DE69225847T2 - Röntgenanalyseapparat - Google Patents
RöntgenanalyseapparatInfo
- Publication number
- DE69225847T2 DE69225847T2 DE69225847T DE69225847T DE69225847T2 DE 69225847 T2 DE69225847 T2 DE 69225847T2 DE 69225847 T DE69225847 T DE 69225847T DE 69225847 T DE69225847 T DE 69225847T DE 69225847 T2 DE69225847 T2 DE 69225847T2
- Authority
- DE
- Germany
- Prior art keywords
- ray analyzer
- analyzer
- ray
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
Landscapes
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP91202092 | 1991-08-14 |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69225847D1 DE69225847D1 (de) | 1998-07-16 |
DE69225847T2 true DE69225847T2 (de) | 1998-12-24 |
Family
ID=8207827
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69225847T Expired - Lifetime DE69225847T2 (de) | 1991-08-14 | 1992-08-06 | Röntgenanalyseapparat |
Country Status (4)
Country | Link |
---|---|
US (1) | US5268953A (de) |
EP (1) | EP0527536B1 (de) |
JP (1) | JP3390030B2 (de) |
DE (1) | DE69225847T2 (de) |
Families Citing this family (16)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0553911A1 (de) * | 1992-01-27 | 1993-08-04 | Koninklijke Philips Electronics N.V. | Ortsempfindliche Röntgenanalyse |
DE9212265U1 (de) * | 1992-09-11 | 1993-03-04 | Siemens AG, 8000 München | Röntgenspektrometer |
DE69323064T2 (de) * | 1993-04-23 | 1999-07-15 | Shimadzu Corp | Ortsaufgelöste Analyse einer Probe mittels eines Röntgenfluoreszenzspektrometers |
USD433641S (en) * | 1996-03-04 | 2000-11-14 | D. Barclay Slocum | Goniometer frame |
US5870832A (en) * | 1996-03-18 | 1999-02-16 | Slocum; Barclay | Frame for gravity-related measurement device |
US6744850B2 (en) * | 2001-01-11 | 2004-06-01 | Therma-Wave, Inc. | X-ray reflectance measurement system with adjustable resolution |
AU2003223173A1 (en) | 2002-02-14 | 2003-09-04 | Faro Technologies, Inc. | Portable coordinate measurement machine with integrated line laser scanner |
US7881896B2 (en) | 2002-02-14 | 2011-02-01 | Faro Technologies, Inc. | Portable coordinate measurement machine with integrated line laser scanner |
US7246030B2 (en) | 2002-02-14 | 2007-07-17 | Faro Technologies, Inc. | Portable coordinate measurement machine with integrated line laser scanner |
US6952882B2 (en) * | 2002-02-14 | 2005-10-11 | Faro Technologies, Inc. | Portable coordinate measurement machine |
US6957496B2 (en) | 2002-02-14 | 2005-10-25 | Faro Technologies, Inc. | Method for improving measurement accuracy of a portable coordinate measurement machine |
USRE42082E1 (en) | 2002-02-14 | 2011-02-01 | Faro Technologies, Inc. | Method and apparatus for improving measurement accuracy of a portable coordinate measurement machine |
US7519493B2 (en) | 2002-02-14 | 2009-04-14 | Faro Technologies, Inc. | Portable coordinate measurement machine with integrated line laser scanner |
US6973734B2 (en) | 2002-02-14 | 2005-12-13 | Faro Technologies, Inc. | Method for providing sensory feedback to the operator of a portable measurement machine |
US8548123B2 (en) * | 2010-04-29 | 2013-10-01 | Bruker Axs, Inc. | Method and apparatus for using an area X-ray detector as a point detector in an X-ray diffractometer |
US8903044B2 (en) * | 2011-01-31 | 2014-12-02 | Rigaku Corporation | X-ray diffraction apparatus |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
SE355668B (de) * | 1971-08-23 | 1973-04-30 | Aga Ab | |
US3736426A (en) * | 1972-03-01 | 1973-05-29 | Western Electric Co | Methods of and apparatus for inspecting crystals |
DD159211A1 (de) * | 1981-05-29 | 1983-02-23 | Franz Kebschull | Anordnung zur lagebestimmung eines index gegenueber einer teilung |
NL8201343A (nl) * | 1982-03-31 | 1983-10-17 | Philips Nv | Roentgen analyse apparaat met instelbare strooistralenspleet. |
NL8300420A (nl) * | 1983-02-04 | 1984-09-03 | Philips Nv | Roentgen analyse apparaat. |
NL8502988A (nl) * | 1985-11-01 | 1987-06-01 | Philips Nv | Halfgeleidende radieele fotodetector, en inrichting bevattende een dergelijke detector. |
-
1992
- 1992-08-06 EP EP92202426A patent/EP0527536B1/de not_active Expired - Lifetime
- 1992-08-06 DE DE69225847T patent/DE69225847T2/de not_active Expired - Lifetime
- 1992-08-11 JP JP21419192A patent/JP3390030B2/ja not_active Expired - Lifetime
- 1992-08-12 US US07/929,066 patent/US5268953A/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
DE69225847D1 (de) | 1998-07-16 |
JPH05196586A (ja) | 1993-08-06 |
EP0527536A3 (en) | 1993-12-15 |
US5268953A (en) | 1993-12-07 |
JP3390030B2 (ja) | 2003-03-24 |
EP0527536B1 (de) | 1998-06-10 |
EP0527536A2 (de) | 1993-02-17 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8327 | Change in the person/name/address of the patent owner |
Owner name: KONINKLIJKE PHILIPS ELECTRONICS N.V., EINDHOVEN, N |
|
8327 | Change in the person/name/address of the patent owner |
Owner name: PANALYTICAL B.V., ALMELO, NL |
|
R071 | Expiry of right |
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