JP3964140B2 - サンプリングデバイス及びインピーダンス形成方法及びアナログ／ディジタル変換器 - Google Patents

サンプリングデバイス及びインピーダンス形成方法及びアナログ／ディジタル変換器 Download PDF

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Publication number
JP3964140B2
JP3964140B2 JP2001025398A JP2001025398A JP3964140B2 JP 3964140 B2 JP3964140 B2 JP 3964140B2 JP 2001025398 A JP2001025398 A JP 2001025398A JP 2001025398 A JP2001025398 A JP 2001025398A JP 3964140 B2 JP3964140 B2 JP 3964140B2
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Prior art keywords
signal
voltage
control
input signal
sample
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Expired - Fee Related
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JP2001025398A
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Japanese (ja)
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JP2001243788A (ja
JP2001243788A5 (enExample
Inventor
ケー、オング エイドリアン
アイ、プロダノフ ウラジミール
ジェイ、ターシア モーリス
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ルーセント テクノロジーズ インコーポレーテッド
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Publication of JP2001243788A5 publication Critical patent/JP2001243788A5/ja
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    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
    • H03K17/06—Modifications for ensuring a fully conducting state
    • H03K17/063—Modifications for ensuring a fully conducting state in field-effect transistor switches
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C27/00—Electric analogue stores, e.g. for storing instantaneous values
    • G11C27/02—Sample-and-hold arrangements
    • G11C27/024—Sample-and-hold arrangements using a capacitive memory element

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  • Electronic Switches (AREA)
  • Analogue/Digital Conversion (AREA)
JP2001025398A 2000-02-03 2001-02-01 サンプリングデバイス及びインピーダンス形成方法及びアナログ／ディジタル変換器 Expired - Fee Related JP3964140B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US09/497612 2000-02-03
US09/497,612 US6310565B1 (en) 2000-02-03 2000-02-03 Sampling switch having an independent “on” impedance

Publications (3)

Publication Number Publication Date
JP2001243788A JP2001243788A (ja) 2001-09-07
JP2001243788A5 JP2001243788A5 (enExample) 2004-09-16
JP3964140B2 true JP3964140B2 (ja) 2007-08-22

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ID=23977574

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JP2001025398A Expired - Fee Related JP3964140B2 (ja) 2000-02-03 2001-02-01 サンプリングデバイス及びインピーダンス形成方法及びアナログ／ディジタル変換器

Country Status (5)

Country Link
US (1) US6310565B1 (enExample)
EP (1) EP1122741B1 (enExample)
JP (1) JP3964140B2 (enExample)
KR (1) KR100664456B1 (enExample)
DE (1) DE60000267T2 (enExample)

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6829003B2 (en) * 2000-06-02 2004-12-07 Pentax Corporation Sampling pulse generator of electronic endoscope
EP1168619A1 (en) * 2000-06-19 2002-01-02 STMicroelectronics S.r.l. Boosted switch device for a sampler of an analogue/digital converter, and operating method thereof
US6525574B1 (en) * 2001-09-06 2003-02-25 Texas Instruments Incorporated Gate bootstrapped CMOS sample-and-hold circuit
EP1494357B1 (en) 2003-07-03 2006-09-13 STMicroelectronics S.r.l. Boosted sampling circuit and relative method of driving
US7148831B2 (en) * 2003-10-27 2006-12-12 Micron Technology, Inc. Variable quantization ADC for image sensors
FR2871630B1 (fr) * 2004-06-11 2007-02-09 Commissariat Energie Atomique Procede de commande d'un interrupteur analogique
US7453291B2 (en) * 2004-09-09 2008-11-18 The Regents Of The University Of California Switch linearized track and hold circuit for switch linearization
TWI334692B (en) * 2007-02-06 2010-12-11 Realtek Semiconductor Corp Dynamic voltage-generating apparatus and method thereof
US20090039924A1 (en) * 2007-08-09 2009-02-12 Alfio Zanchi Systems and methods for reducing distortion in semiconductor based sampling systems
US7863943B2 (en) * 2007-09-28 2011-01-04 Maxim Integrated Products, Inc. Sampling device and circuit having a single voltage supply
US7928794B2 (en) 2008-07-21 2011-04-19 Analog Devices, Inc. Method and apparatus for a dynamically self-bootstrapped switch
US20100109750A1 (en) * 2008-10-30 2010-05-06 Jens Barrenscheen Boost Mechanism Using Driver Current Adjustment for Switching Phase Improvement
US8502594B2 (en) * 2008-12-31 2013-08-06 Linear Technology Corporation Bootstrap transistor circuit
US9378844B2 (en) * 2013-07-31 2016-06-28 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device including transistor whose gate is electrically connected to capacitor
JP6497089B2 (ja) * 2015-01-29 2019-04-10 株式会社ソシオネクスト スイッチ回路、ａｄ変換回路および集積回路
US12276992B2 (en) * 2023-04-28 2025-04-15 Texas Instruments Incorporated Auxiliary supply circuit
CN116811657A (zh) * 2023-05-12 2023-09-29 宁德时代新能源科技股份有限公司 电池控制方法、装置、电池管理系统和存储介质

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5084634A (en) 1990-10-24 1992-01-28 Burr-Brown Corporation Dynamic input sampling switch for CDACS
US5170075A (en) 1991-06-11 1992-12-08 Texas Instruments Incorporated Sample and hold circuitry and methods
US5172019A (en) 1992-01-17 1992-12-15 Burr-Brown Corporation Bootstrapped FET sampling switch
US5500612A (en) 1994-05-20 1996-03-19 David Sarnoff Research Center, Inc. Constant impedance sampling switch for an analog to digital converter
US5909131A (en) 1996-07-31 1999-06-01 Analog Devices, Inc. Low-distortion technique to bandlimit a switched-capacitor sampling circuit
US5936562A (en) 1997-06-06 1999-08-10 Analog Devices, Inc. High-speed sigma-delta ADCs
US5945872A (en) 1997-11-06 1999-08-31 Analog Devices, Inc. Two-phase boosted CMOS switch drive technique and circuit
FR2793970B1 (fr) * 1999-05-20 2001-08-31 St Microelectronics Sa Procede de commande d'un commutateur d'un dispositif de capacite commutee, et dispositif de capacite commutee correspondant

Also Published As

Publication number Publication date
DE60000267T2 (de) 2003-03-27
EP1122741B1 (en) 2002-07-17
JP2001243788A (ja) 2001-09-07
US6310565B1 (en) 2001-10-30
DE60000267D1 (de) 2002-08-22
KR100664456B1 (ko) 2007-01-04
KR20010078319A (ko) 2001-08-20
EP1122741A1 (en) 2001-08-08

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