DE69921150D1 - Speicherüberwachung - Google Patents

Speicherüberwachung

Info

Publication number
DE69921150D1
DE69921150D1 DE1999621150 DE69921150T DE69921150D1 DE 69921150 D1 DE69921150 D1 DE 69921150D1 DE 1999621150 DE1999621150 DE 1999621150 DE 69921150 T DE69921150 T DE 69921150T DE 69921150 D1 DE69921150 D1 DE 69921150D1
Authority
DE
Germany
Prior art keywords
memory monitoring
monitoring
memory
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE1999621150
Other languages
English (en)
Other versions
DE69921150T2 (de
Inventor
Mikael Lindberg
Stefan Gustafsson
Mats Ernkell
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Telefonaktiebolaget LM Ericsson AB
Original Assignee
Telefonaktiebolaget LM Ericsson AB
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Telefonaktiebolaget LM Ericsson AB filed Critical Telefonaktiebolaget LM Ericsson AB
Application granted granted Critical
Publication of DE69921150D1 publication Critical patent/DE69921150D1/de
Publication of DE69921150T2 publication Critical patent/DE69921150T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C2029/0409—Online test
DE69921150T 1998-08-21 1999-07-02 Speicherüberwachung Expired - Lifetime DE69921150T2 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
SE9802800 1998-08-21
SE9802800A SE9802800D0 (sv) 1998-08-21 1998-08-21 Memory supervision
PCT/SE1999/001207 WO2000011678A1 (en) 1998-08-21 1999-07-02 Memory supervision

Publications (2)

Publication Number Publication Date
DE69921150D1 true DE69921150D1 (de) 2004-11-18
DE69921150T2 DE69921150T2 (de) 2005-03-17

Family

ID=20412313

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69921150T Expired - Lifetime DE69921150T2 (de) 1998-08-21 1999-07-02 Speicherüberwachung

Country Status (8)

Country Link
US (1) US6438719B1 (de)
EP (1) EP1104579B1 (de)
AU (1) AU4948899A (de)
BR (1) BR9913467A (de)
CA (1) CA2340633C (de)
DE (1) DE69921150T2 (de)
SE (1) SE9802800D0 (de)
WO (1) WO2000011678A1 (de)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6922801B2 (en) * 2001-06-01 2005-07-26 International Business Machines Corporation Storage media scanner apparatus and method providing media predictive failure analysis and proactive media surface defect management
US20040015762A1 (en) * 2002-07-22 2004-01-22 Finisar Corporation Scalable system testing tools
US7114106B2 (en) 2002-07-22 2006-09-26 Finisar Corporation Scalable network attached storage (NAS) testing tool
US20040015761A1 (en) * 2002-07-22 2004-01-22 Finisar Corporation Scalable asynchronous I/O testing tool
FR2910145A1 (fr) * 2006-12-18 2008-06-20 St Microelectronics Sa Procede et dispositif pour securiser la lecture d'une memoire.
US8843446B2 (en) 2011-07-04 2014-09-23 Zerto Ltd. Methods and apparatus for time-based dynamically adjusted journaling
DE102018006313A1 (de) * 2018-06-08 2019-12-12 Giesecke+Devrient Mobile Security Gmbh Verfahren mit Safe-Error-Abwehrmaßnahme

Family Cites Families (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4414665A (en) * 1979-11-21 1983-11-08 Nippon Telegraph & Telephone Public Corp. Semiconductor memory device test apparatus
AT367557B (de) * 1980-04-25 1982-07-12 Schrack Elektrizitaets Ag E Schaltungsanordnung zur ueberwachung der funktion von festwert- und/oder schreib-lesespeichern
JPS5856294A (ja) * 1981-09-30 1983-04-02 Hitachi Ltd ランダムアクセスメモリのリ−ドライトチエツク方法
JPS59112494A (ja) * 1982-12-17 1984-06-28 Fuji Electric Co Ltd メモリテスト方式
JPS63175300A (ja) 1987-01-16 1988-07-19 Hitachi Ltd 半導体集積回路装置
GB2222461B (en) * 1988-08-30 1993-05-19 Mitsubishi Electric Corp On chip testing of semiconductor memory devices
JP2779538B2 (ja) * 1989-04-13 1998-07-23 三菱電機株式会社 半導体集積回路メモリのためのテスト信号発生器およびテスト方法
JP2838425B2 (ja) * 1990-01-08 1998-12-16 三菱電機株式会社 半導体記憶装置
US5274648A (en) * 1990-01-24 1993-12-28 International Business Machines Corporation Memory card resident diagnostic testing
EP0470030A3 (en) * 1990-08-02 1993-04-21 International Business Machines Corporation Fast memory power-on diagnostics using direct memory addressing
JP2673395B2 (ja) * 1990-08-29 1997-11-05 三菱電機株式会社 半導体記憶装置およびそのテスト方法
JPH04356799A (ja) * 1990-08-29 1992-12-10 Mitsubishi Electric Corp 半導体記憶装置
DE4028819A1 (de) 1990-09-11 1992-03-12 Siemens Ag Schaltungsanordnung zum testen eines halbleiterspeichers mittels paralleltests mit verschiedenen testbitmustern
US6105152A (en) * 1993-04-13 2000-08-15 Micron Technology, Inc. Devices and methods for testing cell margin of memory devices
US5479413A (en) * 1994-06-06 1995-12-26 Digital Equipment Corporation Method for testing large memory arrays during system initialization
KR0152914B1 (ko) * 1995-04-21 1998-12-01 문정환 반도체 메모리장치
JP3673027B2 (ja) * 1996-09-05 2005-07-20 沖電気工業株式会社 テスト対象の半導体記憶回路を備えた半導体記憶装置
JPH10134599A (ja) * 1996-10-31 1998-05-22 Kawasaki Steel Corp 半導体記憶装置

Also Published As

Publication number Publication date
EP1104579A1 (de) 2001-06-06
US6438719B1 (en) 2002-08-20
DE69921150T2 (de) 2005-03-17
SE9802800D0 (sv) 1998-08-21
AU4948899A (en) 2000-03-14
BR9913467A (pt) 2001-06-05
WO2000011678A1 (en) 2000-03-02
CA2340633C (en) 2006-11-14
CA2340633A1 (en) 2000-03-02
EP1104579B1 (de) 2004-10-13

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition