DE69517759D1 - Integrierte Halbleiterschaltung - Google Patents

Integrierte Halbleiterschaltung

Info

Publication number
DE69517759D1
DE69517759D1 DE69517759T DE69517759T DE69517759D1 DE 69517759 D1 DE69517759 D1 DE 69517759D1 DE 69517759 T DE69517759 T DE 69517759T DE 69517759 T DE69517759 T DE 69517759T DE 69517759 D1 DE69517759 D1 DE 69517759D1
Authority
DE
Germany
Prior art keywords
semiconductor circuit
integrated semiconductor
integrated
circuit
semiconductor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69517759T
Other languages
English (en)
Other versions
DE69517759T2 (de
Inventor
Harumi Kawano
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Oki Electric Industry Co Ltd
Original Assignee
Oki Electric Industry Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Oki Electric Industry Co Ltd filed Critical Oki Electric Industry Co Ltd
Publication of DE69517759D1 publication Critical patent/DE69517759D1/de
Application granted granted Critical
Publication of DE69517759T2 publication Critical patent/DE69517759T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/30—Marginal testing, e.g. by varying supply voltage
    • G01R31/3004—Current or voltage test
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
DE69517759T 1994-08-30 1995-08-23 Integrierte Halbleiterschaltung Expired - Fee Related DE69517759T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP20472894A JP3157683B2 (ja) 1994-08-30 1994-08-30 半導体集積回路の静止時電流測定法、半導体集積回路

Publications (2)

Publication Number Publication Date
DE69517759D1 true DE69517759D1 (de) 2000-08-10
DE69517759T2 DE69517759T2 (de) 2001-02-01

Family

ID=16495336

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69517759T Expired - Fee Related DE69517759T2 (de) 1994-08-30 1995-08-23 Integrierte Halbleiterschaltung

Country Status (6)

Country Link
US (3) US5672982A (de)
EP (1) EP0699998B1 (de)
JP (1) JP3157683B2 (de)
KR (1) KR100292728B1 (de)
DE (1) DE69517759T2 (de)
TW (1) TW357270B (de)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE4319710C1 (de) * 1993-06-15 1994-09-29 Ita Ingb Testaufgaben Gmbh Testverfahren für einen auf einer Platine eingelöteten IC und Testvorrichtung zum Durchführen des Testverfahrens
KR970029758A (ko) * 1995-11-09 1997-06-26 리 패치 저전압 cmos 회로용 누설 전류 제어 시스템 및 그 방법
DE19611520A1 (de) * 1996-03-23 1997-09-25 Bosch Gmbh Robert System zum Test eines in einem Steuergerät eingebauten Rechners
US6693448B1 (en) * 1998-08-24 2004-02-17 Renesas Technology Corporation Semiconductor integrated circuit
US6396315B1 (en) * 1999-05-03 2002-05-28 Agere Systems Guardian Corp. Voltage clamp for a failsafe buffer
US6424177B1 (en) 1999-06-28 2002-07-23 Broadcom Corporation Universal single-ended parallel bus
US6377086B1 (en) 1999-10-05 2002-04-23 Agere Systems Guardian Corp. Low power dual-voltage sense circuit buffer
KR100594287B1 (ko) * 2004-07-05 2006-06-30 삼성전자주식회사 넓은 범위의 입력 전압에 대응 가능한 입력 버퍼
KR100728572B1 (ko) 2006-06-29 2007-06-15 주식회사 하이닉스반도체 반도체 메모리 장치
WO2009013814A1 (ja) * 2007-07-24 2009-01-29 Fujitsu Limited 半導体装置
US20130033285A1 (en) * 2011-08-02 2013-02-07 Globalfoundries Inc. Methods for reliability testing of semiconductor devices

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL8900050A (nl) * 1989-01-10 1990-08-01 Philips Nv Inrichting voor het meten van een ruststroom van een geintegreerde monolitische digitale schakeling, geintegreerde monolitische digitale schakeling voorzien van een dergelijke inrichting en testapparaat voorzien van een dergelijke inrichting.
US5371457A (en) * 1991-02-12 1994-12-06 Lipp; Robert J. Method and apparatus to test for current in an integrated circuit
DE69333821T2 (de) * 1992-06-15 2005-11-17 Fujitsu Ltd., Kawasaki Integrierte Halbleiterschaltung mit Eingangs/Ausgangschnittstelle geeignet für niedrige Amplituden
JPH0677786A (ja) * 1992-08-26 1994-03-18 Mitsubishi Electric Corp 半導体集積回路装置
US5508649A (en) * 1994-07-21 1996-04-16 National Semiconductor Corporation Voltage level triggered ESD protection circuit
US5594373A (en) * 1994-12-20 1997-01-14 Sgs-Thomson Microelectronics, Inc. Output driver circuitry with selective limited output high voltage
KR0121137B1 (ko) * 1994-12-31 1997-12-04 문정환 센스 앰프의 구동 신호 발생 회로
US5712857A (en) * 1995-09-29 1998-01-27 Intel Corporation Methods and apparatus for correlating stuck-at fault test coverage and current leakage fault test coverage
US5847581A (en) * 1996-12-31 1998-12-08 Intel Corporation Low power CMOS precision input receiver with integrated reference

Also Published As

Publication number Publication date
JPH0868827A (ja) 1996-03-12
KR100292728B1 (ko) 2001-06-15
US5672982A (en) 1997-09-30
DE69517759T2 (de) 2001-02-01
EP0699998B1 (de) 2000-07-05
EP0699998A1 (de) 1996-03-06
US6064233A (en) 2000-05-16
TW357270B (en) 1999-05-01
US5783947A (en) 1998-07-21
KR960008335A (ko) 1996-03-22
JP3157683B2 (ja) 2001-04-16

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee