DE60303895D1 - Hybridimplementierung von Fehlerkorrekturkoden eines nichtflüchtigen Speichersystems - Google Patents

Hybridimplementierung von Fehlerkorrekturkoden eines nichtflüchtigen Speichersystems

Info

Publication number
DE60303895D1
DE60303895D1 DE60303895T DE60303895T DE60303895D1 DE 60303895 D1 DE60303895 D1 DE 60303895D1 DE 60303895 T DE60303895 T DE 60303895T DE 60303895 T DE60303895 T DE 60303895T DE 60303895 D1 DE60303895 D1 DE 60303895D1
Authority
DE
Germany
Prior art keywords
data
error correction
algorithm
encoded
nonvolatile memory
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60303895T
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English (en)
Other versions
DE60303895T2 (de
Inventor
Robert C Chang
Bahman Qawami
Farshid Sabet-Sharghi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
SanDisk Corp
Original Assignee
SanDisk Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
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First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=32825088&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=DE60303895(D1) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by SanDisk Corp filed Critical SanDisk Corp
Publication of DE60303895D1 publication Critical patent/DE60303895D1/de
Application granted granted Critical
Publication of DE60303895T2 publication Critical patent/DE60303895T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F12/00—Accessing, addressing or allocating within memory systems or architectures
    • G06F12/02—Addressing or allocation; Relocation
    • G06F12/0223—User address space allocation, e.g. contiguous or non contiguous base addressing
    • G06F12/023—Free address space management
    • G06F12/0238—Memory management in non-volatile memory, e.g. resistive RAM or ferroelectric memory
    • G06F12/0246—Memory management in non-volatile memory, e.g. resistive RAM or ferroelectric memory in block erasable memory, e.g. flash memory
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/08—Error detection or correction by redundancy in data representation, e.g. by using checking codes
    • G06F11/10—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's
    • G06F11/1008—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices
    • G06F11/1068—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices in sector programmable memories, e.g. flash disk

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Quality & Reliability (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
  • Read Only Memory (AREA)
  • Debugging And Monitoring (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Detection And Correction Of Errors (AREA)
DE60303895T 2002-10-28 2003-10-28 Hybridimplementierung von Fehlerkorrekturkoden eines nichtflüchtigen Speichersystems Expired - Lifetime DE60303895T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US42191102P 2002-10-28 2002-10-28
US421911P 2002-10-28

Publications (2)

Publication Number Publication Date
DE60303895D1 true DE60303895D1 (de) 2006-05-04
DE60303895T2 DE60303895T2 (de) 2006-10-05

Family

ID=32825088

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60303895T Expired - Lifetime DE60303895T2 (de) 2002-10-28 2003-10-28 Hybridimplementierung von Fehlerkorrekturkoden eines nichtflüchtigen Speichersystems

Country Status (7)

Country Link
US (1) US8412879B2 (de)
EP (1) EP1424631B1 (de)
JP (1) JP4429685B2 (de)
KR (1) KR101017443B1 (de)
CN (1) CN1499532B (de)
AT (1) ATE320041T1 (de)
DE (1) DE60303895T2 (de)

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KR101017443B1 (ko) 2011-02-25
EP1424631A1 (de) 2004-06-02
CN1499532B (zh) 2011-05-18
US8412879B2 (en) 2013-04-02
JP4429685B2 (ja) 2010-03-10
JP2004164634A (ja) 2004-06-10
KR20040038711A (ko) 2004-05-08
US20040083333A1 (en) 2004-04-29
EP1424631B1 (de) 2006-03-08
ATE320041T1 (de) 2006-03-15
CN1499532A (zh) 2004-05-26
DE60303895T2 (de) 2006-10-05

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