) * 1981-02-11 1982-10-30 Кировский Политехнический Институт Устройство дл разбраковки изделий на группы
US4478352A (en) * 1982-05-19 1984-10-23 Micro Component Technology, Inc. Integrated circuit component handler singulation apparatus

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2008521A1 (de) * 1969-02-24 1970-09-10 International Business Machines Corp., Armonk, N.Y. (V.St.A.) Sortiermaschine, insbesondere Maschine zum Sortieren von Postsendungen
US3727757A (en) * 1972-06-12 1973-04-17 C Boissicat Dip handling apparatus
US3896935A (en) * 1973-11-26 1975-07-29 Ramsey Eng Co Integrated circuit handler
EP0007650A1 (de) * 1978-06-23 1980-02-06 Contrel Corporation Maschinelle Handhabung von, mit integrierten Schaltungen versehenen, Bauteilen mit doppelreihigen Leitungsanschlüssen

Also Published As

Publication number Publication date
DE3340183A1 (de) 1985-05-15
EP0144715A1 (de) 1985-06-19
ATE36659T1 (de) 1988-09-15
ATE51166T1 (de) 1990-04-15
EP0144715B1 (de) 1988-08-24
EP0246672A2 (de) 1987-11-25
EP0246672B1 (de) 1990-03-21
DE3481687D1 (de) 1990-04-26
DE3473573D1 (en) 1988-09-29
US4694964A (en) 1987-09-22

Similar Documents

Publication Publication Date Title
EP0246672A3 (en) Device for testing and sorting electronic components
DE3681877D1 (de) Vorrichtung zum pruefen und sortieren von elektronischen bauelementen.
SG90713A1 (en) Semiconductor device testing apparatus and semiconductor device testing system having a plurality of semiconductor device testing apparatus
DE3382311D1 (en) Online-monitor.
IT1230685B (it) Collaudo di circuiti integrati presenti su un supporto
GB2085171B (en) Lsi chip logic testing system resident on an lsi chip
TW352466B (en) Apparatus and method for testing integrated circuit
DE3854014D1 (de) Quergekoppelte Prüfschaltung.
ATE34680T1 (de) Vorrichtung zum weiterleiten von bauteilen, insbesondere von integrierten chips, einem eingangsmagazin zu einem ausgangsmagazin.
DE3377947D1 (en) Device for testing a large scale integrated microprogramme-controlled electronic component
ATE50878T1 (de) Vorrichtung zum pruefen von aufzeichnungstraegern.
DE3486243D1 (de) Elektronischer Einzelbildspeicher mit Schnellsortierung und Verfahren zu seinem Betrieb.
DE69021105D1 (de) Verfahren und Gerät zur Prüfung von integrierten Schaltungen mit hoher Geschwindigkeit.
DE3472593D1 (en) Device for testing and sorting of electronic components, especially of integrated circuits
MY122556A (en) Device for testing connections provided with pulling resistors
JPS5741766A (en) Remote monitor system of automatic transaction system
KR970060442A (ko) 재 선별용 스톡커를 가지는 오토핸들러
DE3853327D1 (de) Testmethode für elektronische Schaltungen.
JPS6413477A (en) Testing device for integrated circuit
JPS5798051A (en) Memory system of scan in/out data
JPS573297A (en) Inspecting method for rom built in controller
Burtness An Electronic Approach to Sortation Control
JPS5339026A (en) Reading exclusive ic memory
JPS5719849A (en) Automatic inspection system of electronic device
JPS6469967A (en) Extracting method of ic device

Legal Events

Date Code Title Description
PUAI Public reference made under article 153(3) epc to a published international application that has entered the european phase

Free format text: ORIGINAL CODE: 0009012

AC Divisional application: reference to earlier application

Ref document number: 144715

Country of ref document: EP

AK Designated contracting states

Kind code of ref document: A2

Designated state(s): AT BE CH DE FR GB IT LI LU NL SE

PUAL Search report despatched

Free format text: ORIGINAL CODE: 0009013

AK Designated contracting states

Kind code of ref document: A3

Designated state(s): AT BE CH DE FR GB IT LI LU NL SE

17P Request for examination filed

Effective date: 19880718

17Q First examination report despatched

Effective date: 19881007

GRAA (expected) grant

Free format text: ORIGINAL CODE: 0009210

AC Divisional application: reference to earlier application

Ref document number: 144715

Country of ref document: EP

AK Designated contracting states

Kind code of ref document: B1

Designated state(s): AT BE CH DE FR GB IT LI LU NL SE

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: IT

Free format text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRE;WARNING: LAPSES OF ITALIAN PATENTS WITH EFFECTIVE DATE BEFORE 2007 MAY HAVE OCCURRED AT ANY TIME BEFORE 2007. THE CORRECT EFFECTIVE DATE MAY BE DIFFERENT FROM THE ONE RECORDED.SCRIBED TIME-LIMIT

Effective date: 19900321

Ref country code: BE

Effective date: 19900321

Ref country code: FR

Effective date: 19900321

Ref country code: NL

Effective date: 19900321

Ref country code: GB

Effective date: 19900321

Ref country code: SE

Effective date: 19900321

REF Corresponds to:

Ref document number: 51166

Country of ref document: AT

Date of ref document: 19900415

Kind code of ref document: T

REF Corresponds to:

Ref document number: 3481687

Country of ref document: DE

Date of ref document: 19900426

EN Fr: translation not filed
NLV1 Nl: lapsed or annulled due to failure to fulfill the requirements of art. 29p and 29m of the patents act
GBV Gb: ep patent (uk) treated as always having been void in accordance with gb section 77(7)/1977 [no translation filed]
PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: CH

Effective date: 19901031

Ref country code: LI

Effective date: 19901031

Ref country code: LU

Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES

Effective date: 19901031

Ref country code: AT

Effective date: 19901031

PLBE No opposition filed within time limit

Free format text: ORIGINAL CODE: 0009261

STAA Information on the status of an ep patent application or granted ep patent

Free format text: STATUS: NO OPPOSITION FILED WITHIN TIME LIMIT

26N No opposition filed
REG Reference to a national code

Ref country code: CH

Ref legal event code: PL

PGFP Annual fee paid to national office [announced via postgrant information from national office to epo]

Ref country code: DE

Payment date: 19931228

Year of fee payment: 10

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: DE

Effective date: 19950701