DE60000267T2 - Abtastschalter mit unabhängiger Impedanz im Ein-Zustand - Google Patents

Abtastschalter mit unabhängiger Impedanz im Ein-Zustand

Info

Publication number
DE60000267T2
DE60000267T2 DE60000267T DE60000267T DE60000267T2 DE 60000267 T2 DE60000267 T2 DE 60000267T2 DE 60000267 T DE60000267 T DE 60000267T DE 60000267 T DE60000267 T DE 60000267T DE 60000267 T2 DE60000267 T2 DE 60000267T2
Authority
DE
Germany
Prior art keywords
sampling
voltage
control
input signal
signal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60000267T
Other languages
German (de)
English (en)
Other versions
DE60000267D1 (de
Inventor
Adrian K. Ong
Vladimir I. Prodanov
Maurice J. Tarsia
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nokia of America Corp
Original Assignee
Lucent Technologies Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Lucent Technologies Inc filed Critical Lucent Technologies Inc
Application granted granted Critical
Publication of DE60000267D1 publication Critical patent/DE60000267D1/de
Publication of DE60000267T2 publication Critical patent/DE60000267T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03KPULSE TECHNIQUE
    • H03K17/00Electronic switching or gating, i.e. not by contact-making and –breaking
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03KPULSE TECHNIQUE
    • H03K17/00Electronic switching or gating, i.e. not by contact-making and –breaking
    • H03K17/06Modifications for ensuring a fully conducting state
    • H03K17/063Modifications for ensuring a fully conducting state in field-effect transistor switches
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C27/00Electric analogue stores, e.g. for storing instantaneous values
    • G11C27/02Sample-and-hold arrangements
    • G11C27/024Sample-and-hold arrangements using a capacitive memory element

Landscapes

  • Electronic Switches (AREA)
  • Analogue/Digital Conversion (AREA)
DE60000267T 2000-02-03 2000-08-14 Abtastschalter mit unabhängiger Impedanz im Ein-Zustand Expired - Lifetime DE60000267T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US09/497,612 US6310565B1 (en) 2000-02-03 2000-02-03 Sampling switch having an independent “on” impedance

Publications (2)

Publication Number Publication Date
DE60000267D1 DE60000267D1 (de) 2002-08-22
DE60000267T2 true DE60000267T2 (de) 2003-03-27

Family

ID=23977574

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60000267T Expired - Lifetime DE60000267T2 (de) 2000-02-03 2000-08-14 Abtastschalter mit unabhängiger Impedanz im Ein-Zustand

Country Status (5)

Country Link
US (1) US6310565B1 (enExample)
EP (1) EP1122741B1 (enExample)
JP (1) JP3964140B2 (enExample)
KR (1) KR100664456B1 (enExample)
DE (1) DE60000267T2 (enExample)

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6829003B2 (en) * 2000-06-02 2004-12-07 Pentax Corporation Sampling pulse generator of electronic endoscope
EP1168619A1 (en) * 2000-06-19 2002-01-02 STMicroelectronics S.r.l. Boosted switch device for a sampler of an analogue/digital converter, and operating method thereof
US6525574B1 (en) * 2001-09-06 2003-02-25 Texas Instruments Incorporated Gate bootstrapped CMOS sample-and-hold circuit
EP1494357B1 (en) * 2003-07-03 2006-09-13 STMicroelectronics S.r.l. Boosted sampling circuit and relative method of driving
US7148831B2 (en) * 2003-10-27 2006-12-12 Micron Technology, Inc. Variable quantization ADC for image sensors
FR2871630B1 (fr) * 2004-06-11 2007-02-09 Commissariat Energie Atomique Procede de commande d'un interrupteur analogique
US7453291B2 (en) * 2004-09-09 2008-11-18 The Regents Of The University Of California Switch linearized track and hold circuit for switch linearization
TWI334692B (en) * 2007-02-06 2010-12-11 Realtek Semiconductor Corp Dynamic voltage-generating apparatus and method thereof
US20090039924A1 (en) * 2007-08-09 2009-02-12 Alfio Zanchi Systems and methods for reducing distortion in semiconductor based sampling systems
US7863943B2 (en) * 2007-09-28 2011-01-04 Maxim Integrated Products, Inc. Sampling device and circuit having a single voltage supply
US7928794B2 (en) 2008-07-21 2011-04-19 Analog Devices, Inc. Method and apparatus for a dynamically self-bootstrapped switch
US20100109750A1 (en) * 2008-10-30 2010-05-06 Jens Barrenscheen Boost Mechanism Using Driver Current Adjustment for Switching Phase Improvement
US8502594B2 (en) * 2008-12-31 2013-08-06 Linear Technology Corporation Bootstrap transistor circuit
US9378844B2 (en) * 2013-07-31 2016-06-28 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device including transistor whose gate is electrically connected to capacitor
JP6497089B2 (ja) * 2015-01-29 2019-04-10 株式会社ソシオネクスト スイッチ回路、ad変換回路および集積回路
US12276992B2 (en) * 2023-04-28 2025-04-15 Texas Instruments Incorporated Auxiliary supply circuit
CN116811657A (zh) * 2023-05-12 2023-09-29 宁德时代新能源科技股份有限公司 电池控制方法、装置、电池管理系统和存储介质

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5084634A (en) 1990-10-24 1992-01-28 Burr-Brown Corporation Dynamic input sampling switch for CDACS
US5170075A (en) 1991-06-11 1992-12-08 Texas Instruments Incorporated Sample and hold circuitry and methods
US5172019A (en) 1992-01-17 1992-12-15 Burr-Brown Corporation Bootstrapped FET sampling switch
US5500612A (en) 1994-05-20 1996-03-19 David Sarnoff Research Center, Inc. Constant impedance sampling switch for an analog to digital converter
US5909131A (en) 1996-07-31 1999-06-01 Analog Devices, Inc. Low-distortion technique to bandlimit a switched-capacitor sampling circuit
US5936562A (en) 1997-06-06 1999-08-10 Analog Devices, Inc. High-speed sigma-delta ADCs
US5945872A (en) 1997-11-06 1999-08-31 Analog Devices, Inc. Two-phase boosted CMOS switch drive technique and circuit
FR2793970B1 (fr) * 1999-05-20 2001-08-31 St Microelectronics Sa Procede de commande d'un commutateur d'un dispositif de capacite commutee, et dispositif de capacite commutee correspondant

Also Published As

Publication number Publication date
JP2001243788A (ja) 2001-09-07
EP1122741A1 (en) 2001-08-08
US6310565B1 (en) 2001-10-30
KR100664456B1 (ko) 2007-01-04
KR20010078319A (ko) 2001-08-20
JP3964140B2 (ja) 2007-08-22
EP1122741B1 (en) 2002-07-17
DE60000267D1 (de) 2002-08-22

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8364 No opposition during term of opposition