DE69935199T2 - Robuste abdeck-platte für strahlungsabbildung - Google Patents
Robuste abdeck-platte für strahlungsabbildung Download PDFInfo
- Publication number
- DE69935199T2 DE69935199T2 DE69935199T DE69935199T DE69935199T2 DE 69935199 T2 DE69935199 T2 DE 69935199T2 DE 69935199 T DE69935199 T DE 69935199T DE 69935199 T DE69935199 T DE 69935199T DE 69935199 T2 DE69935199 T2 DE 69935199T2
- Authority
- DE
- Germany
- Prior art keywords
- layer
- imaging device
- scintillator
- hermetic barrier
- type
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 230000005855 radiation Effects 0.000 title description 14
- 239000000463 material Substances 0.000 claims description 92
- 230000004888 barrier function Effects 0.000 claims description 45
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 claims description 23
- 229910002804 graphite Inorganic materials 0.000 claims description 23
- 239000010439 graphite Substances 0.000 claims description 23
- 239000002131 composite material Substances 0.000 claims description 19
- 239000000758 substrate Substances 0.000 claims description 16
- 238000003384 imaging method Methods 0.000 claims description 15
- 230000001070 adhesive effect Effects 0.000 claims description 14
- 239000000853 adhesive Substances 0.000 claims description 13
- 230000001681 protective effect Effects 0.000 claims description 13
- 239000000835 fiber Substances 0.000 claims description 8
- 229910052782 aluminium Inorganic materials 0.000 claims description 5
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 claims description 5
- 229910010272 inorganic material Inorganic materials 0.000 claims description 5
- 239000011147 inorganic material Substances 0.000 claims description 5
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 claims description 4
- 230000005540 biological transmission Effects 0.000 claims description 4
- XQPRBTXUXXVTKB-UHFFFAOYSA-M caesium iodide Chemical compound [I-].[Cs+] XQPRBTXUXXVTKB-UHFFFAOYSA-M 0.000 claims description 3
- 229920005989 resin Polymers 0.000 claims description 3
- 239000011347 resin Substances 0.000 claims description 3
- 239000007787 solid Substances 0.000 claims description 3
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims description 2
- 229910052802 copper Inorganic materials 0.000 claims description 2
- 239000010949 copper Substances 0.000 claims description 2
- 229910052759 nickel Inorganic materials 0.000 claims description 2
- 239000010410 layer Substances 0.000 claims 24
- WHXSMMKQMYFTQS-UHFFFAOYSA-N Lithium Chemical compound [Li] WHXSMMKQMYFTQS-UHFFFAOYSA-N 0.000 claims 1
- 229910052744 lithium Inorganic materials 0.000 claims 1
- 239000011241 protective layer Substances 0.000 claims 1
- 238000002791 soaking Methods 0.000 claims 1
- 230000003287 optical effect Effects 0.000 description 10
- 239000004593 Epoxy Substances 0.000 description 5
- 239000004840 adhesive resin Substances 0.000 description 3
- 229920006223 adhesive resin Polymers 0.000 description 3
- 230000015556 catabolic process Effects 0.000 description 3
- 238000006731 degradation reaction Methods 0.000 description 3
- 239000011521 glass Substances 0.000 description 3
- 239000003292 glue Substances 0.000 description 3
- 230000000873 masking effect Effects 0.000 description 3
- 150000003839 salts Chemical class 0.000 description 3
- 239000003570 air Substances 0.000 description 2
- 238000003491 array Methods 0.000 description 2
- 230000032798 delamination Effects 0.000 description 2
- 230000007613 environmental effect Effects 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 229910052751 metal Inorganic materials 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 239000010409 thin film Substances 0.000 description 2
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 description 1
- 238000010521 absorption reaction Methods 0.000 description 1
- 230000001464 adherent effect Effects 0.000 description 1
- 239000012080 ambient air Substances 0.000 description 1
- 229910021417 amorphous silicon Inorganic materials 0.000 description 1
- 238000004458 analytical method Methods 0.000 description 1
- -1 cesium iodide (CsJ) Chemical class 0.000 description 1
- 238000011976 chest X-ray Methods 0.000 description 1
- 238000007596 consolidation process Methods 0.000 description 1
- 238000005336 cracking Methods 0.000 description 1
- 230000006735 deficit Effects 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000009826 distribution Methods 0.000 description 1
- 230000004907 flux Effects 0.000 description 1
- 239000011888 foil Substances 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 238000003475 lamination Methods 0.000 description 1
- 239000011368 organic material Substances 0.000 description 1
- 230000000149 penetrating effect Effects 0.000 description 1
- 238000012360 testing method Methods 0.000 description 1
- 238000005382 thermal cycling Methods 0.000 description 1
- 239000010936 titanium Substances 0.000 description 1
- 229910052719 titanium Inorganic materials 0.000 description 1
- 238000002834 transmittance Methods 0.000 description 1
- 230000000007 visual effect Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
- G01T1/2002—Optical details, e.g. reflecting or diffusing layers
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Physics & Mathematics (AREA)
- High Energy & Nuclear Physics (AREA)
- Molecular Biology (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Measurement Of Radiation (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US09/097,165 US6172371B1 (en) | 1998-06-15 | 1998-06-15 | Robust cover plate for radiation imager |
| US97165 | 1998-06-15 | ||
| PCT/US1999/008185 WO1999066352A1 (en) | 1998-06-15 | 1999-04-14 | Robust cover plate for radiation imager |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| DE69935199D1 DE69935199D1 (de) | 2007-04-05 |
| DE69935199T2 true DE69935199T2 (de) | 2007-11-15 |
Family
ID=22261663
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE69935199T Expired - Fee Related DE69935199T2 (de) | 1998-06-15 | 1999-04-14 | Robuste abdeck-platte für strahlungsabbildung |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US6172371B1 (enExample) |
| EP (1) | EP1031048B1 (enExample) |
| JP (1) | JP4293299B2 (enExample) |
| DE (1) | DE69935199T2 (enExample) |
| WO (1) | WO1999066352A1 (enExample) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US11460590B2 (en) | 2017-08-03 | 2022-10-04 | The Research Foundation For The State University Of New York | Dual-screen digital radiography with asymmetric reflective screens |
Families Citing this family (35)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE69931059T2 (de) * | 1998-06-18 | 2006-12-07 | Hamamatsu Photonics K.K., Hamamatsu | Szintillatorpanel und strahlungsbildsensor |
| JP3789646B2 (ja) * | 1998-06-19 | 2006-06-28 | 浜松ホトニクス株式会社 | 放射線イメージセンサ |
| US6350990B1 (en) * | 1999-11-04 | 2002-02-26 | General Electric Company | End cap and sealing method for imager |
| ATE426823T1 (de) * | 2000-01-13 | 2009-04-15 | Hamamatsu Photonics Kk | Strahlungsbildsensor und szintillatorplatte |
| US6455855B1 (en) * | 2000-04-20 | 2002-09-24 | Ge Medical Systems Global Technology Company Llc | Sealed detector for a medical imaging device and a method of manufacturing the same |
| JP4234304B2 (ja) * | 2000-05-19 | 2009-03-04 | 浜松ホトニクス株式会社 | 放射線検出器 |
| WO2001088568A1 (fr) * | 2000-05-19 | 2001-11-22 | Hamamatsu Photonics K.K. | Detecteur de rayonnement et procede de fabrication de ce detecteur |
| JP4398065B2 (ja) * | 2000-05-19 | 2010-01-13 | 浜松ホトニクス株式会社 | 放射線検出器 |
| FR2812089B1 (fr) * | 2000-07-21 | 2007-11-30 | Trixell Sas | Detecteur de rayonnement a duree de vie accrue |
| US6414316B1 (en) * | 2000-11-30 | 2002-07-02 | Fyodor I. Maydanich | Protective cover and attachment method for moisture sensitive devices |
| CN1264026C (zh) * | 2001-01-30 | 2006-07-12 | 浜松光子学株式会社 | 闪烁器板及射线图象传感器 |
| JP4593806B2 (ja) * | 2001-02-09 | 2010-12-08 | キヤノン株式会社 | 放射線検出装置の製造方法、蛍光板の製造方法及び放射線検出装置の製造装置 |
| DE10119783A1 (de) * | 2001-04-23 | 2002-10-31 | Siemens Ag | Strahlungswandler |
| US6657201B2 (en) * | 2001-06-29 | 2003-12-02 | General Electric Company | Cover plate having spacer lip with hermetic barrier for radiation imager and method of manufacturing same |
| FR2831671B1 (fr) | 2001-10-26 | 2004-05-28 | Trixell Sas | Detecteur de rayonnement x a l'etat solide |
| US7126130B2 (en) * | 2001-12-06 | 2006-10-24 | General Electric Company | Direct scintillator coating for radiation detector assembly longevity |
| US6720561B2 (en) * | 2001-12-06 | 2004-04-13 | General Electric Company | Direct CsI scintillator coating for improved digital X-ray detector assembly longevity |
| US6642524B2 (en) * | 2002-01-09 | 2003-11-04 | Ge Medical Systems Global Technology Company, Llc | Scintillator sealing for solid state X-ray detector |
| US7473903B2 (en) * | 2003-02-12 | 2009-01-06 | General Electric Company | Method and apparatus for deposited hermetic cover for digital X-ray panel |
| US7112802B2 (en) * | 2003-04-11 | 2006-09-26 | Canon Kabushiki Kaisha | Scintillator panel, radiation detecting apparatus, and radiation detection system |
| DE102006038969B4 (de) * | 2006-08-21 | 2013-02-28 | Siemens Aktiengesellschaft | Röntgenkonverterelement und Verfahren zu dessen Herstellung |
| US8586933B2 (en) * | 2007-04-25 | 2013-11-19 | Koninklijke Philips N.V. | Radiation detector having a split laminate optical coupling |
| WO2010018496A2 (en) * | 2008-08-11 | 2010-02-18 | Koninklijke Philips Electronics N.V. | Radiation detector and method for preparing same |
| JP5368058B2 (ja) * | 2008-11-04 | 2013-12-18 | 株式会社東芝 | 放射線検出器 |
| FR2944879A1 (fr) * | 2009-04-28 | 2010-10-29 | Centre Nat Rech Scient | Detecteur de radiation a cristaux scintillants et procede de fabrication d'une enveloppe pour un tel detecteur. |
| JP5660122B2 (ja) * | 2010-03-02 | 2015-01-28 | コニカミノルタ株式会社 | 放射線検出パネル、放射線画像検出器、放射線検出パネルの製造方法および放射線画像検出器の製造方法 |
| CN102466808B (zh) * | 2010-11-09 | 2014-06-18 | 北京大基康明医疗设备有限公司 | 非晶硅碘化铯数字x射线平板探测器 |
| JP2012185123A (ja) | 2011-03-08 | 2012-09-27 | Sony Corp | 放射線撮像装置および放射線撮像装置の製造方法 |
| US8415628B1 (en) | 2011-10-31 | 2013-04-09 | General Electric Company | Hermetically sealed radiation detector and methods for making |
| JP2014032170A (ja) | 2012-07-11 | 2014-02-20 | Konica Minolta Inc | 放射線検出パネルおよび放射線画像検出器 |
| JP6487263B2 (ja) * | 2015-04-20 | 2019-03-20 | 浜松ホトニクス株式会社 | 放射線検出器及びその製造方法 |
| JP6555955B2 (ja) * | 2015-07-15 | 2019-08-07 | キヤノン株式会社 | 放射線検出装置及び放射線撮像システム |
| JP6549950B2 (ja) | 2015-09-15 | 2019-07-24 | 浜松ホトニクス株式会社 | シンチレータパネル、及び、放射線検出器 |
| FR3061404B1 (fr) * | 2016-12-27 | 2022-09-23 | Packaging Sip | Procede de fabrication collective de modules electroniques hermetiques |
| WO2019226859A1 (en) | 2018-05-23 | 2019-11-28 | The Research Foundation For The State University Of New York | Flat panel x-ray imager with scintillating glass substrate |
Family Cites Families (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4029964A (en) | 1975-08-11 | 1977-06-14 | G. D. Searle & Co. | Detector construction for a scintillation camera |
| EP0147561A3 (en) | 1983-11-09 | 1985-08-07 | Siemens Aktiengesellschaft | Scintillation crystal for a radiation detector and method for producing the same |
| US5187369A (en) | 1990-10-01 | 1993-02-16 | General Electric Company | High sensitivity, high resolution, solid state x-ray imaging device with barrier layer |
| US5153438A (en) | 1990-10-01 | 1992-10-06 | General Electric Company | Method of forming an x-ray imaging array and the array |
| US5179284A (en) | 1991-08-21 | 1993-01-12 | General Electric Company | Solid state radiation imager having a reflective and protective coating |
| US5132539A (en) | 1991-08-29 | 1992-07-21 | General Electric Company | Planar X-ray imager having a moisture-resistant sealing structure |
| US5148029A (en) | 1991-09-23 | 1992-09-15 | Siemens Gammasonics, Inc. | Improved seal scintillation camera module and method of making it |
| US5463225A (en) | 1992-06-01 | 1995-10-31 | General Electric Company | Solid state radiation imager with high integrity barrier layer and method of fabricating |
| US5517031A (en) | 1994-06-21 | 1996-05-14 | General Electric Company | Solid state imager with opaque layer |
| US5641984A (en) | 1994-08-19 | 1997-06-24 | General Electric Company | Hermetically sealed radiation imager |
-
1998
- 1998-06-15 US US09/097,165 patent/US6172371B1/en not_active Expired - Lifetime
-
1999
- 1999-04-14 DE DE69935199T patent/DE69935199T2/de not_active Expired - Fee Related
- 1999-04-14 EP EP99918553A patent/EP1031048B1/en not_active Expired - Lifetime
- 1999-04-14 WO PCT/US1999/008185 patent/WO1999066352A1/en not_active Ceased
- 1999-04-14 JP JP2000555117A patent/JP4293299B2/ja not_active Expired - Fee Related
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US11460590B2 (en) | 2017-08-03 | 2022-10-04 | The Research Foundation For The State University Of New York | Dual-screen digital radiography with asymmetric reflective screens |
| US12025757B2 (en) | 2017-08-03 | 2024-07-02 | The Research Foundation For The State University Of New York | Dual-screen digital radiography with asymmetric reflective screens |
Also Published As
| Publication number | Publication date |
|---|---|
| DE69935199D1 (de) | 2007-04-05 |
| EP1031048A1 (en) | 2000-08-30 |
| WO1999066352A1 (en) | 1999-12-23 |
| JP2002518686A (ja) | 2002-06-25 |
| EP1031048B1 (en) | 2007-02-21 |
| JP4293299B2 (ja) | 2009-07-08 |
| US6172371B1 (en) | 2001-01-09 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| 8364 | No opposition during term of opposition | ||
| 8339 | Ceased/non-payment of the annual fee |