ATE378608T1 - Automatische fehlerprüfung von logischen blöcken unter verwendung hochschneller bist - Google Patents

Automatische fehlerprüfung von logischen blöcken unter verwendung hochschneller bist

Info

Publication number
ATE378608T1
ATE378608T1 AT05255823T AT05255823T ATE378608T1 AT E378608 T1 ATE378608 T1 AT E378608T1 AT 05255823 T AT05255823 T AT 05255823T AT 05255823 T AT05255823 T AT 05255823T AT E378608 T1 ATE378608 T1 AT E378608T1
Authority
AT
Austria
Prior art keywords
chip
logical blocks
error checking
automatic error
high fast
Prior art date
Application number
AT05255823T
Other languages
English (en)
Inventor
Venkat Chary Mushirabad
Rajanatha Shettigara
Original Assignee
Genesis Microchip Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Genesis Microchip Inc filed Critical Genesis Microchip Inc
Application granted granted Critical
Publication of ATE378608T1 publication Critical patent/ATE378608T1/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3177—Testing of logic operation, e.g. by logic analysers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3187—Built-in tests
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318552—Clock circuits details

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Detection And Correction Of Errors (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
AT05255823T 2004-10-15 2005-09-21 Automatische fehlerprüfung von logischen blöcken unter verwendung hochschneller bist ATE378608T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US61920104P 2004-10-15 2004-10-15
US11/141,763 US7398443B2 (en) 2004-10-15 2005-05-31 Automatic fault-testing of logic blocks using internal at-speed logic-BIST

Publications (1)

Publication Number Publication Date
ATE378608T1 true ATE378608T1 (de) 2007-11-15

Family

ID=35708890

Family Applications (1)

Application Number Title Priority Date Filing Date
AT05255823T ATE378608T1 (de) 2004-10-15 2005-09-21 Automatische fehlerprüfung von logischen blöcken unter verwendung hochschneller bist

Country Status (8)

Country Link
US (1) US7398443B2 (de)
EP (1) EP1647828B1 (de)
JP (1) JP5336692B2 (de)
KR (1) KR101268611B1 (de)
AT (1) ATE378608T1 (de)
DE (1) DE602005003302T2 (de)
SG (1) SG121944A1 (de)
TW (1) TWI370907B (de)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7769558B2 (en) * 2006-07-10 2010-08-03 Asterion, Inc. Digital waveform generation and measurement in automated test equipment
KR20080019078A (ko) * 2006-08-22 2008-03-03 삼성전자주식회사 순환 중복 검사를 이용한 테스트 방법 및 이를 이용하는디지털 장치
TWI312076B (en) 2006-10-19 2009-07-11 Via Tech Inc Apparatus and related method for chip i/o test
TWI304889B (en) 2006-10-26 2009-01-01 Via Tech Inc Method and related apparatus for testing chip
US8675076B2 (en) * 2009-07-21 2014-03-18 Qualcomm Incorporated System for embedded video test pattern generation
US20110029827A1 (en) * 2009-07-29 2011-02-03 International Business Machines Corporation Method, apparatus, and design structure for built-in self-test
US9222971B2 (en) * 2013-10-30 2015-12-29 Freescale Semiconductor, Inc. Functional path failure monitor
US9665934B2 (en) * 2014-10-28 2017-05-30 Texas Instruments Incorporated Apparatus for detecting faults in video frames of video sequence
KR102549438B1 (ko) * 2016-09-27 2023-06-29 삼성전자주식회사 순차 회로, 이를 포함하는 스캔 체인 회로 및 집적 회로
US20190197929A1 (en) * 2017-12-26 2019-06-27 Novatek Microelectronics Corp. Driving apparatus of display panel and operation method thereof
CN111782448A (zh) * 2020-07-01 2020-10-16 长沙景嘉微电子股份有限公司 芯片自检测方法、装置、芯片、显示系统及存储介质

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4513318A (en) * 1982-09-30 1985-04-23 Allied Corporation Programmable video test pattern generator for display systems
US5416784A (en) * 1991-10-28 1995-05-16 Sequoia Semiconductor Built-in self-test flip-flop with asynchronous input
JP3192225B2 (ja) * 1992-07-15 2001-07-23 松下電工株式会社 クロック信号・同期リセット信号発生回路
EP0642083A1 (de) * 1993-09-04 1995-03-08 International Business Machines Corporation Prüfschaltkreis und Verfahren zum Prüfen von Chipverbindungen
KR19990069337A (ko) * 1998-02-06 1999-09-06 윤종용 복합 반도체 메모리장치의자기 테스트 회로 및 이를 이용한 자기 테스트 방법
JP2001074811A (ja) * 1999-09-03 2001-03-23 Hitachi Ltd 半導体集積回路
US6684358B1 (en) * 1999-11-23 2004-01-27 Janusz Rajski Decompressor/PRPG for applying pseudo-random and deterministic test patterns
JP4883850B2 (ja) * 2001-06-29 2012-02-22 ルネサスエレクトロニクス株式会社 半導体装置
US20030074619A1 (en) * 2001-10-12 2003-04-17 Dorsey Michael C. Memory bist employing a memory bist signature
US20030074618A1 (en) * 2001-10-12 2003-04-17 Dorsey Michael C. Dual mode ASIC BIST controller
JP2003302448A (ja) * 2002-04-09 2003-10-24 Kawasaki Microelectronics Kk テスト回路
CN1299502C (zh) * 2002-06-20 2007-02-07 索尼株式会社 解码设备和解码方法
US8621304B2 (en) * 2004-10-07 2013-12-31 Hewlett-Packard Development Company, L.P. Built-in self-test system and method for an integrated circuit

Also Published As

Publication number Publication date
JP2006113058A (ja) 2006-04-27
KR20060092963A (ko) 2006-08-23
US20060107151A1 (en) 2006-05-18
US7398443B2 (en) 2008-07-08
DE602005003302T2 (de) 2008-03-06
DE602005003302D1 (de) 2007-12-27
EP1647828B1 (de) 2007-11-14
EP1647828A1 (de) 2006-04-19
TWI370907B (en) 2012-08-21
SG121944A1 (en) 2006-05-26
TW200624843A (en) 2006-07-16
JP5336692B2 (ja) 2013-11-06
KR101268611B1 (ko) 2013-05-29

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