DE3855913D1 - Gerät zur inspektion von Walzzeichen - Google Patents

Gerät zur inspektion von Walzzeichen

Info

Publication number
DE3855913D1
DE3855913D1 DE3855913T DE3855913T DE3855913D1 DE 3855913 D1 DE3855913 D1 DE 3855913D1 DE 3855913 T DE3855913 T DE 3855913T DE 3855913 T DE3855913 T DE 3855913T DE 3855913 D1 DE3855913 D1 DE 3855913D1
Authority
DE
Germany
Prior art keywords
inspection
rolling marks
marks
rolling
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE3855913T
Other languages
English (en)
Other versions
DE3855913T2 (de
Inventor
Seikichi Nishimura
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP29346787A external-priority patent/JPH0786479B2/ja
Priority claimed from JP29346687A external-priority patent/JPH0786478B2/ja
Application filed by Toshiba Corp filed Critical Toshiba Corp
Application granted granted Critical
Publication of DE3855913D1 publication Critical patent/DE3855913D1/de
Publication of DE3855913T2 publication Critical patent/DE3855913T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G01N21/8922—Periodic flaws
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N2021/8909—Scan signal processing specially adapted for inspection of running sheets
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/93—Detection standards; Calibrating baseline adjustment, drift correction
    • G01N2021/933—Adjusting baseline or gain (also for web inspection)

Landscapes

  • Analytical Chemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Textile Engineering (AREA)
  • Biochemistry (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
DE3855913T 1987-11-20 1988-11-21 Gerät zur inspektion von Walzzeichen Expired - Lifetime DE3855913T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP29346787A JPH0786479B2 (ja) 1987-11-20 1987-11-20 周期疵検出装置
JP29346687A JPH0786478B2 (ja) 1987-11-20 1987-11-20 周期疵検出装置

Publications (2)

Publication Number Publication Date
DE3855913D1 true DE3855913D1 (de) 1997-06-19
DE3855913T2 DE3855913T2 (de) 1997-12-04

Family

ID=26559425

Family Applications (2)

Application Number Title Priority Date Filing Date
DE3855913T Expired - Lifetime DE3855913T2 (de) 1987-11-20 1988-11-21 Gerät zur inspektion von Walzzeichen
DE3851609T Expired - Lifetime DE3851609T2 (de) 1987-11-20 1988-11-21 Gerät zur Inspektion von Walzzeichen.

Family Applications After (1)

Application Number Title Priority Date Filing Date
DE3851609T Expired - Lifetime DE3851609T2 (de) 1987-11-20 1988-11-21 Gerät zur Inspektion von Walzzeichen.

Country Status (3)

Country Link
US (1) US4958307A (de)
EP (2) EP0316961B1 (de)
DE (2) DE3855913T2 (de)

Families Citing this family (27)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0786474B2 (ja) * 1988-09-09 1995-09-20 富士写真フイルム株式会社 欠陥周期の測定方法
US5212647A (en) * 1991-07-15 1993-05-18 Preco Industries, Inc. Die stamping press having ccd camera system for automatic 3-axis die registration
US5436979A (en) * 1992-08-21 1995-07-25 Eastman Kodak Company Process for detecting and mapping dirt on the surface of a photographic element
GB9411908D0 (en) * 1994-06-14 1994-08-03 John Heyer Paper Ltd Web monitoring for paper machines
ES2138187T3 (es) * 1994-12-09 2000-01-01 United Parcel Service Inc Metodo y aparato para la simultanea convolucion multiple de imagenes binarias digitales, utilizando un unico convolucionador con una mascara binaria para determinar las densidades de pixel.
US5654977A (en) * 1995-02-02 1997-08-05 Teledyne Industries Inc. Method and apparatus for real time defect inspection of metal at elevated temperature
JPH08313223A (ja) * 1995-05-16 1996-11-29 Ls Electro Galvanizing Co 移動ストリップを監視する方法と装置
FR2761474B1 (fr) * 1997-03-28 1999-06-25 Lorraine Laminage Procede d'inspection de surface d'une bande en defilement et d'analyse de la defectuosite de la bande
FR2761476B1 (fr) * 1997-03-28 1999-06-11 Lorraine Laminage Procede d'inspection de surface d'une bande en defilement par classification prealable d'irregularite de surface detectee
AU1353899A (en) * 1997-11-27 1999-06-16 Hoogovens Staal Bv Process and device for producing a strip-like material avoiding repeated surfacedefects
EP0927887A1 (de) * 1997-12-17 1999-07-07 Zellweger Luwa Ag Verfahren zur Erkennung periodischer Fehler in einem längsbewegten Prüfgut
DE19812353A1 (de) * 1998-03-20 1999-10-14 Struck Innovative Systeme Gmbh Verfahren und Vorrichtung zur Erkennung von periodischen Walzmarken
DE10127564A1 (de) * 2000-06-16 2002-01-03 Georgsmarienhuette Gmbh Verfahren zum Markieren von Walzmaterial
US6542240B2 (en) * 2001-03-30 2003-04-01 Alcan International Limited Method of identifying defective roll on a strip processing line
FI114741B (fi) * 2001-05-11 2004-12-15 Metso Automation Oy Lämpökuvaukseen perustuva laadun- ja kunnonvalvontamenetelmä
DE10226499B4 (de) * 2002-06-14 2011-12-15 Abb Ag Verfahren und Vorrichtung zum Erfassen und Auswerten von Messsignalen
DE102004061951B4 (de) * 2004-12-23 2017-10-12 manroland sheetfed GmbH Verfahren zur Qualitätskontrolle an oberflächenvariablen Drucksachen
FR2896899B1 (fr) * 2006-02-02 2008-06-06 Vai Clecim Soc Par Actions Sim Procede de traitement des images d'un dispositif d'inspection de surface d'un produit en defilement, pour la detection automatique des defauts cycliques
DE602006005628D1 (de) * 2006-06-13 2009-04-23 Abb Oy Verfahren und Vorrichtung zur Erkennung von sich wiederholenden Mustern
US7797133B2 (en) 2008-09-10 2010-09-14 3M Innovative Properties Company Multi-roller registered repeat defect detection of a web process line
AT13678U1 (de) * 2011-07-15 2014-06-15 Voestalpine Stahl Gmbh Vorrichtung und Verfahren zur Detektion wenigstens eines periodisch auftretenden Fehlers an einem Gegenstand
AT511773A1 (de) * 2011-07-15 2013-02-15 Voestalpine Stahl Gmbh Vorrichtung und verfahren zur detektion wenigstens eines periodisch auftretenden fehlers an einem gegenstand
US9552557B2 (en) * 2012-02-16 2017-01-24 Microsoft Technology Licensing, Llc Visual representation of chart scaling
JP6358002B2 (ja) * 2014-09-16 2018-07-18 旭硝子株式会社 不具合搬送用ロールの特定方法、およびガラスリボンにおける疵発生防止方法
EP3594667A1 (de) 2018-07-12 2020-01-15 Primetals Technologies France SAS Anlage zur erfassung von periodisch auftretenden fehlern eines durchlaufenden produkts
CN115698682A (zh) * 2020-03-30 2023-02-03 斯玛特克斯欧洲一人有限公司 用于校准的系统和方法
EP4105102A1 (de) * 2021-06-15 2022-12-21 Primetals Technologies Austria GmbH Schiene mit einer identifizierungsmarke und vorrichtung zum identifizieren der schiene

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5213952B2 (de) * 1972-07-31 1977-04-18
US3958127A (en) * 1974-08-09 1976-05-18 E. I. Du Pont De Nemours And Company Optical-electrical web inspection system
JPS5213952A (en) * 1975-07-21 1977-02-02 Susumu Sasa Device for raising upper body on bed
GB2037464B (en) * 1978-12-14 1982-11-24 Rank Organisation Ltd Method for analysing variables
US4292672A (en) * 1979-03-19 1981-09-29 Rca Corporation Inspection system for detecting defects in regular patterns
JPS5759353A (en) * 1980-09-27 1982-04-09 Toshiba Corp Manufacture of semiconductor device
JPS57184958A (en) * 1981-05-11 1982-11-13 Nippon Steel Corp Roll mark detecting device
US4495587A (en) * 1981-12-08 1985-01-22 Bethlehem Steel Corporation Automatic nondestructive roll defect inspection system
JPS58156842A (ja) * 1982-03-15 1983-09-17 Toshiba Corp ロ−ル疵検出装置
JPS58165042A (ja) * 1982-03-25 1983-09-30 Toshiba Corp 表面疵検査装置
US4677578A (en) * 1982-04-05 1987-06-30 Armco Inc. Non-contact sensing system for determining the relative elongation in a moving flat steel strip
US4519041A (en) * 1982-05-03 1985-05-21 Honeywell Inc. Real time automated inspection
JPS5938877A (ja) * 1982-08-30 1984-03-02 Musashi Eng Kk 紙葉判別方法
GB2129547B (en) * 1982-11-02 1986-05-21 Cambridge Instr Ltd Reticle inspection
JPS6089751A (ja) * 1983-10-21 1985-05-20 Nippon Steel Corp 鋼材の機械的特性の判定法

Also Published As

Publication number Publication date
EP0316961A3 (en) 1990-08-01
DE3855913T2 (de) 1997-12-04
EP0594220A3 (en) 1994-06-01
EP0594220A2 (de) 1994-04-27
DE3851609T2 (de) 1995-01-19
EP0594220B1 (de) 1997-05-14
EP0316961B1 (de) 1994-09-21
EP0316961A2 (de) 1989-05-24
DE3851609D1 (de) 1994-10-27
US4958307A (en) 1990-09-18

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8320 Willingness to grant licences declared (paragraph 23)