DE69610160T2 - Schaltung zur Verringerung der Offset-Abweichung und Offset-Abweichungsverringerungsverfahren mit einer solchen Schaltung - Google Patents

Schaltung zur Verringerung der Offset-Abweichung und Offset-Abweichungsverringerungsverfahren mit einer solchen Schaltung

Info

Publication number
DE69610160T2
DE69610160T2 DE69610160T DE69610160T DE69610160T2 DE 69610160 T2 DE69610160 T2 DE 69610160T2 DE 69610160 T DE69610160 T DE 69610160T DE 69610160 T DE69610160 T DE 69610160T DE 69610160 T2 DE69610160 T2 DE 69610160T2
Authority
DE
Germany
Prior art keywords
potential
potential difference
output
circuit
offset
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69610160T
Other languages
German (de)
English (en)
Other versions
DE69610160D1 (de
Inventor
Sumihiro Takashima
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Lapis Semiconductor Co Ltd
Original Assignee
Oki Electric Industry Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Oki Electric Industry Co Ltd filed Critical Oki Electric Industry Co Ltd
Application granted granted Critical
Publication of DE69610160D1 publication Critical patent/DE69610160D1/de
Publication of DE69610160T2 publication Critical patent/DE69610160T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L1/00—Measuring force or stress, in general
    • G01L1/20—Measuring force or stress, in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress
    • G01L1/22—Measuring force or stress, in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress using resistance strain gauges
    • G01L1/2268—Arrangements for correcting or for compensating unwanted effects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D3/00—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups
    • G01D3/02—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups with provision for altering or correcting the law of variation

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Technology Law (AREA)
  • Amplifiers (AREA)
  • Measurement Of Current Or Voltage (AREA)
  • Measuring Fluid Pressure (AREA)
  • Testing Or Calibration Of Command Recording Devices (AREA)
DE69610160T 1995-06-13 1996-06-13 Schaltung zur Verringerung der Offset-Abweichung und Offset-Abweichungsverringerungsverfahren mit einer solchen Schaltung Expired - Fee Related DE69610160T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP14625295A JP3609152B2 (ja) 1995-06-13 1995-06-13 オフセットキャンセル回路とそれを用いたオフセットキャンセルシステム

Publications (2)

Publication Number Publication Date
DE69610160D1 DE69610160D1 (de) 2000-10-12
DE69610160T2 true DE69610160T2 (de) 2001-05-10

Family

ID=15403545

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69610160T Expired - Fee Related DE69610160T2 (de) 1995-06-13 1996-06-13 Schaltung zur Verringerung der Offset-Abweichung und Offset-Abweichungsverringerungsverfahren mit einer solchen Schaltung

Country Status (6)

Country Link
US (1) US5703516A (cg-RX-API-DMAC7.html)
EP (1) EP0749001B1 (cg-RX-API-DMAC7.html)
JP (1) JP3609152B2 (cg-RX-API-DMAC7.html)
CN (1) CN1062393C (cg-RX-API-DMAC7.html)
DE (1) DE69610160T2 (cg-RX-API-DMAC7.html)
TW (1) TW310387B (cg-RX-API-DMAC7.html)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102006045893A1 (de) * 2006-09-28 2008-04-03 Siemens Ag Automatische Verschiebung des Messwerterfassungsbereichs einer sensorischen Messeinrichtung

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6194965B1 (en) * 1999-09-03 2001-02-27 Cypress Semiconductor Corp. Differential signal detection circuit
JP4515241B2 (ja) * 2004-12-16 2010-07-28 Ｏｋｉセミコンダクタ株式会社 出力増幅回路及びそれを用いたセンサ装置
US7522676B2 (en) * 2006-02-06 2009-04-21 Nokia Corporation Method and system for transmitter envelope delay calibration
JP2008312079A (ja) * 2007-06-18 2008-12-25 Denso Corp 増幅回路
CN102612279A (zh) * 2011-01-19 2012-07-25 鸿富锦精密工业（深圳）有限公司 服务器机柜
CN116558679A (zh) * 2023-05-11 2023-08-08 上海泰矽微电子有限公司 偏压消除电路和压力测量电路

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4521702A (en) * 1982-10-13 1985-06-04 The United States Of America As Represented By The Administrator, National Aeronautics And Space Administration Reactanceless synthesized impedance bandpass amplifier
JP2534520B2 (ja) * 1987-11-13 1996-09-18 シチズン時計株式会社 生体組織張力計
GB2234069B (en) * 1988-10-28 1992-08-12 Motorola Inc Sensor arrangement
US5047665A (en) * 1989-02-08 1991-09-10 Burr-Brown Corporation Low noise, low offset, high speed CMOS differential amplifier
US5032740A (en) * 1989-11-06 1991-07-16 Eastman Kodak Company Voltage level conversion of a clock signal
JP2625347B2 (ja) * 1993-04-20 1997-07-02 日本電気株式会社 ディジタル受信器の自動オフセット制御回路
US5327099A (en) * 1993-08-02 1994-07-05 Motorola, Inc. Differential stage that provides minimal offset between inputs

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102006045893A1 (de) * 2006-09-28 2008-04-03 Siemens Ag Automatische Verschiebung des Messwerterfassungsbereichs einer sensorischen Messeinrichtung

Also Published As

Publication number Publication date
EP0749001A1 (en) 1996-12-18
CN1062393C (zh) 2001-02-21
US5703516A (en) 1997-12-30
JP3609152B2 (ja) 2005-01-12
EP0749001B1 (en) 2000-09-06
JPH08340222A (ja) 1996-12-24
DE69610160D1 (de) 2000-10-12
TW310387B (cg-RX-API-DMAC7.html) 1997-07-11
CN1141532A (zh) 1997-01-29

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8327 Change in the person/name/address of the patent owner

Owner name: OKI SEMICONDUCTOR CO.,LTD., TOKYO, JP

8339 Ceased/non-payment of the annual fee