JPS5222553B2 - - Google Patents

Info

Publication number
JPS5222553B2
JPS5222553B2 JP48019797A JP1979773A JPS5222553B2 JP S5222553 B2 JPS5222553 B2 JP S5222553B2 JP 48019797 A JP48019797 A JP 48019797A JP 1979773 A JP1979773 A JP 1979773A JP S5222553 B2 JPS5222553 B2 JP S5222553B2
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP48019797A
Other languages
Japanese (ja)
Other versions
JPS49110393A (de
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP48019797A priority Critical patent/JPS5222553B2/ja
Priority to US383611A priority patent/US3868506A/en
Priority to GB3692273A priority patent/GB1390710A/en
Priority to DE19732340028 priority patent/DE2340028A1/de
Publication of JPS49110393A publication Critical patent/JPS49110393A/ja
Publication of JPS5222553B2 publication Critical patent/JPS5222553B2/ja
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions

Landscapes

  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP48019797A 1973-02-20 1973-02-20 Expired JPS5222553B2 (de)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP48019797A JPS5222553B2 (de) 1973-02-20 1973-02-20
US383611A US3868506A (en) 1973-02-20 1973-07-30 X-ray diffraction instrument
GB3692273A GB1390710A (en) 1973-02-20 1973-08-03 X-ray diffraction instrument
DE19732340028 DE2340028A1 (de) 1973-02-20 1973-08-08 Einrichtung zur roentgenstrukturuntersuchung

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP48019797A JPS5222553B2 (de) 1973-02-20 1973-02-20

Publications (2)

Publication Number Publication Date
JPS49110393A JPS49110393A (de) 1974-10-21
JPS5222553B2 true JPS5222553B2 (de) 1977-06-17

Family

ID=12009325

Family Applications (1)

Application Number Title Priority Date Filing Date
JP48019797A Expired JPS5222553B2 (de) 1973-02-20 1973-02-20

Country Status (4)

Country Link
US (1) US3868506A (de)
JP (1) JPS5222553B2 (de)
DE (1) DE2340028A1 (de)
GB (1) GB1390710A (de)

Families Citing this family (41)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4074132A (en) * 1976-08-24 1978-02-14 North American Philips Corporation Automatic single crystal diffractometer
US4209706A (en) * 1976-11-26 1980-06-24 Varian Associates, Inc. Fluoroscopic apparatus mounting fixture
DE2750781A1 (de) * 1976-11-26 1978-06-01 Varian Associates Vorrichtung zur untersuchung des koerperinneren, insbesondere fluoroskopisches roentgensystem
JPS5744841A (en) * 1980-09-01 1982-03-13 Hitachi Ltd Method and apparatus for x-ray diffraction
US4495636A (en) * 1981-01-02 1985-01-22 Research Corporation Multichannel radiography employing scattered radiation
US4561062A (en) * 1983-02-18 1985-12-24 Her Majesty The Queen In Right Of Canada, As Represented By The Minister Of Energy, Mines And Resources Stress measurement by X-ray diffractometry
US4525854A (en) * 1983-03-22 1985-06-25 Troxler Electronic Laboratories, Inc. Radiation scatter apparatus and method
FI67956C (fi) * 1983-09-22 1985-06-10 Mexpert Oy Pao roentgendiffraktion sig grundande foerfarande och anordning foer maetning av spaenningar
GB2169480B (en) * 1985-01-03 1988-12-07 Erno Raumfahrttechnik Gmbh A method of non-destructive testing of structural members
US4987585A (en) * 1989-04-04 1991-01-22 General Electric Company X-ray positioner for multi-axis profiling
US5148458A (en) * 1990-01-18 1992-09-15 Clayton Ruud Method and apparatus for simultaneous phase composition and residual stress measurement by x-ray diffraction
JP2904891B2 (ja) * 1990-08-31 1999-06-14 日新製鋼株式会社 合金化亜鉛めつき鋼板のオンライン合金化度測定装置
GB9223592D0 (en) * 1992-11-11 1992-12-23 Fisons Plc X-ray analysis apparatus
US5764683B1 (en) 1996-02-12 2000-11-21 American Science & Eng Inc Mobile x-ray inspection system for large objects
USRE39396E1 (en) * 1996-02-12 2006-11-14 American Science And Engineering, Inc. Mobile x-ray inspection system for large objects
US5966423A (en) * 1997-03-28 1999-10-12 Philips Electronics North America Corporation Arc diffractometer
US6721393B1 (en) * 1999-03-31 2004-04-13 Proto Manufacturing Ltd. X-ray diffraction apparatus and method
US6693281B2 (en) * 2001-05-02 2004-02-17 Massachusetts Institute Of Technology Fast neutron resonance radiography for elemental mapping
US6697453B1 (en) * 2002-02-08 2004-02-24 Metscan Technologies, Llc Portable X-ray diffractometer
US20040256565A1 (en) * 2002-11-06 2004-12-23 William Adams X-ray backscatter mobile inspection van
US7505556B2 (en) * 2002-11-06 2009-03-17 American Science And Engineering, Inc. X-ray backscatter detection imaging modules
US20090257555A1 (en) * 2002-11-06 2009-10-15 American Science And Engineering, Inc. X-Ray Inspection Trailer
US7099434B2 (en) 2002-11-06 2006-08-29 American Science And Engineering, Inc. X-ray backscatter mobile inspection van
US6925146B2 (en) * 2003-03-17 2005-08-02 Proto Manufacturing Ltd. X-ray diffraction system
WO2005010512A1 (en) * 2003-07-22 2005-02-03 X-Ray Optical Systems, Inc. Method and system for x-ray diffraction measurements using an aligned source and detector rotating around a sample surface
CN1864062B (zh) * 2003-08-04 2011-11-02 X射线光学系统公司 使用在固定角位置的源和检测器的原位x射线衍射系统
WO2006116100A1 (en) * 2005-04-22 2006-11-02 American Science And Engineering, Inc. X-ray backscatter inspection with coincident optical beam
CN101379415B (zh) * 2005-10-24 2013-07-17 美国科技工程公司 基于散射检测的x射线检查
US7593510B2 (en) * 2007-10-23 2009-09-22 American Science And Engineering, Inc. X-ray imaging with continuously variable zoom and lateral relative displacement of the source
US8824632B2 (en) 2009-07-29 2014-09-02 American Science And Engineering, Inc. Backscatter X-ray inspection van with top-down imaging
MY154268A (en) * 2009-07-29 2015-05-29 American Science & Eng Inc Top-down x-ray inspection trailer
US8532823B2 (en) 2010-02-12 2013-09-10 American Science And Engineering, Inc. Disruptor guidance system and methods based on scatter imaging
JP2014106004A (ja) * 2012-11-22 2014-06-09 Kowa Dennetsu Keiki:Kk Ｘ線応力測定装置
US9613728B2 (en) 2013-03-15 2017-04-04 Proto Manufacturing Ltd. X-ray diffraction apparatus and method
JP5984024B2 (ja) * 2014-11-04 2016-09-06 パルステック工業株式会社 Ｘ線回折測定装置
JP6394513B2 (ja) * 2015-06-18 2018-09-26 新東工業株式会社 残留応力測定装置及び残留応力測定方法
DE102016222644A1 (de) 2016-03-14 2017-09-28 Sms Group Gmbh Verfahren zum Walzen und/oder zur Wärmebehandlung eines metallischen Produkts
JP6842084B2 (ja) * 2017-02-03 2021-03-17 国立大学法人東北大学 携帯型３軸応力測定装置
US11058892B2 (en) 2017-05-05 2021-07-13 Zap Surgical Systems, Inc. Revolving radiation collimator
CN108401421B (zh) 2017-09-06 2022-12-20 睿谱外科系统股份有限公司 自屏蔽的集成控制放射外科系统
US11684446B2 (en) 2019-02-27 2023-06-27 Zap Surgical Systems, Inc. Device for radiosurgical treatment of uterine fibroids

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4859887A (de) * 1971-11-24 1973-08-22

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2462374A (en) * 1944-10-04 1949-02-22 Philips Lab Inc Stress analysis by x-ray diffraction
US3322948A (en) * 1964-12-21 1967-05-30 Owens Illinois Inc X-ray diffraction goniometer wherein the specimen is stationary and the source and detector are movable
JPS4919239B1 (de) * 1969-03-07 1974-05-16
IL32247A (en) * 1969-05-20 1972-08-30 Yeda Res & Dev X-ray diffractometer
US3634686A (en) * 1969-06-17 1972-01-11 Rigaku Denki Co Ltd X-ray stress-measuring apparatus

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4859887A (de) * 1971-11-24 1973-08-22

Also Published As

Publication number Publication date
DE2340028A1 (de) 1974-09-05
US3868506A (en) 1975-02-25
JPS49110393A (de) 1974-10-21
GB1390710A (en) 1975-04-16

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