DE60143334D1 - Vernetzte, positiv arbeitende Photoresist-Zusammensetzung - Google Patents
Vernetzte, positiv arbeitende Photoresist-ZusammensetzungInfo
- Publication number
- DE60143334D1 DE60143334D1 DE60143334T DE60143334T DE60143334D1 DE 60143334 D1 DE60143334 D1 DE 60143334D1 DE 60143334 T DE60143334 T DE 60143334T DE 60143334 T DE60143334 T DE 60143334T DE 60143334 D1 DE60143334 D1 DE 60143334D1
- Authority
- DE
- Germany
- Prior art keywords
- acid
- units
- group
- solubility
- photoresist composition
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/039—Macromolecular compounds which are photodegradable, e.g. positive electron resists
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/0045—Photosensitive materials with organic non-macromolecular light-sensitive compounds not otherwise provided for, e.g. dissolution inhibitors
Landscapes
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- General Physics & Mathematics (AREA)
- Materials For Photolithography (AREA)
- Addition Polymer Or Copolymer, Post-Treatments, Or Chemical Modifications (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2000250174A JP4062655B2 (ja) | 2000-08-21 | 2000-08-21 | 架橋化ポジ型レジスト組成物 |
JP2000250175A JP4144726B2 (ja) | 2000-08-21 | 2000-08-21 | 架橋形成ポジ型ホトレジスト組成物 |
Publications (1)
Publication Number | Publication Date |
---|---|
DE60143334D1 true DE60143334D1 (de) | 2010-12-09 |
Family
ID=26598188
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE60143334T Expired - Lifetime DE60143334D1 (de) | 2000-08-21 | 2001-08-14 | Vernetzte, positiv arbeitende Photoresist-Zusammensetzung |
Country Status (4)
Country | Link |
---|---|
US (1) | US6630282B2 (de) |
EP (1) | EP1182506B1 (de) |
AT (1) | ATE486301T1 (de) |
DE (1) | DE60143334D1 (de) |
Families Citing this family (20)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6645695B2 (en) * | 2000-09-11 | 2003-11-11 | Shipley Company, L.L.C. | Photoresist composition |
TWI269118B (en) * | 2001-03-05 | 2006-12-21 | Sumitomo Chemical Co | Chemical amplifying type positive resist composition |
KR20050094828A (ko) * | 2002-12-26 | 2005-09-28 | 도오꾜오까고오교 가부시끼가이샤 | 포지티브형 레지스트 조성물 및 레지스트 패턴 형성 방법 |
JP2004333548A (ja) * | 2003-04-30 | 2004-11-25 | Tokyo Ohka Kogyo Co Ltd | ポジ型ホトレジスト組成物およびレジストパターン形成方法 |
TWI282907B (en) | 2003-05-20 | 2007-06-21 | Tokyo Ohka Kogyo Co Ltd | Chemical amplification type positive photoresist composition and resist pattern forming method using the same |
JP2005053936A (ja) * | 2003-06-13 | 2005-03-03 | Jsr Corp | 光硬化性液状樹脂組成物 |
JP2007522262A (ja) | 2003-06-26 | 2007-08-09 | シミックス・テクノロジーズ・インコーポレイテッド | フォトレジストポリマー |
WO2005003198A1 (en) | 2003-06-26 | 2005-01-13 | Jsr Corporation | Photoresist polymer compositions |
WO2005003192A1 (en) * | 2003-06-26 | 2005-01-13 | Symyx Technologies, Inc. | Synthesis of photoresist polymers |
TWI465467B (zh) * | 2004-03-08 | 2014-12-21 | Mitsubishi Rayon Co | 光阻用聚合物、光阻組成物及圖案製造方法與光阻用聚合物用原料化合物 |
KR100848031B1 (ko) * | 2004-04-13 | 2008-07-23 | 도오꾜오까고오교 가부시끼가이샤 | 고분자 화합물, 이 고분자 화합물을 함유하는 포토레지스트조성물, 및 레지스트 패턴 형성 방법 |
US7951522B2 (en) | 2004-12-29 | 2011-05-31 | Tokyo Ohka Kogyo Co., Ltd. | Chemically amplified positive photoresist composition for thick film, thick-film photoresist laminated product, manufacturing method for thick-film resist pattern, and manufacturing method for connection terminal |
US7927778B2 (en) | 2004-12-29 | 2011-04-19 | Tokyo Ohka Kogyo Co., Ltd. | Chemically amplified positive photoresist composition for thick film, thick-film photoresist laminated product, manufacturing method for thick-film resist pattern, and manufacturing method for connection terminal |
EP1684120A1 (de) * | 2005-01-19 | 2006-07-26 | Rohm and Haas Electronic Materials LLC | Fotoresistzusammensetzungen, die Mischungen von Harzen enthalten |
KR101266564B1 (ko) * | 2005-08-03 | 2013-05-22 | 제이에스알 가부시끼가이샤 | 도금 조형물 제조용 포지티브형 감방사선성 수지 조성물,전사 필름 및 도금 조형물의 제조 방법 |
TW200830050A (en) * | 2006-09-21 | 2008-07-16 | Fujifilm Corp | Resist composition and pattern-forming method using the same |
US8715918B2 (en) * | 2007-09-25 | 2014-05-06 | Az Electronic Materials Usa Corp. | Thick film resists |
KR102261808B1 (ko) | 2016-08-09 | 2021-06-07 | 리지필드 액퀴지션 | 환경적으로 안정한 후막성 화학증폭형 레지스트 |
CN107151287B (zh) * | 2017-05-24 | 2020-06-02 | 儒芯微电子材料(上海)有限公司 | 一种交联型丙烯酸酯类共聚物及其光刻胶 |
WO2019171957A1 (ja) * | 2018-03-07 | 2019-09-12 | 丸善石油化学株式会社 | 新規の二官能(メタ)アクリレート化合物および重合物 |
Family Cites Families (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0422628A3 (en) * | 1989-10-13 | 1992-02-26 | E.I. Du Pont De Nemours And Company | Photosensitive element |
JP3206989B2 (ja) | 1992-11-13 | 2001-09-10 | 富士写真フイルム株式会社 | ポジ型感光性材料 |
JPH06230574A (ja) | 1993-02-05 | 1994-08-19 | Fuji Photo Film Co Ltd | ポジ型感光性組成物 |
JP3373056B2 (ja) | 1994-08-17 | 2003-02-04 | 富士写真フイルム株式会社 | ポジ型感光性組成物 |
US5849808A (en) | 1995-04-21 | 1998-12-15 | Olin Microelectronic Chemicals, Inc. | Organic solvent soluble photoresists which are developable in aqueous alkaline solutions |
JP3695024B2 (ja) | 1996-11-14 | 2005-09-14 | Jsr株式会社 | 半導体デバイス製造用感放射線性樹脂組成物 |
US6120972A (en) * | 1997-09-02 | 2000-09-19 | Jsr Corporation | Radiation-sensitive resin composition |
KR100557368B1 (ko) | 1998-01-16 | 2006-03-10 | 제이에스알 가부시끼가이샤 | 감방사선성 수지 조성물 |
TW487828B (en) | 1998-10-29 | 2002-05-21 | Shinetsu Chemical Co | Positive resist composition |
JP3941268B2 (ja) * | 1998-11-10 | 2007-07-04 | Jsr株式会社 | 感放射線性樹脂組成物 |
JP3796560B2 (ja) * | 1999-01-27 | 2006-07-12 | 信越化学工業株式会社 | 化学増幅ポジ型レジスト組成物及びパターン形成方法 |
JP3662774B2 (ja) | 1999-06-02 | 2005-06-22 | 東京応化工業株式会社 | ポジ型レジスト組成物 |
JP2001166478A (ja) * | 1999-12-03 | 2001-06-22 | Jsr Corp | 感放射線性樹脂組成物 |
JP4694686B2 (ja) * | 2000-08-31 | 2011-06-08 | 東京応化工業株式会社 | 半導体素子製造方法 |
-
2001
- 2001-08-14 US US09/928,399 patent/US6630282B2/en not_active Expired - Lifetime
- 2001-08-14 EP EP01306923A patent/EP1182506B1/de not_active Expired - Lifetime
- 2001-08-14 AT AT01306923T patent/ATE486301T1/de not_active IP Right Cessation
- 2001-08-14 DE DE60143334T patent/DE60143334D1/de not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
US20020034704A1 (en) | 2002-03-21 |
EP1182506A1 (de) | 2002-02-27 |
ATE486301T1 (de) | 2010-11-15 |
EP1182506B1 (de) | 2010-10-27 |
US6630282B2 (en) | 2003-10-07 |
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