DE69532998T2 - Gerät und verfahren zur differentialanayse unter verwendung von realen und imaginären signalkomponenten - Google Patents
Gerät und verfahren zur differentialanayse unter verwendung von realen und imaginären signalkomponenten Download PDFInfo
- Publication number
- DE69532998T2 DE69532998T2 DE69532998T DE69532998T DE69532998T2 DE 69532998 T2 DE69532998 T2 DE 69532998T2 DE 69532998 T DE69532998 T DE 69532998T DE 69532998 T DE69532998 T DE 69532998T DE 69532998 T2 DE69532998 T2 DE 69532998T2
- Authority
- DE
- Germany
- Prior art keywords
- sample
- temperature
- characteristic parameter
- differential
- section
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N25/00—Investigating or analyzing materials by the use of thermal means
- G01N25/20—Investigating or analyzing materials by the use of thermal means by investigating the development of heat, i.e. calorimetry, e.g. by measuring specific heat, by measuring thermal conductivity
- G01N25/48—Investigating or analyzing materials by the use of thermal means by investigating the development of heat, i.e. calorimetry, e.g. by measuring specific heat, by measuring thermal conductivity on solution, sorption, or a chemical reaction not involving combustion or catalytic oxidation
- G01N25/4846—Investigating or analyzing materials by the use of thermal means by investigating the development of heat, i.e. calorimetry, e.g. by measuring specific heat, by measuring thermal conductivity on solution, sorption, or a chemical reaction not involving combustion or catalytic oxidation for a motionless, e.g. solid sample
- G01N25/4866—Investigating or analyzing materials by the use of thermal means by investigating the development of heat, i.e. calorimetry, e.g. by measuring specific heat, by measuring thermal conductivity on solution, sorption, or a chemical reaction not involving combustion or catalytic oxidation for a motionless, e.g. solid sample by using a differential method
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K17/00—Measuring quantity of heat
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N25/00—Investigating or analyzing materials by the use of thermal means
- G01N25/20—Investigating or analyzing materials by the use of thermal means by investigating the development of heat, i.e. calorimetry, e.g. by measuring specific heat, by measuring thermal conductivity
- G01N25/48—Investigating or analyzing materials by the use of thermal means by investigating the development of heat, i.e. calorimetry, e.g. by measuring specific heat, by measuring thermal conductivity on solution, sorption, or a chemical reaction not involving combustion or catalytic oxidation
- G01N25/4806—Details not adapted to a particular type of sample
- G01N25/4826—Details not adapted to a particular type of sample concerning the heating or cooling arrangements
- G01N25/4833—Details not adapted to a particular type of sample concerning the heating or cooling arrangements specially adapted for temperature scanning
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Combustion & Propulsion (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Or Analyzing Materials Using Thermal Means (AREA)
Applications Claiming Priority (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US08/252,597 US5549387A (en) | 1994-06-01 | 1994-06-01 | Apparatus and method for differential analysis using real and imaginary signal components |
US252597 | 1994-06-01 | ||
US39857295A | 1995-03-03 | 1995-03-03 | |
US398572 | 1995-03-03 | ||
PCT/US1995/006464 WO1995033199A1 (en) | 1994-06-01 | 1995-05-22 | Apparatus and method for differential analysis using real and imaginary signal components |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69532998D1 DE69532998D1 (de) | 2004-06-09 |
DE69532998T2 true DE69532998T2 (de) | 2004-09-02 |
Family
ID=26942472
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69532998T Expired - Lifetime DE69532998T2 (de) | 1994-06-01 | 1995-05-22 | Gerät und verfahren zur differentialanayse unter verwendung von realen und imaginären signalkomponenten |
Country Status (5)
Country | Link |
---|---|
EP (1) | EP0803061B1 (ja) |
JP (1) | JP3556227B2 (ja) |
AU (1) | AU2644795A (ja) |
DE (1) | DE69532998T2 (ja) |
WO (1) | WO1995033199A1 (ja) |
Families Citing this family (16)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5672289A (en) * | 1996-01-11 | 1997-09-30 | The Perkin-Elmer Corporation | Heater control circuit |
JP3370592B2 (ja) * | 1998-01-19 | 2003-01-27 | セイコーインスツルメンツ株式会社 | 示差熱分析装置 |
US6402369B1 (en) * | 1998-11-03 | 2002-06-11 | Sarnoff Corporation | Arrayable thermal assays |
DE69903730T2 (de) * | 1999-09-27 | 2003-07-10 | Mettler Toledo Gmbh | Verfahren und Vorrichtung für die thermische Analyse eines Materials |
ATE313073T1 (de) | 2000-02-03 | 2005-12-15 | Mettler Toledo Gmbh | Modulationsverfahren und vorrichtung für die thermoanalyse eines materials |
US6561692B2 (en) * | 2000-03-23 | 2003-05-13 | Ta Instruments-Waters Llc | Differential scanning calorimeter |
US6431747B1 (en) | 2000-03-23 | 2002-08-13 | Ta Instruments, Inc. | Heat flux differential scanning calorimeter sensor |
US6488406B2 (en) | 2000-03-23 | 2002-12-03 | Ta Instruments-Waters, Llc | Differential scanning calorimeter |
EP1162021B1 (en) * | 2000-06-06 | 2005-02-02 | Matsushita Electric Industrial Co., Ltd. | Method for estimating quality of lead-free solder material and process for flow soldering |
EP1182439B1 (en) * | 2000-08-23 | 2016-04-13 | TA Instruments - Waters LLC | Power compensation differential scanning calorimeter |
US6641300B1 (en) | 2001-01-29 | 2003-11-04 | Waters Investment, Ltd. | Differential scanning calorimeter |
US6648504B2 (en) | 2002-03-01 | 2003-11-18 | Waters Investment Limited | System and method for calibrating contact thermal resistances in differential scanning calorimeters |
US7826993B2 (en) * | 2005-01-04 | 2010-11-02 | Mettler-Toledo Ag | Method and device for analyzing substances |
JP5461536B2 (ja) * | 2008-06-06 | 2014-04-02 | パーキンエルマー・ヘルス・サイエンシーズ・インコーポレイテッド | 熱量計およびそれを用いる方法ならびにそのための制御システム |
EP2221136A1 (de) * | 2009-02-20 | 2010-08-25 | Endress+Hauser GmbH+Co. KG | Lötanlage und Verfahren zur Erkennung von einem Lot enthaltenen Verunreinigungen |
NL2028305B1 (en) * | 2021-05-27 | 2022-12-08 | Veridis Tech B V | Massive differential scanning calorimetry analysis method and apparatus |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB1431111A (en) * | 1973-08-28 | 1976-04-07 | Ts K Bjuro Unikalnogo Priboro | Method of and apparatus for measuring dynamic characteristics of materials |
US4255961A (en) * | 1978-10-17 | 1981-03-17 | University Of Va. Alumni Patents Foundation | Differential calorimeter based on the heat leak principle |
GB2075675A (en) * | 1980-03-25 | 1981-11-18 | Inst Cercetari Chim | Method and apparatus for the calorimetric study of composite materials |
US4517021A (en) * | 1983-10-28 | 1985-05-14 | A. E. Staley Manufacturing Company | Semi-crystalline fructose |
DE3529489A1 (de) * | 1985-08-16 | 1987-02-26 | Max Planck Gesellschaft | Verfahren und einrichtung zum bestimmen der waermekapazitaet einer probe |
US5224775C2 (en) * | 1992-03-02 | 2002-04-23 | Ta Instr Inc | Method and apparatus for modulated differential analysis |
JP2909950B2 (ja) * | 1993-09-24 | 1999-06-23 | セイコーインスツルメンツ株式会社 | 熱分析装置 |
-
1995
- 1995-05-22 AU AU26447/95A patent/AU2644795A/en not_active Abandoned
- 1995-05-22 WO PCT/US1995/006464 patent/WO1995033199A1/en active IP Right Grant
- 1995-05-22 DE DE69532998T patent/DE69532998T2/de not_active Expired - Lifetime
- 1995-05-22 JP JP50098696A patent/JP3556227B2/ja not_active Expired - Lifetime
- 1995-05-22 EP EP95921344A patent/EP0803061B1/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
DE69532998D1 (de) | 2004-06-09 |
AU2644795A (en) | 1995-12-21 |
EP0803061A4 (en) | 1998-03-11 |
JP3556227B2 (ja) | 2004-08-18 |
WO1995033199A1 (en) | 1995-12-07 |
EP0803061A1 (en) | 1997-10-29 |
JPH10504381A (ja) | 1998-04-28 |
EP0803061B1 (en) | 2004-05-06 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8327 | Change in the person/name/address of the patent owner |
Owner name: APPLERA CORP., FOSTER CITY, CALIF., US |
|
8327 | Change in the person/name/address of the patent owner |
Owner name: PERKIN-ELMER CORPORATION, NORWALK, CONN., US |
|
8364 | No opposition during term of opposition |