DE69123668D1 - Rasterelektronenmikroskop - Google Patents
RasterelektronenmikroskopInfo
- Publication number
- DE69123668D1 DE69123668D1 DE69123668T DE69123668T DE69123668D1 DE 69123668 D1 DE69123668 D1 DE 69123668D1 DE 69123668 T DE69123668 T DE 69123668T DE 69123668 T DE69123668 T DE 69123668T DE 69123668 D1 DE69123668 D1 DE 69123668D1
- Authority
- DE
- Germany
- Prior art keywords
- electron microscope
- scanning electron
- scanning
- microscope
- electron
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/04—Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement, ion-optical arrangement
- H01J37/09—Diaphragms; Shields associated with electron or ion-optical arrangements; Compensation of disturbing fields
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/244—Detectors; Associated components or circuits therefor
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/02—Details
- H01J2237/024—Moving components not otherwise provided for
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/02—Details
- H01J2237/026—Shields
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/244—Detection characterized by the detecting means
- H01J2237/24435—Microchannel plates
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/244—Detection characterized by the detecting means
- H01J2237/2448—Secondary particle detectors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/245—Detection characterised by the variable being measured
- H01J2237/24507—Intensity, dose or other characteristics of particle beams or electromagnetic radiation
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Electron Sources, Ion Sources (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2234357A JPH071685B2 (ja) | 1990-09-06 | 1990-09-06 | 走査電子顕微鏡 |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69123668D1 true DE69123668D1 (de) | 1997-01-30 |
DE69123668T2 DE69123668T2 (de) | 1997-06-12 |
Family
ID=16969739
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69123668T Expired - Fee Related DE69123668T2 (de) | 1990-09-06 | 1991-09-04 | Rasterelektronenmikroskop |
Country Status (4)
Country | Link |
---|---|
US (1) | US5149968A (de) |
EP (1) | EP0474223B1 (de) |
JP (1) | JPH071685B2 (de) |
DE (1) | DE69123668T2 (de) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3117950B2 (ja) | 1998-05-21 | 2000-12-18 | セイコーインスツルメンツ株式会社 | 荷電粒子装置 |
JP4732917B2 (ja) * | 2006-02-15 | 2011-07-27 | 株式会社日立ハイテクノロジーズ | 走査型電子顕微鏡及び欠陥検出装置 |
Family Cites Families (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR850001390B1 (ko) * | 1980-07-31 | 1985-09-24 | 니혼 덴시 가부시끼 가이샤 | 2차 전자 검출장치 |
JPS59134540A (ja) * | 1983-01-21 | 1984-08-02 | Hitachi Ltd | 二次電子検出装置 |
JPS61131353A (ja) * | 1984-11-30 | 1986-06-19 | Hitachi Ltd | 二次電子検出器 |
JPS6199960A (ja) * | 1985-04-05 | 1986-05-19 | Clarion Co Ltd | テ−プ走行モ−ド切換装置 |
GB8609739D0 (en) * | 1986-04-22 | 1986-05-29 | Spectros Ltd | Charged particle analyser |
JPS63110543A (ja) * | 1986-10-29 | 1988-05-16 | Hitachi Ltd | 走査電子顕微鏡の信号検出器 |
EP0281743B1 (de) * | 1987-02-02 | 1994-03-30 | ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH | Detektorobjectiv für Rastermikroskope |
JPH01220352A (ja) * | 1988-02-26 | 1989-09-04 | Hitachi Ltd | 走査電子顕微鏡及びその類似装置 |
-
1990
- 1990-09-06 JP JP2234357A patent/JPH071685B2/ja not_active Expired - Fee Related
-
1991
- 1991-09-04 EP EP91114959A patent/EP0474223B1/de not_active Expired - Lifetime
- 1991-09-04 DE DE69123668T patent/DE69123668T2/de not_active Expired - Fee Related
- 1991-09-06 US US07/755,844 patent/US5149968A/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
JPH071685B2 (ja) | 1995-01-11 |
JPH04115449A (ja) | 1992-04-16 |
US5149968A (en) | 1992-09-22 |
DE69123668T2 (de) | 1997-06-12 |
EP0474223A2 (de) | 1992-03-11 |
EP0474223B1 (de) | 1996-12-18 |
EP0474223A3 (en) | 1992-05-20 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |