DE602007011985D1 - Strahlungsfilter, der die spektrale zusammensetzung der strahlung nicht verändert - Google Patents

Strahlungsfilter, der die spektrale zusammensetzung der strahlung nicht verändert

Info

Publication number
DE602007011985D1
DE602007011985D1 DE602007011985T DE602007011985T DE602007011985D1 DE 602007011985 D1 DE602007011985 D1 DE 602007011985D1 DE 602007011985 T DE602007011985 T DE 602007011985T DE 602007011985 T DE602007011985 T DE 602007011985T DE 602007011985 D1 DE602007011985 D1 DE 602007011985D1
Authority
DE
Germany
Prior art keywords
radiation
filter
spectral composition
change
absorbing sheets
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
DE602007011985T
Other languages
English (en)
Inventor
Axel Thran
Jens-Peter Schlomka
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Philips Intellectual Property and Standards GmbH
Original Assignee
Philips Intellectual Property and Standards GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Philips Intellectual Property and Standards GmbH filed Critical Philips Intellectual Property and Standards GmbH
Publication of DE602007011985D1 publication Critical patent/DE602007011985D1/de
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/02—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/10—Scattering devices; Absorbing devices; Ionising radiation filters

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
  • Measurement Of Radiation (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Optical Filters (AREA)
  • Materials For Medical Uses (AREA)
DE602007011985T 2006-12-04 2007-11-30 Strahlungsfilter, der die spektrale zusammensetzung der strahlung nicht verändert Active DE602007011985D1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
EP06125335 2006-12-04
PCT/IB2007/054865 WO2008068690A2 (en) 2006-12-04 2007-11-30 Beam filter, particularly for x-rays, that does not change the beam's spectral composition

Publications (1)

Publication Number Publication Date
DE602007011985D1 true DE602007011985D1 (de) 2011-02-24

Family

ID=39433004

Family Applications (1)

Application Number Title Priority Date Filing Date
DE602007011985T Active DE602007011985D1 (de) 2006-12-04 2007-11-30 Strahlungsfilter, der die spektrale zusammensetzung der strahlung nicht verändert

Country Status (7)

Country Link
US (1) US8031840B2 (de)
EP (1) EP2102871B1 (de)
JP (1) JP5355413B2 (de)
CN (1) CN101548339B (de)
AT (1) ATE495529T1 (de)
DE (1) DE602007011985D1 (de)
WO (1) WO2008068690A2 (de)

Families Citing this family (23)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4911373B2 (ja) 2009-11-26 2012-04-04 横河電機株式会社 Ｘ線測定装置
JP5536426B2 (ja) * 2009-11-27 2014-07-02 ジーイー・メディカル・システムズ・グローバル・テクノロジー・カンパニー・エルエルシー ビーム形成ｘ線フィルタおよびこれを使ったｘ線ｃｔ装置
CN103153397B (zh) 2010-11-16 2015-10-07 三菱电机株式会社 物块、物块的制造方法、粒子射线治疗装置、及治疗计划装置
EP2677935A1 (de) 2011-02-22 2014-01-01 Koninklijke Philips N.V. Detektionsvorrichtung
DE102011006421A1 (de) * 2011-03-30 2012-10-04 Siemens Aktiengesellschaft Digitaler Röntgendetektor
WO2012168832A1 (en) * 2011-06-06 2012-12-13 Koninklijke Philips Electronics N.V. Multiple focal spot x-ray radiation filtering
US9414792B2 (en) 2011-06-17 2016-08-16 The Board Of Trustees Of The Leland Stanford Junior University Computed tomography system with dynamic bowtie filter
US9392984B2 (en) * 2011-06-17 2016-07-19 The Board Of Trustees Of The Leland Stanford Junior University Computed tomography system with dynamic bowtie filter
US9521982B2 (en) 2011-06-17 2016-12-20 The Board Of Trustees Of The Leland Stanford Junior University Computed tomography system with dynamic bowtie filter
US9357973B2 (en) * 2011-06-30 2016-06-07 Koninklijke Philips N.V. X-ray beam transmission profile shaper
WO2014087283A1 (en) * 2012-12-03 2014-06-12 Koninklijke Philips N.V. Translating x-ray beam transmission profile shaper
US9775572B2 (en) * 2012-12-05 2017-10-03 Koninklijke Philips N.V. Radiation beam intensity profile shaper
GB201308876D0 (en) 2013-05-16 2013-07-03 Ibex Innovations Ltd X-Ray imaging apparatus and methods
GB201308818D0 (en) 2013-05-16 2013-07-03 Ibex Innovations Ltd X-ray detector apparatus
GB201308851D0 (en) 2013-05-16 2013-07-03 Ibex Innovations Ltd Multi-spectral x-ray detection apparatus
KR102171020B1 (ko) 2013-10-16 2020-10-29 삼성전자주식회사 엑스레이 흡수 필터를 갖는 엑스레이 시스템, 반도체 패키지, 및 트레이
CN105916443B (zh) * 2014-01-14 2022-03-22 皇家飞利浦有限公司 用于x射线成像装置的具有衰减元件的x射线发射设备
WO2016062504A1 (en) * 2014-10-21 2016-04-28 Koninklijke Philips N.V. Dynamic beam shaper
CN107810538B (zh) * 2015-06-29 2021-11-02 皇家飞利浦有限公司 用于生成和准直x射线束的系统
RU168369U1 (ru) * 2016-03-31 2017-01-30 Общество с ограниченной ответственностью Совместное русско-французское предприятие "СпектрАп" Рентгеновский фильтр
EP3509492B1 (de) * 2016-09-08 2021-12-15 Koninklijke Philips N.V. Quellengitter für röntgenbildgebung
WO2020097800A1 (zh) * 2018-11-13 2020-05-22 西安大医集团有限公司 滤光器、放射线扫描装置及放射线扫描方法
EP3834731A1 (de) * 2019-12-12 2021-06-16 Koninklijke Philips N.V. Kombinierte k-randfilter zur dosisreduktion in der röntgenbildgebung

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE9017465U1 (de) * 1990-12-24 1991-04-04 Transformatoren- und Röntgenwerk GmbH i.L., 01139 Dresden Einrichtung zur Herstellung streustrahlenarmer Röntgenbilder
DE4222227A1 (de) * 1992-07-07 1994-01-13 Philips Patentverwaltung Anordnung zum Messen des Impulsübertragsspektrums von elastisch gestreuten Röntgenquanten
EP0556887B1 (de) * 1992-02-06 1998-07-08 Philips Patentverwaltung GmbH Anordnung zum Messen des Impulsübertragsspektrums von elastisch gestreuten Röntgenquanten
CZ2928U1 (cs) * 1994-12-14 1995-02-15 Václav Ing. Machek Řeznická kolébka
US6157703A (en) * 1998-10-06 2000-12-05 Cardiac Mariners, Inc. Beam hardening filter for x-ray source
JP2000217812A (ja) 1999-01-27 2000-08-08 Fuji Photo Film Co Ltd 散乱線除去グリッドおよびその製造方法
US6175615B1 (en) * 1999-04-12 2001-01-16 General Electric Company Radiation imager collimator
DE29910552U1 (de) * 1999-06-16 1999-09-09 Sommerlatte, Frank, 70186 Stuttgart Messerblock mit Halterung für Wiegemesser
EP1277214A1 (de) 2000-04-17 2003-01-22 Koninklijke Philips Electronics N.V. Röntgenstrahlungsvorrichtung mit einem filter mit dynamisch-verstellbarer absorptionsfähigkeit
US6470072B1 (en) * 2000-08-24 2002-10-22 General Electric Company X-ray anti-scatter grid
DE10154461B4 (de) * 2001-11-08 2005-12-15 Siemens Ag Vorrichtung zum Filtern eines Strahlenbündels
JP4041025B2 (ja) 2003-07-15 2008-01-30 ジーイー・メディカル・システムズ・グローバル・テクノロジー・カンパニー・エルエルシー Ｘ線分布調整フィルタ装置およびそれを用いたｘ線ｃｔ装置
JP2005121865A (ja) * 2003-10-16 2005-05-12 New Industry Research Organization 三次元微細構造体加工用ｘ線マスク及びその製造方法
US6990171B2 (en) * 2003-10-27 2006-01-24 General Electric Company System and method of determining a user-defined region-of-interest of an imaging subject for x-ray flux management control
CN1929786A (zh) * 2004-03-10 2007-03-14 皇家飞利浦电子股份有限公司 聚焦的相干－散射计算机层析成像
CN2824991Y (zh) * 2005-10-10 2006-10-11 姚毅 肿瘤放射治疗用的高分辨率多叶光栅

Also Published As

Publication number Publication date
WO2008068690A2 (en) 2008-06-12
WO2008068690A3 (en) 2008-08-14
US8031840B2 (en) 2011-10-04
JP5355413B2 (ja) 2013-11-27
CN101548339B (zh) 2012-06-20
JP2010511857A (ja) 2010-04-15
EP2102871B1 (de) 2011-01-12
EP2102871A2 (de) 2009-09-23
US20100074393A1 (en) 2010-03-25
ATE495529T1 (de) 2011-01-15
CN101548339A (zh) 2009-09-30

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