DE69803881T2 - Vorrichtung zur strahlungsbildaufnahme - Google Patents

Vorrichtung zur strahlungsbildaufnahme

Info

Publication number
DE69803881T2
DE69803881T2 DE69803881T DE69803881T DE69803881T2 DE 69803881 T2 DE69803881 T2 DE 69803881T2 DE 69803881 T DE69803881 T DE 69803881T DE 69803881 T DE69803881 T DE 69803881T DE 69803881 T2 DE69803881 T2 DE 69803881T2
Authority
DE
Germany
Prior art keywords
cell
array
image
cells
imaging
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69803881T
Other languages
English (en)
Other versions
DE69803881D1 (de
Inventor
E Spartiotis
Iiari Pyyhtia
Tapio Eraluoto
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
IPL Intellectual Property Licensing Ltd
Original Assignee
SIMAGE ESPOO Oy
Simage Oy
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by SIMAGE ESPOO Oy, Simage Oy filed Critical SIMAGE ESPOO Oy
Application granted granted Critical
Publication of DE69803881D1 publication Critical patent/DE69803881D1/de
Publication of DE69803881T2 publication Critical patent/DE69803881T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/40—Extracting pixel data from image sensors by controlling scanning circuits, e.g. by modifying the number of pixels sampled or to be sampled
    • H04N25/44—Extracting pixel data from image sensors by controlling scanning circuits, e.g. by modifying the number of pixels sampled or to be sampled by partially reading an SSIS array
    • H04N25/443—Extracting pixel data from image sensors by controlling scanning circuits, e.g. by modifying the number of pixels sampled or to be sampled by partially reading an SSIS array by reading pixels from selected 2D regions of the array, e.g. for windowing or digital zooming
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N3/00—Scanning details of television systems; Combination thereof with generation of supply voltages
    • H04N3/10—Scanning details of television systems; Combination thereof with generation of supply voltages by means not exclusively optical-mechanical
    • H04N3/14—Scanning details of television systems; Combination thereof with generation of supply voltages by means not exclusively optical-mechanical by means of electrically scanned solid-state devices
    • H04N3/15—Scanning details of television systems; Combination thereof with generation of supply voltages by means not exclusively optical-mechanical by means of electrically scanned solid-state devices for picture signal generation
    • H04N3/155—Control of the image-sensor operation, e.g. image processing within the image-sensor
    • H04N3/1568—Control of the image-sensor operation, e.g. image processing within the image-sensor for disturbance correction or prevention within the image-sensor, e.g. biasing, blooming, smearing
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N5/00—Details of television systems
    • H04N5/30—Transforming light or analogous information into electric information
    • H04N5/32—Transforming X-rays
DE69803881T 1997-12-18 1998-11-16 Vorrichtung zur strahlungsbildaufnahme Expired - Lifetime DE69803881T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
GB9726768A GB2332800B (en) 1997-12-18 1997-12-18 Device for imaging radiation
PCT/EP1998/007523 WO1999033258A1 (en) 1997-12-18 1998-11-16 Device for imaging radiation

Publications (2)

Publication Number Publication Date
DE69803881D1 DE69803881D1 (de) 2002-03-21
DE69803881T2 true DE69803881T2 (de) 2002-08-14

Family

ID=10823837

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69803881T Expired - Lifetime DE69803881T2 (de) 1997-12-18 1998-11-16 Vorrichtung zur strahlungsbildaufnahme

Country Status (9)

Country Link
US (1) US6255638B1 (de)
EP (1) EP1040649B1 (de)
JP (1) JP4531251B2 (de)
AT (1) ATE213374T1 (de)
AU (1) AU2153999A (de)
DE (1) DE69803881T2 (de)
GB (2) GB2332800B (de)
IL (1) IL136705A0 (de)
WO (1) WO1999033258A1 (de)

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JP4009761B2 (ja) * 1997-03-31 2007-11-21 株式会社ニコン 固体撮像素子
GB2332585B (en) * 1997-12-18 2000-09-27 Simage Oy Device for imaging radiation
US6665010B1 (en) * 1998-07-21 2003-12-16 Intel Corporation Controlling integration times of pixel sensors
US6977685B1 (en) * 1999-02-26 2005-12-20 Massachusetts Institute Of Technology Single-chip imager system with programmable dynamic range
US6677996B1 (en) * 1999-04-21 2004-01-13 Pictos Technologies, Inc. Real time camera exposure control
DE19947536A1 (de) * 1999-10-02 2001-04-05 Philips Corp Intellectual Pty Verfahren zum Auslesen der Sensorelemente eines Sensors sowie Sensor
WO2001039558A1 (en) * 1999-11-23 2001-05-31 Koninklijke Philips Electronics N.V. X-ray examination apparatus with exposure control
EP1151645B1 (de) * 1999-11-23 2011-10-19 Koninklijke Philips Electronics N.V. Röntgenuntersuchungsvorrichtung mit belichtungssteuerung
EP1176808A3 (de) * 2000-07-27 2003-01-02 Canon Kabushiki Kaisha Bildaufnahmevorrichtung
US6400798B1 (en) * 2000-08-01 2002-06-04 Ge Medical Systems Global Technology Company, Llc Simple means for measuring the offset induced by photo-conductive FETs in a solid state X-ray detector
EP1267567A1 (de) * 2001-06-14 2002-12-18 CSEM Centre Suisse d'Electronique et de Microtechnique Optoelektronischer aktiver Bildsensor mit hoher Auslesegeschwindigkeit und Verfahren zum Erfassen von elektromagnetischer Strahlung
US6794627B2 (en) * 2001-10-24 2004-09-21 Foveon, Inc. Aggregation of active pixel sensor signals
DE10160527A1 (de) * 2001-12-10 2003-06-26 Siemens Ag Sensoranordnung mit Auslesemitteln zur Differenzbildung
GB0202506D0 (en) * 2002-02-02 2002-03-20 Qinetiq Ltd Reconfigurable detector array
EP1335587A1 (de) * 2002-02-08 2003-08-13 STMicroelectronics S.r.l. Verfahren zum Herunterskalieren eines digitalen Bildes und digitale Kamera zur Verarbeitung von Bildern mit unterschiedlicher Auflösung
US7223981B1 (en) * 2002-12-04 2007-05-29 Aguila Technologies Inc. Gamma ray detector modules
US7408195B2 (en) * 2003-09-04 2008-08-05 Cypress Semiconductor Corporation (Belgium) Bvba Semiconductor pixel arrays with reduced sensitivity to defects
US7317190B2 (en) * 2004-09-24 2008-01-08 General Electric Company Radiation absorbing x-ray detector panel support
US7046764B1 (en) 2004-10-04 2006-05-16 General Electric Company X-ray detector having an accelerometer
US7189972B2 (en) * 2004-10-04 2007-03-13 General Electric Company X-ray detector with impact absorbing cover
US7866163B2 (en) * 2004-10-04 2011-01-11 General Electric Company Radiographic detector docking station with dynamic environmental control
US7242430B2 (en) * 2004-11-03 2007-07-10 Taiwan Semiconductor Manufacturing Co., Ltd. High dynamic range image sensor cell
US7342998B2 (en) * 2004-11-18 2008-03-11 General Electric Company X-ray detector quick-connect connection system
US7581885B2 (en) * 2004-11-24 2009-09-01 General Electric Company Method and system of aligning x-ray detector for data acquisition
US7381964B1 (en) 2004-11-24 2008-06-03 General Electric Company Method and system of x-ray data calibration
JP4277216B2 (ja) 2005-01-13 2009-06-10 ソニー株式会社 撮像装置及び撮像結果の処理方法
DE102005047539A1 (de) * 2005-09-30 2007-04-05 Siemens Ag Bildverarbeitungsverfahren zur Fensterung und/oder Dosisregelung für medizinische Diagnostikeinrichtungen
FR2922071A1 (fr) * 2007-10-03 2009-04-10 Commissariat Energie Atomique Dispositif microelectronique matriciel dote de pixels avec precharge des colonnes de la matrice
WO2009107045A2 (en) * 2008-02-25 2009-09-03 Philips Intellectual Property & Standards Gmbh Suppression of direct detection events in x-ray detectors
US8723827B2 (en) 2009-07-28 2014-05-13 Cypress Semiconductor Corporation Predictive touch surface scanning
GB2574619B (en) 2018-06-12 2022-10-12 Res & Innovation Uk Image sensor

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Publication number Priority date Publication date Assignee Title
FR2548498B1 (fr) * 1983-06-28 1985-10-18 Thomson Csf Procede de correction du niveau en sortie d'un dispositif a transfert de charge et dispositif pour sa mise en oeuvre
JPH0744627B2 (ja) 1987-12-21 1995-05-15 株式会社日立製作所 イメージセンサ駆動方法
US5262871A (en) 1989-11-13 1993-11-16 Rutgers, The State University Multiple resolution image sensor
US5581301A (en) * 1990-10-03 1996-12-03 Canon Kabushiki Kaisha Image processing apparatus with adjustable low-pass optical filter characteristics
JPH04199968A (ja) 1990-11-29 1992-07-21 Toshiba Corp 固体撮像装置
US5245191A (en) * 1992-04-14 1993-09-14 The Board Of Regents Of The University Of Arizona Semiconductor sensor for gamma-ray tomographic imaging system
WO1994030004A1 (en) * 1993-06-16 1994-12-22 Cambridge Imaging Limited Improved imaging system
GB2289979A (en) 1994-06-01 1995-12-06 Simage Oy Imaging devices systems and methods
GB2289983B (en) * 1994-06-01 1996-10-16 Simage Oy Imaging devices,systems and methods
JP3668305B2 (ja) * 1995-12-05 2005-07-06 オリンパス株式会社 固体撮像装置
DE69616030T2 (de) * 1995-12-18 2002-06-20 Koninkl Philips Electronics Nv Röntgenstrahluntersuchungsvorrichtung eine bildaufnahmematrix mit korrektureinheit enthaltend
JP3897389B2 (ja) * 1996-02-22 2007-03-22 キヤノン株式会社 光電変換装置の駆動方法及び光電変換装置
JP3791708B2 (ja) * 1996-05-20 2006-06-28 オリンパス株式会社 固体撮像装置
GB2319394B (en) * 1996-12-27 1998-10-28 Simage Oy Bump-bonded semiconductor imaging device
US5973311A (en) * 1997-02-12 1999-10-26 Imation Corp Pixel array with high and low resolution mode

Also Published As

Publication number Publication date
EP1040649A1 (de) 2000-10-04
GB2332586A9 (en)
EP1040649B1 (de) 2002-02-13
GB2332800A (en) 1999-06-30
GB2332800B (en) 2000-09-27
ATE213374T1 (de) 2002-02-15
GB9823403D0 (en) 1998-12-23
AU2153999A (en) 1999-07-12
IL136705A0 (en) 2001-06-14
GB2332586B (en) 2000-09-06
WO1999033258A1 (en) 1999-07-01
JP2001527341A (ja) 2001-12-25
DE69803881D1 (de) 2002-03-21
GB2332586A (en) 1999-06-23
JP4531251B2 (ja) 2010-08-25
GB9726768D0 (en) 1998-02-18
US6255638B1 (en) 2001-07-03

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8327 Change in the person/name/address of the patent owner

Owner name: GOLDPOWER LTD., TORTOLA, VG

8327 Change in the person/name/address of the patent owner

Owner name: IPL INTELLECTUAL PROPERTY LICENSING LTD., LIMA, CY

8328 Change in the person/name/address of the agent

Representative=s name: EISENFUEHR, SPEISER & PARTNER, 28217 BREMEN