DE602005003302T2 - Automatischer mit Geschwindigkeit ablaufender Test auf Fehler von Logikblöcken unter Verwendung von BIST-Logikschaltungen - Google Patents

Automatischer mit Geschwindigkeit ablaufender Test auf Fehler von Logikblöcken unter Verwendung von BIST-Logikschaltungen Download PDF

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Publication number
DE602005003302T2
DE602005003302T2 DE602005003302T DE602005003302T DE602005003302T2 DE 602005003302 T2 DE602005003302 T2 DE 602005003302T2 DE 602005003302 T DE602005003302 T DE 602005003302T DE 602005003302 T DE602005003302 T DE 602005003302T DE 602005003302 T2 DE602005003302 T2 DE 602005003302T2
Authority
DE
Germany
Prior art keywords
logic block
test
signature
logic
flip
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE602005003302T
Other languages
German (de)
English (en)
Other versions
DE602005003302D1 (de
Inventor
Venkat Chary Sunnyvale Mushirabad
Rajanatha San Jose Shettigara
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tamiras Per Pte Ltd LLC
Original Assignee
Genesis Microchip Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Genesis Microchip Inc filed Critical Genesis Microchip Inc
Publication of DE602005003302D1 publication Critical patent/DE602005003302D1/de
Application granted granted Critical
Publication of DE602005003302T2 publication Critical patent/DE602005003302T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3177—Testing of logic operation, e.g. by logic analysers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3187—Built-in tests
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318552—Clock circuits details

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Detection And Correction Of Errors (AREA)
DE602005003302T 2004-10-15 2005-09-21 Automatischer mit Geschwindigkeit ablaufender Test auf Fehler von Logikblöcken unter Verwendung von BIST-Logikschaltungen Expired - Lifetime DE602005003302T2 (de)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
US61920104P 2004-10-15 2004-10-15
US619201P 2004-10-15
US141763 2005-05-31
US11/141,763 US7398443B2 (en) 2004-10-15 2005-05-31 Automatic fault-testing of logic blocks using internal at-speed logic-BIST

Publications (2)

Publication Number Publication Date
DE602005003302D1 DE602005003302D1 (de) 2007-12-27
DE602005003302T2 true DE602005003302T2 (de) 2008-03-06

Family

ID=35708890

Family Applications (1)

Application Number Title Priority Date Filing Date
DE602005003302T Expired - Lifetime DE602005003302T2 (de) 2004-10-15 2005-09-21 Automatischer mit Geschwindigkeit ablaufender Test auf Fehler von Logikblöcken unter Verwendung von BIST-Logikschaltungen

Country Status (8)

Country Link
US (1) US7398443B2 (enExample)
EP (1) EP1647828B1 (enExample)
JP (1) JP5336692B2 (enExample)
KR (1) KR101268611B1 (enExample)
AT (1) ATE378608T1 (enExample)
DE (1) DE602005003302T2 (enExample)
SG (1) SG121944A1 (enExample)
TW (1) TWI370907B (enExample)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7769558B2 (en) * 2006-07-10 2010-08-03 Asterion, Inc. Digital waveform generation and measurement in automated test equipment
KR20080019078A (ko) * 2006-08-22 2008-03-03 삼성전자주식회사 순환 중복 검사를 이용한 테스트 방법 및 이를 이용하는디지털 장치
TWI312076B (en) 2006-10-19 2009-07-11 Via Tech Inc Apparatus and related method for chip i/o test
TWI304889B (en) 2006-10-26 2009-01-01 Via Tech Inc Method and related apparatus for testing chip
US8675076B2 (en) * 2009-07-21 2014-03-18 Qualcomm Incorporated System for embedded video test pattern generation
US20110029827A1 (en) * 2009-07-29 2011-02-03 International Business Machines Corporation Method, apparatus, and design structure for built-in self-test
US9222971B2 (en) * 2013-10-30 2015-12-29 Freescale Semiconductor, Inc. Functional path failure monitor
US9665934B2 (en) * 2014-10-28 2017-05-30 Texas Instruments Incorporated Apparatus for detecting faults in video frames of video sequence
KR102549438B1 (ko) * 2016-09-27 2023-06-29 삼성전자주식회사 순차 회로, 이를 포함하는 스캔 체인 회로 및 집적 회로
US20190197929A1 (en) * 2017-12-26 2019-06-27 Novatek Microelectronics Corp. Driving apparatus of display panel and operation method thereof
CN111782448A (zh) * 2020-07-01 2020-10-16 长沙景嘉微电子股份有限公司 芯片自检测方法、装置、芯片、显示系统及存储介质

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4513318A (en) * 1982-09-30 1985-04-23 Allied Corporation Programmable video test pattern generator for display systems
US5416784A (en) 1991-10-28 1995-05-16 Sequoia Semiconductor Built-in self-test flip-flop with asynchronous input
JP3192225B2 (ja) * 1992-07-15 2001-07-23 松下電工株式会社 クロック信号・同期リセット信号発生回路
EP0642083A1 (en) * 1993-09-04 1995-03-08 International Business Machines Corporation Test circuit and method for interconnect testing of chips
KR19990069337A (ko) * 1998-02-06 1999-09-06 윤종용 복합 반도체 메모리장치의자기 테스트 회로 및 이를 이용한 자기 테스트 방법
JP2001074811A (ja) * 1999-09-03 2001-03-23 Hitachi Ltd 半導体集積回路
US6684358B1 (en) * 1999-11-23 2004-01-27 Janusz Rajski Decompressor/PRPG for applying pseudo-random and deterministic test patterns
JP4883850B2 (ja) * 2001-06-29 2012-02-22 ルネサスエレクトロニクス株式会社 半導体装置
US20030074618A1 (en) * 2001-10-12 2003-04-17 Dorsey Michael C. Dual mode ASIC BIST controller
US20030074619A1 (en) 2001-10-12 2003-04-17 Dorsey Michael C. Memory bist employing a memory bist signature
JP2003302448A (ja) * 2002-04-09 2003-10-24 Kawasaki Microelectronics Kk テスト回路
CN1299502C (zh) * 2002-06-20 2007-02-07 索尼株式会社 解码设备和解码方法
US8621304B2 (en) * 2004-10-07 2013-12-31 Hewlett-Packard Development Company, L.P. Built-in self-test system and method for an integrated circuit

Also Published As

Publication number Publication date
SG121944A1 (en) 2006-05-26
EP1647828A1 (en) 2006-04-19
TWI370907B (en) 2012-08-21
JP2006113058A (ja) 2006-04-27
US20060107151A1 (en) 2006-05-18
KR20060092963A (ko) 2006-08-23
JP5336692B2 (ja) 2013-11-06
ATE378608T1 (de) 2007-11-15
TW200624843A (en) 2006-07-16
DE602005003302D1 (de) 2007-12-27
US7398443B2 (en) 2008-07-08
KR101268611B1 (ko) 2013-05-29
EP1647828B1 (en) 2007-11-14

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Legal Events

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8364 No opposition during term of opposition
8327 Change in the person/name/address of the patent owner

Owner name: TAMIRAS PER PTE. LTD., LLC, DOVER, DEL., US