DE602004013744D1 - Testvorrichtung, programm für eine testvorrichtung und verfahren zur steuerung einer testvorrichtung - Google Patents

Testvorrichtung, programm für eine testvorrichtung und verfahren zur steuerung einer testvorrichtung

Info

Publication number
DE602004013744D1
DE602004013744D1 DE602004013744T DE602004013744T DE602004013744D1 DE 602004013744 D1 DE602004013744 D1 DE 602004013744D1 DE 602004013744 T DE602004013744 T DE 602004013744T DE 602004013744 T DE602004013744 T DE 602004013744T DE 602004013744 D1 DE602004013744 D1 DE 602004013744D1
Authority
DE
Germany
Prior art keywords
test device
program
controlling
test
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE602004013744T
Other languages
English (en)
Inventor
Norio Kumaki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advantest Corp
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Publication of DE602004013744D1 publication Critical patent/DE602004013744D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31928—Formatter
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31919—Storing and outputting test patterns
    • G01R31/31921—Storing and outputting test patterns using compression techniques, e.g. patterns sequencer
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
DE602004013744T 2003-03-14 2004-03-12 Testvorrichtung, programm für eine testvorrichtung und verfahren zur steuerung einer testvorrichtung Expired - Lifetime DE602004013744D1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2003069833 2003-03-14
PCT/JP2004/003282 WO2004081593A1 (ja) 2003-03-14 2004-03-12 試験装置、試験装置のプログラム、試験パターン記録媒体、及び試験装置の制御方法

Publications (1)

Publication Number Publication Date
DE602004013744D1 true DE602004013744D1 (de) 2008-06-26

Family

ID=32984635

Family Applications (1)

Application Number Title Priority Date Filing Date
DE602004013744T Expired - Lifetime DE602004013744D1 (de) 2003-03-14 2004-03-12 Testvorrichtung, programm für eine testvorrichtung und verfahren zur steuerung einer testvorrichtung

Country Status (8)

Country Link
US (1) US7454679B2 (de)
EP (1) EP1605271B1 (de)
JP (1) JP4704211B2 (de)
KR (1) KR20050106524A (de)
CN (1) CN1781029A (de)
DE (1) DE602004013744D1 (de)
TW (1) TW200421080A (de)
WO (1) WO2004081593A1 (de)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20050106524A (ko) 2003-03-14 2005-11-09 주식회사 아도반테스토 시험 장치, 시험 장치의 프로그램, 시험 패턴 기록 매체,및 시험 장치의 제어 방법
JP4910517B2 (ja) * 2006-07-05 2012-04-04 富士通株式会社 無線接続装置及び無線通信装置
JP5211161B2 (ja) * 2008-06-02 2013-06-12 株式会社アドバンテスト 試験装置および試験方法
US7984353B2 (en) * 2008-08-29 2011-07-19 Advantest Corporation Test apparatus, test vector generate unit, test method, program, and recording medium
US8832512B2 (en) * 2010-03-16 2014-09-09 Mentor Graphics Corporation Low power compression of incompatible test cubes
US9443614B2 (en) * 2013-12-30 2016-09-13 Qualcomm Incorporated Data pattern generation for I/O testing

Family Cites Families (26)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4493045A (en) 1981-10-19 1985-01-08 Fairchild Camera & Instrument Corp. Test vector indexing method and apparatus
JPS5992367A (ja) * 1982-11-19 1984-05-28 Toshiba Corp Ｌｓｉ試験装置のテストパタ−ン発生回路
JPS61274280A (ja) * 1985-05-30 1986-12-04 Hitachi Electronics Eng Co Ltd パタ−ン発生装置
US4875210A (en) * 1988-01-06 1989-10-17 Teradyne, Inc. Automatic circuit tester control system
JPH04161869A (ja) * 1990-10-25 1992-06-05 Hitachi Electron Eng Co Ltd テストパターン発生プログラム変換方式
JPH0946629A (ja) * 1995-07-28 1997-02-14 Nippon Telegr & Teleph Corp <Ntt> 映像伝送装置
US5991907A (en) * 1996-02-02 1999-11-23 Lucent Technologies Inc. Method for testing field programmable gate arrays
JP3291451B2 (ja) * 1996-03-04 2002-06-10 株式会社日立国際電気 データ処理システム及び処理方法
JP3693765B2 (ja) * 1996-08-27 2005-09-07 株式会社ルネサステクノロジ テストプログラム作成装置
KR100341211B1 (ko) * 1997-03-24 2002-08-22 가부시키가이샤 아드반테스트 데이터패턴의압축및신장방법과압축및신장장치
JPH1131219A (ja) * 1997-07-11 1999-02-02 Mitsubishi Electric Corp 図形データ作成処理装置
US6661839B1 (en) * 1998-03-24 2003-12-09 Advantest Corporation Method and device for compressing and expanding data pattern
US6885319B2 (en) * 1999-01-29 2005-04-26 Quickshift, Inc. System and method for generating optimally compressed data from a plurality of data compression/decompression engines implementing different data compression algorithms
US20010054131A1 (en) * 1999-01-29 2001-12-20 Alvarez Manuel J. System and method for perfoming scalable embedded parallel data compression
US6226765B1 (en) * 1999-02-26 2001-05-01 Advantest Corp. Event based test system data memory compression
US6684358B1 (en) * 1999-11-23 2004-01-27 Janusz Rajski Decompressor/PRPG for applying pseudo-random and deterministic test patterns
US6331770B1 (en) 2000-04-12 2001-12-18 Advantest Corp. Application specific event based semiconductor test system
US7089391B2 (en) * 2000-04-14 2006-08-08 Quickshift, Inc. Managing a codec engine for memory compression/decompression operations using a data movement engine
JP3937034B2 (ja) * 2000-12-13 2007-06-27 株式会社日立製作所 半導体集積回路のテスト方法及びテストパターン発生回路
KR100408395B1 (ko) * 2001-01-26 2003-12-06 삼성전자주식회사 다 핀의 반도체 장치를 효율적으로 테스트할 수 있는반도체 테스트 시스템 및 테스트 방법
US7032158B2 (en) * 2001-04-23 2006-04-18 Quickshift, Inc. System and method for recognizing and configuring devices embedded on memory modules
US6754868B2 (en) * 2001-06-29 2004-06-22 Nextest Systems Corporation Semiconductor test system having double data rate pin scrambling
US6560756B1 (en) * 2001-07-02 2003-05-06 Ltx Corporation Method and apparatus for distributed test pattern decompression
US20030025519A1 (en) * 2001-08-06 2003-02-06 Cheng-Ju Hsieh Inspection apparatus and method for test ambient and test mode circuit on integrated circuit chip
US7225376B2 (en) * 2002-07-30 2007-05-29 International Business Machines Corporation Method and system for coding test pattern for scan design
KR20050106524A (ko) 2003-03-14 2005-11-09 주식회사 아도반테스토 시험 장치, 시험 장치의 프로그램, 시험 패턴 기록 매체,및 시험 장치의 제어 방법

Also Published As

Publication number Publication date
CN1781029A (zh) 2006-05-31
JPWO2004081593A1 (ja) 2006-06-15
KR20050106524A (ko) 2005-11-09
US7454679B2 (en) 2008-11-18
EP1605271A4 (de) 2006-04-19
WO2004081593A1 (ja) 2004-09-23
TW200421080A (en) 2004-10-16
JP4704211B2 (ja) 2011-06-15
EP1605271B1 (de) 2008-05-14
US20040221215A1 (en) 2004-11-04
EP1605271A1 (de) 2005-12-14

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Legal Events

Date Code Title Description
8328 Change in the person/name/address of the agent

Representative=s name: PFENNING MEINIG & PARTNER GBR, 10719 BERLIN

8364 No opposition during term of opposition