TW310387B - - Google Patents

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Publication number
TW310387B
TW310387B TW085103699A TW85103699A TW310387B TW 310387 B TW310387 B TW 310387B TW 085103699 A TW085103699 A TW 085103699A TW 85103699 A TW85103699 A TW 85103699A TW 310387 B TW310387 B TW 310387B
Authority
TW
Taiwan
Prior art keywords
potential
potential difference
intermediate nodes
output
offset
Prior art date
Application number
TW085103699A
Other languages
English (en)
Chinese (zh)
Original Assignee
Oki Electric Ind Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Oki Electric Ind Co Ltd filed Critical Oki Electric Ind Co Ltd
Application granted granted Critical
Publication of TW310387B publication Critical patent/TW310387B/zh

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01LMEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L1/00Measuring force or stress, in general
    • G01L1/20Measuring force or stress, in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress
    • G01L1/22Measuring force or stress, in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress using resistance strain gauges
    • G01L1/2268Arrangements for correcting or for compensating unwanted effects
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01DMEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D3/00Indicating or recording apparatus with provision for the special purposes referred to in the subgroups
    • G01D3/02Indicating or recording apparatus with provision for the special purposes referred to in the subgroups with provision for altering or correcting the law of variation

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Technology Law (AREA)
  • Amplifiers (AREA)
  • Measurement Of Current Or Voltage (AREA)
  • Measuring Fluid Pressure (AREA)
  • Testing Or Calibration Of Command Recording Devices (AREA)
TW085103699A 1995-06-13 1996-03-27 TW310387B (cg-RX-API-DMAC7.html)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP14625295A JP3609152B2 (ja) 1995-06-13 1995-06-13 オフセットキャンセル回路とそれを用いたオフセットキャンセルシステム

Publications (1)

Publication Number Publication Date
TW310387B true TW310387B (cg-RX-API-DMAC7.html) 1997-07-11

Family

ID=15403545

Family Applications (1)

Application Number Title Priority Date Filing Date
TW085103699A TW310387B (cg-RX-API-DMAC7.html) 1995-06-13 1996-03-27

Country Status (6)

Country Link
US (1) US5703516A (cg-RX-API-DMAC7.html)
EP (1) EP0749001B1 (cg-RX-API-DMAC7.html)
JP (1) JP3609152B2 (cg-RX-API-DMAC7.html)
CN (1) CN1062393C (cg-RX-API-DMAC7.html)
DE (1) DE69610160T2 (cg-RX-API-DMAC7.html)
TW (1) TW310387B (cg-RX-API-DMAC7.html)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6194965B1 (en) * 1999-09-03 2001-02-27 Cypress Semiconductor Corp. Differential signal detection circuit
JP4515241B2 (ja) * 2004-12-16 2010-07-28 Okiセミコンダクタ株式会社 出力増幅回路及びそれを用いたセンサ装置
US7522676B2 (en) * 2006-02-06 2009-04-21 Nokia Corporation Method and system for transmitter envelope delay calibration
DE102006045893A1 (de) * 2006-09-28 2008-04-03 Siemens Ag Automatische Verschiebung des Messwerterfassungsbereichs einer sensorischen Messeinrichtung
JP2008312079A (ja) * 2007-06-18 2008-12-25 Denso Corp 増幅回路
CN102612279A (zh) * 2011-01-19 2012-07-25 鸿富锦精密工业(深圳)有限公司 服务器机柜
CN116558679A (zh) * 2023-05-11 2023-08-08 上海泰矽微电子有限公司 偏压消除电路和压力测量电路

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4521702A (en) * 1982-10-13 1985-06-04 The United States Of America As Represented By The Administrator, National Aeronautics And Space Administration Reactanceless synthesized impedance bandpass amplifier
JP2534520B2 (ja) * 1987-11-13 1996-09-18 シチズン時計株式会社 生体組織張力計
GB2234069B (en) * 1988-10-28 1992-08-12 Motorola Inc Sensor arrangement
US5047665A (en) * 1989-02-08 1991-09-10 Burr-Brown Corporation Low noise, low offset, high speed CMOS differential amplifier
US5032740A (en) * 1989-11-06 1991-07-16 Eastman Kodak Company Voltage level conversion of a clock signal
JP2625347B2 (ja) * 1993-04-20 1997-07-02 日本電気株式会社 ディジタル受信器の自動オフセット制御回路
US5327099A (en) * 1993-08-02 1994-07-05 Motorola, Inc. Differential stage that provides minimal offset between inputs

Also Published As

Publication number Publication date
EP0749001A1 (en) 1996-12-18
CN1062393C (zh) 2001-02-21
DE69610160T2 (de) 2001-05-10
US5703516A (en) 1997-12-30
JP3609152B2 (ja) 2005-01-12
EP0749001B1 (en) 2000-09-06
JPH08340222A (ja) 1996-12-24
DE69610160D1 (de) 2000-10-12
CN1141532A (zh) 1997-01-29

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