DE69414310D1 - Integrierte Halbleiterschaltung mit Prüfschaltung - Google Patents
Integrierte Halbleiterschaltung mit PrüfschaltungInfo
- Publication number
- DE69414310D1 DE69414310D1 DE69414310T DE69414310T DE69414310D1 DE 69414310 D1 DE69414310 D1 DE 69414310D1 DE 69414310 T DE69414310 T DE 69414310T DE 69414310 T DE69414310 T DE 69414310T DE 69414310 D1 DE69414310 D1 DE 69414310D1
- Authority
- DE
- Germany
- Prior art keywords
- test
- circuit
- wiring line
- integrated semiconductor
- wiring
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 239000004065 semiconductor Substances 0.000 title 1
- 230000002411 adverse Effects 0.000 abstract 1
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Quality & Reliability (AREA)
- Semiconductor Integrated Circuits (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Tests Of Electronic Circuits (AREA)
- Test And Diagnosis Of Digital Computers (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP15043293A JP3199908B2 (ja) | 1993-06-22 | 1993-06-22 | 半導体集積回路のテスト回路 |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69414310D1 true DE69414310D1 (de) | 1998-12-10 |
DE69414310T2 DE69414310T2 (de) | 1999-05-06 |
Family
ID=15496804
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69414310T Expired - Fee Related DE69414310T2 (de) | 1993-06-22 | 1994-06-22 | Integrierte Halbleiterschaltung mit Prüfschaltung |
Country Status (5)
Country | Link |
---|---|
US (1) | US5615216A (de) |
EP (1) | EP0632385B1 (de) |
JP (1) | JP3199908B2 (de) |
KR (1) | KR0139304B1 (de) |
DE (1) | DE69414310T2 (de) |
Families Citing this family (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE19510332A1 (de) * | 1995-03-22 | 1996-10-02 | Pilz Gmbh & Co | Schaltungsanordnung und Verfahren zum Testen von nicht intermittierenden Gebern |
JP3607760B2 (ja) * | 1995-10-13 | 2005-01-05 | 富士通株式会社 | 半導体集積回路装置 |
US6076177A (en) * | 1997-09-23 | 2000-06-13 | Motorola, Inc. | Method and apparatus for testing a circuit module concurrently with a non-volatile memory operation in a multi-module data processing system |
US5952674A (en) * | 1998-03-18 | 1999-09-14 | International Business Machines Corporation | Topography monitor |
JP2000292491A (ja) * | 1999-04-08 | 2000-10-20 | Advantest Corp | 2分岐伝送線路及び2分岐ドライバ回路及びこれを用いる半導体試験装置 |
US6476635B1 (en) * | 2000-06-28 | 2002-11-05 | Cypress Semiconductor Corp. | Programmable number of metal lines and effective metal width along critical paths in a programmable logic device |
JP4082261B2 (ja) * | 2003-03-31 | 2008-04-30 | 株式会社デンソー | センサ装置用断線検出回路 |
KR100583960B1 (ko) * | 2004-01-20 | 2006-05-26 | 삼성전자주식회사 | 반도체 소자의 테스트 패턴 및 이를 이용한 테스트 방법. |
US9159646B2 (en) * | 2012-12-13 | 2015-10-13 | Intel Corporation | Apparatus and method to monitor die edge defects |
US9914174B2 (en) | 2013-05-10 | 2018-03-13 | Fuji Machine Mfg. Co., Ltd. | Lathe |
US10295588B2 (en) * | 2016-12-22 | 2019-05-21 | Xcelsis Corporation | Wafer testing without direct probing |
Family Cites Families (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3758761A (en) * | 1971-08-17 | 1973-09-11 | Texas Instruments Inc | Self-interconnecting/self-repairable electronic systems on a slice |
US4758745B1 (en) * | 1986-09-19 | 1994-11-15 | Actel Corp | User programmable integrated circuit interconnect architecture and test method |
US5083083A (en) * | 1986-09-19 | 1992-01-21 | Actel Corporation | Testability architecture and techniques for programmable interconnect architecture |
US5365165A (en) * | 1986-09-19 | 1994-11-15 | Actel Corporation | Testability architecture and techniques for programmable interconnect architecture |
US4857774A (en) * | 1986-09-19 | 1989-08-15 | Actel Corporation | Testing apparatus and diagnostic method for use with programmable interconnect architecture |
US4801869A (en) * | 1987-04-27 | 1989-01-31 | International Business Machines Corporation | Semiconductor defect monitor for diagnosing processing-induced defects |
US5168219A (en) * | 1988-10-31 | 1992-12-01 | Fujitsu Limited | Integrated circuit device having signal discrimination circuit and method of testing the same |
US5361033A (en) * | 1991-07-25 | 1994-11-01 | Texas Instruments Incorporated | On chip bi-stable power-spike detection circuit |
US5072175A (en) * | 1990-09-10 | 1991-12-10 | Compaq Computer Corporation | Integrated circuit having improved continuity testability and a system incorporating the same |
US5196724A (en) * | 1991-04-26 | 1993-03-23 | Quicklogic Corporation | Programmable interconnect structures and programmable integrated circuits |
US5290734A (en) * | 1991-06-04 | 1994-03-01 | Vlsi Technology, Inc. | Method for making anti-fuse structures |
US5373509A (en) * | 1991-07-23 | 1994-12-13 | Matsushita Electric Industrial Co., Ltd. | Semiconductor memory device and method of testing the same |
-
1993
- 1993-06-22 JP JP15043293A patent/JP3199908B2/ja not_active Expired - Fee Related
-
1994
- 1994-06-21 US US08/262,835 patent/US5615216A/en not_active Expired - Fee Related
- 1994-06-22 EP EP94109636A patent/EP0632385B1/de not_active Expired - Lifetime
- 1994-06-22 DE DE69414310T patent/DE69414310T2/de not_active Expired - Fee Related
- 1994-06-22 KR KR1019940014238A patent/KR0139304B1/ko not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
EP0632385B1 (de) | 1998-11-04 |
US5615216A (en) | 1997-03-25 |
JP3199908B2 (ja) | 2001-08-20 |
KR0139304B1 (ko) | 1998-06-15 |
DE69414310T2 (de) | 1999-05-06 |
JPH0720201A (ja) | 1995-01-24 |
EP0632385A1 (de) | 1995-01-04 |
KR950001318A (ko) | 1995-01-03 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |