DE69232494D1 - Nichtflüchtiger Halbleiterspeicher - Google Patents

Nichtflüchtiger Halbleiterspeicher

Info

Publication number
DE69232494D1
DE69232494D1 DE69232494T DE69232494T DE69232494D1 DE 69232494 D1 DE69232494 D1 DE 69232494D1 DE 69232494 T DE69232494 T DE 69232494T DE 69232494 T DE69232494 T DE 69232494T DE 69232494 D1 DE69232494 D1 DE 69232494D1
Authority
DE
Germany
Prior art keywords
write
erase
operable
erased
memory cell
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69232494T
Other languages
English (en)
Other versions
DE69232494T2 (de
Inventor
Masanobu Yoshida
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Publication of DE69232494D1 publication Critical patent/DE69232494D1/de
Application granted granted Critical
Publication of DE69232494T2 publication Critical patent/DE69232494T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C29/00Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/52Protection of memory contents; Detection of errors in memory contents
DE1992632494 1992-05-28 1992-12-29 Nichtflüchtiger Halbleiterspeicher Expired - Fee Related DE69232494T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP13708092A JPH05334882A (ja) 1992-05-28 1992-05-28 不揮発性半導体記憶装置

Publications (2)

Publication Number Publication Date
DE69232494D1 true DE69232494D1 (de) 2002-04-18
DE69232494T2 DE69232494T2 (de) 2002-07-04

Family

ID=15190429

Family Applications (1)

Application Number Title Priority Date Filing Date
DE1992632494 Expired - Fee Related DE69232494T2 (de) 1992-05-28 1992-12-29 Nichtflüchtiger Halbleiterspeicher

Country Status (3)

Country Link
EP (1) EP0884734B1 (de)
JP (1) JPH05334882A (de)
DE (1) DE69232494T2 (de)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2016092416A1 (en) * 2014-12-11 2016-06-16 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device, memory device, and electronic device
CN116453572A (zh) * 2022-01-10 2023-07-18 长鑫存储技术有限公司 存储器的测试方法及测试装置

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4498151A (en) * 1980-04-17 1985-02-05 Texas Instruments Incorporated On board non-volatile memory programming
DE3134995A1 (de) * 1981-02-06 1983-03-17 Robert Bosch Gmbh, 7000 Stuttgart Verfahren und vorrichtung zur erkennung von informationsaenderungen in programmierbaren speichern

Also Published As

Publication number Publication date
DE69232494T2 (de) 2002-07-04
JPH05334882A (ja) 1993-12-17
EP0884734A1 (de) 1998-12-16
EP0884734B1 (de) 2002-03-13

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee