DE69227824D1 - Spektrumanalysator - Google Patents

Spektrumanalysator

Info

Publication number
DE69227824D1
DE69227824D1 DE69227824T DE69227824T DE69227824D1 DE 69227824 D1 DE69227824 D1 DE 69227824D1 DE 69227824 T DE69227824 T DE 69227824T DE 69227824 T DE69227824 T DE 69227824T DE 69227824 D1 DE69227824 D1 DE 69227824D1
Authority
DE
Germany
Prior art keywords
spectrum analyzer
analyzer
spectrum
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69227824T
Other languages
English (en)
Other versions
DE69227824T2 (de
Inventor
Shigeo Tomikawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advantest Corp
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP3221773A external-priority patent/JP3009114B2/ja
Priority claimed from JP03227261A external-priority patent/JP3102651B2/ja
Application filed by Advantest Corp filed Critical Advantest Corp
Publication of DE69227824D1 publication Critical patent/DE69227824D1/de
Application granted granted Critical
Publication of DE69227824T2 publication Critical patent/DE69227824T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R23/00—Arrangements for measuring frequencies; Arrangements for analysing frequency spectra
    • G01R23/16—Spectrum analysis; Fourier analysis
    • G01R23/173—Wobbulating devices similar to swept panoramic receivers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R23/00—Arrangements for measuring frequencies; Arrangements for analysing frequency spectra
    • G01R23/16—Spectrum analysis; Fourier analysis

Landscapes

  • Physics & Mathematics (AREA)
  • Mathematical Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Spectrometry And Color Measurement (AREA)
DE69227824T 1991-09-02 1992-09-01 Spektrumanalysator Expired - Fee Related DE69227824T2 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP3221773A JP3009114B2 (ja) 1991-09-02 1991-09-02 スペクトラムアナライザ
JP03227261A JP3102651B2 (ja) 1991-09-06 1991-09-06 スペクトラムアナライザと波形表示器の兼用器
PCT/JP1992/001114 WO1993005403A1 (en) 1991-09-02 1992-09-01 Spectrum analyzer

Publications (2)

Publication Number Publication Date
DE69227824D1 true DE69227824D1 (de) 1999-01-21
DE69227824T2 DE69227824T2 (de) 1999-06-10

Family

ID=26524491

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69227824T Expired - Fee Related DE69227824T2 (de) 1991-09-02 1992-09-01 Spektrumanalysator

Country Status (4)

Country Link
US (1) US5869959A (de)
EP (1) EP0555491B1 (de)
DE (1) DE69227824T2 (de)
WO (1) WO1993005403A1 (de)

Families Citing this family (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH08292218A (ja) * 1995-04-21 1996-11-05 Advantest Corp スペクトラムアナライザの測定方法
JPH1054855A (ja) * 1996-08-09 1998-02-24 Advantest Corp スペクトラムアナライザ
US6356067B1 (en) * 1998-08-10 2002-03-12 Sony/Tektronix Corporation Wide band signal analyzer with wide band and narrow band signal processors
US6344735B1 (en) * 1999-04-07 2002-02-05 Advantest Corporation Spectrum analyzer and spectrum measuring method using the same
JP3375919B2 (ja) * 1999-11-11 2003-02-10 アンリツ株式会社 信号分析装置
US7099016B2 (en) * 2002-02-11 2006-08-29 Rohde Schwarz Gmbh & Co. Kg Method and apparatus for zero-mixing spectrum analysis
WO2003075632A2 (en) * 2002-03-06 2003-09-18 Paradigm Wireless Systems, Inc. Rf amplifier system with interface to provide a computer readable spectral depiction of the re output
JP2004347320A (ja) * 2003-05-15 2004-12-09 Advantest Corp 信号測定表示装置および方法
JP2004347321A (ja) * 2003-05-15 2004-12-09 Advantest Corp 信号測定装置、方法、プログラムおよび記録媒体
EP1635181A1 (de) * 2004-09-13 2006-03-15 Rohde & Schwarz GmbH & Co. KG Vorrichtung und Verfahren zur Pulsmessung
KR100646932B1 (ko) * 2004-12-06 2006-11-23 주식회사 하이닉스반도체 오프 칩 드라이버 제어용 카운터 회로
US7403006B2 (en) * 2005-10-11 2008-07-22 Regents Of The University Of Minnesota Frequency swept excitation for magnetic resonance
US7425828B2 (en) * 2005-10-11 2008-09-16 Regents Of The University Of Minnesota Frequency swept excitation for magnetic resonance
US7786729B2 (en) * 2006-10-31 2010-08-31 Regents Of The University Of Minnesota Method for magnetic resonance imaging
US20080309388A1 (en) * 2007-06-15 2008-12-18 Agilent Technologies, Inc. Method for adjusting phase relationship between signals in a measuring apparatus, and a measuring apparatus
US8159208B2 (en) * 2007-12-20 2012-04-17 Anritsu Company Hand-held microwave spectrum analyzer with operation range from 9 KHz to over 20 GHz
US7714564B2 (en) * 2008-01-16 2010-05-11 Agilent Technologies, Inc. Gated sweep in spectrum analyzers
JP2015503765A (ja) 2012-01-11 2015-02-02 ユティルクス・コーポレーション 部分放電を分析して位置を特定するシステム
RU2501026C1 (ru) * 2012-06-01 2013-12-10 Федеральное Государственное Унитарное Предприятие Ордена Трудового Красного Знамени Научно-Исследовательский Институт Радио (Фгуп Ниир) Способ измерения параметров сигналов исходящего канала базовой станции в сетях с временным разделением дуплексных каналов
US10608916B2 (en) * 2017-03-23 2020-03-31 Rohde & Schwarz Gmbh & Co. Kg Measuring device and method for dynamically selecting a channel bandwidth
US11387922B2 (en) 2020-02-25 2022-07-12 Rohde & Schwarz Gmbh & Co. Kg Receiver with a power detecting function for a pulsed signal and receiving method

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59157574A (ja) * 1983-02-27 1984-09-06 Anritsu Corp スペクトラムアナライザ
JPH0611480Y2 (ja) * 1986-05-22 1994-03-23 株式会社アドバンテスト スペクトラムアナライザ
JPH07122648B2 (ja) * 1986-11-22 1995-12-25 ソニー株式会社 スペクトラムアナライザ
JP2627501B2 (ja) * 1987-03-06 1997-07-09 アンリツ株式会社 スペクトラムアナライザ
US4839582A (en) * 1987-07-01 1989-06-13 Anritsu Corporation Signal analyzer apparatus with automatic frequency measuring function
JP2577566B2 (ja) * 1987-07-01 1997-02-05 アンリツ株式会社 スペクトラムアナライザ
JPH01213006A (ja) * 1988-02-22 1989-08-25 Mitsubishi Electric Corp 掃引周波数発振器
JP2766685B2 (ja) * 1988-09-26 1998-06-18 アンリツ株式会社 スペクトラムアナライザ

Also Published As

Publication number Publication date
EP0555491A4 (en) 1994-07-27
WO1993005403A1 (en) 1993-03-18
US5869959A (en) 1999-02-09
DE69227824T2 (de) 1999-06-10
EP0555491B1 (de) 1998-12-09
EP0555491A1 (de) 1993-08-18

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee