DE69823100D1 - Abrichtgerät für chemisch-mechanisches Polierkissen - Google Patents

Abrichtgerät für chemisch-mechanisches Polierkissen

Info

Publication number
DE69823100D1
DE69823100D1 DE69823100T DE69823100T DE69823100D1 DE 69823100 D1 DE69823100 D1 DE 69823100D1 DE 69823100 T DE69823100 T DE 69823100T DE 69823100 T DE69823100 T DE 69823100T DE 69823100 D1 DE69823100 D1 DE 69823100D1
Authority
DE
Germany
Prior art keywords
dresser
mechanical polishing
chemical mechanical
polishing pads
pads
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69823100T
Other languages
English (en)
Other versions
DE69823100T2 (de
Inventor
Robert Ploessl
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Qimonda AG
Original Assignee
Infineon Technologies AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Infineon Technologies AG filed Critical Infineon Technologies AG
Publication of DE69823100D1 publication Critical patent/DE69823100D1/de
Application granted granted Critical
Publication of DE69823100T2 publication Critical patent/DE69823100T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/302Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
    • H01L21/304Mechanical treatment, e.g. grinding, polishing, cutting
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B53/00Devices or means for dressing or conditioning abrasive surfaces
    • B24B53/017Devices or means for dressing, cleaning or otherwise conditioning lapping tools
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B37/00Lapping machines or devices; Accessories
    • B24B37/04Lapping machines or devices; Accessories designed for working plane surfaces
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B55/00Safety devices for grinding or polishing machines; Accessories fitted to grinding or polishing machines for keeping tools or parts of the machine in good working condition
    • B24B55/06Dust extraction equipment on grinding or polishing machines

Landscapes

  • Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
  • Mechanical Treatment Of Semiconductor (AREA)
  • Grinding-Machine Dressing And Accessory Apparatuses (AREA)
DE69823100T 1997-06-27 1998-06-02 Abrichtgerät für chemisch-mechanisches Polierkissen Expired - Lifetime DE69823100T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US08/884,118 US5885137A (en) 1997-06-27 1997-06-27 Chemical mechanical polishing pad conditioner
US884118 1997-06-27

Publications (2)

Publication Number Publication Date
DE69823100D1 true DE69823100D1 (de) 2004-05-19
DE69823100T2 DE69823100T2 (de) 2004-11-25

Family

ID=25383990

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69823100T Expired - Lifetime DE69823100T2 (de) 1997-06-27 1998-06-02 Abrichtgerät für chemisch-mechanisches Polierkissen

Country Status (6)

Country Link
US (1) US5885137A (de)
EP (1) EP0887151B1 (de)
JP (1) JPH1158217A (de)
KR (1) KR19990007315A (de)
DE (1) DE69823100T2 (de)
TW (1) TW393700B (de)

Families Citing this family (67)

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Publication number Priority date Publication date Assignee Title
US9868100B2 (en) 1997-04-04 2018-01-16 Chien-Min Sung Brazed diamond tools and methods for making the same
US9463552B2 (en) 1997-04-04 2016-10-11 Chien-Min Sung Superbrasvie tools containing uniformly leveled superabrasive particles and associated methods
US9221154B2 (en) 1997-04-04 2015-12-29 Chien-Min Sung Diamond tools and methods for making the same
US9238207B2 (en) 1997-04-04 2016-01-19 Chien-Min Sung Brazed diamond tools and methods for making the same
US9409280B2 (en) 1997-04-04 2016-08-09 Chien-Min Sung Brazed diamond tools and methods for making the same
US9199357B2 (en) 1997-04-04 2015-12-01 Chien-Min Sung Brazed diamond tools and methods for making the same
JP3722591B2 (ja) * 1997-05-30 2005-11-30 株式会社日立製作所 研磨装置
US6004196A (en) * 1998-02-27 1999-12-21 Micron Technology, Inc. Polishing pad refurbisher for in situ, real-time conditioning and cleaning of a polishing pad used in chemical-mechanical polishing of microelectronic substrates
US6250994B1 (en) * 1998-10-01 2001-06-26 Micron Technology, Inc. Methods and apparatuses for mechanical and chemical-mechanical planarization of microelectronic-device substrate assemblies on planarizing pads
US6179693B1 (en) * 1998-10-06 2001-01-30 International Business Machines Corporation In-situ/self-propelled polishing pad conditioner and cleaner
US6291349B1 (en) 1999-03-25 2001-09-18 Beaver Creek Concepts Inc Abrasive finishing with partial organic boundary layer
US6568989B1 (en) 1999-04-01 2003-05-27 Beaver Creek Concepts Inc Semiconductor wafer finishing control
US6267644B1 (en) 1998-11-06 2001-07-31 Beaver Creek Concepts Inc Fixed abrasive finishing element having aids finishing method
US6739947B1 (en) 1998-11-06 2004-05-25 Beaver Creek Concepts Inc In situ friction detector method and apparatus
US6293851B1 (en) 1998-11-06 2001-09-25 Beaver Creek Concepts Inc Fixed abrasive finishing method using lubricants
US6346202B1 (en) 1999-03-25 2002-02-12 Beaver Creek Concepts Inc Finishing with partial organic boundary layer
US6634927B1 (en) 1998-11-06 2003-10-21 Charles J Molnar Finishing element using finishing aids
US7131890B1 (en) 1998-11-06 2006-11-07 Beaver Creek Concepts, Inc. In situ finishing control
US6541381B2 (en) 1998-11-06 2003-04-01 Beaver Creek Concepts Inc Finishing method for semiconductor wafers using a lubricating boundary layer
US6428388B2 (en) 1998-11-06 2002-08-06 Beaver Creek Concepts Inc. Finishing element with finishing aids
US6656023B1 (en) * 1998-11-06 2003-12-02 Beaver Creek Concepts Inc In situ control with lubricant and tracking
TW383644U (en) * 1999-03-23 2000-03-01 Vanguard Int Semiconduct Corp Dressing apparatus
US6551933B1 (en) 1999-03-25 2003-04-22 Beaver Creek Concepts Inc Abrasive finishing with lubricant and tracking
US6306008B1 (en) 1999-08-31 2001-10-23 Micron Technology, Inc. Apparatus and method for conditioning and monitoring media used for chemical-mechanical planarization
US6325709B1 (en) * 1999-11-18 2001-12-04 Chartered Semiconductor Manufacturing Ltd Rounded surface for the pad conditioner using high temperature brazing
US7201645B2 (en) * 1999-11-22 2007-04-10 Chien-Min Sung Contoured CMP pad dresser and associated methods
US6419553B2 (en) * 2000-01-04 2002-07-16 Rodel Holdings, Inc. Methods for break-in and conditioning a fixed abrasive polishing pad
JP2001191246A (ja) * 2000-01-06 2001-07-17 Nec Corp 平面研磨装置および平面研磨方法
US6969305B2 (en) * 2000-02-07 2005-11-29 Ebara Corporation Polishing apparatus
US6645046B1 (en) * 2000-06-30 2003-11-11 Lam Research Corporation Conditioning mechanism in a chemical mechanical polishing apparatus for semiconductor wafers
US6572446B1 (en) * 2000-09-18 2003-06-03 Applied Materials Inc. Chemical mechanical polishing pad conditioning element with discrete points and compliant membrane
US6773337B1 (en) * 2000-11-07 2004-08-10 Planar Labs Corporation Method and apparatus to recondition an ion exchange polish pad
JP4072810B2 (ja) * 2001-01-19 2008-04-09 株式会社荏原製作所 ドレッシング装置および該ドレッシング装置を備えたポリッシング装置
US6796883B1 (en) 2001-03-15 2004-09-28 Beaver Creek Concepts Inc Controlled lubricated finishing
US6508697B1 (en) * 2001-07-16 2003-01-21 Robert Lyle Benner Polishing pad conditioning system
US7156717B2 (en) 2001-09-20 2007-01-02 Molnar Charles J situ finishing aid control
US6682406B2 (en) * 2001-11-30 2004-01-27 Taiwan Semiconductor Manufacturing Co., Ltd Abrasive cleaning tool for removing contamination
AU2003225999A1 (en) * 2002-03-25 2003-10-13 Thomas West, Inc Smooth pads for cmp and polishing substrates
US20040214508A1 (en) * 2002-06-28 2004-10-28 Lam Research Corporation Apparatus and method for controlling film thickness in a chemical mechanical planarization system
US7544113B1 (en) * 2003-05-29 2009-06-09 Tbw Industries, Inc. Apparatus for controlling the forces applied to a vacuum-assisted pad conditioning system
US7052371B2 (en) * 2003-05-29 2006-05-30 Tbw Industries Inc. Vacuum-assisted pad conditioning system and method utilizing an apertured conditioning disk
US7004825B1 (en) * 2003-09-29 2006-02-28 Lam Research Corporation Apparatus and associated method for conditioning in chemical mechanical planarization
DE602005013356D1 (de) * 2004-01-26 2009-04-30 Tbw Ind Inc Chemisch-mechanische planarisierungsprozesssteuerung mit einem in-situ-aufbereitungsprozess
US7182680B2 (en) * 2004-06-22 2007-02-27 Applied Materials, Inc. Apparatus for conditioning processing pads
US7097542B2 (en) * 2004-07-26 2006-08-29 Intel Corporation Method and apparatus for conditioning a polishing pad
US7089925B1 (en) 2004-08-18 2006-08-15 Kinik Company Reciprocating wire saw for cutting hard materials
US7210988B2 (en) * 2004-08-24 2007-05-01 Applied Materials, Inc. Method and apparatus for reduced wear polishing pad conditioning
US8393934B2 (en) 2006-11-16 2013-03-12 Chien-Min Sung CMP pad dressers with hybridized abrasive surface and related methods
US8398466B2 (en) * 2006-11-16 2013-03-19 Chien-Min Sung CMP pad conditioners with mosaic abrasive segments and associated methods
US8678878B2 (en) 2009-09-29 2014-03-25 Chien-Min Sung System for evaluating and/or improving performance of a CMP pad dresser
US9724802B2 (en) 2005-05-16 2017-08-08 Chien-Min Sung CMP pad dressers having leveled tips and associated methods
US9138862B2 (en) 2011-05-23 2015-09-22 Chien-Min Sung CMP pad dresser having leveled tips and associated methods
US8622787B2 (en) * 2006-11-16 2014-01-07 Chien-Min Sung CMP pad dressers with hybridized abrasive surface and related methods
US7597608B2 (en) * 2006-10-30 2009-10-06 Applied Materials, Inc. Pad conditioning device with flexible media mount
US9011563B2 (en) 2007-12-06 2015-04-21 Chien-Min Sung Methods for orienting superabrasive particles on a surface and associated tools
JP5396616B2 (ja) * 2008-10-29 2014-01-22 Sumco Techxiv株式会社 シーズニングプレート、半導体研磨装置、研磨パッドのシーズニング方法
WO2010096765A1 (en) * 2009-02-20 2010-08-26 Diversified Machine Inc. Wheel assembly and method for making same
TWI464839B (zh) 2010-09-21 2014-12-11 Ritedia Corp 單層鑽石顆粒散熱器及其相關方法
WO2012162430A2 (en) 2011-05-23 2012-11-29 Chien-Min Sung Cmp pad dresser having leveled tips and associated methods
US9149906B2 (en) 2011-09-07 2015-10-06 Taiwan Semiconductor Manufacturing Company, Ltd. Apparatus for CMP pad conditioning
KR102218530B1 (ko) * 2013-04-19 2021-02-22 어플라이드 머티어리얼스, 인코포레이티드 멀티디스크 화학 기계적 폴리싱 패드 컨디셔너 및 방법
US9375825B2 (en) * 2014-04-30 2016-06-28 Applied Materials, Inc. Polishing pad conditioning system including suction
US9452506B2 (en) * 2014-07-15 2016-09-27 Applied Materials, Inc. Vacuum cleaning systems for polishing pads, and related methods
TWI616279B (zh) * 2016-08-01 2018-03-01 中國砂輪企業股份有限公司 Chemical mechanical polishing dresser and manufacturing method thereof
JP6842859B2 (ja) * 2016-08-12 2021-03-17 株式会社荏原製作所 ドレッシング装置、研磨装置、ホルダー、ハウジング及びドレッシング方法
WO2019089467A1 (en) * 2017-11-06 2019-05-09 Axus Technology, Llc Planarized membrane and methods for substrate processing systems
KR20200127328A (ko) 2019-05-02 2020-11-11 삼성전자주식회사 컨디셔너, 이를 포함하는 화학 기계적 연마 장치 및 이 장치를 이용한 반도체 장치의 제조 방법

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US1212628A (en) * 1915-03-03 1917-01-16 Henry Orford Gowlland Smoothing-head for manufacturing eyeglass-lenses.
JPS59134650A (ja) * 1983-01-21 1984-08-02 Toshiba Corp 目詰除去装置
US4918869A (en) * 1987-10-28 1990-04-24 Fujikoshi Machinery Corporation Method for lapping a wafer material and an apparatus therefor
JPH0265967A (ja) * 1988-08-29 1990-03-06 Kanebo Ltd 砥面修正用プレート及び砥面修正方法
US5230184A (en) * 1991-07-05 1993-07-27 Motorola, Inc. Distributed polishing head
US5531861A (en) * 1993-09-29 1996-07-02 Motorola, Inc. Chemical-mechanical-polishing pad cleaning process for use during the fabrication of semiconductor devices
US5486131A (en) * 1994-01-04 1996-01-23 Speedfam Corporation Device for conditioning polishing pads
JP2937881B2 (ja) * 1995-09-04 1999-08-23 株式会社東芝 真空バルブ
US5683289A (en) * 1996-06-26 1997-11-04 Texas Instruments Incorporated CMP polishing pad conditioning apparatus

Also Published As

Publication number Publication date
EP0887151A3 (de) 2002-02-13
KR19990007315A (ko) 1999-01-25
DE69823100T2 (de) 2004-11-25
US5885137A (en) 1999-03-23
TW393700B (en) 2000-06-11
EP0887151B1 (de) 2004-04-14
JPH1158217A (ja) 1999-03-02
EP0887151A2 (de) 1998-12-30

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8327 Change in the person/name/address of the patent owner

Owner name: QIMONDA AG, 81739 MUENCHEN, DE