DE69719416D1 - Abtastpfadzelle - Google Patents
AbtastpfadzelleInfo
- Publication number
- DE69719416D1 DE69719416D1 DE69719416T DE69719416T DE69719416D1 DE 69719416 D1 DE69719416 D1 DE 69719416D1 DE 69719416 T DE69719416 T DE 69719416T DE 69719416 T DE69719416 T DE 69719416T DE 69719416 D1 DE69719416 D1 DE 69719416D1
- Authority
- DE
- Germany
- Prior art keywords
- cell
- scan
- abtastpfadzelle
- bypasses
- image
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
- G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
- G01R31/318541—Scan latches or cell details
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
- Test And Diagnosis Of Digital Computers (AREA)
- Investigating Or Analysing Biological Materials (AREA)
- Semiconductor Integrated Circuits (AREA)
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US62965496A | 1996-04-09 | 1996-04-09 | |
US629654 | 1996-04-09 | ||
US08/643,444 US5710779A (en) | 1996-04-09 | 1996-05-08 | Real time data observation method and apparatus |
US643444 | 1996-05-08 |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69719416D1 true DE69719416D1 (de) | 2003-04-10 |
DE69719416T2 DE69719416T2 (de) | 2004-01-08 |
Family
ID=27090998
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69719416T Expired - Fee Related DE69719416T2 (de) | 1996-04-09 | 1997-04-08 | Abtastpfadzelle |
Country Status (4)
Country | Link |
---|---|
US (1) | US5710779A (de) |
EP (1) | EP0822497B1 (de) |
KR (1) | KR100469875B1 (de) |
DE (1) | DE69719416T2 (de) |
Families Citing this family (22)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6260165B1 (en) | 1996-10-18 | 2001-07-10 | Texas Instruments Incorporated | Accelerating scan test by re-using response data as stimulus data |
US5958076A (en) * | 1996-10-29 | 1999-09-28 | Matsushita Electric Industrial Co., Ltd. | Semiconductor integrated circuit |
US5909453A (en) * | 1997-07-02 | 1999-06-01 | Xilinx, Inc. | Lookahead structure for fast scan testing |
US6408413B1 (en) | 1998-02-18 | 2002-06-18 | Texas Instruments Incorporated | Hierarchical access of test access ports in embedded core integrated circuits |
US6405335B1 (en) | 1998-02-25 | 2002-06-11 | Texas Instruments Incorporated | Position independent testing of circuits |
US6560734B1 (en) | 1998-06-19 | 2003-05-06 | Texas Instruments Incorporated | IC with addressable test port |
US6694467B2 (en) * | 1999-06-24 | 2004-02-17 | Texas Instruments Incorporated | Low power testing of very large circuits |
US6519729B1 (en) | 1998-06-27 | 2003-02-11 | Texas Instruments Incorporated | Reduced power testing with equally divided scan paths |
US6266801B1 (en) * | 1998-09-15 | 2001-07-24 | Adaptec, Inc. | Boundary-scan cells with improved timing characteristics |
JP2000214220A (ja) | 1999-01-19 | 2000-08-04 | Texas Instr Inc <Ti> | オンチップモジュ―ルおよびオンチップモジュ―ル間の相互接続をテストするシステムおよび方法 |
JP2000275303A (ja) * | 1999-03-23 | 2000-10-06 | Mitsubishi Electric Corp | バウンダリスキャンテスト方法及びバウンダリスキャンテスト装置 |
US7058862B2 (en) * | 2000-05-26 | 2006-06-06 | Texas Instruments Incorporated | Selecting different 1149.1 TAP domains from update-IR state |
GB9920077D0 (en) | 1999-08-24 | 1999-10-27 | Sgs Thomson Microelectronics | Scan latch circuit |
US6272657B1 (en) * | 1999-10-19 | 2001-08-07 | Atmel Corporation | Apparatus and method for progammable parametric toggle testing of digital CMOS pads |
US6728915B2 (en) | 2000-01-10 | 2004-04-27 | Texas Instruments Incorporated | IC with shared scan cells selectively connected in scan path |
US6769080B2 (en) | 2000-03-09 | 2004-07-27 | Texas Instruments Incorporated | Scan circuit low power adapter with counter |
EP1233276B1 (de) * | 2001-02-19 | 2004-12-01 | Lucent Technologies Inc. | Abtastverzögerungskette zur Verzögerungsmessung |
EP1286170A1 (de) * | 2001-08-14 | 2003-02-26 | Lucent Technologies Inc. | Flipflop für "Boundary-Scan" mit Bypass für die Speicherzelle des Flipflops |
JP4684942B2 (ja) * | 2006-05-10 | 2011-05-18 | ルネサスエレクトロニクス株式会社 | 半導体装置及び観測用フリップフロップの配置方法 |
US9791505B1 (en) * | 2016-04-29 | 2017-10-17 | Texas Instruments Incorporated | Full pad coverage boundary scan |
US11959965B2 (en) | 2021-11-12 | 2024-04-16 | Samsung Electronics Co., Ltd. | Test circuit using clock gating scheme to hold capture procedure and bypass mode, and integrated circuit including the same |
EP4180825A1 (de) * | 2021-11-12 | 2023-05-17 | Samsung Electronics Co., Ltd. | Testschaltung, die ein clock-gating-schema verwendet, um die capture-prozedur und den bypass-modus zu halten, und integrierte schaltung, die diese enthält |
Family Cites Families (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4872169A (en) * | 1987-03-06 | 1989-10-03 | Texas Instruments Incorporated | Hierarchical scan selection |
JP2676169B2 (ja) * | 1989-12-27 | 1997-11-12 | 三菱電機株式会社 | スキャンパス回路 |
JPH03252569A (ja) * | 1990-02-26 | 1991-11-11 | Advanced Micro Devicds Inc | スキャンパス用レジスタ回路 |
JP2770617B2 (ja) * | 1991-09-05 | 1998-07-02 | 日本電気株式会社 | テスト回路 |
US5528610A (en) * | 1992-04-30 | 1996-06-18 | Hughes Aircraft Company | Boundary test cell with self masking capability |
JP2550837B2 (ja) * | 1992-09-25 | 1996-11-06 | 日本電気株式会社 | スキャンパスのテスト制御回路 |
US5477545A (en) * | 1993-02-09 | 1995-12-19 | Lsi Logic Corporation | Method and apparatus for testing of core-cell based integrated circuits |
US5513186A (en) * | 1993-12-07 | 1996-04-30 | Sun Microsystems, Inc. | Method and apparatus for interconnect testing without speed degradation |
US5550843A (en) * | 1994-04-01 | 1996-08-27 | Xilinx, Inc. | Programmable scan chain testing structure and method |
US5623502A (en) * | 1994-07-15 | 1997-04-22 | National Semiconductor Corporation | Testing of electronic circuits which typically contain asynchronous digital circuitry |
US5570375A (en) * | 1995-05-10 | 1996-10-29 | National Science Council Of R.O.C. | IEEE Std. 1149.1 boundary scan circuit capable of built-in self-testing |
-
1996
- 1996-05-08 US US08/643,444 patent/US5710779A/en not_active Expired - Lifetime
-
1997
- 1997-04-08 EP EP97105801A patent/EP0822497B1/de not_active Expired - Lifetime
- 1997-04-08 DE DE69719416T patent/DE69719416T2/de not_active Expired - Fee Related
- 1997-04-09 KR KR1019970012998A patent/KR100469875B1/ko not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
KR100469875B1 (ko) | 2005-05-13 |
EP0822497A2 (de) | 1998-02-04 |
EP0822497A3 (de) | 1998-05-06 |
DE69719416T2 (de) | 2004-01-08 |
KR970071019A (ko) | 1997-11-07 |
EP0822497B1 (de) | 2003-03-05 |
US5710779A (en) | 1998-01-20 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |