EP0245805B1 - Münzenprüfeinrichtung - Google Patents

Münzenprüfeinrichtung Download PDF

Info

Publication number
EP0245805B1
EP0245805B1 EP87106761A EP87106761A EP0245805B1 EP 0245805 B1 EP0245805 B1 EP 0245805B1 EP 87106761 A EP87106761 A EP 87106761A EP 87106761 A EP87106761 A EP 87106761A EP 0245805 B1 EP0245805 B1 EP 0245805B1
Authority
EP
European Patent Office
Prior art keywords
coin
support
probes
checking
distance
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
EP87106761A
Other languages
German (de)
English (en)
French (fr)
Other versions
EP0245805A2 (de
EP0245805A3 (en
Inventor
Fritz Siegenthaler
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Ascom Autelca AG
Original Assignee
Ascom Autelca AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ascom Autelca AG filed Critical Ascom Autelca AG
Priority to AT87106761T priority Critical patent/ATE79190T1/de
Publication of EP0245805A2 publication Critical patent/EP0245805A2/de
Publication of EP0245805A3 publication Critical patent/EP0245805A3/de
Application granted granted Critical
Publication of EP0245805B1 publication Critical patent/EP0245805B1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Images

Classifications

    • GPHYSICS
    • G07CHECKING-DEVICES
    • G07DHANDLING OF COINS OR VALUABLE PAPERS, e.g. TESTING, SORTING BY DENOMINATIONS, COUNTING, DISPENSING, CHANGING OR DEPOSITING
    • G07D5/00Testing specially adapted to determine the identity or genuineness of coins, e.g. for segregating coins which are unacceptable or alien to a currency
    • G07D5/08Testing the magnetic or electric properties
    • GPHYSICS
    • G07CHECKING-DEVICES
    • G07DHANDLING OF COINS OR VALUABLE PAPERS, e.g. TESTING, SORTING BY DENOMINATIONS, COUNTING, DISPENSING, CHANGING OR DEPOSITING
    • G07D5/00Testing specially adapted to determine the identity or genuineness of coins, e.g. for segregating coins which are unacceptable or alien to a currency
    • G07D5/02Testing the dimensions, e.g. thickness, diameter; Testing the deformation

Definitions

  • the invention relates to a coin checking device for checking coins of any diameter.
  • the diameter of the coin is checked either mechanically or inductively.
  • the mechanical check is carried out according to the principle used in conventional limit gauges, for example by dimensioning the coin slot so that coins whose diameter exceeds an upper limit cannot pass and the inclined coin channel has a side window through the coins whose diameter falls below a lower limit, fall out.
  • EP-A2-0 122 732 For each type of coin to be accepted, this requires a separate, individually adapted coin insertion slot and a separate coin channel with an individually adapted window. Converting the slot and the channel with the window of one Diameter range to another is complex, and an actual diameter measurement is not possible in this way.
  • the coin influences the field of a coil excited with high frequency in a mass dependent on the coin diameter, from which an analog signal is obtained which can be used to recognize whether the coin has the diameter of the coin to be accepted (US Pat. No. 4,108 296).
  • the conversion from one diameter range to another is also complex, even if the signal is converted from analog to digital and evaluated in a microprocessor; because there is no linear relationship between the coin diameter and the signal size because of the stray field of the coil, so that the coin validator cannot simply be programmed for another coin diameter. Rather, the signal size assigned to the other coin diameter must first be determined empirically and reprogrammed according to this size.
  • the invention seeks to remedy this.
  • the invention as characterized in claim 1, solves the problem of creating a coin checking device which provides a control variable which is mathematically defined as a function of the distance between the sensors when they strike the edge of the coin.
  • the thrust drive is preferably a linear gear driven by a stepper motor (linear relationship between input rotation and output thrust), a counter counts the impulses driving the stepper motor starting from a predetermined distance of the sensors up to their abutment on the edge of the coin, and in a microprocessor Subtraction of the pulse number from a constant formed a signal proportional to the coin diameter.
  • the size depending on the distance of the sensors can in particular also the position of one or two support members be, which are moved by means of a gear driven together with the thrust drive, expediently cam gear, so that at the respective distance of the sensors a coin, the diameter of which corresponds to this distance, in a position for supporting this coin in a coaxial to the coil field of an inductive testing device Hold position.
  • the sensors and the thrust drive can be arranged in a test station, the test coil or two coaxial test coils for inductive coin testing can be arranged together with one or two support members in the same or a second test station arranged below this.
  • the common or only the second test station can be displaceable in order to distribute the tested coins into different memories or channels leading to them, the displacement of the second test station, if implemented accordingly, enables the diameter of the next coin to be measured while the second test station is still on the move.
  • the advantages achieved by the invention are essentially to be seen in the fact that a signal which corresponds exactly to the coin diameter, in particular proportional, can be obtained, so that if the device is equipped with a microprocessor, it is programmed directly for the coin diameter (s) and therefore simple and can be quickly converted for other coins, and that the coins in the inductive test are independent of the coin diameter in a position concentric to the coil field, in which the test is much more accurate and reliable is. Since each coin is supported during inductive testing, a test coil can be pressed on one side or two coaxial test coils opposite each other on both sides of the coin to further improve the accuracy and reliability of this test.
  • a measurement value for the exact determination of the coin thickness can be derived from the position of the organ exerting the pressure.
  • acceptable coins can be distinguished much more critically from unacceptable ones.
  • the combination of all tests in one or all tests with the exception of the diameter test in the second test station is space-saving, especially if the second test station is located directly below the first. This, as well as the type of distribution of the tested coins, avoids coin channels and coin spools prone to failure. Further details and advantages will appear from the following description.
  • a first test station 1 (FIGS. 2 and 4) with a fixed and a displaceable sensor 2 and 3 for measuring the diameter of the coin 5 supported by a support 4:
  • a second test station 8 (FIGS. 2 and 3) with two coaxial test coils 9 and 10 for inductive testing of the coin alloy and two support members 11 and 12 for supporting the coin 13 in a position centered with respect to the coils 9 and 10.
  • the test coil 10 is fixed and the test coil 9 is slidably arranged to inductively test the coin 13 on both test coils 9 and 10, the thickness of the coin 13 being the distance between the test coils 9 and 10 and the coin between them Coils can be held when the support members 11 and 12 leave their position supporting the coin 13.
  • the second test station 8 is in its rest position shown below the first test station 1, so that the coin 5 falls directly between the test coils 9 and 10 and support members 11 and 12 into the position designated 13 when the support 4 is pivoted to the side (arrow 15, Fig. 2).
  • a thrust cam gear (FIGS. 2 and 3) with a first gear stage 18, 19 which is driven together with the displaceable sensor 3 and which moves the support members 11 and 12 in such a way that, at the respective distance between the sensors 2 and 3, a coin 13 whose diameter corresponds to this distance corresponds to support in a coaxial position to the test coils 9 and 10 when the second test station 8 is in its (shown) rest position under the first test station 1 is; and with a second gear stage 23, 24, which moves the support members 11 and 12 into a position which is not suitable for supporting a coin, regardless of the state of the first gear stage 18, 19, when the second test station 8 leaves its rest position in the direction of arrow 25, and the support members 11 and 12 return to the position dependent on the distance between the sensors 2 and 3 when the second test station 8 approaches its rest position again.
  • a displacement drive 27-30 (FIG. 1) through which the second test station 8 can be displaced on a displacement path 32, 33 to one of a plurality of coin outlets 35, 36 of the coin inspection device.
  • the output 35 leads into a return channel (not shown) for coins not accepted.
  • Each of the outputs 36 leads to a memory (not shown) for one of the coin types to be accepted.
  • the first coin checking station 1 (FIGS. 2 and 4) includes a thrust drive with a reversible stepper motor 39, which drives a pinion 40 of a rack and pinion gear 40, 41. At one end of the rack 41, the displaceable sensor 3 is formed.
  • the sensors 2 and 3 have parallel touch surfaces 43, 44 and are arranged on one side of a plate 46 which forms a guide surface for one side of the coin 5. A guide surface for the other side of the coin is not shown. The distance between these guide surfaces is slightly larger than the thickness of the thickest coin. The play of the coin between these guide surfaces has no influence on the measurement of the coin diameter.
  • the support 4 can be moved laterally in the direction of the arrow 15 by means of a swivel mechanism, of which only the swivel arm 48 is shown.
  • a sensor coil 50 for controlling the coin checking device is inserted into the plate 46.
  • a coin falls from a coin feed device (not shown) into the first test station 1 in the direction of the arrow 52
  • a signal is triggered by the sensor coil 50, which causes and maintains the locked state of a lock provided in the coin feed device until this coin 5 leaves the first test station 1 has by moving the support 4 out of its illustrated position supporting the coin 5 in the direction of arrow 15 in order to release the coin 5 into the second test station 8.
  • the stepper motor 39 is started in the feed direction of the sensor 3 by the signal from the sensor coil 50 triggered when the coin 5 arrives.
  • a counter 54 counts the pulses which drive the stepper motor 39, starting from a predetermined initial distance between the sensors 2 and 3, until both sensors 2 and 3 are pressed against the edge of the coin 5. The counted number of pulses corresponds to the sensor feed distance.
  • the microprocessor of the device determines the diameter of the coin 5 by subtracting the feed distance (or the corresponding number of pulses) from a constant given by the initial distance between the sensors 2 and 3, and checks in the usual way whether the coin 5 has one due to its diameter acceptable coin.
  • the second test station 8 (FIGS. 2 and 3) includes a gear transmission 57, 58 for symmetrically pivoting the support members 11 and 12, a magnetic coil 60 with plunger armature 61 Move the coil 9 and an inductive transmitter 63, 64, which provides a signal dependent on the position of the coil 9 for measuring the thickness of the coin 13.
  • the second test station 8 is designed as a slide which is guided by means of rollers 66, 67 to the rails 32 and 33 forming the sliding track and is displaceable by means of the sliding drive 27-30 described in more detail below. In its illustrated rest position, which serves for inductive coin checking, the second checking station 8 is below the first checking station 1 such that a coin dropped by actuation of the support 4 falls directly between the coils 9 and 10 and supporting members 11 and 12.
  • the parts of the second test station 8 are arranged on a support plate 69 on which the rollers 66 and 67 are mounted.
  • a support plate 69 On the support plate 69, two bodies 71 and 72 made of insulating material are held at a distance from one another by bolts 74.
  • the test coil 9 is axially displaceably mounted in the body 71, the other test coil 10 is permanently installed in the body 72.
  • the pivotable support members 11 and 12 are arranged between the bodies 71 and 72, and they each sit on a shaft 76 and 77, respectively, which are mounted in bores in the bodies 71 and 72. On each shaft 76 and 77 there is one of two intermeshing gear segments 57 and 58 which form the gear transmission.
  • the test coil 9 is loaded by a compression spring 79 (only partially shown) in the direction of the test coil 10 and is firmly connected to the plunger armature 61, to which the magnet coil 60 is assigned, and a plate 64 made of magnetically conductive material, which together with an induction coil 63 forms the inductive transmitter with which a signal proportional to the thickness of the coin 13 is generated when the coil 60 is not energized, so that the spring 79 connects the test coil 9 to the coin 11 and thereby presses the coin 11 onto the test coil 10.
  • the mutually facing end faces of the test coils 9 and 10 have thin supports with slightly spherically curved outer surfaces. This ensures that any curvature of the coin does not influence the inductive test or the test of the coin thickness.
  • the transmitter is designed so that its measured value is a linear function of the coin thickness, so that it can be obtained simply by subtracting the measured value from a constant.
  • the thrust cam gear (FIGS. 2 and 3) has in its first gear stage a cam carrier 18 (see also FIG. 4) which is fixedly connected to the sensor 3 and on the curve 81 of which a pin 19 is guided.
  • the pin 19 is fixedly connected to the cam supports 23 of the second gear stage, which is vertically displaceable by means of bolts 84, 85 fastened to the rear wall 83 of the housing, which are guided in elongated holes 87, 88 (FIG. 3) of the cam support 23.
  • a pin 24 is guided, which is attached to the gear segment 57 eccentrically, so that it forms a crank pin for pivoting the support members 11 and 12.
  • Stops not shown, limit the rotatability of the gear segments 57 and 58, and a return spring, not shown, strives to keep the support members 11 and 12 at a distance from each other at which they no longer support the coin 13.
  • This return spring also ensures a frictional connection of the second gear stage 23, 24.
  • the pin 24 In the shown rest position of the second test station 8, the pin 24 lies on a slope-free part 91 of the curve 90 of the cam carrier 23. The pin 24 follows the vertical output movement of the first gear stage 18, 19.
  • its curve 81 is straight and the other facing support surfaces 93 and 94 of the support members 11 and 12 are curved so that they concave keep a coin 13, the diameter of which corresponds to this distance, centered with respect to the test coils 9 and 10 at the respective distance between the sensors 2 and 3.
  • this can also be achieved with straight support members and a curved curve 81, or in that both the curve 81 and the support surfaces 93, 94 are curved.
  • the relationship between the vertical movement of the crank pin 24 and the rotation of the gear segments 57 and 58 is not linear.
  • the displacement drive (FIG. 1) for displacing the second test station 8 on the displacement path formed by the rails 32 and 33 is a cable drive with a practically inextensible cable 27, a deflection roller 28 and a cable drum 30 driven by a stepping motor 29.
  • the second test station 8 is connected to a point of one of the dreams of the rope 27.
  • the ends of the rope 27 are fastened to the rope drum 30, and end pieces of the rope 27 adjoining these ends are wound onto the rope drum 30 in opposite directions, so that when the rope drum 30 rotates, the rope 27 is wound at one end and at the other end is handled. In this way, a slippage of the rope 27 is prevented and the second test station 8 is shifted by a distance that is exactly that Number of impulses corresponding to the stepping motor 29 and thereby the cable drum 30.
  • sensors 2 and 3 have the predetermined initial distance, which is larger than the diameter of the largest of the coins to be accepted.
  • the support 4 and the second test station 8 are in their position shown in the drawings.
  • a coin arriving from the coin feed device in the direction of arrow 52 falls between the sensors 2 and 3 on the support 4 (coin 5 in FIGS. 2 and 4).
  • the signal triggered by the sensor coil 50 (FIG. 2) starts the stepping motor 39 (FIG. 4), which feeds the sensor 3 until it hits the coin 5 and the coin 5 on the sensor 2.
  • the pin 19 runs on the curve 81 of the first cam carrier 18 (FIG.
  • the counter 54 counts the pulses driving the stepping motor 39.
  • the microprocessor determines the coin diameter from the counted number of pulses. After the sensor has advanced, the support 4 is temporarily pivoted to the side (arrow 15, FIG. 2) in order to release the coin 5 into the second test station 8.
  • the sensors 2 and 3 are also released from the coin 5 in that the motor 39 is driven in the retracting direction of the sensor 3 by a certain small number of pulses.
  • This small retreat distance is the shape of the Support surfaces of the support members 11 and 12 (or in the course of curve 81) are taken into account.
  • the coin falls between the blocks 71 and 72 or test coils 9 and 10 and the support members 11 and 12 which support the coin in the bearing, which is centered in relation to the coils 9 and 10 and is designated by 13.
  • the magnet coil 60 is energized to pull the coil 9 back against the force of the compression spring 79 to such an extent that it does not protrude into the space between the blocks 71 and 72.
  • the excitation of the magnet coil 60 is switched off, whereupon the coil 9 contacts the coin 13 and this coin under the action of the spring 79 the test coil 10 is pressed. While the test coils 9 and 10 lie opposite one another on the coin 7, this is tested inductively in a manner known per se.
  • a signal for measuring the thickness of the coin 7 is generated by means of the transmitter 63, 64.
  • the stepping motor 39 is driven to retract the sensor 3 in its initial position.
  • the pin 19 runs downward on the curve 81 (FIGS. 3 and 4) and moves the cam carrier 23 and thus the crank pin 24 downward, so that the support members 11 and 12 diverge and no longer support the coin 13.
  • the coin 13 is still held in the second test station 8 because it is held between the test coils 9 and 10 under the action of the compression spring 79.
  • the microprocessor uses the measured diameter and the measured thickness and the result of the inductive test to determine whether the coin 13 is acceptable. Is if it is not acceptable, the magnetic coil 60 is briefly energized, the coil 9 being withdrawn and the coin 13 no longer supported by the support members 11 and 12 falling through the outlet 35 (FIGS. 1 and 2) into the coin return channel (not shown).
  • the second test station 8 is pushed by means of the shift drive 27 to 30 (FIG. 1) to that of the outputs 36, which leads into the coin store (not shown) provided for the coin type in question, and that Coin 13 is released into this coin store by briefly exciting magnetic coil 60.
  • the second test station 8 is then pushed back into its rest position. If a further coin has meanwhile reached the first test station 1, its sensors 2 and 3 have already the distance corresponding to the diameter of this coin.
  • crank pin 24 runs on the curve 90 on the curve part 91 thereof in the position in which the support members 11 and 12 receive this coin in the position centered with respect to the test coils 9 and 10, when it falls into the second test station 8, where it is tested and from which it is released through one of the exits 35 and 36, as previously described.
  • the coin checking device for example, another linear gear or a gear whose output thrust is not a linear function of the drive rotation can be used instead of the rack and pinion gear 40, 41.
  • the diameter of the coin can be determined precisely because the function is mathematically defined by the geometry of the gear so that it can be taken into account in the microprocessor.
  • the sensors 2, 3 could, for example, also be displaceable in opposite directions by means of two toothed racks meshing with opposite sides of the pinion 40 or by means of a spindle having a left-hand and a right-hand thread, with a single support member which can be displaced perpendicularly to the sensors in relation to the coin supported laterally on the sensors supported on one or two coaxial test coils.
  • the required displacement of the support member is proportional to the displacement of each of the sensors.
  • the two gearwheel segments 57 and 58 can be replaced by means having the same effect, for example two cranks connected to one another by a push rod, and instead of being pivoted in opposite directions, they can also be displaced in opposite directions.
  • a support member that can be displaced perpendicular to the sensors with two downwardly converging support surfaces for supporting the coin at two mutually opposite edge locations could be provided, which, like the aforementioned support member, can be displaced, for example, parallel to the test coil axis by to drop the coin.

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Coins (AREA)
  • Control Of Vending Devices And Auxiliary Devices For Vending Devices (AREA)
  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
  • Polyoxymethylene Polymers And Polymers With Carbon-To-Carbon Bonds (AREA)
  • Lubricants (AREA)
  • Organic Insulating Materials (AREA)
EP87106761A 1986-05-14 1987-05-09 Münzenprüfeinrichtung Expired - Lifetime EP0245805B1 (de)

Priority Applications (1)

Application Number Priority Date Filing Date Title
AT87106761T ATE79190T1 (de) 1986-05-14 1987-05-09 Muenzenpruefeinrichtung.

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
CH1965/86 1986-05-14
CH1965/86A CH670717A5 (es) 1986-05-14 1986-05-14

Publications (3)

Publication Number Publication Date
EP0245805A2 EP0245805A2 (de) 1987-11-19
EP0245805A3 EP0245805A3 (en) 1988-09-21
EP0245805B1 true EP0245805B1 (de) 1992-08-05

Family

ID=4222753

Family Applications (1)

Application Number Title Priority Date Filing Date
EP87106761A Expired - Lifetime EP0245805B1 (de) 1986-05-14 1987-05-09 Münzenprüfeinrichtung

Country Status (5)

Country Link
US (1) US4815579A (es)
EP (1) EP0245805B1 (es)
AT (1) ATE79190T1 (es)
CH (1) CH670717A5 (es)
DE (1) DE3780858D1 (es)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0636205B2 (ja) * 1988-11-15 1994-05-11 旭精工株式会社 硬貨選別装置
DE4139503C2 (de) * 1991-11-27 1994-10-27 Act Soft Hardware Verfahren und Vorrichtung zum Prüfen von Münzen
US5361886A (en) * 1991-04-11 1994-11-08 Act Gesellschaft Fuer Soft- Und Hardware-Systeme Gmbh Method and apparatus for examining coins
CH683463A5 (de) 1991-12-10 1994-03-15 Ascom Autelca Ag Verfahren zum Prüfen einer Münze.
US6907977B1 (en) * 2000-01-28 2005-06-21 Cashcode Company Inc. Capacitance sensor for coin evaluation
US8170831B2 (en) * 2009-04-29 2012-05-01 Maw-Yuan Liou Apparatus and method for measuring dimension of circular object
AT509885B1 (de) * 2010-12-28 2011-12-15 Novotech Elektronik Gmbh Vorrichtung und verfahren zur münzerkennung
US10957445B2 (en) 2017-10-05 2021-03-23 Hill-Rom Services, Inc. Caregiver and staff information system

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US1647180A (en) * 1927-11-01 Coin chute
US1236870A (en) * 1916-06-09 1917-08-14 Edward F Henson Coin-selector.
US1354647A (en) * 1918-12-28 1920-10-05 Nat Sales Machine Company Coin-selector
AT122301B (de) * 1927-05-09 1931-04-10 Edmund Dr Szeparowicz Prägeprüfer für Selbstverkaüfer.
US2003771A (en) * 1933-11-22 1935-06-04 Harry E Rubens Coin testing device
US2881975A (en) * 1956-07-18 1959-04-14 Clyde S Bower Coin register
US3191739A (en) * 1959-03-09 1965-06-29 Electronic Coil Proc Corp Coin tester
GB861623A (en) * 1959-07-13 1961-02-22 Raffaele Spinelli Coin selecting device and apparatus
DE1806439A1 (de) * 1968-10-31 1970-05-27 Siemens Ag Muenzpruefeinrichtung fuer Selbstverkaeufer,insbesondere fuer Muenzfernsprecher
US3738469A (en) * 1969-08-22 1973-06-12 G Prumm Tester for different types of coins
DE2313241C3 (de) * 1973-03-16 1981-11-26 Standard Elektrik Lorenz Ag, 7000 Stuttgart Einrichtung zur mechanischen Prüfung von Münzen
US4108296A (en) * 1976-04-08 1978-08-22 Nippon Coinco Co., Ltd. Coin receiving apparatus for a vending machine
US4124110A (en) * 1976-07-23 1978-11-07 Orin W. Coburn Magnetic coin element sensor
FR2418502A1 (fr) * 1978-02-22 1979-09-21 Glory Kogyo Kk Dispositif de detection de pieces residuelles pour machine de traitement de pieces de monnaie
DE2927417C2 (de) * 1979-07-06 1982-03-04 Laurel Bank Machine Co., Ltd., Tokyo Vorrichtung zum Fördern von Münzen mit Förderband
CH655810A5 (de) * 1982-03-04 1986-05-15 Autelca Ag Muenzpruefer fuer die pruefung unterschiedlicher muenzdicken und/oder muenzdurchmesser und/oder muenzlegierungen.
EP0122732B1 (en) * 1983-03-21 1988-06-22 Starpoint Electrics Limited Coin checking

Also Published As

Publication number Publication date
ATE79190T1 (de) 1992-08-15
CH670717A5 (es) 1989-06-30
EP0245805A2 (de) 1987-11-19
EP0245805A3 (en) 1988-09-21
US4815579A (en) 1989-03-28
DE3780858D1 (en) 1992-09-10

Similar Documents

Publication Publication Date Title
DE69825955T2 (de) Gerät zur förderung einer flüssigkeit
DE2727069C2 (de) Zahnradeinstellvorrichtung zur Verwendung in einer Druckvorrichtung mit Sätzen von Typenrädern
EP0287506A2 (de) Schieblehre
EP0956908A1 (de) Elektrisch betriebenes Kartuschenaustraggerät
EP0162803A2 (de) Zweiflanken-Wälzprüfgerät
EP0245805B1 (de) Münzenprüfeinrichtung
DE2750193C2 (de) Münzprüfaggregat für elektronische Parkhausuhren
DE2313241A1 (de) Pruef- und kassiereinrichtung
DE2554484C3 (de) Überwachungssystem für den Lagezustand hydraulisch betätigter Armaturen
DE2054643A1 (de) Vorrichtung zur Bestimmung von Abmessungen
DE2518868C3 (de) Schalttisch-Vorschubeinrichtung
DE1473782B2 (de) Laengenmess und sortiergeraet
DE2804541C3 (de) Mikrometer zur Messung eines Dimensionsabstandes zwischen einem zu messenden Werkstück und einem Vergleichsmaß
DE1423570B2 (de) Selbsttätig arbeitendes Zahnradprüfgerät. Ausscheidung aus: II88826
DE2830644C2 (de) Verfahren zum Wickeln elektrischer Spulen
DE1804456C3 (de) Einrichtung zur zeilenweisen Abtastung der Oberfläche von Prüfobjekten
EP1219936B1 (de) Wägevorrichtung mit Freistellungseinrichtung
DE19636315C2 (de) Münzauszahlvorrichtung
DE2059043C3 (de) Münzprüfeinrichtung für Parkzeituhren
DE2242356C3 (de) Feinverstellbares Präzisionsgesperre
CH463126A (de) Antriebseinrichtung zur rotierenden Bewegung eines Maschinentisches zur Durchführung der Teilungs-Prüfung
DE2226571C3 (de) Zählwerk mit Echappementantrieb
DE1463463A1 (de) Registrier- oder Aufnahmegeraet fuer Verschiebungen oder Verlagerungen
DE1423570C (de) Selbsttätig arbeitendes Zahnrad prüfgerät Ausscheidung aus 1188826
DE1473782C (de) Langenmeß und Sortiergerat

Legal Events

Date Code Title Description
PUAI Public reference made under article 153(3) epc to a published international application that has entered the european phase

Free format text: ORIGINAL CODE: 0009012

AK Designated contracting states

Kind code of ref document: A2

Designated state(s): AT DE FR GB IT NL SE

PUAL Search report despatched

Free format text: ORIGINAL CODE: 0009013

AK Designated contracting states

Kind code of ref document: A3

Designated state(s): AT DE FR GB IT NL SE

17P Request for examination filed

Effective date: 19881118

RAP1 Party data changed (applicant data changed or rights of an application transferred)

Owner name: ASCOM AUTELCA AG

17Q First examination report despatched

Effective date: 19910322

ITTA It: last paid annual fee
GRAA (expected) grant

Free format text: ORIGINAL CODE: 0009210

AK Designated contracting states

Kind code of ref document: B1

Designated state(s): AT DE FR GB IT NL SE

REF Corresponds to:

Ref document number: 79190

Country of ref document: AT

Date of ref document: 19920815

Kind code of ref document: T

ITF It: translation for a ep patent filed

Owner name: STUDIO APRA' BREVETTI

GBT Gb: translation of ep patent filed (gb section 77(6)(a)/1977)
REF Corresponds to:

Ref document number: 3780858

Country of ref document: DE

Date of ref document: 19920910

ET Fr: translation filed
PLBE No opposition filed within time limit

Free format text: ORIGINAL CODE: 0009261

STAA Information on the status of an ep patent application or granted ep patent

Free format text: STATUS: NO OPPOSITION FILED WITHIN TIME LIMIT

26N No opposition filed
PGFP Annual fee paid to national office [announced via postgrant information from national office to epo]

Ref country code: AT

Payment date: 19940506

Year of fee payment: 8

PGFP Annual fee paid to national office [announced via postgrant information from national office to epo]

Ref country code: NL

Payment date: 19940531

Year of fee payment: 8

EAL Se: european patent in force in sweden

Ref document number: 87106761.7

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: AT

Effective date: 19950509

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: NL

Effective date: 19951201

NLV4 Nl: lapsed or anulled due to non-payment of the annual fee

Effective date: 19951201

REG Reference to a national code

Ref country code: GB

Ref legal event code: IF02

PGFP Annual fee paid to national office [announced via postgrant information from national office to epo]

Ref country code: GB

Payment date: 20030417

Year of fee payment: 17

PGFP Annual fee paid to national office [announced via postgrant information from national office to epo]

Ref country code: FR

Payment date: 20030429

Year of fee payment: 17

PGFP Annual fee paid to national office [announced via postgrant information from national office to epo]

Ref country code: SE

Payment date: 20030519

Year of fee payment: 17

PGFP Annual fee paid to national office [announced via postgrant information from national office to epo]

Ref country code: DE

Payment date: 20030723

Year of fee payment: 17

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: GB

Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES

Effective date: 20040509

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: SE

Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES

Effective date: 20040510

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: DE

Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES

Effective date: 20041201

EUG Se: european patent has lapsed
GBPC Gb: european patent ceased through non-payment of renewal fee

Effective date: 20040509

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: FR

Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES

Effective date: 20050131

REG Reference to a national code

Ref country code: FR

Ref legal event code: ST

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: IT

Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES;WARNING: LAPSES OF ITALIAN PATENTS WITH EFFECTIVE DATE BEFORE 2007 MAY HAVE OCCURRED AT ANY TIME BEFORE 2007. THE CORRECT EFFECTIVE DATE MAY BE DIFFERENT FROM THE ONE RECORDED.

Effective date: 20050509