DE60102041D1 - Halbleitervorrichtug - Google Patents

Halbleitervorrichtug

Info

Publication number
DE60102041D1
DE60102041D1 DE60102041T DE60102041T DE60102041D1 DE 60102041 D1 DE60102041 D1 DE 60102041D1 DE 60102041 T DE60102041 T DE 60102041T DE 60102041 T DE60102041 T DE 60102041T DE 60102041 D1 DE60102041 D1 DE 60102041D1
Authority
DE
Germany
Prior art keywords
halbleitervorrichtug
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60102041T
Other languages
English (en)
Other versions
DE60102041T2 (de
Inventor
Masaharu Wada
Kenji Tsuchida
Atsushi Takeuchi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Fujitsu Semiconductor Ltd
Original Assignee
Toshiba Corp
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Fujitsu Ltd filed Critical Toshiba Corp
Application granted granted Critical
Publication of DE60102041D1 publication Critical patent/DE60102041D1/de
Publication of DE60102041T2 publication Critical patent/DE60102041T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
    • G11C11/4063—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
    • G11C11/407—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing for memory cells of the field-effect type
    • G11C11/4074—Power supply or voltage generation circuits, e.g. bias voltage generators, substrate voltage generators, back-up power, power control circuits
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
    • G11C7/06—Sense amplifiers; Associated circuits, e.g. timing or triggering circuits

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • Dram (AREA)
DE60102041T 2000-07-05 2001-07-04 Halbleitervorrichtug Expired - Lifetime DE60102041T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2000204104 2000-07-05
JP2000204104A JP2002025264A (ja) 2000-07-05 2000-07-05 半導体装置

Publications (2)

Publication Number Publication Date
DE60102041D1 true DE60102041D1 (de) 2004-03-25
DE60102041T2 DE60102041T2 (de) 2004-09-09

Family

ID=18701422

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60102041T Expired - Lifetime DE60102041T2 (de) 2000-07-05 2001-07-04 Halbleitervorrichtug

Country Status (6)

Country Link
US (1) US6487133B2 (de)
EP (1) EP1170749B1 (de)
JP (1) JP2002025264A (de)
KR (1) KR100420088B1 (de)
DE (1) DE60102041T2 (de)
TW (1) TW523904B (de)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003228981A (ja) * 2002-02-05 2003-08-15 Toshiba Corp 半導体記憶装置
KR100546188B1 (ko) * 2003-05-24 2006-01-24 주식회사 하이닉스반도체 감지증폭수단을 포함하는 반도체 메모리 장치 및 그의감지증폭수단을 오버드라이브 하는 방법
KR100541367B1 (ko) * 2003-07-15 2006-01-11 주식회사 하이닉스반도체 오버드라이빙 구조를 가진 반도체 메모리 소자
JP2007519336A (ja) * 2004-01-19 2007-07-12 コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ Ｍｏｓスイッチング回路
JP4580202B2 (ja) * 2004-09-03 2010-11-10 富士通セミコンダクター株式会社 半導体装置の電圧供給回路
KR100613449B1 (ko) 2004-10-07 2006-08-21 주식회사 하이닉스반도체 내부전압 공급회로
US7599243B2 (en) * 2005-09-28 2009-10-06 Hynix Semiconductor, Inc. Sense amplifier over driver control circuit and method for controlling sense amplifier of semiconductor device
KR100776758B1 (ko) 2006-06-14 2007-11-19 주식회사 하이닉스반도체 반도체 메모리의 전압 방전 장치
US7463054B1 (en) * 2007-09-12 2008-12-09 United Memories, Inc. Data bus charge-sharing technique for integrated circuit devices
US7649406B2 (en) * 2007-09-13 2010-01-19 United Memories, Inc. Short-circuit charge-sharing technique for integrated circuit devices
US8014214B2 (en) * 2007-11-08 2011-09-06 Hynix Semiconductor Inc. Semiconductor memory device

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3085782B2 (ja) * 1992-05-29 2000-09-11 株式会社東芝 半導体記憶装置
JP3694072B2 (ja) * 1995-08-18 2005-09-14 株式会社日立製作所 半導体装置
JPH10135424A (ja) * 1996-11-01 1998-05-22 Mitsubishi Electric Corp 半導体集積回路装置
US5862089A (en) * 1997-08-14 1999-01-19 Micron Technology, Inc. Method and memory device for dynamic cell plate sensing with ac equilibrate
JPH11144465A (ja) * 1997-11-10 1999-05-28 Texas Instr Japan Ltd 半導体記憶装置
JPH11203862A (ja) * 1998-01-13 1999-07-30 Mitsubishi Electric Corp 半導体記憶装置
JP2000057764A (ja) * 1998-08-05 2000-02-25 Hitachi Ltd 半導体集積回路
JP3185875B2 (ja) * 1998-08-12 2001-07-11 日本電気株式会社 センスアンプ駆動回路

Also Published As

Publication number Publication date
US20020003737A1 (en) 2002-01-10
KR20020003829A (ko) 2002-01-15
JP2002025264A (ja) 2002-01-25
TW523904B (en) 2003-03-11
EP1170749B1 (de) 2004-02-18
US6487133B2 (en) 2002-11-26
DE60102041T2 (de) 2004-09-09
EP1170749A2 (de) 2002-01-09
KR100420088B1 (ko) 2004-02-25
EP1170749A3 (de) 2002-11-27

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8327 Change in the person/name/address of the patent owner

Owner name: FUJITSU MICROELECTRONICS LTD., TOKYO, JP

Owner name: KABUSHIKI KAISHA TOSHIBA, TOKYO, JP

8327 Change in the person/name/address of the patent owner

Owner name: FUJITSU SEMICONDUCTOR LTD., YOKOHAMA, KANAGAWA, JP

Owner name: KABUSHIKI KAISHA TOSHIBA, TOKYO, JP