DE69331775T2 - Röntgenanalysegerät - Google Patents

Röntgenanalysegerät

Info

Publication number
DE69331775T2
DE69331775T2 DE69331775T DE69331775T DE69331775T2 DE 69331775 T2 DE69331775 T2 DE 69331775T2 DE 69331775 T DE69331775 T DE 69331775T DE 69331775 T DE69331775 T DE 69331775T DE 69331775 T2 DE69331775 T2 DE 69331775T2
Authority
DE
Germany
Prior art keywords
ray analyzer
analyzer
ray
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69331775T
Other languages
English (en)
Other versions
DE69331775D1 (de
Inventor
Ravisekhar Yellepeddi
Alexandre Bapst
Pierre-Yves Negro
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Thermo Fisher Scientific Inc
Original Assignee
Thermo Electron Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Thermo Electron Corp filed Critical Thermo Electron Corp
Publication of DE69331775D1 publication Critical patent/DE69331775D1/de
Application granted granted Critical
Publication of DE69331775T2 publication Critical patent/DE69331775T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/2206—Combination of two or more measurements, at least one measurement being that of secondary emission, e.g. combination of secondary electron [SE] measurement and back-scattered electron [BSE] measurement
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/05—Investigating materials by wave or particle radiation by diffraction, scatter or reflection
    • G01N2223/056—Investigating materials by wave or particle radiation by diffraction, scatter or reflection diffraction
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076—X-ray fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/10—Different kinds of radiation or particles
    • G01N2223/101—Different kinds of radiation or particles electromagnetic radiation
    • G01N2223/1016—X-ray

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
DE69331775T 1992-11-11 1993-11-09 Röntgenanalysegerät Expired - Lifetime DE69331775T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB929223592A GB9223592D0 (en) 1992-11-11 1992-11-11 X-ray analysis apparatus

Publications (2)

Publication Number Publication Date
DE69331775D1 DE69331775D1 (de) 2002-05-08
DE69331775T2 true DE69331775T2 (de) 2002-11-21

Family

ID=10724881

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69331775T Expired - Lifetime DE69331775T2 (de) 1992-11-11 1993-11-09 Röntgenanalysegerät

Country Status (5)

Country Link
US (1) US5406608A (de)
EP (1) EP0597668B1 (de)
JP (1) JPH06213836A (de)
DE (1) DE69331775T2 (de)
GB (1) GB9223592D0 (de)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN108562603A (zh) * 2017-10-27 2018-09-21 钢研纳克检测技术股份有限公司 用于波谱能谱复合型x射线荧光光谱仪的x射线探测系统

Families Citing this family (23)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE4304938C2 (de) * 1993-02-18 1996-04-25 Daimler Benz Ag Goniometer mit mehreren Achsen
JPH11502025A (ja) * 1995-10-03 1999-02-16 フィリップス エレクトロニクス エヌ ベー 同時ｘ線回折及びｘ線蛍光測定のための装置
WO1997025614A1 (en) * 1996-01-12 1997-07-17 Philips Electronics N.V. X-ray analysis apparatus including a rotatable primary collimator
DE19745793A1 (de) * 1997-10-16 1999-04-22 Krupp Polysius Ag Verfahren zur Vorausbestimmung des Mahlwiderstandes von Mahlgut
DE19820321B4 (de) * 1998-05-07 2004-09-16 Bruker Axs Gmbh Kompaktes Röntgenspektrometer
JP3531098B2 (ja) * 1998-12-28 2004-05-24 理学電機工業株式会社 蛍光ｘ線分析装置
EP1076222A1 (de) * 1999-08-10 2001-02-14 Corus Aluminium Walzprodukte GmbH Röntgenfluoreszenz-Messung der Dicke von Aluminiumblech
JP4777539B2 (ja) * 2001-05-29 2011-09-21 エスアイアイ・ナノテクノロジー株式会社 複合ｘ線分析装置
AU2002324849B2 (en) * 2001-09-04 2008-01-24 Quality Control, Inc. X-ray fluorescence measuring system and methods for trace elements
US7352845B2 (en) * 2003-07-11 2008-04-01 Waseda University Energy dispersion type X-ray diffraction/spectral device
DE10346433B4 (de) * 2003-10-07 2006-05-11 Bruker Axs Gmbh Analytisches Verfahren zum Bestimmen von kristallographischen Phasen einer Messprobe
US7430273B2 (en) * 2007-02-23 2008-09-30 Thermo Fisher Scientific Inc. Instrument having X-ray fluorescence and spark emission spectroscopy analysis capabilities
GB2447252B (en) * 2007-03-06 2012-03-14 Thermo Fisher Scientific Inc X-ray analysis instrument
JP2011527015A (ja) * 2008-07-01 2011-10-20 カルデラ・ファーマシューティカルズ・インコーポレーテッド 障壁を透過する検体の移送を測定する方法および装置
DE102009006984B4 (de) * 2009-01-31 2010-09-30 Bruker Axs Gmbh Röntgen-Mehrkanal-Spektrometer
US20110079734A1 (en) * 2009-10-02 2011-04-07 Lee Grodzins Elemental Analysis Based on Complementary Techniques
GB2476255B (en) 2009-12-17 2012-03-07 Thermo Fisher Scient Ecublens Sarl Method and apparatus for performing x-ray analysis of a sample
CN105092618A (zh) * 2015-09-18 2015-11-25 北京师范大学 一种微束能量色散的x射线衍射仪及其使用方法
DE102016014213A1 (de) * 2015-12-08 2017-07-06 Shimadzu Corporation Röntgenspektroskopische analysevorrichtung und elementaranalyseverfahren
DE102016210304B8 (de) 2016-06-10 2017-08-17 Bruker Axs Gmbh Messkammer für ein kompaktes Goniometer in einem Röntgenspektrometer
US11112371B2 (en) * 2017-05-18 2021-09-07 Shimadzu Corporation X-ray spectrometer
WO2019064360A1 (ja) 2017-09-27 2019-04-04 株式会社島津製作所 Ｘ線分光分析装置、及び該ｘ線分光分析装置を用いた化学状態分析方法
WO2023215204A1 (en) * 2022-05-02 2023-11-09 Sigray, Inc. X-ray sequential array wavelength dispersive spectrometer

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3344274A (en) * 1967-09-26 Ray analysis apparatus having both diffraction amd spectrometer tubes mounted on a common housing
IL41592A (en) * 1973-02-20 1976-02-29 Tech Res & Dev Found Ltd X-ray spectrodiffractometer
JPS5222553B2 (de) * 1973-02-20 1977-06-17
US4263510A (en) * 1979-07-30 1981-04-21 General Electric Company Combined x-ray diffraction and fluorescence spectroscopy apparatus with environmentally controllable chamber
DE3573316D1 (en) * 1984-10-22 1989-11-02 Siemens Ag Arrangement for x-ray analysis
FI80524C (fi) * 1986-06-02 1990-06-11 Outokumpu Oy Foerfarande och anordning foer analysering av slamartade material.
GB2214769A (en) * 1988-03-04 1989-09-06 Le N Proizv Ob Burevestnik Multichannel x-ray spectrometer
DD270969A1 (de) * 1988-04-08 1989-08-16 Ilmenau Tech Hochschule Einrichtung zur beruehrungslosen messung der bewegungscharakteristik von leistungsschalterantrieben
JPH0739987B2 (ja) * 1988-06-28 1995-05-01 川崎製鉄株式会社 皮膜の厚みと組成の同時測定方法
US5369275A (en) * 1991-07-11 1994-11-29 International Superconductivity Technology Center Apparatus for solid surface analysis using X-ray spectroscopy

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN108562603A (zh) * 2017-10-27 2018-09-21 钢研纳克检测技术股份有限公司 用于波谱能谱复合型x射线荧光光谱仪的x射线探测系统
CN108562603B (zh) * 2017-10-27 2023-08-15 钢研纳克检测技术股份有限公司 用于波谱能谱复合型x射线荧光光谱仪的x射线探测系统

Also Published As

Publication number Publication date
EP0597668A1 (de) 1994-05-18
EP0597668B1 (de) 2002-04-03
JPH06213836A (ja) 1994-08-05
DE69331775D1 (de) 2002-05-08
GB9223592D0 (en) 1992-12-23
US5406608A (en) 1995-04-11

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Legal Events

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