DE60235906D1 - Erfahren - Google Patents

Erfahren

Info

Publication number
DE60235906D1
DE60235906D1 DE60235906T DE60235906T DE60235906D1 DE 60235906 D1 DE60235906 D1 DE 60235906D1 DE 60235906 T DE60235906 T DE 60235906T DE 60235906 T DE60235906 T DE 60235906T DE 60235906 D1 DE60235906 D1 DE 60235906D1
Authority
DE
Germany
Prior art keywords
substrates
electronic device
metal pattern
organic layer
apertures
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60235906T
Other languages
German (de)
English (en)
Inventor
De Walle Gerjan F Van
Andreas H Montree
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Koninklijke Philips NV
Original Assignee
Koninklijke Philips Electronics NV
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Koninklijke Philips Electronics NV filed Critical Koninklijke Philips Electronics NV
Application granted granted Critical
Publication of DE60235906D1 publication Critical patent/DE60235906D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D30/00—Field-effect transistors [FET]
    • H10D30/60—Insulated-gate field-effect transistors [IGFET]
    • H10D30/67—Thin-film transistors [TFT]
    • H10D30/6729—Thin-film transistors [TFT] characterised by the electrodes
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D30/00—Field-effect transistors [FET]
    • H10D30/60—Insulated-gate field-effect transistors [IGFET]
    • H10D30/67—Thin-film transistors [TFT]
    • H10D30/6729—Thin-film transistors [TFT] characterised by the electrodes
    • H10D30/673—Thin-film transistors [TFT] characterised by the electrodes characterised by the shapes, relative sizes or dispositions of the gate electrodes
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D30/00—Field-effect transistors [FET]
    • H10D30/60—Insulated-gate field-effect transistors [IGFET]
    • H10D30/67—Thin-film transistors [TFT]
    • H10D30/6758—Thin-film transistors [TFT] characterised by the insulating substrates

Landscapes

  • Thin Film Transistor (AREA)
  • Electrodes Of Semiconductors (AREA)
  • Saccharide Compounds (AREA)
  • Polymers With Sulfur, Phosphorus Or Metals In The Main Chain (AREA)
DE60235906T 2001-10-11 2002-10-10 Erfahren Expired - Lifetime DE60235906D1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
EP01203855 2001-10-11
PCT/IB2002/004169 WO2003034502A1 (en) 2001-10-11 2002-10-10 Thin film transistor device and method of manufacturing same

Publications (1)

Publication Number Publication Date
DE60235906D1 true DE60235906D1 (de) 2010-05-20

Family

ID=8181046

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60235906T Expired - Lifetime DE60235906D1 (de) 2001-10-11 2002-10-10 Erfahren

Country Status (8)

Country Link
US (1) US7282769B2 (enExample)
EP (1) EP1438753B1 (enExample)
JP (1) JP2005506704A (enExample)
KR (1) KR20040052226A (enExample)
CN (1) CN100367516C (enExample)
AT (1) ATE463845T1 (enExample)
DE (1) DE60235906D1 (enExample)
WO (1) WO2003034502A1 (enExample)

Families Citing this family (23)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6661024B1 (en) * 2002-07-02 2003-12-09 Motorola, Inc. Integrated circuit including field effect transistor and method of manufacture
US7045884B2 (en) * 2002-10-04 2006-05-16 International Rectifier Corporation Semiconductor device package
JP4729843B2 (ja) * 2003-10-15 2011-07-20 凸版印刷株式会社 薄膜トランジスタの製造方法
US7166867B2 (en) * 2003-12-05 2007-01-23 International Rectifier Corporation III-nitride device with improved layout geometry
US7130234B2 (en) * 2003-12-12 2006-10-31 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device
US7768405B2 (en) * 2003-12-12 2010-08-03 Semiconductor Energy Laboratory Co., Ltd Semiconductor device and manufacturing method thereof
US7405665B2 (en) * 2003-12-19 2008-07-29 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device, RFID tag and label-like object
US7508305B2 (en) * 2003-12-26 2009-03-24 Semiconductor Energy Laboratory Co., Ltd. Packing material, tag, certificate, paper money, and securities
EP1733334B1 (en) 2004-04-09 2011-05-25 Semiconductor Energy Laboratory Co., Ltd. Product management system
JP5041681B2 (ja) * 2004-06-29 2012-10-03 株式会社半導体エネルギー研究所 半導体装置の作製方法
US7452786B2 (en) * 2004-06-29 2008-11-18 Semiconductor Energy Laboratory Co., Ltd. Method for manufacturing thin film integrated circuit, and element substrate
US7309895B2 (en) * 2005-01-25 2007-12-18 Hewlett-Packard Development Company, L.P. Semiconductor device
TWI569441B (zh) 2005-01-28 2017-02-01 半導體能源研究所股份有限公司 半導體裝置，電子裝置，和半導體裝置的製造方法
TWI472037B (zh) 2005-01-28 2015-02-01 半導體能源研究所股份有限公司 半導體裝置，電子裝置，和半導體裝置的製造方法
JP4951868B2 (ja) * 2005-03-18 2012-06-13 凸版印刷株式会社 薄膜トランジスタの製造方法
US8414962B2 (en) 2005-10-28 2013-04-09 The Penn State Research Foundation Microcontact printed thin film capacitors
JP5200443B2 (ja) * 2007-07-30 2013-06-05 セイコーエプソン株式会社 有機トランジスタ及びアクティブマトリックス基板
JP5532553B2 (ja) * 2008-06-11 2014-06-25 凸版印刷株式会社 薄膜トランジスタ、薄膜トランジスタの製造方法、薄膜トランジスタアレイ及び画像表示装置
JP5445590B2 (ja) * 2009-11-13 2014-03-19 株式会社島津製作所 薄膜トランジスタの製造方法
GB2480876B (en) * 2010-06-04 2015-02-25 Plastic Logic Ltd Conductive elements in organic electronic devices
KR20130051614A (ko) * 2011-11-10 2013-05-21 삼성전기주식회사 적층 세라믹 전자 부품 및 그 제조 방법
TWI532191B (zh) * 2013-12-31 2016-05-01 友達光電股份有限公司 薄膜電晶體結構
CN107204375B (zh) * 2017-05-19 2019-11-26 深圳市华星光电技术有限公司 薄膜晶体管及其制作方法

Family Cites Families (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US655365A (en) * 1899-11-14 1900-08-07 Henry M Johnson Hernial truss.
US5681718A (en) * 1986-03-14 1997-10-28 Celltech Limited Methods for enhanced production of tissue plasminogen activator in cell culture using alkanoic acids or salts thereof
US5468681A (en) * 1989-08-28 1995-11-21 Lsi Logic Corporation Process for interconnecting conductive substrates using an interposer having conductive plastic filled vias
US5650323A (en) * 1991-06-26 1997-07-22 Costar Corporation System for growing and manipulating tissue cultures using 96-well format equipment
US5707869A (en) * 1994-06-28 1998-01-13 Wolf; Martin L. Compartmentalized multiple well tissue culture plate
JP3372258B2 (ja) * 1995-08-04 2003-01-27 インターナシヨナル・ビジネス・マシーンズ・コーポレーシヨン リソグラフィ・プロセス用のスタンプ
US6031269A (en) * 1997-04-18 2000-02-29 Advanced Micro Devices, Inc. Quadruple gate field effect transistor structure for use in integrated circuit devices
EP0958663A1 (en) * 1997-12-05 1999-11-24 Koninklijke Philips Electronics N.V. Identification transponder
US7122835B1 (en) * 1999-04-07 2006-10-17 Semiconductor Energy Laboratory Co., Ltd. Electrooptical device and a method of manufacturing the same
US6197663B1 (en) * 1999-12-07 2001-03-06 Lucent Technologies Inc. Process for fabricating integrated circuit devices having thin film transistors
KR100315208B1 (ko) * 1999-12-17 2001-11-26 구본준, 론 위라하디락사 액정표시소자 및 그 제조방법
WO2003036265A2 (en) * 2001-10-26 2003-05-01 Virtual Arrays, Inc. Assay systems with adjustable fluid communication
IL136232A0 (en) * 2000-05-18 2001-05-20 Bar Ilan University Res Author Measurements of enzymatic activity in a single, individual cell in population
EP1330306A2 (en) * 2000-10-10 2003-07-30 BioTrove, Inc. Apparatus for assay, synthesis and storage, and methods of manufacture, use, and manipulation thereof
US6495340B2 (en) * 2000-11-28 2002-12-17 Medis El Ltd. Cell carrier grids
US6544788B2 (en) * 2001-02-15 2003-04-08 Vijay Singh Disposable perfusion bioreactor for cell culture
US6982194B2 (en) * 2001-03-27 2006-01-03 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and method for manufacturing the same
ES2259085T3 (es) * 2001-06-14 2006-09-16 Millipore Corporation Aparato de ensayo multipocillo.

Also Published As

Publication number Publication date
CN100367516C (zh) 2008-02-06
US7282769B2 (en) 2007-10-16
EP1438753A1 (en) 2004-07-21
ATE463845T1 (de) 2010-04-15
KR20040052226A (ko) 2004-06-22
WO2003034502A1 (en) 2003-04-24
JP2005506704A (ja) 2005-03-03
US20040245519A1 (en) 2004-12-09
CN1568548A (zh) 2005-01-19
EP1438753B1 (en) 2010-04-07

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Legal Events

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8364 No opposition during term of opposition