DE69526123D1 - Fehlersteuerungsverfahren für flash-eeprom-speichermatritzen - Google Patents

Fehlersteuerungsverfahren für flash-eeprom-speichermatritzen

Info

Publication number
DE69526123D1
DE69526123D1 DE69526123T DE69526123T DE69526123D1 DE 69526123 D1 DE69526123 D1 DE 69526123D1 DE 69526123 T DE69526123 T DE 69526123T DE 69526123 T DE69526123 T DE 69526123T DE 69526123 D1 DE69526123 D1 DE 69526123D1
Authority
DE
Germany
Prior art keywords
control method
error control
eeprom memory
flash eeprom
flash
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69526123T
Other languages
English (en)
Other versions
DE69526123T2 (de
Inventor
Mark Christopherson
Steven Wells
Greg Atwood
Mark Bauer
Albert Fazio
Robert Hasbun
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Intel Corp
Original Assignee
Intel Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Intel Corp filed Critical Intel Corp
Application granted granted Critical
Publication of DE69526123D1 publication Critical patent/DE69526123D1/de
Publication of DE69526123T2 publication Critical patent/DE69526123T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/70—Masking faults in memories by using spares or by reconfiguring
    • G11C29/76—Masking faults in memories by using spares or by reconfiguring using address translation or modifications
    • G11C29/765—Masking faults in memories by using spares or by reconfiguring using address translation or modifications in solid state disks
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/08—Error detection or correction by redundancy in data representation, e.g. by using checking codes
    • G06F11/10—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's
    • G06F11/1008—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices
    • G06F11/1068—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices in sector programmable memories, e.g. flash disk
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/56—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency
    • G11C11/5621—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency using charge storage in a floating gate
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/08—Error detection or correction by redundancy in data representation, e.g. by using checking codes
    • G06F11/10—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's
    • G06F11/1008—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices
    • G06F11/1012—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices using codes or arrangements adapted for a specific type of error
    • G06F11/1036—Unidirectional errors
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/08—Error detection or correction by redundancy in data representation, e.g. by using checking codes
    • G06F11/10—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's
    • G06F11/1008—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices
    • G06F11/1048—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices using arrangements adapted for a specific error detection or correction feature
    • G06F11/106—Correcting systematically all correctable errors, i.e. scrubbing
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/08—Error detection or correction by redundancy in data representation, e.g. by using checking codes
    • G06F11/10—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's
    • G06F11/1008—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices
    • G06F11/1072—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices in multilevel memories
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F2201/00—Indexing scheme relating to error detection, to error correction, and to monitoring
    • G06F2201/88—Monitoring involving counting
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
  • Read Only Memory (AREA)
DE69526123T 1994-12-27 1995-12-21 Fehlersteuerungsverfahren für flash-eeprom-speichermatritzen Expired - Lifetime DE69526123T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US08/364,546 US5475693A (en) 1994-12-27 1994-12-27 Error management processes for flash EEPROM memory arrays
PCT/US1995/016761 WO1996020443A1 (en) 1994-12-27 1995-12-21 Error management processes for flash eeprom memory arrays

Publications (2)

Publication Number Publication Date
DE69526123D1 true DE69526123D1 (de) 2002-05-02
DE69526123T2 DE69526123T2 (de) 2002-11-21

Family

ID=23434967

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69526123T Expired - Lifetime DE69526123T2 (de) 1994-12-27 1995-12-21 Fehlersteuerungsverfahren für flash-eeprom-speichermatritzen

Country Status (8)

Country Link
US (1) US5475693A (de)
EP (1) EP0813711B1 (de)
KR (1) KR100283726B1 (de)
CN (1) CN1097227C (de)
AU (1) AU4606396A (de)
DE (1) DE69526123T2 (de)
HK (1) HK1008584A1 (de)
WO (1) WO1996020443A1 (de)

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Also Published As

Publication number Publication date
DE69526123T2 (de) 2002-11-21
EP0813711A4 (de) 1998-04-01
KR100283726B1 (ko) 2001-03-02
CN1175311A (zh) 1998-03-04
EP0813711A1 (de) 1997-12-29
US5475693A (en) 1995-12-12
CN1097227C (zh) 2002-12-25
WO1996020443A1 (en) 1996-07-04
HK1008584A1 (en) 1999-05-14
EP0813711B1 (de) 2002-03-27
AU4606396A (en) 1996-07-19

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