DE69114957D1 - Verfahren zur Herstellung eines dünnen Membrans oder Balkens aus Silicium. - Google Patents

Verfahren zur Herstellung eines dünnen Membrans oder Balkens aus Silicium.

Info

Publication number
DE69114957D1
DE69114957D1 DE69114957T DE69114957T DE69114957D1 DE 69114957 D1 DE69114957 D1 DE 69114957D1 DE 69114957 T DE69114957 T DE 69114957T DE 69114957 T DE69114957 T DE 69114957T DE 69114957 D1 DE69114957 D1 DE 69114957D1
Authority
DE
Germany
Prior art keywords
silicon
production
thin membrane
beam made
membrane
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69114957T
Other languages
English (en)
Other versions
DE69114957T2 (de
Inventor
James Houston Logsdon
Roo David William De
Steven Edward Staller
Gerold Walter Neudeck
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Delphi Technologies Inc
Purdue Research Foundation
Original Assignee
Delco Electronics LLC
Purdue Research Foundation
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Delco Electronics LLC, Purdue Research Foundation filed Critical Delco Electronics LLC
Publication of DE69114957D1 publication Critical patent/DE69114957D1/de
Application granted granted Critical
Publication of DE69114957T2 publication Critical patent/DE69114957T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01P—MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
    • G01P15/00—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration
    • G01P15/02—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses
    • G01P15/08—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values
    • G01P15/0802—Details
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L9/00—Measuring steady of quasi-steady pressure of fluid or fluent solid material by electric or magnetic pressure-sensitive elements; Transmitting or indicating the displacement of mechanical pressure-sensitive elements, used to measure the steady or quasi-steady pressure of a fluid or fluent solid material, by electric or magnetic means
    • G01L9/0041—Transmitting or indicating the displacement of flexible diaphragms
    • G01L9/0042—Constructional details associated with semiconductive diaphragm sensors, e.g. etching, or constructional details of non-semiconductive diaphragms
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T29/00—Metal working
    • Y10T29/49—Method of mechanical manufacture
    • Y10T29/49002—Electrical device making
    • Y10T29/49082—Resistor making
    • Y10T29/49103—Strain gauge making

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Engineering & Computer Science (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Pressure Sensors (AREA)
  • Recrystallisation Techniques (AREA)
DE69114957T 1990-09-04 1991-08-20 Verfahren zur Herstellung eines dünnen Membrans oder Balkens aus Silicium. Expired - Fee Related DE69114957T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US07/577,656 US5068203A (en) 1990-09-04 1990-09-04 Method for forming thin silicon membrane or beam

Publications (2)

Publication Number Publication Date
DE69114957D1 true DE69114957D1 (de) 1996-01-11
DE69114957T2 DE69114957T2 (de) 1996-04-18

Family

ID=24309622

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69114957T Expired - Fee Related DE69114957T2 (de) 1990-09-04 1991-08-20 Verfahren zur Herstellung eines dünnen Membrans oder Balkens aus Silicium.

Country Status (5)

Country Link
US (1) US5068203A (de)
EP (1) EP0474280B1 (de)
JP (1) JPH0670642B2 (de)
KR (1) KR920007082A (de)
DE (1) DE69114957T2 (de)

Families Citing this family (47)

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US5221400A (en) * 1990-12-11 1993-06-22 Delco Electronics Corporation Method of making a microaccelerometer having low stress bonds and means for preventing excessive z-axis deflection
US5408112A (en) * 1991-06-03 1995-04-18 Nippondenso Co., Ltd. Semiconductor strain sensor having improved resistance to bonding strain effects
US5805119A (en) * 1992-10-13 1998-09-08 General Motors Corporation Vehicle projected display using deformable mirror device
FR2697536B1 (fr) * 1992-11-04 1995-01-06 Suisse Electronique Microtech Procédé de fabrication d'un élément de microstructure mécanique.
DE4238571C1 (de) * 1992-11-16 1994-06-01 Kernforschungsz Karlsruhe Verfahren zur Herstellung von durch einen Rahmen aufgespannte Membranen
WO1994018697A1 (en) * 1993-02-04 1994-08-18 Cornell Research Foundation, Inc. Microstructures and single mask, single-crystal process for fabrication thereof
US5426070A (en) * 1993-05-26 1995-06-20 Cornell Research Foundation, Inc. Microstructures and high temperature isolation process for fabrication thereof
US6149190A (en) * 1993-05-26 2000-11-21 Kionix, Inc. Micromechanical accelerometer for automotive applications
US5413679A (en) * 1993-06-30 1995-05-09 The United States Of America As Represented By The Secretary Of The Navy Method of producing a silicon membrane using a silicon alloy etch stop layer
US5483834A (en) * 1993-09-20 1996-01-16 Rosemount Inc. Suspended diaphragm pressure sensor
US5738731A (en) * 1993-11-19 1998-04-14 Mega Chips Corporation Photovoltaic device
US5369057A (en) * 1993-12-21 1994-11-29 Delco Electronics Corporation Method of making and sealing a semiconductor device having an air path therethrough
KR0133481B1 (ko) * 1994-03-10 1998-04-23 구자홍 평면마이크로 가공기술을 이용한 적외선어레이센서 제조방법
US5640133A (en) * 1995-06-23 1997-06-17 Cornell Research Foundation, Inc. Capacitance based tunable micromechanical resonators
EP0758080B1 (de) * 1995-08-09 1998-09-30 Siemens Aktiengesellschaft Mikromechanisches Bauelement mit perforierter, spannungsfreier Membran
SG68630A1 (en) * 1996-10-18 1999-11-16 Eg & G Int Isolation process for surface micromachined sensors and actuators
US6069392A (en) * 1997-04-11 2000-05-30 California Institute Of Technology Microbellows actuator
US5914553A (en) * 1997-06-16 1999-06-22 Cornell Research Foundation, Inc. Multistable tunable micromechanical resonators
US6756247B1 (en) 1998-01-15 2004-06-29 Timothy J. Davis Integrated large area microstructures and micromechanical devices
US6225140B1 (en) * 1998-10-13 2001-05-01 Institute Of Microelectronics CMOS compatable surface machined pressure sensor and method of fabricating the same
JP3007971B1 (ja) * 1999-03-01 2000-02-14 東京大学長 単結晶薄膜の形成方法
DE19932541B4 (de) * 1999-07-13 2011-07-28 Robert Bosch GmbH, 70469 Verfahren zur Herstellung einer Membran
US20020071169A1 (en) 2000-02-01 2002-06-13 Bowers John Edward Micro-electro-mechanical-system (MEMS) mirror device
US6753638B2 (en) 2000-02-03 2004-06-22 Calient Networks, Inc. Electrostatic actuator for micromechanical systems
US6628041B2 (en) 2000-05-16 2003-09-30 Calient Networks, Inc. Micro-electro-mechanical-system (MEMS) mirror device having large angle out of plane motion using shaped combed finger actuators and method for fabricating the same
US6585383B2 (en) 2000-05-18 2003-07-01 Calient Networks, Inc. Micromachined apparatus for improved reflection of light
US6560384B1 (en) 2000-06-01 2003-05-06 Calient Networks, Inc. Optical switch having mirrors arranged to accommodate freedom of movement
KR100345516B1 (ko) * 2000-09-05 2002-07-24 아남반도체 주식회사 고주파 집적회로 장치 및 그 제조 방법
US6825967B1 (en) 2000-09-29 2004-11-30 Calient Networks, Inc. Shaped electrodes for micro-electro-mechanical-system (MEMS) devices to improve actuator performance and methods for fabricating the same
US6544863B1 (en) 2001-08-21 2003-04-08 Calient Networks, Inc. Method of fabricating semiconductor wafers having multiple height subsurface layers
US6541834B1 (en) * 2001-10-09 2003-04-01 Integrated Crystal Technology Corp. Silicon pressure micro-sensing device and the fabrication process
US6818464B2 (en) * 2001-10-17 2004-11-16 Hymite A/S Double-sided etching technique for providing a semiconductor structure with through-holes, and a feed-through metalization process for sealing the through-holes
US7728339B1 (en) 2002-05-03 2010-06-01 Calient Networks, Inc. Boundary isolation for microelectromechanical devices
KR20070006852A (ko) * 2004-04-23 2007-01-11 에이에스엠 아메리카, 인코포레이티드 인-시츄 도핑된 에피택셜 막
US7681306B2 (en) * 2004-04-28 2010-03-23 Hymite A/S Method of forming an assembly to house one or more micro components
US7850778B2 (en) * 2005-09-06 2010-12-14 Lemaire Charles A Apparatus and method for growing fullerene nanotube forests, and forming nanotube films, threads and composite structures therefrom
US7744793B2 (en) 2005-09-06 2010-06-29 Lemaire Alexander B Apparatus and method for growing fullerene nanotube forests, and forming nanotube films, threads and composite structures therefrom
JP2009521801A (ja) 2005-12-22 2009-06-04 エーエスエム アメリカ インコーポレイテッド ドープされた半導体物質のエピタキシャル堆積
TWI305474B (en) * 2006-04-10 2009-01-11 Touch Micro System Tech Method of fabricating a diaphragm of a capacitive microphone device
DE102008041436A1 (de) 2007-10-02 2009-04-09 Carl Zeiss Smt Ag Optisches Membranelement
DE102008003716A1 (de) * 2008-01-09 2009-07-30 CiS Institut für Mikrosensorik GmbH Mikromechanischer Drucksensor
US9162876B2 (en) 2011-03-18 2015-10-20 Stmicroelectronics S.R.L. Process for manufacturing a membrane microelectromechanical device, and membrane microelectromechanical device
US9010200B2 (en) 2012-08-06 2015-04-21 Amphenol Thermometrics, Inc. Device for measuring forces and method of making the same
CN105092104B (zh) * 2014-05-14 2018-09-21 中芯国际集成电路制造(上海)有限公司 一种压力传感器及其制备方法、电子装置
JP7266199B2 (ja) * 2019-11-26 2023-04-28 パナソニックＩｐマネジメント株式会社 載置物検出装置および車両制御システム
US12103843B2 (en) 2021-01-20 2024-10-01 Calient.Ai Inc. MEMS mirror arrays with reduced crosstalk
KR20230020204A (ko) * 2021-08-03 2023-02-10 삼성전자주식회사 반도체 장치 및 그 제조 방법

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3296040A (en) * 1962-08-17 1967-01-03 Fairchild Camera Instr Co Epitaxially growing layers of semiconductor through openings in oxide mask
US3634150A (en) * 1969-06-25 1972-01-11 Gen Electric Method for forming epitaxial crystals or wafers in selected regions of substrates
JPH0712086B2 (ja) * 1984-01-27 1995-02-08 株式会社日立製作所 ダイヤフラムセンサの製造方法
JPS6197572A (ja) * 1984-10-19 1986-05-16 Nissan Motor Co Ltd 半導体加速度センサの製造方法
US4670092A (en) * 1986-04-18 1987-06-02 Rockwell International Corporation Method of fabricating a cantilever beam for a monolithic accelerometer
US4948456A (en) * 1989-06-09 1990-08-14 Delco Electronics Corporation Confined lateral selective epitaxial growth

Also Published As

Publication number Publication date
EP0474280B1 (de) 1995-11-29
KR920007082A (ko) 1992-04-28
EP0474280A2 (de) 1992-03-11
DE69114957T2 (de) 1996-04-18
US5068203A (en) 1991-11-26
JPH04256866A (ja) 1992-09-11
EP0474280A3 (en) 1992-12-09
JPH0670642B2 (ja) 1994-09-07

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8327 Change in the person/name/address of the patent owner

Owner name: DELPHI TECHNOLOGIES, INC., TROY, MICH., US

Owner name: PURDUE RESEARCH FOUNDATION, WEST LAFAYETTE, IND.,

8339 Ceased/non-payment of the annual fee