DE4134176C2 - Halbleiteranordnung mit einer im Halbleiterkörper integrierten und aus zwei Feldeffekttransistoren aufgebauten Tetrode - Google Patents
Halbleiteranordnung mit einer im Halbleiterkörper integrierten und aus zwei Feldeffekttransistoren aufgebauten TetrodeInfo
- Publication number
- DE4134176C2 DE4134176C2 DE4134176A DE4134176A DE4134176C2 DE 4134176 C2 DE4134176 C2 DE 4134176C2 DE 4134176 A DE4134176 A DE 4134176A DE 4134176 A DE4134176 A DE 4134176A DE 4134176 C2 DE4134176 C2 DE 4134176C2
- Authority
- DE
- Germany
- Prior art keywords
- field effect
- semiconductor
- control circuit
- arrangement
- tetrode
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
- H03F3/34—DC amplifiers in which all stages are DC-coupled
- H03F3/343—DC amplifiers in which all stages are DC-coupled with semiconductor devices only
- H03F3/345—DC amplifiers in which all stages are DC-coupled with semiconductor devices only with field-effect devices
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03D—DEMODULATION OR TRANSFERENCE OF MODULATION FROM ONE CARRIER TO ANOTHER
- H03D9/00—Demodulation or transference of modulation of modulated electromagnetic waves
- H03D9/06—Transference of modulation using distributed inductance and capacitance
- H03D9/0658—Transference of modulation using distributed inductance and capacitance by means of semiconductor devices having more than two electrodes
- H03D9/0675—Transference of modulation using distributed inductance and capacitance by means of semiconductor devices having more than two electrodes using field effect transistors
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
- H03F3/189—High-frequency amplifiers, e.g. radio frequency amplifiers
- H03F3/19—High-frequency amplifiers, e.g. radio frequency amplifiers with semiconductor devices only
- H03F3/193—High-frequency amplifiers, e.g. radio frequency amplifiers with semiconductor devices only with field-effect devices
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
- H10D84/80—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D12/00 or H10D30/00, e.g. integration of IGFETs
- H10D84/811—Combinations of field-effect devices and one or more diodes, capacitors or resistors
- H10D84/817—Combinations of field-effect devices and resistors only
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03D—DEMODULATION OR TRANSFERENCE OF MODULATION FROM ONE CARRIER TO ANOTHER
- H03D2200/00—Indexing scheme relating to details of demodulation or transference of modulation from one carrier to another covered by H03D
- H03D2200/0001—Circuit elements of demodulators
- H03D2200/0007—Dual gate field effect transistors
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03D—DEMODULATION OR TRANSFERENCE OF MODULATION FROM ONE CARRIER TO ANOTHER
- H03D7/00—Transference of modulation from one carrier to another, e.g. frequency-changing
- H03D7/12—Transference of modulation from one carrier to another, e.g. frequency-changing by means of semiconductor devices having more than two electrodes
- H03D7/125—Transference of modulation from one carrier to another, e.g. frequency-changing by means of semiconductor devices having more than two electrodes with field effect transistors
Landscapes
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- Semiconductor Integrated Circuits (AREA)
- Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
- Junction Field-Effect Transistors (AREA)
- Design And Manufacture Of Integrated Circuits (AREA)
- Insulated Gate Type Field-Effect Transistor (AREA)
Priority Applications (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE4134176A DE4134176C2 (de) | 1991-10-16 | 1991-10-16 | Halbleiteranordnung mit einer im Halbleiterkörper integrierten und aus zwei Feldeffekttransistoren aufgebauten Tetrode |
| US07/953,718 US5317282A (en) | 1991-10-16 | 1992-09-30 | Tetrode biasing circuit |
| ITMI922354A IT1255865B (it) | 1991-10-16 | 1992-10-14 | Disposizione a semiconduttore |
| FR9212441A FR2682812A1 (fr) | 1991-10-16 | 1992-10-16 | Dispositif semi-conducteur comprenant une tetrode a transistors integree. |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE4134176A DE4134176C2 (de) | 1991-10-16 | 1991-10-16 | Halbleiteranordnung mit einer im Halbleiterkörper integrierten und aus zwei Feldeffekttransistoren aufgebauten Tetrode |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| DE4134176A1 DE4134176A1 (de) | 1993-04-22 |
| DE4134176C2 true DE4134176C2 (de) | 1994-04-21 |
Family
ID=6442760
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE4134176A Expired - Fee Related DE4134176C2 (de) | 1991-10-16 | 1991-10-16 | Halbleiteranordnung mit einer im Halbleiterkörper integrierten und aus zwei Feldeffekttransistoren aufgebauten Tetrode |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US5317282A (enExample) |
| DE (1) | DE4134176C2 (enExample) |
| FR (1) | FR2682812A1 (enExample) |
| IT (1) | IT1255865B (enExample) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6271067B1 (en) | 1998-02-27 | 2001-08-07 | Micron Technology, Inc. | Methods of forming field effect transistors and field effect transistor circuitry |
| KR100585886B1 (ko) * | 2004-01-27 | 2006-06-01 | 삼성전자주식회사 | 동적 문턱 전압을 가지는 반도체 회로 |
| US7864492B2 (en) * | 2006-10-31 | 2011-01-04 | Siemens Industry, Inc. | Systems and methods for arc fault detection |
Family Cites Families (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE2823662A1 (de) * | 1978-05-30 | 1979-12-06 | Siemens Ag | Schaltungsanordnung zur arbeitspunktstabilisierung eines verstaerker-feldeffekttransistors |
| DE3017654A1 (de) * | 1980-05-08 | 1981-11-12 | Siemens AG, 1000 Berlin und 8000 München | Integrierte schaltungsanordnung |
| US4658220A (en) * | 1985-09-06 | 1987-04-14 | Texas Instruments Incorporated | Dual-gate, field-effect transistor low noise amplifier |
| JPH0770733B2 (ja) * | 1988-02-22 | 1995-07-31 | 株式会社東芝 | 半導体装置とその使用方法 |
-
1991
- 1991-10-16 DE DE4134176A patent/DE4134176C2/de not_active Expired - Fee Related
-
1992
- 1992-09-30 US US07/953,718 patent/US5317282A/en not_active Expired - Fee Related
- 1992-10-14 IT ITMI922354A patent/IT1255865B/it active IP Right Grant
- 1992-10-16 FR FR9212441A patent/FR2682812A1/fr active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| ITMI922354A0 (it) | 1992-10-14 |
| FR2682812B1 (enExample) | 1995-01-20 |
| US5317282A (en) | 1994-05-31 |
| IT1255865B (it) | 1995-11-17 |
| DE4134176A1 (de) | 1993-04-22 |
| FR2682812A1 (fr) | 1993-04-23 |
| ITMI922354A1 (it) | 1994-04-14 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| OM8 | Search report available as to paragraph 43 lit. 1 sentence 1 patent law | ||
| OP8 | Request for examination as to paragraph 44 patent law | ||
| 8127 | New person/name/address of the applicant |
Owner name: TEMIC TELEFUNKEN MICROELECTRONIC GMBH, 7100 HEILBR |
|
| 8120 | Willingness to grant licences paragraph 23 | ||
| D2 | Grant after examination | ||
| 8364 | No opposition during term of opposition | ||
| 8327 | Change in the person/name/address of the patent owner |
Owner name: VISHAY SEMICONDUCTOR GMBH, 74072 HEILBRONN, DE |
|
| 8339 | Ceased/non-payment of the annual fee |