DE69803881T2 - Vorrichtung zur strahlungsbildaufnahme - Google Patents
Vorrichtung zur strahlungsbildaufnahmeInfo
- Publication number
- DE69803881T2 DE69803881T2 DE69803881T DE69803881T DE69803881T2 DE 69803881 T2 DE69803881 T2 DE 69803881T2 DE 69803881 T DE69803881 T DE 69803881T DE 69803881 T DE69803881 T DE 69803881T DE 69803881 T2 DE69803881 T2 DE 69803881T2
- Authority
- DE
- Germany
- Prior art keywords
- cell
- imaging device
- array
- imaging
- group
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000003384 imaging method Methods 0.000 title claims abstract description 131
- 230000005855 radiation Effects 0.000 title claims abstract description 28
- 238000000034 method Methods 0.000 claims description 15
- 230000004044 response Effects 0.000 claims description 6
- 239000003990 capacitor Substances 0.000 abstract description 3
- 239000000758 substrate Substances 0.000 description 24
- 238000012545 processing Methods 0.000 description 7
- 238000010586 diagram Methods 0.000 description 6
- 238000005516 engineering process Methods 0.000 description 5
- 238000012935 Averaging Methods 0.000 description 4
- 239000004065 semiconductor Substances 0.000 description 4
- 230000008859 change Effects 0.000 description 3
- 238000004519 manufacturing process Methods 0.000 description 3
- 230000008569 process Effects 0.000 description 3
- 230000008901 benefit Effects 0.000 description 2
- 230000001419 dependent effect Effects 0.000 description 2
- 238000001514 detection method Methods 0.000 description 2
- 230000006870 function Effects 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- JBRZTFJDHDCESZ-UHFFFAOYSA-N AsGa Chemical compound [As]#[Ga] JBRZTFJDHDCESZ-UHFFFAOYSA-N 0.000 description 1
- 229910004613 CdTe Inorganic materials 0.000 description 1
- 229910004611 CdZnTe Inorganic materials 0.000 description 1
- 229910001218 Gallium arsenide Inorganic materials 0.000 description 1
- 230000003111 delayed effect Effects 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000002059 diagnostic imaging Methods 0.000 description 1
- 230000009977 dual effect Effects 0.000 description 1
- WPYVAWXEWQSOGY-UHFFFAOYSA-N indium antimonide Chemical compound [Sb]#[In] WPYVAWXEWQSOGY-UHFFFAOYSA-N 0.000 description 1
- YFDLHELOZYVNJE-UHFFFAOYSA-L mercury diiodide Chemical compound I[Hg]I YFDLHELOZYVNJE-UHFFFAOYSA-L 0.000 description 1
- 238000009659 non-destructive testing Methods 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 238000012805 post-processing Methods 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/40—Extracting pixel data from image sensors by controlling scanning circuits, e.g. by modifying the number of pixels sampled or to be sampled
- H04N25/44—Extracting pixel data from image sensors by controlling scanning circuits, e.g. by modifying the number of pixels sampled or to be sampled by partially reading an SSIS array
- H04N25/443—Extracting pixel data from image sensors by controlling scanning circuits, e.g. by modifying the number of pixels sampled or to be sampled by partially reading an SSIS array by reading pixels from selected 2D regions of the array, e.g. for windowing or digital zooming
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
- H04N23/30—Cameras or camera modules comprising electronic image sensors; Control thereof for generating image signals from X-rays
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/40—Extracting pixel data from image sensors by controlling scanning circuits, e.g. by modifying the number of pixels sampled or to be sampled
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/70—SSIS architectures; Circuits associated therewith
- H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/70—SSIS architectures; Circuits associated therewith
- H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
- H04N25/779—Circuitry for scanning or addressing the pixel array
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/70—SSIS architectures; Circuits associated therewith
- H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
- H04N25/7795—Circuitry for generating timing or clock signals
Landscapes
- Engineering & Computer Science (AREA)
- Multimedia (AREA)
- Signal Processing (AREA)
- Transforming Light Signals Into Electric Signals (AREA)
- Apparatus For Radiation Diagnosis (AREA)
- Measurement Of Radiation (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Solid State Image Pick-Up Elements (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| GB9726768A GB2332800B (en) | 1997-12-18 | 1997-12-18 | Device for imaging radiation |
| PCT/EP1998/007523 WO1999033258A1 (en) | 1997-12-18 | 1998-11-16 | Device for imaging radiation |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| DE69803881D1 DE69803881D1 (de) | 2002-03-21 |
| DE69803881T2 true DE69803881T2 (de) | 2002-08-14 |
Family
ID=10823837
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE69803881T Expired - Lifetime DE69803881T2 (de) | 1997-12-18 | 1998-11-16 | Vorrichtung zur strahlungsbildaufnahme |
Country Status (9)
| Country | Link |
|---|---|
| US (1) | US6255638B1 (enExample) |
| EP (1) | EP1040649B1 (enExample) |
| JP (1) | JP4531251B2 (enExample) |
| AT (1) | ATE213374T1 (enExample) |
| AU (1) | AU2153999A (enExample) |
| DE (1) | DE69803881T2 (enExample) |
| GB (2) | GB2332800B (enExample) |
| IL (1) | IL136705A0 (enExample) |
| WO (1) | WO1999033258A1 (enExample) |
Families Citing this family (32)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4009761B2 (ja) * | 1997-03-31 | 2007-11-21 | 株式会社ニコン | 固体撮像素子 |
| GB2332585B (en) * | 1997-12-18 | 2000-09-27 | Simage Oy | Device for imaging radiation |
| US6665010B1 (en) * | 1998-07-21 | 2003-12-16 | Intel Corporation | Controlling integration times of pixel sensors |
| US6977685B1 (en) * | 1999-02-26 | 2005-12-20 | Massachusetts Institute Of Technology | Single-chip imager system with programmable dynamic range |
| US6677996B1 (en) * | 1999-04-21 | 2004-01-13 | Pictos Technologies, Inc. | Real time camera exposure control |
| DE19947536A1 (de) * | 1999-10-02 | 2001-04-05 | Philips Corp Intellectual Pty | Verfahren zum Auslesen der Sensorelemente eines Sensors sowie Sensor |
| WO2001039558A1 (en) * | 1999-11-23 | 2001-05-31 | Koninklijke Philips Electronics N.V. | X-ray examination apparatus with exposure control |
| JP4746808B2 (ja) * | 1999-11-23 | 2011-08-10 | コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ | 露光制御付きx線診断装置 |
| EP2290952A3 (en) * | 2000-07-27 | 2011-08-17 | Canon Kabushiki Kaisha | Image sensing apparatus |
| US6400798B1 (en) * | 2000-08-01 | 2002-06-04 | Ge Medical Systems Global Technology Company, Llc | Simple means for measuring the offset induced by photo-conductive FETs in a solid state X-ray detector |
| EP1267567A1 (en) * | 2001-06-14 | 2002-12-18 | CSEM Centre Suisse d'Electronique et de Microtechnique | High speed optoelectronic active-pixel sensor and method for detecting electromagnetic radiation |
| US6794627B2 (en) * | 2001-10-24 | 2004-09-21 | Foveon, Inc. | Aggregation of active pixel sensor signals |
| DE10160527A1 (de) * | 2001-12-10 | 2003-06-26 | Siemens Ag | Sensoranordnung mit Auslesemitteln zur Differenzbildung |
| GB0202506D0 (en) * | 2002-02-02 | 2002-03-20 | Qinetiq Ltd | Reconfigurable detector array |
| EP1335587A1 (en) * | 2002-02-08 | 2003-08-13 | STMicroelectronics S.r.l. | A method for down-scaling a digital image and a digital camera for processing images of different resolutions |
| DE10245715A1 (de) * | 2002-10-01 | 2004-04-15 | Philips Intellectual Property & Standards Gmbh | Verfahren und Vorrichtung zur Erzeugung von Teilabbildungen |
| US7223981B1 (en) * | 2002-12-04 | 2007-05-29 | Aguila Technologies Inc. | Gamma ray detector modules |
| US7408195B2 (en) * | 2003-09-04 | 2008-08-05 | Cypress Semiconductor Corporation (Belgium) Bvba | Semiconductor pixel arrays with reduced sensitivity to defects |
| US7317190B2 (en) * | 2004-09-24 | 2008-01-08 | General Electric Company | Radiation absorbing x-ray detector panel support |
| US7866163B2 (en) * | 2004-10-04 | 2011-01-11 | General Electric Company | Radiographic detector docking station with dynamic environmental control |
| US7046764B1 (en) | 2004-10-04 | 2006-05-16 | General Electric Company | X-ray detector having an accelerometer |
| US7189972B2 (en) * | 2004-10-04 | 2007-03-13 | General Electric Company | X-ray detector with impact absorbing cover |
| US7242430B2 (en) * | 2004-11-03 | 2007-07-10 | Taiwan Semiconductor Manufacturing Co., Ltd. | High dynamic range image sensor cell |
| US7342998B2 (en) * | 2004-11-18 | 2008-03-11 | General Electric Company | X-ray detector quick-connect connection system |
| US7581885B2 (en) * | 2004-11-24 | 2009-09-01 | General Electric Company | Method and system of aligning x-ray detector for data acquisition |
| US7381964B1 (en) | 2004-11-24 | 2008-06-03 | General Electric Company | Method and system of x-ray data calibration |
| JP4277216B2 (ja) * | 2005-01-13 | 2009-06-10 | ソニー株式会社 | 撮像装置及び撮像結果の処理方法 |
| DE102005047539A1 (de) | 2005-09-30 | 2007-04-05 | Siemens Ag | Bildverarbeitungsverfahren zur Fensterung und/oder Dosisregelung für medizinische Diagnostikeinrichtungen |
| FR2922071A1 (fr) * | 2007-10-03 | 2009-04-10 | Commissariat Energie Atomique | Dispositif microelectronique matriciel dote de pixels avec precharge des colonnes de la matrice |
| US9201150B2 (en) * | 2008-02-25 | 2015-12-01 | Koninklijke Philips N.V. | Suppression of direct detection events in X-ray detectors |
| US8723827B2 (en) | 2009-07-28 | 2014-05-13 | Cypress Semiconductor Corporation | Predictive touch surface scanning |
| GB2574619B (en) * | 2018-06-12 | 2022-10-12 | Res & Innovation Uk | Image sensor |
Family Cites Families (15)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| FR2548498B1 (fr) * | 1983-06-28 | 1985-10-18 | Thomson Csf | Procede de correction du niveau en sortie d'un dispositif a transfert de charge et dispositif pour sa mise en oeuvre |
| JPH0744627B2 (ja) | 1987-12-21 | 1995-05-15 | 株式会社日立製作所 | イメージセンサ駆動方法 |
| US5262871A (en) | 1989-11-13 | 1993-11-16 | Rutgers, The State University | Multiple resolution image sensor |
| US5581301A (en) * | 1990-10-03 | 1996-12-03 | Canon Kabushiki Kaisha | Image processing apparatus with adjustable low-pass optical filter characteristics |
| JPH04199968A (ja) | 1990-11-29 | 1992-07-21 | Toshiba Corp | 固体撮像装置 |
| US5245191A (en) * | 1992-04-14 | 1993-09-14 | The Board Of Regents Of The University Of Arizona | Semiconductor sensor for gamma-ray tomographic imaging system |
| DE69427759T2 (de) * | 1993-06-16 | 2002-05-23 | Cambridge Imaging Ltd., Cambridge | Bilderzeugungssystem |
| GB2289983B (en) * | 1994-06-01 | 1996-10-16 | Simage Oy | Imaging devices,systems and methods |
| GB2289979A (en) | 1994-06-01 | 1995-12-06 | Simage Oy | Imaging devices systems and methods |
| JP3668305B2 (ja) * | 1995-12-05 | 2005-07-06 | オリンパス株式会社 | 固体撮像装置 |
| WO1997023090A2 (en) * | 1995-12-18 | 1997-06-26 | Philips Electronics N.V. | X-ray examination apparatus including an image sensor matrix with a correction unit |
| JP3897389B2 (ja) * | 1996-02-22 | 2007-03-22 | キヤノン株式会社 | 光電変換装置の駆動方法及び光電変換装置 |
| JP3791708B2 (ja) * | 1996-05-20 | 2006-06-28 | オリンパス株式会社 | 固体撮像装置 |
| GB2319394B (en) * | 1996-12-27 | 1998-10-28 | Simage Oy | Bump-bonded semiconductor imaging device |
| US5973311A (en) * | 1997-02-12 | 1999-10-26 | Imation Corp | Pixel array with high and low resolution mode |
-
1997
- 1997-12-18 GB GB9726768A patent/GB2332800B/en not_active Expired - Fee Related
-
1998
- 1998-06-10 US US09/095,153 patent/US6255638B1/en not_active Expired - Lifetime
- 1998-10-26 GB GB9823403A patent/GB2332586B/en not_active Expired - Fee Related
- 1998-11-16 WO PCT/EP1998/007523 patent/WO1999033258A1/en not_active Ceased
- 1998-11-16 JP JP2000526041A patent/JP4531251B2/ja not_active Expired - Lifetime
- 1998-11-16 DE DE69803881T patent/DE69803881T2/de not_active Expired - Lifetime
- 1998-11-16 AU AU21539/99A patent/AU2153999A/en not_active Abandoned
- 1998-11-16 EP EP98965690A patent/EP1040649B1/en not_active Expired - Lifetime
- 1998-11-16 IL IL13670598A patent/IL136705A0/xx unknown
- 1998-11-16 AT AT98965690T patent/ATE213374T1/de not_active IP Right Cessation
Also Published As
| Publication number | Publication date |
|---|---|
| GB2332800A (en) | 1999-06-30 |
| GB2332586A9 (en) | |
| US6255638B1 (en) | 2001-07-03 |
| EP1040649B1 (en) | 2002-02-13 |
| GB9726768D0 (en) | 1998-02-18 |
| AU2153999A (en) | 1999-07-12 |
| GB2332586B (en) | 2000-09-06 |
| JP4531251B2 (ja) | 2010-08-25 |
| ATE213374T1 (de) | 2002-02-15 |
| GB9823403D0 (en) | 1998-12-23 |
| WO1999033258A1 (en) | 1999-07-01 |
| GB2332586A (en) | 1999-06-23 |
| IL136705A0 (en) | 2001-06-14 |
| EP1040649A1 (en) | 2000-10-04 |
| JP2001527341A (ja) | 2001-12-25 |
| DE69803881D1 (de) | 2002-03-21 |
| GB2332800B (en) | 2000-09-27 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| 8364 | No opposition during term of opposition | ||
| 8327 | Change in the person/name/address of the patent owner |
Owner name: GOLDPOWER LTD., TORTOLA, VG |
|
| 8327 | Change in the person/name/address of the patent owner |
Owner name: IPL INTELLECTUAL PROPERTY LICENSING LTD., LIMA, CY |
|
| 8328 | Change in the person/name/address of the agent |
Representative=s name: EISENFUEHR, SPEISER & PARTNER, 28217 BREMEN |