DE69403129D1 - Röntgenstrahlen-Analysegerät - Google Patents

Röntgenstrahlen-Analysegerät

Info

Publication number
DE69403129D1
DE69403129D1 DE69403129T DE69403129T DE69403129D1 DE 69403129 D1 DE69403129 D1 DE 69403129D1 DE 69403129 T DE69403129 T DE 69403129T DE 69403129 T DE69403129 T DE 69403129T DE 69403129 D1 DE69403129 D1 DE 69403129D1
Authority
DE
Germany
Prior art keywords
ray analyzer
analyzer
ray
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69403129T
Other languages
English (en)
Other versions
DE69403129T2 (de
Inventor
Shuzo Sudo
Kunio Nakajima
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Seiko Instruments Inc
Original Assignee
Seiko Instruments Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP6713593A external-priority patent/JPH06281798A/ja
Priority claimed from JP09168893A external-priority patent/JP3197104B2/ja
Priority claimed from JP05091683A external-priority patent/JP3111269B2/ja
Application filed by Seiko Instruments Inc filed Critical Seiko Instruments Inc
Application granted granted Critical
Publication of DE69403129D1 publication Critical patent/DE69403129D1/de
Publication of DE69403129T2 publication Critical patent/DE69403129T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • C—CHEMISTRY; METALLURGY
    • C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
    • C09K11/00—Luminescent, e.g. electroluminescent, chemiluminescent materials
    • C09K11/08—Luminescent, e.g. electroluminescent, chemiluminescent materials containing inorganic luminescent materials
    • C09K11/77—Luminescent, e.g. electroluminescent, chemiluminescent materials containing inorganic luminescent materials containing rare earth metals
    • C09K11/7766—Luminescent, e.g. electroluminescent, chemiluminescent materials containing inorganic luminescent materials containing rare earth metals containing two or more rare earth metals
    • C09K11/7767—Chalcogenides
    • C09K11/7769—Oxides
    • C09K11/7771—Oxysulfides
    • C—CHEMISTRY; METALLURGY
    • C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
    • C09K11/00—Luminescent, e.g. electroluminescent, chemiluminescent materials
    • C09K11/08—Luminescent, e.g. electroluminescent, chemiluminescent materials containing inorganic luminescent materials
    • C09K11/77—Luminescent, e.g. electroluminescent, chemiluminescent materials containing inorganic luminescent materials containing rare earth metals
    • C09K11/7766—Luminescent, e.g. electroluminescent, chemiluminescent materials containing inorganic luminescent materials containing rare earth metals containing two or more rare earth metals
    • C09K11/7767—Chalcogenides
    • C09K11/7769—Oxides
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K4/00—Conversion screens for the conversion of the spatial distribution of X-rays or particle radiation into visible images, e.g. fluoroscopic screens
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K4/00—Conversion screens for the conversion of the spatial distribution of X-rays or particle radiation into visible images, e.g. fluoroscopic screens
    • G21K2004/06—Conversion screens for the conversion of the spatial distribution of X-rays or particle radiation into visible images, e.g. fluoroscopic screens with a phosphor layer

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Inorganic Chemistry (AREA)
  • Materials Engineering (AREA)
  • Organic Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Measurement Of Radiation (AREA)
DE69403129T 1993-03-25 1994-03-25 Röntgenstrahlen-Analysegerät Expired - Lifetime DE69403129T2 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP6713593A JPH06281798A (ja) 1993-03-25 1993-03-25 Ｘ線ミラー用マニピュレータ
JP09168893A JP3197104B2 (ja) 1993-04-19 1993-04-19 Ｘ線解析装置
JP05091683A JP3111269B2 (ja) 1993-04-19 1993-04-19 Ｘ線回折用二次元検出器

Publications (2)

Publication Number Publication Date
DE69403129D1 true DE69403129D1 (de) 1997-06-19
DE69403129T2 DE69403129T2 (de) 1997-08-28

Family

ID=27299360

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69403129T Expired - Lifetime DE69403129T2 (de) 1993-03-25 1994-03-25 Röntgenstrahlen-Analysegerät

Country Status (3)

Country Link
US (2) US5612987A (de)
EP (1) EP0617431B1 (de)
DE (1) DE69403129T2 (de)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3531908B2 (ja) 1999-02-17 2004-05-31 キヤノン株式会社 撮像装置、放射線検出装置および画像処理システム
US6577705B1 (en) * 2001-04-02 2003-06-10 William Chang Combinatorial material analysis using X-ray capillary optics
US7339661B2 (en) * 2002-09-30 2008-03-04 Doron Korngut Dark field inspection system
RU2242748C1 (ru) * 2003-08-19 2004-12-20 Общество с ограниченной ответственностью "Институт рентгеновской оптики" Детектирующий узел для рентгеновских дифракционных измерений
US7978820B2 (en) * 2009-10-22 2011-07-12 Panalytical B.V. X-ray diffraction and fluorescence
JP2019533819A (ja) * 2016-11-09 2019-11-21 アイメック・ヴェーゼットウェーＩｍｅｃ Ｖｚｗ 組み合わされたｓｔｅｍとｅｄｓの断層撮影のための装置
DE102023207959A1 (de) * 2022-09-23 2024-03-28 Carl Zeiss Smt Gmbh Baugruppe eines optischen Systems

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3725704A (en) * 1971-01-28 1973-04-03 Lockheed Aircraft Corp Rare earth phosphors for x-ray conversion screens
BE786323A (fr) * 1971-07-16 1973-01-15 Eastman Kodak Co Ecran renforcateur et produit radiographique le
DE2907160C2 (de) * 1979-02-23 1986-09-25 Siemens AG, 1000 Berlin und 8000 München Röntgen-Pulverdiffraktometer
US4446568A (en) * 1981-06-05 1984-05-01 California Institute Of Technology Versatile focusing radiation analyzer
DE3380915D1 (de) * 1982-08-30 1990-01-04 Fuji Photo Film Co Ltd Radiographischer verstaerkungsschirm und verfahren zur herstellung desselben.
FR2574583B1 (fr) * 1984-12-07 1989-04-28 Commissariat Energie Atomique Ecran radioluminescent en couche epaisse, son procede de fabrication et dispositif pour la mise en oeuvre du procede
US4739172A (en) * 1986-01-08 1988-04-19 Tokyo Shibaura Denki Kabushiki Kaisha Fiber optic phosphor screen and a method of manufacturing the same
US4821303A (en) * 1986-12-05 1989-04-11 The Dow Chemical Company Combined thermal analyzer and x-ray diffractometer
JP2742415B2 (ja) * 1987-11-27 1998-04-22 株式会社日立製作所 Ｘ線分析装置
US5127039A (en) * 1991-01-16 1992-06-30 The United States Of America As Represented By The United States Department Of Energy Sample holder for X-ray diffractometry
US5216252A (en) * 1991-06-20 1993-06-01 Thomas Jefferson University Binary screen, system and method for single pulse dual energy radiography
US5373544A (en) * 1992-08-12 1994-12-13 Siemens Aktiengesellschaft X-ray diffractometer
US5367172A (en) * 1993-06-01 1994-11-22 E. I. Du Pont De Nemours And Company Radiological system employing phosphors of different densities

Also Published As

Publication number Publication date
DE69403129T2 (de) 1997-08-28
EP0617431B1 (de) 1997-05-14
US5739542A (en) 1998-04-14
US5612987A (en) 1997-03-18
EP0617431A3 (de) 1994-12-21
EP0617431A2 (de) 1994-09-28

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition