DE60216123D1 - Vorrichtung zum messen eines oberflächenprofils - Google Patents

Vorrichtung zum messen eines oberflächenprofils

Info

Publication number
DE60216123D1
DE60216123D1 DE60216123T DE60216123T DE60216123D1 DE 60216123 D1 DE60216123 D1 DE 60216123D1 DE 60216123 T DE60216123 T DE 60216123T DE 60216123 T DE60216123 T DE 60216123T DE 60216123 D1 DE60216123 D1 DE 60216123D1
Authority
DE
Germany
Prior art keywords
measuring
surface profile
profile
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE60216123T
Other languages
English (en)
Other versions
DE60216123T2 (de
Inventor
Yasunari Nagaike
Yasushi Nakamura
Yoshiaki Ito
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Olympus Corp
Original Assignee
Olympus Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Olympus Corp filed Critical Olympus Corp
Application granted granted Critical
Publication of DE60216123D1 publication Critical patent/DE60216123D1/de
Publication of DE60216123T2 publication Critical patent/DE60216123T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B5/00Measuring arrangements characterised by the use of mechanical techniques
    • G01B5/004Measuring arrangements characterised by the use of mechanical techniques for measuring coordinates of points
    • G01B5/008Measuring arrangements characterised by the use of mechanical techniques for measuring coordinates of points using coordinate measuring machines
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B3/00Measuring instruments characterised by the use of mechanical techniques
    • G01B3/002Details
    • G01B3/008Arrangements for controlling the measuring force
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B5/00Measuring arrangements characterised by the use of mechanical techniques
    • G01B5/004Measuring arrangements characterised by the use of mechanical techniques for measuring coordinates of points
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B5/00Measuring arrangements characterised by the use of mechanical techniques
    • G01B5/20Measuring arrangements characterised by the use of mechanical techniques for measuring contours or curvatures
DE60216123T 2001-09-07 2002-09-05 Vorrichtung zur Messung eines Oberflächenprofils eines zu vermessenden Objekts Expired - Fee Related DE60216123T2 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2001271500 2001-09-07
JP2001271500 2001-09-07
PCT/JP2002/009058 WO2003023369A2 (en) 2001-09-07 2002-09-05 Apparatus for measuring a surface profile

Publications (2)

Publication Number Publication Date
DE60216123D1 true DE60216123D1 (de) 2006-12-28
DE60216123T2 DE60216123T2 (de) 2007-03-01

Family

ID=19096998

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60216123T Expired - Fee Related DE60216123T2 (de) 2001-09-07 2002-09-05 Vorrichtung zur Messung eines Oberflächenprofils eines zu vermessenden Objekts

Country Status (7)

Country Link
US (1) US6758085B2 (de)
EP (1) EP1423677B1 (de)
JP (1) JP3926793B2 (de)
CN (1) CN100395537C (de)
DE (1) DE60216123T2 (de)
TW (1) TW550375B (de)
WO (1) WO2003023369A2 (de)

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FR2853056B1 (fr) * 2003-03-28 2005-07-15 Snecma Moteurs Dispositif et procede de mesure de profil
JP4281904B2 (ja) * 2003-08-11 2009-06-17 株式会社フコク 等速ジョイント用ブーツの大径側端部における内径寸法測定方法および寸法測定装置
JP4519449B2 (ja) * 2003-11-12 2010-08-04 オリンパス株式会社 形状測定機
JP5032741B2 (ja) * 2003-11-18 2012-09-26 オリンパス株式会社 3次元形状測定方法及び3次元形状測定装置
EP1730465B1 (de) * 2004-03-18 2015-05-20 Renishaw plc Scannen eines objekts
US7140119B2 (en) * 2004-04-23 2006-11-28 Corning Incorporated Measurement of form of spherical and near-spherical optical surfaces
JP4529562B2 (ja) * 2004-07-06 2010-08-25 横浜ゴム株式会社 接触特性の評価方法及び接触状態の評価用コンピュータプログラム
JP5027668B2 (ja) * 2004-12-01 2012-09-19 ピレリ・タイヤ・ソチエタ・ペル・アツィオーニ 車輪用タイヤの構成要素の製造工程を制御する方法及び装置
EP1704963B1 (de) * 2005-03-23 2008-01-09 Asphericon Gmbh Verfahren zur Bearbeitung und Vermessung von rotationssymmetrischen Werkstücken
JP4836478B2 (ja) 2005-03-31 2011-12-14 カヤバ工業株式会社 クロージング加工方法及びクロージング加工機
JP4923441B2 (ja) 2005-05-26 2012-04-25 株式会社ジェイテクト 形状測定器
JP2007038305A (ja) * 2005-07-29 2007-02-15 Metrol Ltd 工具折損検出装置
JP5292668B2 (ja) * 2006-01-06 2013-09-18 コニカミノルタ株式会社 形状測定装置及び方法
CN101354246B (zh) * 2007-07-27 2010-09-29 鸿富锦精密工业(深圳)有限公司 物体表面形貌测量方法
TWI393855B (zh) * 2007-09-21 2013-04-21 Hon Hai Prec Ind Co Ltd 透鏡測厚儀
JP4480769B2 (ja) * 2008-01-11 2010-06-16 パナソニック株式会社 形状測定方法
JP5270246B2 (ja) * 2008-07-28 2013-08-21 株式会社ミツトヨ 表面性状測定機および測定方法
JP5465848B2 (ja) * 2008-07-28 2014-04-09 株式会社ミツトヨ 昇降傾斜調整装置
JP5301412B2 (ja) * 2009-10-21 2013-09-25 株式会社ミツトヨ 測定力制御装置
JP5663274B2 (ja) * 2010-11-10 2015-02-04 オリンパス株式会社 形状測定センサ
CN102095366A (zh) * 2010-12-14 2011-06-15 苏州大学 一种大梯度非球面的轮廓测量方法
RU2464527C1 (ru) * 2011-05-23 2012-10-20 Государственное образовательное учреждение высшего профессионального образования "Московский государственный университет дизайна и технологии" Устройство для измерения неровностей листовых вязкоупругих материалов
DE102011116339A1 (de) * 2011-10-19 2013-04-25 Spieth-Maschinenelemente Gmbh & Co. Kg Verfahren zur Vermessung eines dreidimensionalen Objekts
DE102012205184B4 (de) * 2012-03-30 2015-07-09 Aktiebolaget Skf Messvorrichtung zur Längenmessung an einem Werkstück
CN103264318B (zh) * 2013-04-19 2015-11-18 湖北三江航天险峰电子信息有限公司 一种立体型面的在线检测方法
TW201445119A (zh) * 2013-05-27 2014-12-01 Hon Hai Prec Ind Co Ltd 承載裝置
CN103481122B (zh) * 2013-08-08 2016-05-04 哈尔滨理工大学 面向自由曲面的接触式测量误差补偿方法
CN103594129B (zh) * 2013-10-22 2016-01-20 中广核检测技术有限公司 核电站反应堆压力容器内管状部件表面智能扫查方法
JP6448242B2 (ja) * 2014-07-18 2019-01-09 株式会社ミツトヨ 形状測定装置の測定誤差の補正方法及び形状測定装置
CN104655078B (zh) * 2015-02-13 2016-10-26 青岛玉兰祥商务服务有限公司 通过风扇散热的电力行业汽轮机主轴轴承的检测装置及检测方法
JP6472299B2 (ja) * 2015-03-31 2019-02-20 株式会社ミツトヨ 形状測定機の姿勢調整器
CN105387810A (zh) * 2015-10-20 2016-03-09 四川大学 一种测量力可控的电磁轴承自倾斜式微位移传感器系统
DE102017103938A1 (de) * 2017-02-24 2018-08-30 Carl Zeiss Industrielle Messtechnik Gmbh Vorrichtung zum Messen der Rauheit einer Werkstückoberfläche
CN108132022A (zh) * 2017-12-05 2018-06-08 航天材料及工艺研究所 一种大直径薄壁箱体的形变测量装置
CN108278950B (zh) * 2018-01-22 2023-09-22 中国人民解放军第五七二一工厂 一种飞行器风挡玻璃总成调整装置及调整方法
CN109084722B (zh) * 2018-06-20 2019-08-13 华中科技大学 一种自适应采样的复杂曲面接触式测量方法
JP7072990B2 (ja) * 2018-06-22 2022-05-23 株式会社ミツトヨ 測定装置および測定方法
TWI705036B (zh) * 2019-01-22 2020-09-21 鈺皓實業有限公司 搬運載具之夾持裝置
JP7328134B2 (ja) 2019-12-11 2023-08-16 株式会社ディスコ ブラケット
JP7298896B2 (ja) 2019-12-20 2023-06-27 オールグッド株式会社 被検体の状態測定装置

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3795132A (en) * 1972-05-30 1974-03-05 Caterpillar Tractor Co Curved surface finish analyzer
GB1597842A (en) * 1977-02-07 1981-09-09 Rolls Royce Indexing mechanism
US4103542A (en) * 1977-09-09 1978-08-01 Tencor Instruments Metrology instrument for measuring vertical profiles of integrated circuits
US4391044A (en) * 1981-09-28 1983-07-05 Tencor Instruments Metrology instrument for measuring vertical profiles of integrated circuits and the like
US4495703A (en) * 1981-11-25 1985-01-29 Mitutoyo Mfg. Co., Ltd. Coordinate measuring instrument
US4679326A (en) * 1984-11-21 1987-07-14 Mitutoyo Mfg. Co., Ltd. Height gauge
FR2645638A1 (fr) * 1989-04-11 1990-10-12 Inst Superieur Etat Surfaces Procede et dispositif de mesurage profilometrique de large echelle et leurs applications a la mesure de l'etat de surfaces de forme quelconque
US5309755A (en) * 1992-10-02 1994-05-10 Tencor Instruments Profilometer stylus assembly insensitive to vibration
DE4238139C2 (de) * 1992-11-12 2002-10-24 Zeiss Carl Koordinatenmeßgerät
JPH07260471A (ja) * 1994-03-16 1995-10-13 Nikon Corp 表面形状測定装置
US5705741A (en) * 1994-12-22 1998-01-06 Tencor Instruments Constant-force profilometer with stylus-stabilizing sensor assembly, dual-view optics, and temperature drift compensation
DE10035714B4 (de) * 1999-07-23 2011-06-09 Mitutoyo Corp. Oberflächengestalt-Messverfahren

Also Published As

Publication number Publication date
DE60216123T2 (de) 2007-03-01
WO2003023369A3 (en) 2003-08-14
EP1423677B1 (de) 2006-11-15
US6758085B2 (en) 2004-07-06
EP1423677A2 (de) 2004-06-02
WO2003023369A2 (en) 2003-03-20
CN100395537C (zh) 2008-06-18
JP2005502876A (ja) 2005-01-27
US20030217592A1 (en) 2003-11-27
TW550375B (en) 2003-09-01
JP3926793B2 (ja) 2007-06-06
CN1484760A (zh) 2004-03-24

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Legal Events

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8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee