DE3481687D1 - Vorrichtung zum pruefen und sortieren von elektronischen bauteilen. - Google Patents

Vorrichtung zum pruefen und sortieren von elektronischen bauteilen.

Info

Publication number
DE3481687D1
DE3481687D1 DE8787110137T DE3481687T DE3481687D1 DE 3481687 D1 DE3481687 D1 DE 3481687D1 DE 8787110137 T DE8787110137 T DE 8787110137T DE 3481687 T DE3481687 T DE 3481687T DE 3481687 D1 DE3481687 D1 DE 3481687D1
Authority
DE
Germany
Prior art keywords
testing
magazine
component
class
receiving portions
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE8787110137T
Other languages
English (en)
Inventor
Ekkehard Ueberreiter
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Individual
Original Assignee
Individual
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Individual filed Critical Individual
Priority to DE8787110137T priority Critical patent/DE3481687D1/de
Application granted granted Critical
Publication of DE3481687D1 publication Critical patent/DE3481687D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
    • B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
    • B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
    • B07C5/34—Sorting according to other particular properties
    • B07C5/344—Sorting according to other particular properties according to electric or electromagnetic properties
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
    • B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
    • B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
    • B07C5/36—Sorting apparatus characterised by the means used for distribution

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Branching, Merging, And Special Transfer Between Conveyors (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Die Bonding (AREA)
DE8787110137T 1983-11-07 1984-10-31 Vorrichtung zum pruefen und sortieren von elektronischen bauteilen. Expired - Lifetime DE3481687D1 (de)

Priority Applications (1)

Application Number Priority Date Filing Date Title
DE8787110137T DE3481687D1 (de) 1983-11-07 1984-10-31 Vorrichtung zum pruefen und sortieren von elektronischen bauteilen.

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE19833340183 DE3340183A1 (de) 1983-11-07 1983-11-07 Vorrichtung zum weiterleiten von bauteilen, insbesondere von integrierten chips, von einem eingangsmagazin zu einem ausgangsmagazin
DE8787110137T DE3481687D1 (de) 1983-11-07 1984-10-31 Vorrichtung zum pruefen und sortieren von elektronischen bauteilen.

Publications (1)

Publication Number Publication Date
DE3481687D1 true DE3481687D1 (de) 1990-04-26

Family

ID=6213647

Family Applications (3)

Application Number Title Priority Date Filing Date
DE19833340183 Withdrawn DE3340183A1 (de) 1983-11-07 1983-11-07 Vorrichtung zum weiterleiten von bauteilen, insbesondere von integrierten chips, von einem eingangsmagazin zu einem ausgangsmagazin
DE8787110137T Expired - Lifetime DE3481687D1 (de) 1983-11-07 1984-10-31 Vorrichtung zum pruefen und sortieren von elektronischen bauteilen.
DE8484113097T Expired DE3473573D1 (en) 1983-11-07 1984-10-31 Device for transferring components, in particular integrated chips, from an input tray to an output tray

Family Applications Before (1)

Application Number Title Priority Date Filing Date
DE19833340183 Withdrawn DE3340183A1 (de) 1983-11-07 1983-11-07 Vorrichtung zum weiterleiten von bauteilen, insbesondere von integrierten chips, von einem eingangsmagazin zu einem ausgangsmagazin

Family Applications After (1)

Application Number Title Priority Date Filing Date
DE8484113097T Expired DE3473573D1 (en) 1983-11-07 1984-10-31 Device for transferring components, in particular integrated chips, from an input tray to an output tray

Country Status (4)

Country Link
US (1) US4694964A (de)
EP (2) EP0144715B1 (de)
AT (2) ATE51166T1 (de)
DE (3) DE3340183A1 (de)

Families Citing this family (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3531120C2 (de) * 1985-06-04 1994-02-03 Ekkehard Ueberreiter Einrichtung zum Prüfen und Sortieren von elektronischen Bauelementen, insbesondere integrierten Chips
US4889242A (en) * 1985-06-04 1989-12-26 Multitest Elektronische Systeme Device for testing and sorting electronic components, more particularly integrated circuit chips
DE3638430A1 (de) * 1986-11-11 1988-05-19 Multitest Elektronische Syst Vorrichtung zum testen und sortieren von elektronischen bauelementen, insbesondere ic's
DE3638431A1 (de) * 1986-11-11 1988-05-26 Multitest Elektronische Syst Einrichtung zum testen und sortieren von elektronischen bauelementen, insbesondere von dual-in-line-ic's
US4926118A (en) * 1988-02-22 1990-05-15 Sym-Tek Systems, Inc. Test station
DE3912589A1 (de) * 1989-04-17 1990-10-25 Ekkehard Ueberreiter Einrichtung zum testen von elektronischen bauelementen mit einer ladestation, einer teststation und eine entladestation fuer die bauelemente
US5184068A (en) * 1990-09-24 1993-02-02 Symtek Systems, Inc. Electronic device test handler
JP3224483B2 (ja) * 1994-12-05 2001-10-29 富士通株式会社 ライブラリ装置及びその装置による複写ディスク選別方法
JP3417528B2 (ja) * 1996-04-05 2003-06-16 株式会社アドバンテスト Ｉｃ試験装置
US5909657A (en) * 1996-06-04 1999-06-01 Advantest Corporation Semiconductor device testing apparatus
JP3344548B2 (ja) 1997-04-16 2002-11-11 株式会社アドバンテスト Ｉｃ試験装置
US5940466A (en) * 1997-10-29 1999-08-17 Micron Electronics, Inc. Apparatus for counting parts in a tray
US6135291A (en) * 1998-01-16 2000-10-24 Micron Electronics, Inc. Vertical magazine method for integrated circuit device dispensing, receiving, storing, testing or binning
US6112940A (en) * 1998-01-16 2000-09-05 Micron Electronics, Inc. Vertical magazine apparatus for integrated circuit device dispensing, receiving or storing
US5998751A (en) * 1998-02-20 1999-12-07 Micron Electronics, Inc. Sorting system for computer chips
US5996996A (en) * 1998-02-20 1999-12-07 Micron Electronics, Inc. Method of sorting computer chips
US6563070B2 (en) 1999-03-30 2003-05-13 Micron Technology, Inc. Enhanced grading and sorting of semiconductor devices using modular “plug-in” sort algorithms
KR100972502B1 (ko) * 2003-12-30 2010-07-26 엘지디스플레이 주식회사 액정표시장치의 등급표시 자동화 장치 및 이의 동작 방법
US9193525B2 (en) * 2014-03-12 2015-11-24 Asm Technology Singapore Pte Ltd Apparatus for handling electronic components

Family Cites Families (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US431699A (en) * 1890-07-08 Pneumatic dispatch-tube
US3032191A (en) * 1959-04-20 1962-05-01 Sylvania Electric Prod Testing and sorting apparatus
US3017025A (en) * 1960-04-26 1962-01-16 Western Electric Co Apparatus for distributing an article to one of several receiving locations
US3142382A (en) * 1962-03-12 1964-07-28 Motorola Inc Comprehensive testing system
US3573748A (en) * 1969-02-24 1971-04-06 Ibm Postal system
US3716786A (en) * 1970-10-02 1973-02-13 Cogar Corp Module tester and sorter for use in a module test system
US3664499A (en) * 1970-11-06 1972-05-23 Fairchild Camera Instr Co High speed automatic sequential tester-handler
US3727757A (en) * 1972-06-12 1973-04-17 C Boissicat Dip handling apparatus
US3896935A (en) * 1973-11-26 1975-07-29 Ramsey Eng Co Integrated circuit handler
US4170290A (en) * 1977-02-28 1979-10-09 Motorola, Inc. Lift and feed mechanism for high speed integrated circuit handler
US4230985A (en) * 1978-01-12 1980-10-28 Fairchild Camera And Instrument Corporation Fixturing system
US4234418A (en) * 1978-06-23 1980-11-18 Contrel Corporation Dip-handling apparatus
JPS5937785B2 (ja) * 1978-08-18 1984-09-12 松下電器産業株式会社 電子部品検査装置
DE2855913C2 (de) * 1978-12-23 1983-05-19 Licentia Patent-Verwaltungs-Gmbh, 6000 Frankfurt Vorrichtung zum Sortieren von Bauelementen
JPS5677765A (en) * 1979-11-28 1981-06-26 Tokyo Seimitsu Co Ltd Measurement/selection device of semiconductor device
SU980027A1 (ru) * 1981-01-12 1982-12-07 Предприятие П/Я А-1178 Устройство автоматического контрол электронных систем
SU970386A1 (ru) * 1981-02-11 1982-10-30 Кировский Политехнический Институт Устройство дл разбраковки изделий на группы
US4478352A (en) * 1982-05-19 1984-10-23 Micro Component Technology, Inc. Integrated circuit component handler singulation apparatus

Also Published As

Publication number Publication date
ATE51166T1 (de) 1990-04-15
EP0246672A3 (en) 1988-01-20
EP0144715A1 (de) 1985-06-19
DE3340183A1 (de) 1985-05-15
EP0144715B1 (de) 1988-08-24
EP0246672B1 (de) 1990-03-21
DE3473573D1 (en) 1988-09-29
EP0246672A2 (de) 1987-11-25
US4694964A (en) 1987-09-22
ATE36659T1 (de) 1988-09-15

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee