DE69502752T2 - Steckverbinder und Vorrichtung zum Prüfen von Konnektoren und Betätigungsmechanismus dazu - Google Patents
Steckverbinder und Vorrichtung zum Prüfen von Konnektoren und Betätigungsmechanismus dazuInfo
- Publication number
- DE69502752T2 DE69502752T2 DE69502752T DE69502752T DE69502752T2 DE 69502752 T2 DE69502752 T2 DE 69502752T2 DE 69502752 T DE69502752 T DE 69502752T DE 69502752 T DE69502752 T DE 69502752T DE 69502752 T2 DE69502752 T2 DE 69502752T2
- Authority
- DE
- Germany
- Prior art keywords
- connector
- actuating mechanism
- mechanism therefor
- testing connectors
- connectors
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R43/00—Apparatus or processes specially adapted for manufacturing, assembling, maintaining, or repairing of line connectors or current collectors or for joining electric conductors
- H01R43/20—Apparatus or processes specially adapted for manufacturing, assembling, maintaining, or repairing of line connectors or current collectors or for joining electric conductors for assembling or disassembling contact members with insulating base, case or sleeve
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/66—Testing of connections, e.g. of plugs or non-disconnectable joints
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/66—Testing of connections, e.g. of plugs or non-disconnectable joints
- G01R31/68—Testing of releasable connections, e.g. of terminals mounted on a printed circuit board
- G01R31/69—Testing of releasable connections, e.g. of terminals mounted on a printed circuit board of terminals at the end of a cable or a wire harness; of plugs; of sockets, e.g. wall sockets or power sockets in appliances
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
- H01R13/40—Securing contact members in or to a base or case; Insulating of contact members
- H01R13/42—Securing in a demountable manner
- H01R13/422—Securing in resilient one-piece base or case, e.g. by friction; One-piece base or case formed with resilient locking means
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Manufacturing Of Electrical Connectors (AREA)
- Connector Housings Or Holding Contact Members (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP6067830A JP2976801B2 (ja) | 1994-03-10 | 1994-03-10 | コネクタ検査装置 |
JP6067829A JP2940392B2 (ja) | 1994-03-10 | 1994-03-10 | コネクタ検査装置 |
JP6070131A JP3043568B2 (ja) | 1994-03-14 | 1994-03-14 | コネクタ |
JP6107962A JP2797965B2 (ja) | 1994-04-21 | 1994-04-21 | コネクタ検査方法及びコネクタ検査装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69502752D1 DE69502752D1 (de) | 1998-07-09 |
DE69502752T2 true DE69502752T2 (de) | 1998-10-08 |
Family
ID=27464906
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69502752T Expired - Lifetime DE69502752T2 (de) | 1994-03-10 | 1995-03-10 | Steckverbinder und Vorrichtung zum Prüfen von Konnektoren und Betätigungsmechanismus dazu |
Country Status (3)
Country | Link |
---|---|
US (2) | US5614820A (de) |
EP (1) | EP0671789B1 (de) |
DE (1) | DE69502752T2 (de) |
Families Citing this family (42)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0922765A (ja) * | 1995-07-06 | 1997-01-21 | Yazaki Corp | コネクタ導通検査器及びコネクタ導通検査時の端子係止方法 |
EP0774667A3 (de) * | 1995-11-16 | 1998-07-08 | The Whitaker Corporation | Überprufung des Verbindens zweier Teile |
JP3094891B2 (ja) * | 1996-02-16 | 2000-10-03 | 住友電装株式会社 | コネクタ検査装置 |
JP3161351B2 (ja) * | 1997-02-24 | 2001-04-25 | 住友電装株式会社 | オートロック式導通検査ユニット |
US6081124A (en) * | 1997-03-31 | 2000-06-27 | Sumitomo Wiring Systems, Ltd. | Testing unit for connector testing |
US6280236B1 (en) | 1998-12-21 | 2001-08-28 | Avaya Technology Corp. | Testing system with bridge clip, and connector having a positive stop |
US6129575A (en) * | 1998-12-21 | 2000-10-10 | Lucent Technologies Inc. | Testing system for a connector with a self-sealing connector housing |
US6302725B1 (en) | 1998-12-21 | 2001-10-16 | Avaya Technology Corporation | Self-latching terminal strip |
US6340306B1 (en) | 1998-12-21 | 2002-01-22 | Avaya Technology Corp. | Bridge clip for a connector |
JP3662756B2 (ja) * | 1999-01-11 | 2005-06-22 | インターナショナル・ビジネス・マシーンズ・コーポレーション | プローバ圧接装置及びプローバ圧接方法 |
US6373259B1 (en) | 1999-03-09 | 2002-04-16 | Avaya Technology Corp. | Connector testing system having a test prong including a projection |
EP1073164B1 (de) * | 1999-07-28 | 2003-05-14 | Sumitomo Wiring Systems, Ltd. | Sensor, Vorrichtung zum Anzeigen der Drahteinführung, Inspektionsverfahren und Inspektionsapparat für die Drahtmontage |
AU8033900A (en) * | 1999-08-25 | 2001-03-19 | Cinch Connectors, Inc. | Testing device for an electrical connector |
JP3828697B2 (ja) * | 1999-12-03 | 2006-10-04 | 矢崎総業株式会社 | コネクタ導通検査具 |
JP2001194408A (ja) * | 2000-01-11 | 2001-07-19 | Yazaki Corp | コネクタ導通検査具のランス変位検出ピンとコネクタのランスとの接触構造 |
JP2001208790A (ja) * | 2000-01-26 | 2001-08-03 | Yazaki Corp | コネクタ導通検査具 |
EP1124136A1 (de) * | 2000-02-10 | 2001-08-16 | Sumitomo Wiring Systems, Ltd. | Vorrichtung und Verfahren zum Prüfen der elektrischen Verbindung für Verbinderanschlüsse |
JP2001257023A (ja) | 2000-03-14 | 2001-09-21 | Yazaki Corp | コネクタ |
JP3575597B2 (ja) | 2000-03-14 | 2004-10-13 | 矢崎総業株式会社 | コネクタの位置決め構造 |
JP3804432B2 (ja) * | 2000-10-17 | 2006-08-02 | 住友電装株式会社 | 検査ユニットおよびそれを用いたコネクタ検査装置 |
JP2003017174A (ja) * | 2001-07-04 | 2003-01-17 | Yazaki Corp | ホルダ付コネクタ |
US6600330B1 (en) * | 2002-01-11 | 2003-07-29 | Tektronix, Inc. | Probe head holder |
JP2003255013A (ja) * | 2002-02-28 | 2003-09-10 | Sumitomo Wiring Syst Ltd | コネクタの導通検査ユニット |
US6876206B2 (en) * | 2002-08-23 | 2005-04-05 | Adc Telecommunications, Inc. | Automatic jack tester |
US7059880B2 (en) * | 2003-10-08 | 2006-06-13 | R & R Home Networking | Coupling device for coaxial cable and communication applications |
FR2866485A1 (fr) * | 2004-02-12 | 2005-08-19 | Framatome Connectors Int | Partie de connecteur electrique etanche. |
KR100666854B1 (ko) * | 2004-11-17 | 2007-01-10 | 현대자동차주식회사 | 커넥터 핀 검사장치 |
US7116120B1 (en) * | 2005-09-07 | 2006-10-03 | Agilent Technologies, Inc. | Clamping test fixture for a high frequency miniature probe assembly |
TWM290998U (en) * | 2005-12-15 | 2006-05-21 | Quanta Comp Inc | Slant detection device |
US8769812B2 (en) | 2007-03-22 | 2014-07-08 | International Business Machines Corporation | Propagating pin corrections through physically mating devices |
JP5140407B2 (ja) * | 2007-12-18 | 2013-02-06 | 株式会社オートネットワーク技術研究所 | ジョイントコネクタ |
JP5471607B2 (ja) * | 2010-03-03 | 2014-04-16 | 住友電装株式会社 | コネクタ組立用治具 |
JP5618667B2 (ja) * | 2010-07-20 | 2014-11-05 | 矢崎総業株式会社 | コネクタ検査システム |
DE102011053800A1 (de) * | 2011-09-20 | 2013-03-21 | Invite GmbH | Haltegestell für eine Multikupplung zum Befüllen und/oder Entleeren eines Chemieanlagencontainers |
JP6432017B2 (ja) * | 2016-11-30 | 2018-12-05 | 日本電産リード株式会社 | 接触端子、検査治具、及び検査装置 |
US11128086B2 (en) * | 2018-05-11 | 2021-09-21 | The Boeing Company | Apparatus for contact insertion and retention testing |
JP6892422B2 (ja) * | 2018-09-04 | 2021-06-23 | 矢崎総業株式会社 | 同軸ケーブルの端子状態測定装置 |
CN111488747A (zh) * | 2019-01-28 | 2020-08-04 | 上海瑞实电子系统集成有限公司 | 一种防止内存卡高温的读卡器 |
JP7099408B2 (ja) * | 2019-06-17 | 2022-07-12 | 株式会社オートネットワーク技術研究所 | ワイヤーハーネスの製造方法及び製造装置 |
US11171450B2 (en) * | 2019-07-12 | 2021-11-09 | International Business Machines Corporation | Method and apparatus for the alignment and locking of removable elements with a connector |
USD925467S1 (en) * | 2019-11-19 | 2021-07-20 | American Electric Power Company, Inc. | Switch cover blockout device |
CN117452035B (zh) * | 2023-11-20 | 2024-04-16 | 南京鼎典科技有限公司 | 一种线束导通检测用辅助定位工装及线束导通检测方法 |
Family Cites Families (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4232262A (en) * | 1978-10-12 | 1980-11-04 | Emo George C | Connector contact terminal contamination probe |
JPS60140160A (ja) * | 1983-12-27 | 1985-07-25 | Sumitomo Wiring Syst Ltd | コネクタの端子検査器 |
DE3545114A1 (de) * | 1985-12-19 | 1987-06-25 | Siemens Ag | Pruef- und messeinrichtung fuer elektrische kontakte, insbesondere von steckkontakten fuer die nachrichtentechnik |
JPH0692918B2 (ja) * | 1987-12-08 | 1994-11-16 | 矢崎総業株式会社 | コネクタの端子検査装置および検査方法 |
JPH025383A (ja) * | 1988-06-24 | 1990-01-10 | Yazaki Corp | コネクタ端子検出具 |
ES2072951T3 (es) * | 1989-09-25 | 1995-08-01 | Whitaker Corp | Conjunto de conectador electrico con multiples contactos. |
US5030906A (en) * | 1990-01-18 | 1991-07-09 | Seagate Technology, Inc. | Electrical connecting apparatus |
JP2682594B2 (ja) * | 1992-07-27 | 1997-11-26 | 矢崎総業株式会社 | コネクタ端子検出具 |
JP2868394B2 (ja) * | 1993-08-20 | 1999-03-10 | 矢崎総業株式会社 | コネクタ端子検査具 |
JP2575406Y2 (ja) * | 1993-08-24 | 1998-06-25 | 住友電装株式会社 | コネクタ検査装置 |
JP3029081B2 (ja) * | 1993-08-24 | 2000-04-04 | 矢崎総業株式会社 | コネクタ検査具 |
JP2797928B2 (ja) * | 1993-10-15 | 1998-09-17 | 住友電装株式会社 | コネクタ検査装置 |
JP3038113B2 (ja) * | 1994-05-09 | 2000-05-08 | 矢崎総業株式会社 | コネクタの端子検出具 |
-
1995
- 1995-03-09 US US08/401,443 patent/US5614820A/en not_active Expired - Lifetime
- 1995-03-10 EP EP95103510A patent/EP0671789B1/de not_active Expired - Lifetime
- 1995-03-10 DE DE69502752T patent/DE69502752T2/de not_active Expired - Lifetime
-
1997
- 1997-01-22 US US08/787,222 patent/US5877622A/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
DE69502752D1 (de) | 1998-07-09 |
US5614820A (en) | 1997-03-25 |
EP0671789A1 (de) | 1995-09-13 |
EP0671789B1 (de) | 1998-06-03 |
US5877622A (en) | 1999-03-02 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition |